Low Power And Reliable Sram Memory Cell And Array Design

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Low Power and Reliable SRAM Memory Cell and Array Design

Author : Koichiro Ishibashi,Kenichi Osada
Publisher : Springer Science & Business Media
Page : 154 pages
File Size : 50,6 Mb
Release : 2011-08-18
Category : Technology & Engineering
ISBN : 9783642195686

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Low Power and Reliable SRAM Memory Cell and Array Design by Koichiro Ishibashi,Kenichi Osada Pdf

Success in the development of recent advanced semiconductor device technologies is due to the success of SRAM memory cells. This book addresses various issues for designing SRAM memory cells for advanced CMOS technology. To study LSI design, SRAM cell design is the best materials subject because issues about variability, leakage and reliability have to be taken into account for the design.

Energy Efficient and Reliable Embedded Nanoscale SRAM Design

Author : Bhupendra Singh Reniwal,Pooran Singh,Ambika Prasad Shah,Santosh Kumar Vishvakarma
Publisher : CRC Press
Page : 213 pages
File Size : 44,6 Mb
Release : 2023-11-30
Category : Technology & Engineering
ISBN : 9781000985153

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Energy Efficient and Reliable Embedded Nanoscale SRAM Design by Bhupendra Singh Reniwal,Pooran Singh,Ambika Prasad Shah,Santosh Kumar Vishvakarma Pdf

This reference text covers a wide spectrum for designing robust embedded memory and peripheral circuitry. It will serve as a useful text for senior undergraduate and graduate students and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discusses low-power design methodologies for static random-access memory (SRAM) Covers radiation-hardened SRAM design for aerospace applications Focuses on various reliability issues that are faced by submicron technologies Exhibits more stable memory topologies Nanoscale technologies unveiled significant challenges to the design of energy- efficient and reliable SRAMs. This reference text investigates the impact of process variation, leakage, aging, soft errors and related reliability issues in embedded memory and periphery circuitry. The text adopts a unique way to explain the SRAM bitcell, array design, and analysis of its design parameters to meet the sub-nano-regime challenges for complementary metal-oxide semiconductor devices. It comprehensively covers low- power-design methodologies for SRAM, exhibits more stable memory topologies, and radiation-hardened SRAM design for aerospace applications. Every chapter includes a glossary, highlights, a question bank, and problems. The text will serve as a useful text for senior undergraduate students, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discussing comprehensive studies of variability-induced failure mechanism in sense amplifiers and power, delay, and read yield trade-offs, this reference text will serve as a useful text for senior undergraduate, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. It covers the development of robust SRAMs, well suited for low-power multi-core processors for wireless sensors node, battery-operated portable devices, personal health care assistants, and smart Internet of Things applications.

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Author : Andrei Pavlov,Manoj Sachdev
Publisher : Springer Science & Business Media
Page : 203 pages
File Size : 53,5 Mb
Release : 2008-06-01
Category : Technology & Engineering
ISBN : 9781402083631

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies by Andrei Pavlov,Manoj Sachdev Pdf

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

Dynamic Memory Management for Embedded Systems

Author : David Atienza Alonso,Stylianos Mamagkakis,Christophe Poucet,Miguel Peón-Quirós,Alexandros Bartzas,Francky Catthoor,Dimitrios Soudris
Publisher : Springer
Page : 243 pages
File Size : 47,5 Mb
Release : 2014-09-19
Category : Technology & Engineering
ISBN : 9783319105727

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Dynamic Memory Management for Embedded Systems by David Atienza Alonso,Stylianos Mamagkakis,Christophe Poucet,Miguel Peón-Quirós,Alexandros Bartzas,Francky Catthoor,Dimitrios Soudris Pdf

This book provides a systematic and unified methodology, including basic principles and reusable processes, for dynamic memory management (DMM) in embedded systems. The authors describe in detail how to design and optimize the use of dynamic memory in modern, multimedia and network applications, targeting the latest generation of portable embedded systems, such as smartphones. Coverage includes a variety of design and optimization topics in electronic design automation of DMM, from high-level software optimization to microarchitecture-level hardware support. The authors describe the design of multi-layer dynamic data structures for the final memory hierarchy layers of the target portable embedded systems and how to create a low-fragmentation, cost-efficient, dynamic memory management subsystem out of configurable components for the particular memory allocation and de-allocation patterns for each type of application. The design methodology described in this book is based on propagating constraints among design decisions from multiple abstraction levels (both hardware and software) and customizing DMM according to application-specific data access and storage behaviors.

Terrestrial Radiation Effects in ULSI Devices and Electronic Systems

Author : Eishi H. Ibe
Publisher : John Wiley & Sons
Page : 292 pages
File Size : 52,5 Mb
Release : 2015-03-02
Category : Technology & Engineering
ISBN : 9781118479292

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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems by Eishi H. Ibe Pdf

This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithms Covers both terrestrial and avionic-level conditions Logically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summary Written by a widely-recognized authority in soft-errors in electronic devices Code samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.

Robust SRAM Designs and Analysis

Author : Jawar Singh,Saraju P. Mohanty,Dhiraj K. Pradhan
Publisher : Springer Science & Business Media
Page : 176 pages
File Size : 44,6 Mb
Release : 2012-08-01
Category : Technology & Engineering
ISBN : 9781461408185

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Robust SRAM Designs and Analysis by Jawar Singh,Saraju P. Mohanty,Dhiraj K. Pradhan Pdf

This book provides a guide to Static Random Access Memory (SRAM) bitcell design and analysis to meet the nano-regime challenges for CMOS devices and emerging devices, such as Tunnel FETs. Since process variability is an ongoing challenge in large memory arrays, this book highlights the most popular SRAM bitcell topologies (benchmark circuits) that mitigate variability, along with exhaustive analysis. Experimental simulation setups are also included, which cover nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis. Emphasis is placed throughout the book on the various trade-offs for achieving a best SRAM bitcell design. Provides a complete and concise introduction to SRAM bitcell design and analysis; Offers techniques to face nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis; Includes simulation set-ups for extracting different design metrics for CMOS technology and emerging devices; Emphasizes different trade-offs for achieving the best possible SRAM bitcell design.

Energy Efficient and Reliable Embedded Nanoscale SRAM Design

Author : Bhupendra Singh Reniwal,Pooran Singh,Ambika Prasad Shah,Santosh Kumar Vishvakarma
Publisher : CRC Press
Page : 221 pages
File Size : 43,5 Mb
Release : 2023-11-29
Category : Technology & Engineering
ISBN : 9781000985139

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Energy Efficient and Reliable Embedded Nanoscale SRAM Design by Bhupendra Singh Reniwal,Pooran Singh,Ambika Prasad Shah,Santosh Kumar Vishvakarma Pdf

This reference text covers a wide spectrum for designing robust embedded memory and peripheral circuitry. It will serve as a useful text for senior undergraduate and graduate students and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discusses low-power design methodologies for static random-access memory (SRAM) Covers radiation-hardened SRAM design for aerospace applications Focuses on various reliability issues that are faced by submicron technologies Exhibits more stable memory topologies Nanoscale technologies unveiled significant challenges to the design of energy- efficient and reliable SRAMs. This reference text investigates the impact of process variation, leakage, aging, soft errors and related reliability issues in embedded memory and periphery circuitry. The text adopts a unique way to explain the SRAM bitcell, array design, and analysis of its design parameters to meet the sub-nano-regime challenges for complementary metal-oxide semiconductor devices. It comprehensively covers low- power-design methodologies for SRAM, exhibits more stable memory topologies, and radiation-hardened SRAM design for aerospace applications. Every chapter includes a glossary, highlights, a question bank, and problems. The text will serve as a useful text for senior undergraduate students, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discussing comprehensive studies of variability-induced failure mechanism in sense amplifiers and power, delay, and read yield trade-offs, this reference text will serve as a useful text for senior undergraduate, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. It covers the development of robust SRAMs, well suited for low-power multi-core processors for wireless sensors node, battery-operated portable devices, personal health care assistants, and smart Internet of Things applications.

SRAM Design for Wireless Sensor Networks

Author : Vibhu Sharma,Francky Catthoor,Wim Dehaene
Publisher : Springer Science & Business Media
Page : 179 pages
File Size : 44,7 Mb
Release : 2012-07-27
Category : Technology & Engineering
ISBN : 9781461440390

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SRAM Design for Wireless Sensor Networks by Vibhu Sharma,Francky Catthoor,Wim Dehaene Pdf

This book features various, ultra low energy, variability resilient SRAM circuit design techniques for wireless sensor network applications. Conventional SRAM design targets area efficiency and high performance at the increased cost of energy consumption, making it unsuitable for computation-intensive sensor node applications. This book, therefore, guides the reader through different techniques at the circuit level for reducing energy consumption and increasing the variability resilience. It includes a detailed review of the most efficient circuit design techniques and trade-offs, introduces new memory architecture techniques, sense amplifier circuits and voltage optimization methods for reducing the impact of variability for the advanced technology nodes.

VLSI Design and Test for Systems Dependability

Author : Shojiro Asai
Publisher : Springer
Page : 800 pages
File Size : 49,9 Mb
Release : 2018-07-20
Category : Technology & Engineering
ISBN : 9784431565949

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VLSI Design and Test for Systems Dependability by Shojiro Asai Pdf

This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.

Computer Memory and Data Storage

Author : Azam Seyedi
Publisher : BoD – Books on Demand
Page : 86 pages
File Size : 50,9 Mb
Release : 2024-01-10
Category : Computers
ISBN : 9781803555881

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Computer Memory and Data Storage by Azam Seyedi Pdf

Computer Memory and Data Storage presents a comprehensive exploration of the intricacies of memory design, delving into the challenges and advanced techniques involved in optimizing power consumption, performance, reliability, and data integrity. The chapters provide a complete understanding of modern memory technologies, ranging from radiation-hardened memory for space applications to diverse memory designs and their trade-offs.

Security and Privacy-Preserving Techniques in Wireless Robotics

Author : Amit Kumar Tyagi,Ajith Abraham,A. Kaklauskas,N. Sreenath,Gillala Rekha,Shaveta Malik
Publisher : CRC Press
Page : 336 pages
File Size : 43,9 Mb
Release : 2022-08-01
Category : Technology & Engineering
ISBN : 9781000510171

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Security and Privacy-Preserving Techniques in Wireless Robotics by Amit Kumar Tyagi,Ajith Abraham,A. Kaklauskas,N. Sreenath,Gillala Rekha,Shaveta Malik Pdf

The wide gap between the existing security solutions and the actual practical deployment in smart manufacturing, smart home, and remote environments (with respect to wireless robotics) is one of the major reasons why we require novel strategies, mechanisms, architectures, and frameworks. Furthermore, it is also important to access and understand the different level of vulnerabilities and attack vectors in Wireless Sensor Network (WSN) and Wireless Robotics. This book includes an in-depth explanation of a secure and dependable Wireless Robotics (WR) architecture, to ensure confidentiality, authenticity, and availability. Features Blockchain technology for securing data at end/server side Emerging technologies/networking, like Cloud, Edge, Fog, etc., for communicating and storing data (securely). Various open issues, challenges faced in this era towards wireless robotics, including several future research directions for the future. Several real world’s case studies are included Chapters on ethical concerns and privacy laws, i.e., laws for service providers Security and privacy challenges in wireless sensor networks and wireless robotics The book is especially useful for academic researchers, undergraduate students, postgraduate students, and industry researchers and professionals.

Low Power Design Essentials

Author : Jan Rabaey
Publisher : Springer Science & Business Media
Page : 371 pages
File Size : 52,5 Mb
Release : 2009-04-21
Category : Technology & Engineering
ISBN : 9780387717135

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Low Power Design Essentials by Jan Rabaey Pdf

This book contains all the topics of importance to the low power designer. It first lays the foundation and then goes on to detail the design process. The book also discusses such special topics as power management and modal design, ultra low power, and low power design methodology and flows. In addition, coverage includes projections of the future and case studies.

Circuits and Systems Advances in Near Threshold Computing

Author : Sanghamitra Roy
Publisher : MDPI
Page : 120 pages
File Size : 47,7 Mb
Release : 2021-05-11
Category : Technology & Engineering
ISBN : 9783036507200

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Circuits and Systems Advances in Near Threshold Computing by Sanghamitra Roy Pdf

Modern society is witnessing a sea change in ubiquitous computing, in which people have embraced computing systems as an indispensable part of day-to-day existence. Computation, storage, and communication abilities of smartphones, for example, have undergone monumental changes over the past decade. However, global emphasis on creating and sustaining green environments is leading to a rapid and ongoing proliferation of edge computing systems and applications. As a broad spectrum of healthcare, home, and transport applications shift to the edge of the network, near-threshold computing (NTC) is emerging as one of the promising low-power computing platforms. An NTC device sets its supply voltage close to its threshold voltage, dramatically reducing the energy consumption. Despite showing substantial promise in terms of energy efficiency, NTC is yet to see widescale commercial adoption. This is because circuits and systems operating with NTC suffer from several problems, including increased sensitivity to process variation, reliability problems, performance degradation, and security vulnerabilities, to name a few. To realize its potential, we need designs, techniques, and solutions to overcome these challenges associated with NTC circuits and systems. The readers of this book will be able to familiarize themselves with recent advances in electronics systems, focusing on near-threshold computing.

Nanoelectronics for Next-Generation Integrated Circuits

Author : Rohit Dhiman
Publisher : CRC Press
Page : 255 pages
File Size : 45,5 Mb
Release : 2022-11-23
Category : Technology & Engineering
ISBN : 9781000778069

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Nanoelectronics for Next-Generation Integrated Circuits by Rohit Dhiman Pdf

The incessant scaling of complementary metal-oxide semiconductor (CMOS) technology has resulted in significant performance improvements in very-large-scale integration (VLSI) design techniques and system architectures. This trend is expected to continue in the future, but this requires breakthroughs in the design of nano-CMOS and post-CMOS technologies. Nanoelectronics refers to the possible future technologies beyond conventional CMOS scaling limits. This volume addresses the current state-of-the-art nanoelectronic technologies and presents potential options for next-generation integrated circuits. Nanoelectronics for Next-generation Integrated Circuits is a useful reference guide for researchers, engineers, and advanced students working on the frontier of the design and modeling of nanoelectronic devices and their integration aspects with future CMOS circuits. This comprehensive volume eloquently presents the design methodologies for spintronics memories, quantum-dot cellular automata, and post-CMOS FETs, including applications in emerging integrated circuit technologies.

Low-Power Variation-Tolerant Design in Nanometer Silicon

Author : Swarup Bhunia,Saibal Mukhopadhyay
Publisher : Springer Science & Business Media
Page : 444 pages
File Size : 53,5 Mb
Release : 2010-11-10
Category : Technology & Engineering
ISBN : 9781441974181

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Low-Power Variation-Tolerant Design in Nanometer Silicon by Swarup Bhunia,Saibal Mukhopadhyay Pdf

Design considerations for low-power operations and robustness with respect to variations typically impose contradictory requirements. Low-power design techniques such as voltage scaling, dual-threshold assignment and gate sizing can have large negative impact on parametric yield under process variations. This book focuses on circuit/architectural design techniques for achieving low power operation under parameter variations. We consider both logic and memory design aspects and cover modeling and analysis, as well as design methodology to achieve simultaneously low power and variation tolerance, while minimizing design overhead. This book will discuss current industrial practices and emerging challenges at future technology nodes.