Fundamentals Of Energy Dispersive X Ray Analysis

Author : John C. Russ
Publisher : Butterworth-Heinemann
Page : 315 pages
File Size : 49,6 Mb
Release : 2013-10-22
Category : Science
ISBN : 9781483164007

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Fundamentals of Energy Dispersive X-Ray Analysis by John C. Russ Pdf

Fundamentals of Energy Dispersive X-ray Analysis provides an introduction to the fundamental principles of dispersive X-ray analysis. It presents descriptions, equations, and graphs to enable the users of these techniques to develop an intuitive and conceptual image of the physical processes involved in the generation and detection of X-rays. The book begins with a discussion of X-ray detection and measurement, which is accomplished by one of two types of X-ray spectrometer: energy dispersive or wavelength dispersive. The emphasis is on energy dispersive spectrometers, given their rather widespread use compared to the wavelength dispersive type. This is followed by separate chapters on techniques such as X-ray absorption; spectrum processing; and elimination of spectrum background produced by electron excitation. Subsequent chapters cover X-ray fluorescence; the use of regression models; hardware for X-ray fluorescence analysis; scattering, background, and trace element analysis; and methods for producing inner shell excitation of atoms in a sample of interest. The final chapter deals with applications of X-ray analysis.

Author : John C. Russ
Publisher : Butterworth-Heinemann
Page : 328 pages
File Size : 50,6 Mb
Release : 1984
Category : Science
ISBN : UOM:39015016075379

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Fundamentals of Energy Dispersive X-ray Analysis by John C. Russ Pdf

Fundamentals of Energy Dispersive X-ray Analysis provides an introduction to the fundamental principles of dispersive X-ray analysis. It presents descriptions, equations, and graphs to enable the users of these techniques to develop an intuitive and conceptual image of the physical processes involved in the generation and detection of X-rays. The book begins with a discussion of X-ray detection and measurement, which is accomplished by one of two types of X-ray spectrometer: energy dispersive or wavelength dispersive. The emphasis is on energy dispersive spectrometers, given their rather wid ...

Author : DC Bell,AJ Garratt-Reed
Publisher : Garland Science
Page : 270 pages
File Size : 50,7 Mb
Release : 2003-07-10
Category : Science
ISBN : 9781135331399

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Energy Dispersive X-ray Analysis in the Electron Microscope by DC Bell,AJ Garratt-Reed Pdf

This book provides an in-depth description of x-ray microanalysis in the electron microscope. It is sufficiently detailed to ensure that novices will understand the nuances of high-quality EDX analysis. Includes information about hardware design as well as the physics of x-ray generation, absorption and detection, and most post-detection data processing. Details on electron optics and electron probe formation allow the novice to make sensible adjustments to the electron microscope in order to set up a system which optimises analysis. It also helps the reader determine which microanalytical method is more suitable for their planned application.

Author : Günter H. Zschornack
Publisher : Springer Science & Business Media
Page : 969 pages
File Size : 43,6 Mb
Release : 2007-01-24
Category : Technology & Engineering
ISBN : 9783540286189

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Handbook of X-Ray Data by Günter H. Zschornack Pdf

This is the only handbook available on X-ray data. In a concise and informative manner, the most important data connected with the emission of characteristic X-ray lines are tabulated for all elements up to Z = 95 (Americium). The tabulated data are characterized and, in most cases, evaluated. Furthermore, all important processes and phenomena connected with the production, emission and detection of characteristic X-rays are discussed.

Author : Eva Margui,Rene Van Grieken
Publisher : Momentum Press
Page : 160 pages
File Size : 43,7 Mb
Release : 2013-01-25
Category : Technology & Engineering
ISBN : 9781606503935

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X-Ray Fluorescence Spectrometry and Related Techniques by Eva Margui,Rene Van Grieken Pdf

X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF. Those recent technological advances, including the design of low-power micro- focus tubes and novel X-ray optics and detectors, have made it possible to extend XRF to the analysis of low-Z elements and to obtain 2D or 3D information on a micrometer-scale. And, the recent development and commercialization of bench top and portable instrumentation, offering extreme simplicity of operation in a low-cost design, have extended the applications of XRF to many more analytical problems.

Author : Joseph Goldstein,Dale E. Newbury,Patrick Echlin,David C. Joy,Charles Fiori,Eric Lifshin
Publisher : Springer Science & Business Media
Page : 679 pages
File Size : 53,6 Mb
Release : 2013-11-11
Category : Science
ISBN : 9781461332732

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Scanning Electron Microscopy and X-Ray Microanalysis by Joseph Goldstein,Dale E. Newbury,Patrick Echlin,David C. Joy,Charles Fiori,Eric Lifshin Pdf

This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

Author : E. Prince
Publisher : Springer Science & Business Media
Page : 1033 pages
File Size : 53,5 Mb
Release : 2004-01-31
Category : Science
ISBN : 9781402019005

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International Tables for Crystallography,Volume C by E. Prince Pdf

International Tables for Crystallography are no longer available for purchase from Springer. For further information please contact Wiley Inc. (follow the link on the right hand side of this page). The purpose of Volume C is to provide the mathematical, physical and chemical information needed for experimental studies in structural crystallography. The volume covers all aspects of experimental techniques, using all three principal radiation types, from the selection and mounting of crystals and production of radiation, through data collection and analysis, to interpretation of results. As such, it is an essential source of information for all workers using crystallographic techniques in physics, chemistry, metallurgy, earth sciences and molecular biology.

Author : Peter Brouwer
Publisher : Unknown
Page : 71 pages
File Size : 49,5 Mb
Release : 2006
Category : Electronic
ISBN : 9090167587

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Theory of XRF : getting acquainted with the principles by Peter Brouwer Pdf

Author : Gernot Friedbacher,Henning Bubert
Publisher : John Wiley & Sons
Page : 514 pages
File Size : 55,7 Mb
Release : 2011-03-31
Category : Technology & Engineering
ISBN : 9783527636938

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Surface and Thin Film Analysis by Gernot Friedbacher,Henning Bubert Pdf

Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)

Author : Patrick Echlin
Publisher : Springer Science & Business Media
Page : 329 pages
File Size : 41,9 Mb
Release : 2011-04-14
Category : Technology & Engineering
ISBN : 9780387857312

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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis by Patrick Echlin Pdf

Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Author : Rene Van Grieken,A. Markowicz
Publisher : CRC Press
Page : 1016 pages
File Size : 47,7 Mb
Release : 2001-11-27
Category : Science
ISBN : 0203908708

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Handbook of X-Ray Spectrometry by Rene Van Grieken,A. Markowicz Pdf

"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."

Author : Rosalind Wolstenholme,Sue Jickells,Shari Forbes
Publisher : John Wiley & Sons
Page : 464 pages
File Size : 40,6 Mb
Release : 2021-01-26
Category : Medical
ISBN : 9781119978282

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Analytical Techniques in Forensic Science by Rosalind Wolstenholme,Sue Jickells,Shari Forbes Pdf

An in-depth text that explores the interface between analytical chemistry and trace evidence Analytical Techniques in Forensic Science is a comprehensive guide written in accessible terms that examines the interface between analytical chemistry and trace evidence in forensic science. With contributions from noted experts on the topic, the text features a detailed introduction analysis in forensic science and then subsequent chapters explore the laboratory techniques grouped by shared operating principles. For each technique, the authors incorporate specific theory, application to forensic analytics, interpretation, forensic specific developments, and illustrative case studies. Forensic techniques covered include UV-Vis and vibrational spectroscopy, mass spectrometry and gas and liquid chromatography. The applications reviewed include evidence types such as fibers, paint, drugs and explosives. The authors highlight data collection, subsequent analysis, what information has been obtained and what this means in the context of a case. The text shows how analytical chemistry and trace evidence can problem solve the nature of much of forensic analysis. This important text: Puts the focus on trace evidence and analytical science Contains case studies that illustrate theory in practice Includes contributions from experts on the topics of instrumentation, theory, and case examples Explores novel and future applications for analytical techniques Written for undergraduate and graduate students in forensic chemistry and forensic practitioners and researchers, Analytical Techniques in Forensic Science offers a text that bridges the gap between introductory textbooks and professional level literature.

Author : Burkhard Beckhoff,Birgit Kanngießer,Norbert Langhoff,Reiner Wedell,Helmut Wolff
Publisher : Springer Science & Business Media
Page : 897 pages
File Size : 43,8 Mb
Release : 2007-05-18
Category : Science
ISBN : 9783540367222

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Handbook of Practical X-Ray Fluorescence Analysis by Burkhard Beckhoff,Birgit Kanngießer,Norbert Langhoff,Reiner Wedell,Helmut Wolff Pdf

X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.

Author : Michael Haschke
Publisher : Springer Science & Business Media
Page : 367 pages
File Size : 49,9 Mb
Release : 2014-05-08
Category : Science
ISBN : 9783319048642

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Laboratory Micro-X-Ray Fluorescence Spectroscopy by Michael Haschke Pdf

Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a μ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.

Author : American Society for Testing and Materials. Meeting
Publisher : Unknown
Page : 285 pages
File Size : 54,5 Mb
Release : 1971
Category : Electromagnetic noise
ISBN : 0803100701

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Energy Dispersion X-ray Analysis by American Society for Testing and Materials. Meeting Pdf