Comprehensive Test Pattern And Approach For Characterizing Sos Technology

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Materials and Process Characterization

Author : Norman G. Einspruch,Graydon B. Larrabee
Publisher : Academic Press
Page : 614 pages
File Size : 49,6 Mb
Release : 2014-12-01
Category : Technology & Engineering
ISBN : 9781483217734

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Materials and Process Characterization by Norman G. Einspruch,Graydon B. Larrabee Pdf

VLSI Electronics: Microstructure Science, Volume 6: Materials and Process Characterization addresses the problem of how to apply a broad range of sophisticated materials characterization tools to materials and processes used for development and production of very large scale integration (VLSI) electronics. This book discusses the various characterization techniques, such as Auger spectroscopy, secondary ion mass spectroscopy, X-ray topography, transmission electron microscopy, and spreading resistance. The systematic approach to the technologies of VLSI electronic materials and device manufacture are also considered. This volume is beneficial to materials scientists, chemists, and engineers who are commissioned with the responsibility of developing and implementing the production of materials and devices to support the VLSI era.

NBS Special Publication

Author : Anonim
Publisher : Unknown
Page : 1538 pages
File Size : 48,9 Mb
Release : 1979
Category : Weights and measures
ISBN : UOM:39015009843650

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NBS Special Publication by Anonim Pdf

Semiconductor Measurement Technology

Author : United States. National Bureau of Standards
Publisher : Unknown
Page : 48 pages
File Size : 44,8 Mb
Release : 1979
Category : Integrated circuits
ISBN : STANFORD:36105131570728

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Semiconductor Measurement Technology by United States. National Bureau of Standards Pdf

National Semiconductor Metrology Program

Author : National Institute of Standards and Technology (U.S.)
Publisher : Unknown
Page : 148 pages
File Size : 45,5 Mb
Release : 1999
Category : Semiconductors
ISBN : PSU:000073567967

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National Semiconductor Metrology Program by National Institute of Standards and Technology (U.S.) Pdf

National Semiconductor Metrology Program

Author : National Semiconductor Metrology Program (U.S.)
Publisher : Unknown
Page : 120 pages
File Size : 46,6 Mb
Release : 1997
Category : Semiconductors
ISBN : IND:30000097657559

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National Semiconductor Metrology Program by National Semiconductor Metrology Program (U.S.) Pdf

Semiconductor Measurement Technology

Author : National Institute of Standards and Technology (U.S.)
Publisher : Unknown
Page : 140 pages
File Size : 54,8 Mb
Release : 1990
Category : Semiconductors
ISBN : IND:30000097323293

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Semiconductor Measurement Technology by National Institute of Standards and Technology (U.S.) Pdf

Scientific and Technical Aerospace Reports

Author : Anonim
Publisher : Unknown
Page : 1282 pages
File Size : 52,8 Mb
Release : 1982
Category : Aeronautics
ISBN : UIUC:30112102359566

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Scientific and Technical Aerospace Reports by Anonim Pdf

Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.

Monthly Catalog of United States Government Publications

Author : United States. Superintendent of Documents
Publisher : Unknown
Page : 1220 pages
File Size : 46,9 Mb
Release : 1968
Category : Government publications
ISBN : UCR:31210024274720

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Monthly Catalog of United States Government Publications by United States. Superintendent of Documents Pdf

Publications Catalog of the U.S. Department of Commerce

Author : United States. Department of Commerce. Office of Publications
Publisher : Unknown
Page : 822 pages
File Size : 54,9 Mb
Release : 1980
Category : Government publications
ISBN : UIUC:30112075692712

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Publications Catalog of the U.S. Department of Commerce by United States. Department of Commerce. Office of Publications Pdf