Author : A. S. M. International
Publisher : ASM International
Page : 634 pages
File Size : 46,6 Mb
Release : 2013-01-01
Category : Technology & Engineering
ISBN : 9781627080224
ISTFA 2013 by A. S. M. International Pdf
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.