Fringe Pattern Analysis For Optical Metrology

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Fringe Pattern Analysis for Optical Metrology

Author : Manuel Servin,J. Antonio Quiroga,Moises Padilla
Publisher : John Wiley & Sons
Page : 344 pages
File Size : 47,7 Mb
Release : 2014-08-18
Category : Technology & Engineering
ISBN : 9783527411528

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Fringe Pattern Analysis for Optical Metrology by Manuel Servin,J. Antonio Quiroga,Moises Padilla Pdf

The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.

Fringe Pattern Analysis for Optical Metrology

Author : Manuel Servín,José Moisés Padilla,J. Antonio Quiroga
Publisher : Unknown
Page : 328 pages
File Size : 52,7 Mb
Release : 2014
Category : Diffraction patterns
ISBN : 3527681078

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Fringe Pattern Analysis for Optical Metrology by Manuel Servín,José Moisés Padilla,J. Antonio Quiroga Pdf

The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.

Interferogram Analysis, Digital Fringe Pattern Measurement Techniques

Author : David W. Robinson,Graeme T. Reid
Publisher : CRC Press
Page : 328 pages
File Size : 41,7 Mb
Release : 1993
Category : Art
ISBN : UOM:39015029940627

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Interferogram Analysis, Digital Fringe Pattern Measurement Techniques by David W. Robinson,Graeme T. Reid Pdf

Very Good,No Highlights or Markup,all pages are intact.

Interferogram Analysis for Optical Testing

Author : Daniel Malacara,Manuel Servín,Zacarias Malacara
Publisher : CRC Press
Page : 458 pages
File Size : 46,7 Mb
Release : 1998-07-21
Category : Technology & Engineering
ISBN : 0824799402

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Interferogram Analysis for Optical Testing by Daniel Malacara,Manuel Servín,Zacarias Malacara Pdf

"Lays out the fundamentals of, as well as computational methods for, studying fringe patterns produced by optical testing interferometers--providing beginners with the necessary background to enter this field and helping seasoned researchers to refine current analytical approaches. Discusses classical and state-of-the-art fringe analysis techniques with exceptional clarity."

Fringe 2005

Author : Wolfgang Osten
Publisher : Springer Science & Business Media
Page : 729 pages
File Size : 51,8 Mb
Release : 2006-01-26
Category : Technology & Engineering
ISBN : 9783540293033

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Fringe 2005 by Wolfgang Osten Pdf

In 1989 the time was hot to create a workshop series dedicated to the dicussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial applications of optical metrology. However, such a workshop must take place in a dynamic environment. The- fore the main topics of the previous events were always adapted to the most interesting subjects of the new period. In 1993 new prin- ples of optical shape measurement, setup calibration, phase unwr- ping and nondestructive testing were the focus of discussion, while in 1997 new approaches in multi-sensor metrology, active measu- ment strategies and hybrid processing technologies played a central role. 2001, the first meeting in the 21st century, was dedicated to - tical methods for micromeasurements, hybrid measurement te- nologies and new sensor solutions for industrial inspection. The fifth workshop takes place in Stuttgart, the capital of the state of Baden- Württemberg and the centre of a region with a long and remarkable tradition in engineering. Thus after Berlin 1989, Bremen 1993, 1997 and 2001, Stuttgart is the third Fringe city where international - perts will meet each other to share new ideas and concepts in optical metrology. This volume contains the papers presented during FRINGE 2005.

Fringe 2009

Author : Wolfgang Osten,Malgorzata Kujawinska
Publisher : Springer Science & Business Media
Page : 792 pages
File Size : 49,7 Mb
Release : 2010-04-28
Category : Technology & Engineering
ISBN : 9783642030512

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Fringe 2009 by Wolfgang Osten,Malgorzata Kujawinska Pdf

21 years ago it was a joint idea with Hans Rottenkolber to organize a workshop dedicated to the discussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial and scientific applications of optical metrology. A couple of months later more than 50 specialists from East and West met in East Berlin, the capital of the former GDR, to spend 3 days with the discussion of new principles of fringe processing. In the stimulating atmoshere the idea was born to repeat the workshop and to organize the meeting in an olympic schedule. And thus meanwhile 20 years have been passed and we have today Fringe number six. However, such a workshop takes place in a dynamic environment. Therefore the main topics of the previous events were always adapted to the most interesting subjects of the new period. In 1993 the workshop took place in Bremen and was dedicated to new principles of optical shape measurement, setup calibration, phase unwrapping and nondestructive testing, while in 1997 new approaches in multi-sensor metrology, active measurement strategies and hybrid processing technologies played a central role. 2001, the first meeting in the 21st century, was focused to optical methods for micromeasurements, hybrid measurement technologies and new sensor solutions for industrial inspection.

Optical Metrology

Author : Kjell J. G?svik
Publisher : Unknown
Page : 254 pages
File Size : 52,6 Mb
Release : 1987-05-06
Category : Science
ISBN : UVA:X001400729

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Optical Metrology by Kjell J. G?svik Pdf

Covers the four optical metrology techniques of holographic interferometry, moire techniques, speckle methods and photoelasticity in a single volume.

Windowed Fringe Pattern Analysis

Author : Qian Kemao
Publisher : SPIE-International Society for Optical Engineering
Page : 278 pages
File Size : 51,9 Mb
Release : 2013
Category : Electronic books
ISBN : 0819496421

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Windowed Fringe Pattern Analysis by Qian Kemao Pdf

Fringe patterns can be formed coherently using various interferometers and incoherently using the moiré technique. They can also be designed in fringe projection profilometry. All of these techniques are useful for full-field, noncontact, and high-sensitivity measurement. The primary goal of fringe pattern analysis is to extract the hidden phase distributions that generally relate to the physical quantities being measured. This book addresses the challenges and solutions involved in this process. Both theoretical analysis and algorithm development will be covered to facilitate the work of both researchers and engineers. The information herein may also serve as a specialized subject for students of optical and/or computer engineering.

Optical Metrology and Optoacoustics in Nondestructive Evaluation of Materials

Author : Zinoviy Nazarchuk,Leonid Muravsky,Dozyslav Kuryliak
Publisher : Springer Nature
Page : 415 pages
File Size : 43,9 Mb
Release : 2023-05-23
Category : Science
ISBN : 9789819912261

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Optical Metrology and Optoacoustics in Nondestructive Evaluation of Materials by Zinoviy Nazarchuk,Leonid Muravsky,Dozyslav Kuryliak Pdf

This book includes the description, modeling and realization of new optical metrology techniques for technical diagnostics of materials. Special attention is paid to multi-step phase shifting interferometry with arbitrary phase shifts between interferograms, phase shifting and correlation digital speckle pattern interferometry, optical-digital speckle correlation, and digital image correlation, as well as dynamic speckle patterns analysis. Optoacoustic techniques can be treated as a separate branch of optical metrology and can solve many problems of technical diagnostics, including detection and localization of subsurface defects in laminated composite materials. The utility of such techniques can be increased by illumination of the object via acoustic waves at certain frequencies. Hence, an effective theoretical approach to the modeling of an elastic wave field interaction with an interphase defect, and to defect visualization using dynamic speckle patterns, is also included in this book. The experimental proof of the proposed approaches was achieved using a specially created hybrid optical-digital system for detection of different subsurface defects. This book is intended for engineers, researchers and students engaged in the field of nondestructive evaluation of materials and technical diagnostics of structural elements, hybrid optical systems, speckle metrology and optoacoustic imaging techniques.

Handbook of Optical Metrology

Author : Toru Yoshizawa
Publisher : CRC Press
Page : 744 pages
File Size : 50,5 Mb
Release : 2009-02-25
Category : Science
ISBN : 1420019511

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Handbook of Optical Metrology by Toru Yoshizawa Pdf

The field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked for a comprehensive handbook, one providing an overview of optical metrology that covers practical applications as well as fundamentals. Carefully designed to make information accessible to beginners without sacrificing academic rigor, the Handbook of Optical Metrology: Principles and Applications discusses fundamental principles and techniques before exploring practical applications. With contributions from veterans in the field, as well as from up-and-coming researchers, the Handbook offers 30 substantial and well-referenced chapters. In addition to the introductory matter, forward-thinking descriptions are included in every chapter that make this a valuable reference for all those involved with optical metrology.

Handbook of Optical Metrology

Author : Toru Yoshizawa
Publisher : CRC Press
Page : 744 pages
File Size : 44,9 Mb
Release : 2017-07-28
Category : Technology & Engineering
ISBN : 9781351831840

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Handbook of Optical Metrology by Toru Yoshizawa Pdf

Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.

Optical Metrology

Author : Olivério D.D. Soares
Publisher : Springer Science & Business Media
Page : 794 pages
File Size : 54,6 Mb
Release : 2012-12-06
Category : Science
ISBN : 9789400936096

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Optical Metrology by Olivério D.D. Soares Pdf

Optical Metrology is a rapidly expanding field i'n both its scientific foundations and technological developments, being of major concern to measurements, quality control, non-destructive tes ting and in fundamental research. In order to define the state-of-the-art, and to evaluate pre sent accomplishments, whilst giving an appraisal of how each of the particular topics will evolve the Optical Metrology-anAdvancedStudy Institute was organized with a concourse of the world's acknowledged experts. Thus, the Institute provided a forum for tutorial reviews blended with topics of current research in the form of a progressive and comprehensive presentation of recent promising developments, lea ding techniques and instrumentation in incoherent and coherent optics for Metrology, Sensing and Control in Science, Industry and Biomedici ne. Optical Metrology is a very broad field which is highly inter disciplinary in its applications, and in its scientific and technolo gical background. It is related to such diverse disciplines as physi cal and chemical sciences, engineering, electronics, computer scien ces, biological sciences and theoretical sciences, such as statistics. Although there was an emphasis on photomechanics and industri al applications, a marked diversity was reflected in the different background and interests of the participants. The vitality and viabi lity of the discipline was enhanced not only by the encouraging number of young scientists and industrialists participating and authoring, but also by the remarkably promising prospects found in x the practical applications supported by advanced electronic hybridi zation.

Optical Metrology

Author : Kjell J. Gåsvik
Publisher : Wiley
Page : 372 pages
File Size : 44,8 Mb
Release : 2003-04-11
Category : Technology & Engineering
ISBN : 9780470846704

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Optical Metrology by Kjell J. Gåsvik Pdf

New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. * New introductory sections to all chapters. * Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry. * Thorough coverage of the CCD camera.

Optical Methods of Measurement

Author : Rajpal Sirohi
Publisher : CRC Press
Page : 218 pages
File Size : 43,6 Mb
Release : 2018-09-03
Category : Technology & Engineering
ISBN : 9781351837248

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Optical Methods of Measurement by Rajpal Sirohi Pdf

Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections. The book explores the propagation of laser beams, metrological applications of phase-singular beams, various detectors such as CCD and CMOS devices, and recording materials. It also covers interference, diffraction, and digital fringe pattern measurement techniques, with special emphasis on phase measurement interferometry and algorithms. The remainder of the book focuses on theory, experimental arrangements, and applications of wholefield techniques. The author discusses digital hologram interferometry, digital speckle photography, digital speckle pattern interferometry, Talbot interferometry, and holophotoelasticity. This updated book compiles the major wholefield methods of measurement in one volume. It provides a solid understanding of the techniques by describing the physics behind them. In addition, the examples given illustrate how the techniques solve measurement problems.

The Physics of Moire Metrology

Author : Oded Kafri,Ilana Glatt
Publisher : Wiley-Interscience
Page : 216 pages
File Size : 53,5 Mb
Release : 1990
Category : Science
ISBN : UOM:39015018499643

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The Physics of Moire Metrology by Oded Kafri,Ilana Glatt Pdf

This one volume treatise presents a comprehensive discussion of moire metrology analysis. The authors work from a new point of view, treating the gratings used in moire analysis as an artificial analog to electromagnetic waves, thereby comparing moire analysis with conventional optical methods based on wave properties such as interferometry. It is shown that for every interferometric technique in metrology, there is an analogous technique in moire metrology and vice versa, and that scientists involved in optical metrology have a real choice between interferometric and moire methods.