Author : William E. Ham
Publisher : Unknown
Page : 361 pages
File Size : 51,9 Mb
Release : 1980
Category : Integrated circuits
ISBN : LCCN:79600194
Comprehensive Test Pattern And Approach For Characterizing Sos Technology
Comprehensive Test Pattern And Approach For Characterizing Sos Technology Book in PDF, ePub and Kindle version is available to download in english. Read online anytime anywhere directly from your device. Click on the download button below to get a free pdf file of Comprehensive Test Pattern And Approach For Characterizing Sos Technology book. This book definitely worth reading, it is an incredibly well-written.
Comprehensive Test Pattern and Approach for Characterizing SOS Technology
Author : William E. Ham
Publisher : Unknown
Page : 388 pages
File Size : 52,6 Mb
Release : 1980
Category : Integrated circuits
ISBN : UCR:31210024872986
Comprehensive Test Pattern and Approach for Characterizing SOS Technology by William E. Ham Pdf
Materials and Process Characterization
Author : Norman G. Einspruch,Graydon B. Larrabee
Publisher : Academic Press
Page : 614 pages
File Size : 49,6 Mb
Release : 2014-12-01
Category : Technology & Engineering
ISBN : 9781483217734
Materials and Process Characterization by Norman G. Einspruch,Graydon B. Larrabee Pdf
VLSI Electronics: Microstructure Science, Volume 6: Materials and Process Characterization addresses the problem of how to apply a broad range of sophisticated materials characterization tools to materials and processes used for development and production of very large scale integration (VLSI) electronics. This book discusses the various characterization techniques, such as Auger spectroscopy, secondary ion mass spectroscopy, X-ray topography, transmission electron microscopy, and spreading resistance. The systematic approach to the technologies of VLSI electronic materials and device manufacture are also considered. This volume is beneficial to materials scientists, chemists, and engineers who are commissioned with the responsibility of developing and implementing the production of materials and devices to support the VLSI era.
NBS Special Publication
Author : Anonim
Publisher : Unknown
Page : 1538 pages
File Size : 48,9 Mb
Release : 1979
Category : Weights and measures
ISBN : UOM:39015009843650
NBS Special Publication by Anonim Pdf
Monthly Catalogue, United States Public Documents
Author : Anonim
Publisher : Unknown
Page : 1188 pages
File Size : 45,9 Mb
Release : 1980
Category : Government publications
ISBN : UIUC:30112063912619
Monthly Catalogue, United States Public Documents by Anonim Pdf
Semiconductor Measurement Technology
Author : United States. National Bureau of Standards
Publisher : Unknown
Page : 48 pages
File Size : 44,8 Mb
Release : 1979
Category : Integrated circuits
ISBN : STANFORD:36105131570728
Semiconductor Measurement Technology by United States. National Bureau of Standards Pdf
National Semiconductor Metrology Program
Author : National Institute of Standards and Technology (U.S.)
Publisher : Unknown
Page : 148 pages
File Size : 45,5 Mb
Release : 1999
Category : Semiconductors
ISBN : PSU:000073567967
National Semiconductor Metrology Program by National Institute of Standards and Technology (U.S.) Pdf
National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000
Author : Anonim
Publisher : Unknown
Page : 160 pages
File Size : 42,6 Mb
Release : 2000
Category : Electronic
ISBN : STANFORD:36105050150742
National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000 by Anonim Pdf
National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999
Author : Anonim
Publisher : Unknown
Page : 148 pages
File Size : 43,5 Mb
Release : 1999
Category : Electronic
ISBN : STANFORD:36105050030753
National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999 by Anonim Pdf
National Semiconductor Metrology Program
Author : National Semiconductor Metrology Program (U.S.)
Publisher : Unknown
Page : 120 pages
File Size : 46,6 Mb
Release : 1997
Category : Semiconductors
ISBN : IND:30000097657559
National Semiconductor Metrology Program by National Semiconductor Metrology Program (U.S.) Pdf
Semiconductor Measurement Technology
Author : National Institute of Standards and Technology (U.S.)
Publisher : Unknown
Page : 140 pages
File Size : 54,8 Mb
Release : 1990
Category : Semiconductors
ISBN : IND:30000097323293
Semiconductor Measurement Technology by National Institute of Standards and Technology (U.S.) Pdf
Scientific and Technical Aerospace Reports
Author : Anonim
Publisher : Unknown
Page : 1282 pages
File Size : 52,8 Mb
Release : 1982
Category : Aeronautics
ISBN : UIUC:30112102359566
Scientific and Technical Aerospace Reports by Anonim Pdf
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Monthly Catalog of United States Government Publications
Author : Anonim
Publisher : Unknown
Page : 994 pages
File Size : 51,9 Mb
Release : 2024-06-02
Category : Government publications
ISBN : WISC:89117117184
Monthly Catalog of United States Government Publications by Anonim Pdf
Monthly Catalog of United States Government Publications
Author : United States. Superintendent of Documents
Publisher : Unknown
Page : 1220 pages
File Size : 46,9 Mb
Release : 1968
Category : Government publications
ISBN : UCR:31210024274720
Monthly Catalog of United States Government Publications by United States. Superintendent of Documents Pdf
Publications Catalog of the U.S. Department of Commerce
Author : United States. Department of Commerce. Office of Publications
Publisher : Unknown
Page : 822 pages
File Size : 54,9 Mb
Release : 1980
Category : Government publications
ISBN : UIUC:30112075692712