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Author : Lowis D'Aguilar Jackson
Publisher : Unknown
Page : 562 pages
File Size : 44,9 Mb
Release : 1882
Category : Length measurement
ISBN : OXFORD:590530513
Author : Luigi Cocco
Publisher : BoD – Books on Demand
Page : 474 pages
File Size : 50,9 Mb
Release : 2012-05-16
Category : Technology & Engineering
ISBN : 9789535105848
"What are the recent developments in the field of Metrology?" International leading experts answer this question providing both state of the art presentation and a road map to the future of measurement science. The book is organized in six sections according to the areas of expertise, namely: Introduction; Length, Distance and Surface; Voltage, Current and Frequency; Optics; Time and Relativity; Biology and Medicine. Theoretical basis and applications are explained in accurate and comprehensive manner, providing a valuable reference to researchers and professionals.
Author : Oleh Velychko
Publisher : BoD – Books on Demand
Page : 152 pages
File Size : 47,6 Mb
Release : 2022-05-11
Category : Technology & Engineering
ISBN : 9781803550480
In the modern era of scientific and technological development, the role of measurements and metrology in scientific research is becoming more and more important due to the increase in the testing of various products. Moreover, requirements for the accuracy and reliability of measurement results are increasing significantly and their ranges are expanding. Improving measurement accuracy allows us to identify the shortcomings of certain technological processes and either eliminate them or reduce their influence. This leads to better-quality products and contributes to saving energy and other resources, as well as raw materials and materials. This book discusses relevant aspects of practical metrological activity to establish traceability of measurements while increasing their accuracy and reliability. It also presents procedures for the calibration and testing of measuring instruments.
Author : Lowis D'Aguilar Jackson
Publisher : Unknown
Page : 536 pages
File Size : 44,8 Mb
Release : 1882
Category : Length measurement
ISBN : UCAL:B4253007
Author : Itzal Zabala
Publisher : Unknown
Page : 302 pages
File Size : 44,8 Mb
Release : 2010-08-01
Category : Electronic
ISBN : 1681175312
Have you ever wondered how an inch became an inch, and why a kilo is not a pound? Do you know what the distance is between the earth and the sun in millimeters? These are questions that can only be answered if you learn more about metrology. Metrology covers both the experimental and theoretical aspects of measurement and the determination of the levels of uncertainty of these aspects. The study of measurement is a basic requirement in any field of science and technology, most importantly in engineering and manufacturing. Since metrology is the study of measurement, it is expected to enforce, validate and verify predefined standards for traceability, accuracy, reliability, and precision. All of these are factors that would affect the validity of measurement. Although these standards vary widely, these are mandated by the government, the agencies, and some treaties. Subsequently, these standards are verified and tested against a recognized quality system in calibration laboratories. The experimental aspect of metrology is that which deals with the investigation of the relationship among variables. These variables are established depending on set of observations being considered or classified. As such, it is in this aspect that hypotheses are established and tested. On the other hand, the theoretical aspect of metrology pacts with the various concepts and principles underlying the study.Modern Metrology Concerns provides comprehensive overview on the recent developments in the field of Metrology. Theoretical basis and applications are enlightened in accurate and comprehensive manner, providing a appreciated reference to researchers and professionals.
Author : Lowis D'Aguilar Jackson
Publisher : BoD – Books on Demand
Page : 522 pages
File Size : 53,8 Mb
Release : 2024-04-09
Category : Fiction
ISBN : 9783385411760
Reprint of the original, first published in 1882.
Author : Alessandro Ferrero,Dario Petri,Paolo Carbone,Marcantonio Catelani
Publisher : John Wiley & Sons
Page : 400 pages
File Size : 40,5 Mb
Release : 2015-09-03
Category : Technology & Engineering
ISBN : 9781119021339
This book is a collection of chapters linked together by a logical framework aimed at exploring the modern role of the measurement science in both the technically most advanced applications and in everyday life Provides a unique methodological approach to understanding modern measurements Important methods and devices are presented in a synthetic and easy-to-understand way Includes end-of-chapter exercises and solutions
Author : René Schödel
Publisher : Institute of Physics Publishing
Page : 326 pages
File Size : 50,7 Mb
Release : 2018-12-21
Category : Science
ISBN : 0750319445
Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the field of length and distance metrology. Within the book advanced solutions, which can be used for various applications and can help provide a comprehensive understanding of both metrology and interferometry, have been developed and discussed.
Author : LOWIS D'AGUILAR. JACKSON
Publisher : Unknown
Page : 0 pages
File Size : 50,5 Mb
Release : 2019
Category : Electronic
ISBN : 1033993859
Author : Lowis D'Aguilar Jackson
Publisher : Palala Press
Page : 532 pages
File Size : 50,8 Mb
Release : 2016-05-12
Category : Electronic
ISBN : 1356465536
This work has been selected by scholars as being culturally important, and is part of the knowledge base of civilization as we know it. This work was reproduced from the original artifact, and remains as true to the original work as possible. Therefore, you will see the original copyright references, library stamps (as most of these works have been housed in our most important libraries around the world), and other notations in the work.This work is in the public domain in the United States of America, and possibly other nations. Within the United States, you may freely copy and distribute this work, as no entity (individual or corporate) has a copyright on the body of the work.As a reproduction of a historical artifact, this work may contain missing or blurred pages, poor pictures, errant marks, etc. Scholars believe, and we concur, that this work is important enough to be preserved, reproduced, and made generally available to the public. We appreciate your support of the preservation process, and thank you for being an important part of keeping this knowledge alive and relevant.
Author : Lowis D'aguilar Jackson
Publisher : Forgotten Books
Page : 530 pages
File Size : 40,8 Mb
Release : 2016-12-23
Category : Mathematics
ISBN : 1334737622
Excerpt from Modern Metrology: A Manual of the Metrical Units and Systems of the Present Century; With an Appendix Containing a Proposed English System A collection of the measures of all nations constitutes in one form an annal of the world, and metrology in the same way corresponds to history in this respect measures become scientifically interesting. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
Author : Alessandro Ferrero,Dario Petri,Paolo Carbone,Marcantonio Catelani
Publisher : John Wiley & Sons
Page : 398 pages
File Size : 55,9 Mb
Release : 2015-10-05
Category : Technology & Engineering
ISBN : 9781118171318
This book is a collection of chapters linked together by a logical framework aimed at exploring the modern role of the measurement science in both the technically most advanced applications and in everyday life Provides a unique methodological approach to understanding modern measurements Important methods and devices are presented in a synthetic and easy-to-understand way Includes end-of-chapter exercises and solutions
Author : Dinesh K. Aswal,Sanjay Yadav,Toshiyuki Takatsuji,Prem Rachakonda,Harish Kumar
Publisher : Springer Nature
Page : 2504 pages
File Size : 50,9 Mb
Release : 2023-08-23
Category : Technology & Engineering
ISBN : 9789819920747
This handbook provides comprehensive and up-to-date information on the topic of scientific, industrial and legal metrology. It discusses the state-of-art review of various metrological aspects pertaining to redefinition of SI Units and their implications, applications of time and frequency metrology, certified reference materials, industrial metrology, industry 4.0, metrology in additive manufacturing, digital transformations in metrology, soft metrology and cyber security, optics in metrology, nano-metrology, metrology for advanced communication, environmental metrology, metrology in biomedical engineering, legal metrology and global trade, ionizing radiation metrology, advanced techniques in evaluation of measurement uncertainty, etc. The book has contributed chapters from world’s leading metrologists and experts on the diversified metrological theme. The internationally recognized team of editors adopt a consistent and systematic approach and writing style, including ample cross reference among topics, offering readers a user-friendly knowledgebase greater than the sum of its parts, perfect for frequent consultation. Moreover, the content of this volume is highly interdisciplinary in nature, with insights from not only metrology but also mechanical/material science, optics, physics, chemistry, biomedical and more. This handbook is ideal for academic and professional readers in the traditional and emerging areas of metrology and related fields.
Author : Komyo Kariya,Ludwik Finkelstein
Publisher : IOS Press
Page : 226 pages
File Size : 48,7 Mb
Release : 2000
Category : Measurement
ISBN : 4274903982
Author : Ewa Bulska
Publisher : Springer
Page : 188 pages
File Size : 47,6 Mb
Release : 2018-09-29
Category : Science
ISBN : 9783319992068
In this concise book, the author presents the essentials every chemist needs to know about how to obtain reliable measurement results. Starting with the basics of metrology and the metrological infrastructure, all relevant topics – such as traceability, calibration, chemical reference materials, validation and uncertainty – are covered. In addition, key aspects of laboratory management, including quality management, inter-laboratory comparisons, proficiency testing, and accreditation, are addressed.
