Author : Peter Pichler
Publisher : Springer Science & Business Media
Page : 554 pages
File Size : 45,8 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9783709105979
Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon by Peter Pichler Pdf
This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon. Besides compiling the structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion behaviour from investigations, it gives a comprehensive introduction into the relevant fundamental concepts.