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Author : Matthew Joseph Brukman
Publisher : Unknown
Page : 208 pages
File Size : 42,6 Mb
Release : 2005
Category : Electronic
ISBN : WISC:89086990652
Author : Victor Bellitto
Publisher : BoD – Books on Demand
Page : 272 pages
File Size : 51,8 Mb
Release : 2012-03-23
Category : Science
ISBN : 9789535104148
With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.
Author : Wesley C. Sanders
Publisher : CRC Press
Page : 154 pages
File Size : 53,7 Mb
Release : 2019-10-08
Category : Technology & Engineering
ISBN : 9781000707649
This book focuses primarily on the atomic force microscope and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester-long introductory course in atomic force microscopy. There are a few algebra-based mathematical relationships included in the book that describe the mechanical properties, behaviors, and intermolecular forces associated with probes used in atomic force microscopy. Relevant figures, tables, and illustrations also appear in each chapter in an effort to provide additional information and points of interest. This book includes suggested laboratory investigations that provide opportunities to explore the versatility of the atomic force microscope. These laboratory exercises include opportunities for experimenters to explore force curves, surface roughness, friction loops, conductivity imaging, and phase imaging.
Author : Seizo Morita,Franz J. Giessibl,Ernst Meyer,Roland Wiesendanger
Publisher : Springer
Page : 527 pages
File Size : 50,8 Mb
Release : 2015-05-18
Category : Science
ISBN : 9783319155883
This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.
Author : Bharat Bhushan
Publisher : Springer Science & Business Media
Page : 1157 pages
File Size : 40,8 Mb
Release : 2006-01-27
Category : Technology & Engineering
ISBN : 9783540282488
The recent emergence and proliferation of proximal probes, e.g. SPM and AFM, and computational techniques for simulating tip-surface interactions has enabled the systematic investigation of interfacial problems on ever smaller scales, as well as created means for modifying and manipulating nanostructures. In short, they have led to the appearance of the new, interdisciplinary fields of micro/nanotribology and micro/nanomechanics. This volume serves as a timely, practical introduction to the principles of nanotribology and nanomechanics and applications to magnetic storage systems and MEMS/NEMS. Assuming some familiarity with macrotribology/mechanics, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. They cover key measurement techniques, their applications, and theoretical modelling of interfaces, each beginning their contributions with macro- and progressing to microconcepts. After reviewing the fundamental experimental and theoretical aspects in the first part, Nanotribology and Nanomechanics then treats applications. Three groups of readers are likely to find this text valuable: graduate students, research workers, and practicing engineers. It can serve as the basis for a comprehensive, one- or two-semester course in scanning probe microscopy; applied scanning probe techniques; or nanotribology/nanomechanics/nanotechnology, in departments such as mechanical engineering, materials science, and applied physics. With a Foreword by Physics Nobel Laureate Gerd Binnig Dr. Bharat Bhushan is an Ohio Eminent Scholar and The Howard D. Winbigler Professor in the Department of Mechanical Engineering, Graduate Research Faculty Advisor in the Department of Materials Science and Engineering, and the Director of the Nanotribology Laboratory for Information Storage & MEMS/NEMS (NLIM) at the Ohio State University, Columbus, Ohio. He is an internationally recognized expert of tribology and mechanics on the macro- to nanoscales, and is one of the most prolific authors. He is considered by some a pioneer of the tribology and mechanics of magnetic storage devices and a leading researcher in the fields of nanotribology and nanomechanics using scanning probe microscopy and applications to micro/nanotechnology. He is the recipient of various international fellowships including the Alexander von Humboldt Research Prize for Senior Scientists, Max Planck Foundation Research Award for Outstanding Foreign Scientists, and the Fulbright Senior Scholar Award.
Author : Bharat Bhushan
Publisher : Springer
Page : 1500 pages
File Size : 40,9 Mb
Release : 2017-11-05
Category : Technology & Engineering
ISBN : 9783662543573
This comprehensive handbook has become the definitive reference work in the field of nanoscience and nanotechnology, and this 4th edition incorporates a number of recent new developments. It integrates nanofabrication, nanomaterials, nanodevices, nanomechanics, nanotribology, materials science, and reliability engineering knowledge in just one volume. Furthermore, it discusses various nanostructures; micro/nanofabrication; micro/nanodevices and biomicro/nanodevices, as well as scanning probe microscopy; nanotribology and nanomechanics; molecularly thick films; industrial applications and nanodevice reliability; societal, environmental, health and safety issues; and nanotechnology education. In this new edition, written by an international team of over 140 distinguished experts and put together by an experienced editor with a comprehensive understanding of the field, almost all the chapters are either new or substantially revised and expanded, with new topics of interest added. It is an essential resource for anyone working in the rapidly evolving field of key technology, including mechanical and electrical engineers, materials scientists, physicists, and chemists.
Author : S. Morita,Roland Wiesendanger,E. Meyer
Publisher : Springer Science & Business Media
Page : 448 pages
File Size : 47,7 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9783642560194
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
Author : Seizo Morita,Franz J. Giessibl,Roland Wiesendanger
Publisher : Springer Science & Business Media
Page : 410 pages
File Size : 54,7 Mb
Release : 2009-09-18
Category : Technology & Engineering
ISBN : 9783642014956
Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.
Author : Bharat Bhushan
Publisher : Springer Science & Business Media
Page : 666 pages
File Size : 48,8 Mb
Release : 2012-12-06
Category : Science
ISBN : 9789401156462
Micro/nanotribology as a field is concerned with experimental and theoretical investigations of processes ranging from atomic and molecular scales to the microscale, occurring during adhesion, friction, wear, and thin-film lubrication at sliding surfaces. As a field it is truly interdisciplinary, but this confronts the would-be entrant with the difficulty of becoming familiar with the basic theories and applications: the area is not covered in any undergraduate or graduate scientific curriculum. The present work commences with a history of tribology and micro/nanotribology, followed by discussions of instrumentation, basic theories of friction, wear and lubrication on nano- to microscales, and their industrial applications. A variety of research instruments are covered, including a variety of scanning probe microscopes and surface force apparatus. Experimental research and modelling are expertly dealt with, the emphasis throughout being applied aspects.
Author : Wei Wang
Publisher : Unknown
Page : 232 pages
File Size : 44,7 Mb
Release : 2004
Category : Electronic
ISBN : UOM:39015059125412
Author : Bharat Bhushan
Publisher : CRC Press
Page : 1760 pages
File Size : 55,5 Mb
Release : 2000-12-28
Category : Technology & Engineering
ISBN : 9780849377877
Recent research has led to a deeper understanding of the nature and consequences of interactions between materials on an atomic scale. The results have resonated throughout the field of tribology. For example, new applications require detailed understanding of the tribological process on macro- and microscales and new knowledge guides the rational
Author : Anonim
Publisher : Unknown
Page : 564 pages
File Size : 53,7 Mb
Release : 1994
Category : Aeronautics
ISBN : UIUC:30112067190071
Author : M.T. Bray,Samuel H. Cohen,Marcia L. Lightbody
Publisher : Springer Science & Business Media
Page : 431 pages
File Size : 55,6 Mb
Release : 2013-11-11
Category : Technology & Engineering
ISBN : 9781475793222
The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1993 in Natick, Massachusetts. This book represents the compilation of the papers presented at the meeting. The purpose ofthis symposium was to provide a forum where scientists from a number of diverse fields could interact with one another and exchange ideas. The various topics inc1uded application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments inc1uding new probe microscopies and frontiers in this exciting area. The meeting's format was designed to encourage communication between members of the general scientific community and those individuals who are at the cutting edge of AFM, STM and other probe microscopies. It immediately became clear that this conference enabled interdisciplinary interactions among researchers from academia, industry and government, and set the tone for future collaborations. Expert scientists from diverse scientific areas including physics, chemistry, biology, materials science and electronics were invited to participate in the symposium. The agenda of the meeting was divided into three major sessions. In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.
Author : Bharat Bhushan
Publisher : Springer Science & Business Media
Page : 1025 pages
File Size : 53,9 Mb
Release : 2011-05-30
Category : Technology & Engineering
ISBN : 9783642152634
The comprehensive reference and textbook serves as a timely, practical introduction to the principles of nanotribology and nanomechanics. Assuming some familiarity with macroscopic tribology, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. They cover key measurement techniques, their applications, and theoretical modelling of interfaces, each beginning their contributions with macro- and progressing to microconcepts.
Author : James A. Schwarz,Cristian I. Contescu,Karol Putyera
Publisher : CRC Press
Page : 974 pages
File Size : 53,7 Mb
Release : 2004
Category : Science
ISBN : 0824750497