Electron Microprobe Analysis And Scanning Electron Microscopy In Geology

Author : S. J. B. Reed
Publisher : Cambridge University Press
Page : 232 pages
File Size : 45,6 Mb
Release : 2005-08-25
Category : Science
ISBN : 9781139446389

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Electron Microprobe Analysis and Scanning Electron Microscopy in Geology by S. J. B. Reed Pdf

Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Author : Joseph Goldstein
Publisher : Springer Science & Business Media
Page : 598 pages
File Size : 42,9 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461344223

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Practical Scanning Electron Microscopy by Joseph Goldstein Pdf

In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.

Author : Joseph Goldstein,Dale E. Newbury,Patrick Echlin,David C. Joy,Charles Fiori,Eric Lifshin
Publisher : Springer Science & Business Media
Page : 679 pages
File Size : 42,7 Mb
Release : 2013-11-11
Category : Science
ISBN : 9781461332732

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Scanning Electron Microscopy and X-Ray Microanalysis by Joseph Goldstein,Dale E. Newbury,Patrick Echlin,David C. Joy,Charles Fiori,Eric Lifshin Pdf

This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

Author : S. J. B. Reed
Publisher : Cambridge University Press
Page : 350 pages
File Size : 51,9 Mb
Release : 1997-07-10
Category : Science
ISBN : 052159944X

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Electron Microprobe Analysis by S. J. B. Reed Pdf

This 1993 book gives a comprehensive account of both experimental and theoretical aspects of electron microprobe analysis, and is an extensively updated version of the seminal first edition, published in 1975. The design and operation of the instrument, including the electron column and both wavelength- and energy-dispersive X-ray spectrometers, are covered in the first part of the book. Experimental procedures for qualitative and quantitative analysis, using both types of spectrometer, are then discussed. Matrix ('ZAF') corrections, as required for quantitative analysis, are treated in some detail from both theoretical and practical viewpoints. Special considerations applying to the analysis of 'light' elements (atomic number below 10) are covered in a separate chapter. The emphasis throughout is on a sound understanding of principles and the treatment is applicable equally to the electron microprobe in its 'classical' form and to scanning electron microscopes fitted with X-ray spectrometers.

Author : Joseph Goldstein,Dale E. Newbury,Patrick Echlin,David C. Joy,Charles Fiori,Eric Lifshin
Publisher : Springer
Page : 673 pages
File Size : 54,6 Mb
Release : 2013-03-20
Category : Science
ISBN : 1461332753

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Scanning Electron Microscopy and X-Ray Microanalysis by Joseph Goldstein,Dale E. Newbury,Patrick Echlin,David C. Joy,Charles Fiori,Eric Lifshin Pdf

This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

Author : Joseph I. Goldstein,Harvey Yakowitz,T. E. Everhart
Publisher : Unknown
Page : 128 pages
File Size : 54,5 Mb
Release : 1977
Category : Microprobe analysis
ISBN : OCLC:56004917

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Practical Scanning Electron Microscopy by Joseph I. Goldstein,Harvey Yakowitz,T. E. Everhart Pdf

Author : Joseph Goldstein,Dale E. Newbury,Patrick Echlin,David C. Joy,Alton D. Romig Jr.,Charles E. Lyman,Charles Fiori,Eric Lifshin
Publisher : Springer
Page : 840 pages
File Size : 42,6 Mb
Release : 2011-09-28
Category : Science
ISBN : 1461276535

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Scanning Electron Microscopy and X-Ray Microanalysis by Joseph Goldstein,Dale E. Newbury,Patrick Echlin,David C. Joy,Alton D. Romig Jr.,Charles E. Lyman,Charles Fiori,Eric Lifshin Pdf

In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities.

Author : Charles E. Lyman,Dale E. Newbury,Joseph Goldstein,David B. Williams,Alton D. Romig Jr.,John Armstrong,Patrick Echlin,Charles Fiori,David C. Joy,Eric Lifshin,Klaus-Rüdiger Peters
Publisher : Springer Science & Business Media
Page : 415 pages
File Size : 43,7 Mb
Release : 2012-12-06
Category : Science
ISBN : 9781461306351

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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy by Charles E. Lyman,Dale E. Newbury,Joseph Goldstein,David B. Williams,Alton D. Romig Jr.,John Armstrong,Patrick Echlin,Charles Fiori,David C. Joy,Eric Lifshin,Klaus-Rüdiger Peters Pdf

During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal classes in universities and colleges and by special summer courses such as the ones offered for the past 19 years at Lehigh University. Laboratory work, which should be an integral part of such courses, is often hindered by the lack of a suitable laboratory workbook. While laboratory workbooks for transmission electron microscopy have-been in existence for many years, the broad range of topics that must be dealt with in scanning electron microscopy and microanalysis has made it difficult for instructors to devise meaningful experiments. The present workbook provides a series of fundamental experiments to aid in "hands-on" learning of the use of the instrumentation and the techniques. It is written by a group of eminently qualified scientists and educators. The importance of hands-on learning cannot be overemphasized.

Author : Philip J. Potts,J.F. Bowles,Stephen.J. Reed,R. Cave
Publisher : Springer Science & Business Media
Page : 430 pages
File Size : 48,5 Mb
Release : 2012-12-06
Category : Science
ISBN : 9781461520535

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Microprobe Techniques in the Earth Sciences by Philip J. Potts,J.F. Bowles,Stephen.J. Reed,R. Cave Pdf

30% discount for members of The Mineralogical Society of Britain and Ireland This text covers the range of microanalytical techniques available for the analysis of geological samples, principally in research applications. Each chapter is written in a clear, informative style and has a tutorial element, designed to introduce each technique for the beginning and experienced researcher alike.

Author : Stephen Jervis Brent Reed
Publisher : Unknown
Page : 0 pages
File Size : 53,8 Mb
Release : 1993
Category : Electronic
ISBN : OCLC:59957223

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Electron Microprobe Analysis by Stephen Jervis Brent Reed Pdf

Author : Joseph Goldstein,Dale E. Newbury,David C. Joy,Charles E. Lyman,Patrick Echlin,Eric Lifshin,Linda Sawyer,J.R. Michael
Publisher : Springer Science & Business Media
Page : 689 pages
File Size : 55,6 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461502159

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Scanning Electron Microscopy and X-Ray Microanalysis by Joseph Goldstein,Dale E. Newbury,David C. Joy,Charles E. Lyman,Patrick Echlin,Eric Lifshin,Linda Sawyer,J.R. Michael Pdf

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.

Author : Peter J. Goodhew,John Humphreys
Publisher : CRC Press
Page : 264 pages
File Size : 44,7 Mb
Release : 2000-11-30
Category : Technology & Engineering
ISBN : 9781482289343

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Electron Microscopy and Analysis by Peter J. Goodhew,John Humphreys Pdf

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors h

Author : David Henry Krinsley
Publisher : Cambridge University Press
Page : 207 pages
File Size : 47,7 Mb
Release : 1998-07-13
Category : Nature
ISBN : 9780521453462

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Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks by David Henry Krinsley Pdf

A concise summary that uses abundant images to illustrate the type of information backscattered scanning electron microscopy (BSE) yields. Lucidly written, this book will be ideal for researchers and graduate students.

Author : M. A. Hayat
Publisher : John Wiley & Sons
Page : 264 pages
File Size : 45,6 Mb
Release : 1974
Category : Science
ISBN : UOM:39015046245760

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Principles and Techniques of Scanning Electron Microscopy by M. A. Hayat Pdf

Author : Kenneth P. Severin
Publisher : Springer Science & Business Media
Page : 225 pages
File Size : 51,8 Mb
Release : 2008-01-18
Category : Science
ISBN : 9781402028410

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Energy Dispersive Spectrometry of Common Rock Forming Minerals by Kenneth P. Severin Pdf

This book provides a very basic introduction to electron microscopy and energy dispersive spectrometry (EDS). It has the largest compiled collection of EDS spectra ever published and covers most common rock forming minerals. In addition, it provides a key to help the novice wade through the large number of spectra.