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Author : Warren Boxleitner
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
Page : 138 pages
File Size : 50,6 Mb
Release : 1989
Category : Science
ISBN : UOM:39015018839244
Author : Edward A. Lacy
Publisher : Unknown
Page : 0 pages
File Size : 40,8 Mb
Release : 1984
Category : Electric discharges
ISBN : 0830608206
Author : Niels Jonassen
Publisher : Springer Science & Business Media
Page : 202 pages
File Size : 41,7 Mb
Release : 2013-04-17
Category : Technology & Engineering
ISBN : 9781475711820
This book is the most comprehensive treatment yet of the problems faced by the engineer caused by static electricity. Written in as non-technical a manner as possible, given the depth of the material, this book discusses the material from the beginner level to many advanced topics for engineers and designers. It discusses not only the harmful and damaging known effects of static electricity on electrical and electronic equipment, but the possible solutions and applications that can be used to stop it.
Author : United States. Department of Defense
Publisher : Unknown
Page : 168 pages
File Size : 53,6 Mb
Release : 1991
Category : Electric discharges
ISBN : PSU:000022744722
Author : Sten Hellström
Publisher : Springer Science & Business Media
Page : 204 pages
File Size : 47,5 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9783642803024
This book on electrostatic discharge phenomena is essentially a translation and update ofa Swedish edition from 1992. The book is intended for people working with electronic circuits and equipments, in application and development. All personnel should be aware of the ESD-hazards, especially those responsible for quality. ESD-prevention is a part of TQM (Total Quality Management). The book is also usable for courses on the subject. Background It was soon realised that the MOS-circuits (MOS=Metal Oxide Semiconductor), which appeared in the beginning of the 1960-ties were sensitive to electrostatic discharges. But a severe accident accelerated the search for materials that do not generate electric charges. In April 1964 three people were working inside a satellite at Cape Kennedy Space Center. They suddenly screamed "we are burning". They died. The satellite incapsulation was covered with untreated plastics to protect against dust. When the plastics was pulled off both this and the metal incapsulating got charged. A discharge from the metal ignited inflammable parts of the satellite. Eleven more people were injured and the cost of the accident amounted to about 55 billions USD.
Author : John M. Kolyer,Donald Watson
Publisher : Springer Science & Business Media
Page : 346 pages
File Size : 46,6 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461311775
Existing sections in ESD Frim A to Z have been thoroughly revised and updated. New examples have been added to the troubleshooting chapter; and new versions of model specifications for ESD-safe handling and packaging can be found in the specifications chapter. The Appendix now includes ten recently published papers (making a total of 20) whose topics span the field of ESD control.
Author : Bernard S. Matisoff
Publisher : Van Nostrand Reinhold Company
Page : 168 pages
File Size : 47,9 Mb
Release : 1986
Category : Science
ISBN : UOM:39015009806426
Good,No Highlights,No Markup,all pages are intact, Slight Shelfwear,may have the corners slightly dented, may have slight color changes/slightly damaged spine.
Author : IEEE Power Engineering Society. Surge Protective Devices Committee
Publisher : Inst of Elect & Electronic
Page : 12 pages
File Size : 50,9 Mb
Release : 1995
Category : Electric discharges
ISBN : 1559374713
This guide establishes test methods for the evaluation of ESD withstand capability for electronic equipment subassemblies. It includes information about test conditions, test equipment, and test procedures for ESD tests of printed circuit boards and other subassemblies.
Author : Steven H. Voldman
Publisher : John Wiley & Sons
Page : 328 pages
File Size : 43,8 Mb
Release : 2016-10-07
Category : Technology & Engineering
ISBN : 9781118707142
With the evolution of semiconductor technology and global diversification of the semiconductor business, testing of semiconductor devices to systems for electrostatic discharge (ESD) and electrical overstress (EOS) has increased in importance. ESD Testing: From Components to Systems updates the reader in the new tests, test models, and techniques in the characterization of semiconductor components for ESD, EOS, and latchup. Key features: Provides understanding and knowledge of ESD models and specifications including human body model (HBM), machine model (MM), charged device model (CDM), charged board model (CBM), cable discharge events (CDE), human metal model (HMM), IEC 61000-4-2 and IEC 61000-4-5. Discusses new testing methodologies such as transmission line pulse (TLP), to very fast transmission line pulse (VF-TLP), and future methods of long pulse TLP, to ultra-fast TLP (UF-TLP). Describes both conventional testing and new testing techniques for both chip and system level evaluation. Addresses EOS testing, electromagnetic compatibility (EMC) scanning, to current reconstruction methods. Discusses latchup characterization and testing methodologies for evaluation of semiconductor technology to product testing. ESD Testing: From Components to Systems is part of the authors’ series of books on electrostatic discharge (ESD) protection; this book will be an invaluable reference for the professional semiconductor chip and system-level ESD and EOS test engineer. Semiconductor device and process development, circuit designers, quality, reliability and failure analysis engineers will also find it an essential reference. In addition, its academic treatment will appeal to both senior and graduate students with interests in semiconductor process, device physics, semiconductor testing and experimental work.
Author : Michel Mardiguian
Publisher : John Wiley & Sons
Page : 239 pages
File Size : 45,6 Mb
Release : 2011-09-20
Category : Technology & Engineering
ISBN : 9781118211076
A thorough and concise treatment of ESD Recognizing its methodic, step-by-step attack of the electrostatic discharge (ESD) problem, the initial release of this book was quoted by specialists as "the most thorough and concise treatment of the broad ESD continuum that is available." Now in its Third Edition, this book delivers the same trusted coverage of the topic while also incorporating recent technological advances that have taken place in the engineering community. The book begins with the basics of ESD for humans and objects, and goes on to cover: Effects of ESD coupled to electronics Principal ESD specifications ESD diagnostics and testing Design for ESD immunity To help with troubleshooting, many ESD case histories are given along with their successful fixes. Electrostatic Discharge is essential reading for all designers who want to avoid component failures, no trouble found incidents, and random errors.
Author : Institute of Electrical and Electronics Engineers
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
Page : 58 pages
File Size : 41,8 Mb
Release : 1994
Category : Electric discharges
ISBN : 1559374039
Author : Ratan Sengupta
Publisher : Sankalp Publication
Page : 127 pages
File Size : 43,9 Mb
Release : 2024-06-16
Category : Education
ISBN : 9789394901520
Author : Juin J. Liou
Publisher : CRC Press
Page : 304 pages
File Size : 40,5 Mb
Release : 2017-12-19
Category : Technology & Engineering
ISBN : 9781482255898
Electrostatic discharge (ESD) is one of the most prevalent threats to electronic components. In an ESD event, a finite amount of charge is transferred from one object (i.e., human body) to another (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time. Thus, more than 35 percent of single-event chip damages can be attributed to ESD events, and designing ESD structures to protect integrated circuits against the ESD stresses is a high priority in the semiconductor industry. Electrostatic Discharge Protection: Advances and Applications delivers timely coverage of component- and system-level ESD protection for semiconductor devices and integrated circuits. Bringing together contributions from internationally respected researchers and engineers with expertise in ESD design, optimization, modeling, simulation, and characterization, this book bridges the gap between theory and practice to offer valuable insight into the state of the art of ESD protection. Amply illustrated with tables, figures, and case studies, the text: Instills a deeper understanding of ESD events and ESD protection design principles Examines vital processes including Si CMOS, Si BCD, Si SOI, and GaN technologies Addresses important aspects pertinent to the modeling and simulation of ESD protection solutions Electrostatic Discharge Protection: Advances and Applications provides a single source for cutting-edge information vital to the research and development of effective, robust ESD protection solutions for semiconductor devices and integrated circuits.
Author : Eugene R. Hnatek
Publisher : CRC Press
Page : 433 pages
File Size : 49,6 Mb
Release : 2002-10-25
Category : Technology & Engineering
ISBN : 9780824743543
Practical Reliability of Electronic Equipment and Products will help electrical, electronics, manufacturing, mechanical, systems design, and reliability engineers; electronics production managers; electronic circuit designers; and upper-level undergraduate and graduate students in these disciplines.
Author : Qiang Cui,Juin J. Liou,Jean-Jacques Hajjar,Javier Salcedo,Yuanzhong Zhou,Parthasarathy Srivatsan
Publisher : Springer
Page : 86 pages
File Size : 52,5 Mb
Release : 2015-03-10
Category : Technology & Engineering
ISBN : 9783319108193
This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs’ ESD safety level, while maximizing RF performance.
