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Author : EOS/ESDAssociation
Publisher : Unknown
Page : 17 pages
File Size : 55,7 Mb
Release : 2005-01-01
Category : Electronic
ISBN : 1585371009
Author : Steven H. Voldman
Publisher : John Wiley & Sons
Page : 1172 pages
File Size : 53,6 Mb
Release : 2021-04-12
Category : Technology & Engineering
ISBN : 9781119965176
A practical and comprehensive reference that explores Electrostatic Discharge (ESD) in semiconductor components and electronic systems The ESD Handbook offers a comprehensive reference that explores topics relevant to ESD design in semiconductor components and explores ESD in various systems. Electrostatic discharge is a common problem in the semiconductor environment and this reference fills a gap in the literature by discussing ESD protection. Written by a noted expert on the topic, the text offers a topic-by-topic reference that includes illustrative figures, discussions, and drawings. The handbook covers a wide-range of topics including ESD in manufacturing (garments, wrist straps, and shoes); ESD Testing; ESD device physics; ESD semiconductor process effects; ESD failure mechanisms; ESD circuits in different technologies (CMOS, Bipolar, etc.); ESD circuit types (Pin, Power, Pin-to-Pin, etc.); and much more. In addition, the text includes a glossary, index, tables, illustrations, and a variety of case studies. Contains a well-organized reference that provides a quick review on a range of ESD topics Fills the gap in the current literature by providing information from purely scientific and physical aspects to practical applications Offers information in clear and accessible terms Written by the accomplished author of the popular ESD book series Written for technicians, operators, engineers, circuit designers, and failure analysis engineers, The ESD Handbook contains an accessible reference to ESD design and ESD systems.
Author : Steven H. Voldman
Publisher : John Wiley & Sons
Page : 244 pages
File Size : 51,8 Mb
Release : 2012-10-22
Category : Technology & Engineering
ISBN : 9780470979716
Electrostatic discharge (ESD) continues to impact semiconductor manufacturing, semiconductor components and systems, as technologies scale from micro- to nano electronics. This book introduces the fundamentals of ESD, electrical overstress (EOS), electromagnetic interference (EMI), electromagnetic compatibility (EMC), and latchup, as well as provides a coherent overview of the semiconductor manufacturing environment and the final system assembly. It provides an illuminating look into the integration of ESD protection networks followed by examples in specific technologies, circuits, and chips. The text is unique in covering semiconductor chip manufacturing issues, ESD semiconductor chip design, and system problems confronted today as well as the future of ESD phenomena and nano-technology. Look inside for extensive coverage on: The fundamentals of electrostatics, triboelectric charging, and how they relate to present day manufacturing environments of micro-electronics to nano-technology Semiconductor manufacturing handling and auditing processing to avoid ESD failures ESD, EOS, EMI, EMC, and latchup semiconductor component and system level testing to demonstrate product resilience from human body model (HBM), transmission line pulse (TLP), charged device model (CDM), human metal model (HMM), cable discharge events (CDE), to system level IEC 61000-4-2 tests ESD on-chip design and process manufacturing practices and solutions to improve ESD semiconductor chip solutions, also practical off-chip ESD protection and system level solutions to provide more robust systems System level concerns in servers, laptops, disk drives, cell phones, digital cameras, hand held devices, automobiles, and space applications Examples of ESD design for state-of-the-art technologies, including CMOS, BiCMOS, SOI, bipolar technology, high voltage CMOS (HVCMOS), RF CMOS, smart power, magnetic recording technology, micro-machines (MEMs) to nano-structures ESD Basics: From Semiconductor Manufacturing to Product Use complements the author’s series of books on ESD protection. For those new to the field, it is an essential reference and a useful insight into the issues that confront modern technology as we enter the Nano-electronic Era.
Author : Elya B. Joffe,Kai-Sang Lock
Publisher : John Wiley & Sons
Page : 827 pages
File Size : 42,5 Mb
Release : 2011-09-20
Category : Technology & Engineering
ISBN : 9781118211519
GROUNDS FOR GROUNDING The first book to cover grounding from the circuit to system and across the entire spectrum of applications Grounds for Grounding provides a complete and thorough approach to the subject of designing electrical and electronic circuits and systems, blending theory and practice to demonstrate how a few basic rules can be applied across a broad range of applications. The authors begin with the basic concepts of Electromagnetic Compatibility (EMC) that are essential for understanding grounding theory and its applications, such as “ground loop,” which is one of the most misunderstood concepts in EMC. Next, they provide an introduction to grounding, including safety grounding, grounding for control of electromagnetic interference, and grounding-related case studies. Subsequent chapter coverage includes: Fundamentals of grounding design Bonding principles Grounding for power distribution and lightning protection systems Grounding in wiring circuits and cable shields Grounding of EMI terminal protection devices Grounding on printed circuit boards Integrated facility and platform grounding system Practical case studies are integrated throughout the book to aid in readers’ comprehension and each chapter concludes with a useful bibliography. Grounds for Grounding is an indispensable resource for electrical and electronic engineers who work with the design of circuits, systems, and facilities.
Author : Anonim
Publisher : Unknown
Page : 658 pages
File Size : 42,8 Mb
Release : 2008
Category : Hyperbaric oxygenation
ISBN : UCSD:31822037758968
Author : Anonim
Publisher : Unknown
Page : 176 pages
File Size : 47,5 Mb
Release : 2006
Category : Electronic systems
ISBN : PSU:000058142844
Author : EOS/ESD Association, Incorporated
Publisher : Unknown
Page : 6 pages
File Size : 42,6 Mb
Release : 2006
Category : Electronic
ISBN : 1585371173
Author : Halime Ö. Paksoy
Publisher : Springer Science & Business Media
Page : 440 pages
File Size : 45,7 Mb
Release : 2007-03-16
Category : Technology & Engineering
ISBN : 9781402052903
Çukurova University, Turkey in collaboration with Ljubljana University, Slovenia and the International Energy Agency Implementing Agreement on Energy Conservation Through Energy Storage (IEA ECES IA) organized a NATO Advanced Study Institute on Thermal Energy Storage for Sustainable Energy Consumption – Fundamentals, Case Studies and Design (NATO ASI TESSEC), in Cesme, Izmir, Turkey in June, 2005. This book contains manuscripts based on the lectures included in the scientific programme of the NATO ASI TESSEC.
Author : Anne M. Coghill,Lorrin R. Garson
Publisher : American Chemical Society
Page : 0 pages
File Size : 41,8 Mb
Release : 2006
Category : Authorship
ISBN : 0841239495
In the time since the second edition of The ACS Style Guide was published, the rapid growth of electronic communication has dramatically changed the scientific, technical, and medical (STM) publication world. This dynamic mode of dissemination is enabling scientists, engineers, and medicalpractitioners all over the world to obtain and transmit information quickly and easily. An essential constant in this changing environment is the requirement that information remain accurate, clear, unambiguous, and ethically sound.This extensive revision of The ACS Style Guide thoroughly examines electronic tools now available to assist STM writers in preparing manuscripts and communicating with publishers. Valuable updates include discussions of markup languages, citation of electronic sources, online submission ofmanuscripts, and preparation of figures, tables, and structures. In keeping current with the changing environment, this edition also contains references to many resources on the internet.With this wealth of new information, The ACS Style Guide's Third Edition continues its long tradition of providing invaluable insight on ethics in scientific communication, the editorial process, copyright, conventions in chemistry, grammar, punctuation, spelling, and writing style for any STMauthor, reviewer, or editor. The Third Edition is the definitive source for all information needed to write, review, submit, and edit scholarly and scientific manuscripts.
Author : Fernando Galembeck,Thiago A. L. Burgo
Publisher : Springer
Page : 230 pages
File Size : 53,6 Mb
Release : 2017-03-09
Category : Science
ISBN : 9783319523743
This book provides new clues for understanding electrostatic charging in solids and liquids, resulting from the surge of research in this active area of science that is taking place since the 1990's but is still largely unknown to most researchers, lecturers and engineers. Written by a leading researcher in this field, this book describes the formation and properties of the Earth capacitor, the production of environmental electricity and its effect on natural and anthropic systems and examines many situations in which water may play a decisive role in electrostatic behavior. The authors present an informed critique of the long-held assumption that pure substances should be electroneutral. In this regard, the authors show that charge partition and accumulation is expected considering the electrochemical potential under non-zero electrostatic potential, which prevails at Earth surface. This book provides conceptual tools to guide the reader through the complexities and consequences of electrostatic phenomena while covering exciting current topics such as energy scavenging from the environment, electrostatic based green production, energy-saving processes, electrochemistry at the solid-gas interface, therapeutic electrostatic treatments, applications in sanitation and pest control and control of atmospheric electricity and its use in climate engineering.
Author : David Prutchi,Michael Norris
Publisher : John Wiley & Sons
Page : 479 pages
File Size : 52,6 Mb
Release : 2005-01-28
Category : Technology & Engineering
ISBN : 9780471681830
Design and Development of Medical Electronic Instrumentation fills a gap in the existing medical electronic devices literature by providing background and examples of how medical instrumentation is actually designed and tested. The book includes practical examples and projects, including working schematics, ranging in difficulty from simple biopotential amplifiers to computer-controlled defibrillators. Covering every stage of the development process, the book provides complete coverage of the practical aspects of amplifying, processing, simulating and evoking biopotentials. In addition, two chapters address the issue of safety in the development of electronic medical devices, and providing valuable insider advice.
Author : Helmut E. Graeb
Publisher : Springer Science & Business Media
Page : 302 pages
File Size : 55,9 Mb
Release : 2010-09-28
Category : Technology & Engineering
ISBN : 9781441969323
Integrated circuits are fundamental electronic components in biomedical, automotive and many other technical systems. A small, yet crucial part of a chip consists of analog circuitry. This part is still in large part designed by hand and therefore represents not only a bottleneck in the design flow, but also a permanent source of design errors responsible for re-designs, costly in terms of wasted test chips and in terms of lost time-to-market. Layout design is the step of the analog design flow with the least support by commercially available, computer-aided design tools. This book provides a survey of promising new approaches to automated, analog layout design, which have been described recently and are rapidly being adopted in industry.
Author : B. T. Fijalkowski
Publisher : Springer Science & Business Media
Page : 585 pages
File Size : 42,7 Mb
Release : 2010-11-25
Category : Technology & Engineering
ISBN : 9789400704091
This book presents operational and practical issues of automotive mechatronics with special emphasis on the heterogeneous automotive vehicle systems approach, and is intended as a graduate text as well as a reference for scientists and engineers involved in the design of automotive mechatronic control systems. As the complexity of automotive vehicles increases, so does the dearth of high competence, multi-disciplined automotive scientists and engineers. This book provides a discussion into the type of mechatronic control systems found in modern vehicles and the skills required by automotive scientists and engineers working in this environment. Divided into two volumes and five parts, Automotive Mechatronics aims at improving automotive mechatronics education and emphasises the training of students’ experimental hands-on abilities, stimulating and promoting experience among high education institutes and produce more automotive mechatronics and automation engineers. The main subject that are treated are: VOLUME I: RBW or XBW unibody or chassis-motion mechatronic control hypersystems; DBW AWD propulsion mechatronic control systems; BBW AWB dispulsion mechatronic control systems; VOLUME II: SBW AWS diversion mechatronic control systems; ABW AWA suspension mechatronic control systems. This volume was developed for undergraduate and postgraduate students as well as for professionals involved in all disciplines related to the design or research and development of automotive vehicle dynamics, powertrains, brakes, steering, and shock absorbers (dampers). Basic knowledge of college mathematics, college physics, and knowledge of the functionality of automotive vehicle basic propulsion, dispulsion, conversion and suspension systems is required.
Author : Abderrahim El Moataz,Driss Mammass,Alamin Mansouri,Fathallah Nouboud
Publisher : Springer Nature
Page : 388 pages
File Size : 43,9 Mb
Release : 2020-07-08
Category : Computers
ISBN : 9783030519353
This volume constitutes the refereed proceedings of the 9th International Conference on Image and Signal Processing, ICISP 2020, which was due to be held in Marrakesh, Morocco, in June 2020. The conference was cancelled due to the COVID-19 pandemic. The 40 revised full papers were carefully reviewed and selected from 84 submissions. The contributions presented in this volume were organized in the following topical sections: digital cultural heritage & color and spectral imaging; data and image processing for precision agriculture; machine learning application and innovation; biomedical imaging; deep learning and applications; pattern recognition; segmentation and retrieval; mathematical imaging & signal processing.
Author : Steven H. Voldman
Publisher : John Wiley & Sons
Page : 368 pages
File Size : 40,9 Mb
Release : 2013-08-27
Category : Technology & Engineering
ISBN : 9781118703335
Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system design. It provides an illuminating insight into the sources of EOS in manufacturing, integration of on-chip, and system level EOS protection networks, followed by examples in specific technologies, circuits, and chips. The book is unique in covering the EOS manufacturing issues from on-chip design and electronic design automation to factory-level EOS program management in today’s modern world. Look inside for extensive coverage on: Fundamentals of electrical overstress, from EOS physics, EOS time scales, safe operating area (SOA), to physical models for EOS phenomena EOS sources in today’s semiconductor manufacturing environment, and EOS program management, handling and EOS auditing processing to avoid EOS failures EOS failures in both semiconductor devices, circuits and system Discussion of how to distinguish between EOS events, and electrostatic discharge (ESD) events (e.g. such as human body model (HBM), charged device model (CDM), cable discharge events (CDM), charged board events (CBE), to system level IEC 61000-4-2 test events) EOS protection on-chip design practices and how they differ from ESD protection networks and solutions Discussion of EOS system level concerns in printed circuit boards (PCB), and manufacturing equipment Examples of EOS issues in state-of-the-art digital, analog and power technologies including CMOS, LDMOS, and BCD EOS design rule checking (DRC), LVS, and ERC electronic design automation (EDA) and how it is distinct from ESD EDA systems EOS testing and qualification techniques, and Practical off-chip ESD protection and system level solutions to provide more robust systems Electrical Overstress (EOS): Devices, Circuits and Systems is a continuation of the author’s series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the nano-electronic era.
