Elements Of X Ray Diffraction

Author : B. D. Cullity
Publisher : Franklin Classics Trade Press
Page : 526 pages
File Size : 54,6 Mb
Release : 2018-11-10
Category : History
ISBN : 0353234281

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Elements of X Ray Diffraction by B. D. Cullity Pdf

This work has been selected by scholars as being culturally important and is part of the knowledge base of civilization as we know it. This work is in the public domain in the United States of America, and possibly other nations. Within the United States, you may freely copy and distribute this work, as no entity (individual or corporate) has a copyright on the body of the work. Scholars believe, and we concur, that this work is important enough to be preserved, reproduced, and made generally available to the public. To ensure a quality reading experience, this work has been proofread and republished using a format that seamlessly blends the original graphical elements with text in an easy-to-read typeface. We appreciate your support of the preservation process, and thank you for being an important part of keeping this knowledge alive and relevant.

Author : Bernard D. Cullity,S. R. Stock
Publisher : Pearson
Page : 656 pages
File Size : 46,7 Mb
Release : 2013-11-01
Category : X-ray crystallography
ISBN : 1292040548

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Elements of X-Ray Diffraction by Bernard D. Cullity,S. R. Stock Pdf

Designed for Junior/Senior undergraduate courses. This revision of a classical text is intended to acquaint the reader, who has no prior knowledge of the subject, with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The text is a collection of principles and methods designed directly for the student and not a reference tool for the advanced reader

Author : Bernard Dennis Cullity,Stuart R. Stock
Publisher : Unknown
Page : 664 pages
File Size : 54,6 Mb
Release : 2001
Category : X-ray crystallography
ISBN : 0131788183

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Elements of X-ray Diffraction by Bernard Dennis Cullity,Stuart R. Stock Pdf

Designed for Junior/Senior undergraduate courses. This revision of a classical text is intended to acquaint the reader, who has no prior knowledge of the subject, with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The text is a collection of principles and methods designed directly for the student and not a reference tool for the advanced reader.

Author : Bernard Dennis Cullity,Stuart R. Stock
Publisher : Pearson
Page : 690 pages
File Size : 47,5 Mb
Release : 2001
Category : Science
ISBN : UOM:39015060918599

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Elements of X-ray Diffraction by Bernard Dennis Cullity,Stuart R. Stock Pdf

This text is intended to acquaint the reader, who has no prior knowledge of the subject, with the theory of x-ray diffraction, the experimental methods involved, and the main applications. No metallurgical data are given beyond that necessary to illustrate the diffraction methods involved.

Author : Yoshio Waseda,Eiichiro Matsubara,Kozo Shinoda
Publisher : Springer Science & Business Media
Page : 320 pages
File Size : 41,8 Mb
Release : 2011-03-18
Category : Technology & Engineering
ISBN : 9783642166358

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X-Ray Diffraction Crystallography by Yoshio Waseda,Eiichiro Matsubara,Kozo Shinoda Pdf

X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.

Author : Jens Als-Nielsen,Des McMorrow
Publisher : John Wiley & Sons
Page : 440 pages
File Size : 52,5 Mb
Release : 2011-04-04
Category : Science
ISBN : 9780470973943

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Elements of Modern X-ray Physics by Jens Als-Nielsen,Des McMorrow Pdf

Eagerly awaited, this second edition of a best-selling text comprehensively describes from a modern perspective the basics of x-ray physics as well as the completely new opportunities offered by synchrotron radiation. Written by internationally acclaimed authors, the style of the book is to develop the basic physical principles without obscuring them with excessive mathematics. The second edition differs substantially from the first edition, with over 30% new material, including: A new chapter on non-crystalline diffraction - designed to appeal to the large community who study the structure of liquids, glasses, and most importantly polymers and bio-molecules A new chapter on x-ray imaging - developed in close cooperation with many of the leading experts in the field Two new chapters covering non-crystalline diffraction and imaging Many important changes to various sections in the book have been made with a view to improving the exposition Four-colour representation throughout the text to clarify key concepts Extensive problems after each chapter There is also supplementary book material for this title available online (http://booksupport.wiley.com). Praise for the previous edition: “The publication of Jens Als-Nielsen and Des McMorrow’s Elements of Modern X-ray Physics is a defining moment in the field of synchrotron radiation… a welcome addition to the bookshelves of synchrotron–radiation professionals and students alike.... The text is now my personal choice for teaching x-ray physics…” – Physics Today, 2002

Author : Joyce Alvin Bearden
Publisher : Unknown
Page : 548 pages
File Size : 53,6 Mb
Release : 1964
Category : Spectrum analysis
ISBN : UOM:39015095026491

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X Ray Wavelengths by Joyce Alvin Bearden Pdf

Author : C. Suryanarayana,M. Grant Norton
Publisher : Springer Science & Business Media
Page : 275 pages
File Size : 49,9 Mb
Release : 2013-06-29
Category : Technology & Engineering
ISBN : 9781489901484

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X-Ray Diffraction by C. Suryanarayana,M. Grant Norton Pdf

In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a "hands on" approach through experiments and examples based on actual laboratory data. Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information. In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it. Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.

Author : René Guinebretière
Publisher : John Wiley & Sons
Page : 290 pages
File Size : 40,6 Mb
Release : 2013-03-01
Category : Technology & Engineering
ISBN : 9781118613955

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X-Ray Diffraction by Polycrystalline Materials by René Guinebretière Pdf

This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.

Author : A. Guinier
Publisher : Courier Corporation
Page : 404 pages
File Size : 47,7 Mb
Release : 2013-01-17
Category : Science
ISBN : 9780486141343

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X-Ray Diffraction by A. Guinier Pdf

Exploration of fundamentals of x-ray diffraction theory using Fourier transforms applies general results to various atomic structures, amorphous bodies, crystals, and imperfect crystals. 154 illustrations. 1963 edition.

Author : Leonid V. Azároff
Publisher : Unknown
Page : 726 pages
File Size : 49,7 Mb
Release : 1968
Category : Science
ISBN : UOM:39015002006420

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Elements of X-ray Crystallography by Leonid V. Azároff Pdf

Author : Myeongkyu Lee
Publisher : CRC Press
Page : 302 pages
File Size : 43,6 Mb
Release : 2017-03-16
Category : Science
ISBN : 9781315361970

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X-Ray Diffraction for Materials Research by Myeongkyu Lee Pdf

X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.

Author : Mario Birkholz
Publisher : John Wiley & Sons
Page : 378 pages
File Size : 44,9 Mb
Release : 2006-05-12
Category : Technology & Engineering
ISBN : 9783527607044

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Thin Film Analysis by X-Ray Scattering by Mario Birkholz Pdf

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.

Author : Richard A Dunlap
Publisher : Morgan & Claypool Publishers
Page : 125 pages
File Size : 44,7 Mb
Release : 2018-12-05
Category : Technology & Engineering
ISBN : 9781643273389

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Novel Microstructures for Solids by Richard A Dunlap Pdf

For many years, evidence suggested that all solid materials either possessed a periodic crystal structure as proposed by the Braggs or they were amorphous glasses with no long-range order. In the 1970s, Roger Penrose hypothesized structures (Penrose tilings) with long-range order which were not periodic. The existence of a solid phase, known as a quasicrystal, that possessed the structure of a three dimensional Penrose tiling, was demonstrated experimentally in 1984 by Dan Shechtman and colleagues. Shechtman received the 2011 Nobel Prize in Chemistry for his discovery. The discovery and description of quasicrystalline materials provided the first concrete evidence that traditional crystals could be viewed as a subset of a more general category of ordered materials. This book introduces the diversity of structures that are now known to exist in solids through a consideration of quasicrystals (Part I) and the various structures of elemental carbon (Part II) and through an analysis of their relationship to conventional crystal structures. Both quasicrystals and the various allotropes of carbon are excellent examples of how our understanding of the microstructure of solids has progressed over the years beyond the concepts of traditional crystallography.

Author : Bernard Dennis Cullity
Publisher : Unknown
Page : 528 pages
File Size : 48,8 Mb
Release : 2015-02-15
Category : X-ray crystallography
ISBN : 1298026679

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Elements of X Ray Diffraction - Scholar's Choice Edition by Bernard Dennis Cullity Pdf

This work has been selected by scholars as being culturally important, and is part of the knowledge base of civilization as we know it. This work was reproduced from the original artifact, and remains as true to the original work as possible. Therefore, you will see the original copyright references, library stamps (as most of these works have been housed in our most important libraries around the world), and other notations in the work. This work is in the public domain in the United States of America, and possibly other nations. Within the United States, you may freely copy and distribute this work, as no entity (individual or corporate) has a copyright on the body of the work. As a reproduction of a historical artifact, this work may contain missing or blurred pages, poor pictures, errant marks, etc. Scholars believe, and we concur, that this work is important enough to be preserved, reproduced, and made generally available to the public. We appreciate your support of the preservation process, and thank you for being an important part of keeping this knowledge alive and relevant.