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Author : Wei Gao,Yuki Shimizu
Publisher : Unknown
Page : 0 pages
File Size : 40,5 Mb
Release : 2022
Category : Metrology
ISBN : 1523153040
Author : Kevin Harding
Publisher : Taylor & Francis
Page : 497 pages
File Size : 49,6 Mb
Release : 2016-04-19
Category : Science
ISBN : 9781439854822
Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods
Author : American Society for Precision Engineering
Publisher : Unknown
Page : 172 pages
File Size : 48,6 Mb
Release : 2011
Category : Electronic
ISBN : 1887706577
Author : Wei Gao,Yuki Shimizu
Publisher : Walter de Gruyter GmbH & Co KG
Page : 655 pages
File Size : 49,6 Mb
Release : 2021-11-22
Category : Technology & Engineering
ISBN : 9783110542363
This book provides readers the fundamentals of optical metrology for precision engineering. The next-generation measurement technologies based on ultrashort pulse laser and optical frequency comb are also presented, making it an essential reference book for various engineering fields. • Introduces fundamental theories and techniques • Combines theories with practical applications • Presents technologies in an easy-to-understand way
Author : D.C. Williams
Publisher : Springer Science & Business Media
Page : 490 pages
File Size : 48,5 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9789401115643
Optical methods, stimulated by the advent of inexpensive and reliable lasers, are assuming an increasingly important role in the field of engineering metrology. Requiring only a basic knowledge of optics, this text provides a compendium of practical information prepared by leaders in the field.
Author : LEACH
Publisher : Emerging Technologies in Optic
Page : 250 pages
File Size : 40,6 Mb
Release : 2020-12-10
Category : Science
ISBN : 0750325224
Advances in Optical Form and Coordinate Metrology covers the latest advances in the development of optical form and coordinate measuring instruments plus the manipulation of point cloud data. The book presents some basic principles of the optical measurement methods and takes a deeper look at the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed include the drive towards faster instruments for in-process applications, the ability to measure highly complex objects (e.g. in additive manufacturing), performance verification and advances in the use of machine learning to enhance data analysis. Key Features Provides cutting-edge advances in the field Includes new ISO framework for performance verification Presents advances in artificial intelligence Includes advances in in-process measurement Discusses a forward look at calibration
Author : Dahi Ghareab Abdelsalam Ibrahim
Publisher : Cambridge Scholars Publishing
Page : 312 pages
File Size : 51,9 Mb
Release : 2019-07-31
Category : Technology & Engineering
ISBN : 9781527537736
The accurate measurements of surface topography are becoming important to many applications in both engineering and science. Optical interferometry is considered a preferable technique for featuring accurate 3D surface profiling since it is non-contacting, non-destructive and highly accurate. In combination with computers and other electronic devices, optical interferometry has become faster, more reliable, more convenient and more robust. There is now a wealth of new optical interferometry techniques on the market, or being developed in academia, that can measure surface topography with high precision. Each method has both its strong points and its limitations. This book explains in detail the basics of optical interferometry, their common language, generic features and limitations, and their simulation and uncertainties. Moreover, it provides an introduction to new frontiers in optical interferometry, including terahertz technology and optical frequency combs.
Author : Kjell J. G?svik
Publisher : Unknown
Page : 254 pages
File Size : 42,5 Mb
Release : 1987-05-06
Category : Science
ISBN : UVA:X001400729
Covers the four optical metrology techniques of holographic interferometry, moire techniques, speckle methods and photoelasticity in a single volume.
Author : Kjell J. Gåsvik
Publisher : John Wiley & Sons
Page : 372 pages
File Size : 47,6 Mb
Release : 2003-04-11
Category : Technology & Engineering
ISBN : 9780470846704
New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. * New introductory sections to all chapters. * Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry. * Thorough coverage of the CCD camera.
Author : Richard Leach
Publisher : Myprint
Page : 200 pages
File Size : 44,7 Mb
Release : 2020-12-21
Category : Electronic
ISBN : 0750325291
Author : Rajpal S. Sirohi
Publisher : CRC Press
Page : 449 pages
File Size : 47,9 Mb
Release : 2017-07-12
Category : Technology & Engineering
ISBN : 9781482236118
Introduction to Optical Metrology examines the theory and practice of various measurement methodologies utilizing the wave nature of light. The book begins by introducing the subject of optics, and then addresses the propagation of laser beams through free space and optical systems. After explaining how a Gaussian beam propagates, how to set up a collimator to get a collimated beam for experimentation, and how to detect and record optical signals, the text: Discusses interferometry, speckle metrology, moiré phenomenon, photoelasticity, and microscopy Describes the different principles used to measure the refractive indices of solids, liquids, and gases Presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and length Details techniques for optical testing as well as for making fiber optic- and MEMS-based measurements Depicts a wave propagating in the positive z-direction by ei(ωt – kz), as opposed to ei(kz – ωt) Featuring exercise problems at the end of each chapter, Introduction to Optical Metrology provides an applied understanding of essential optical measurement concepts, techniques, and procedures.
Author : Wolfgang Osten,Malgorzata Kujawinska
Publisher : Springer Science & Business Media
Page : 792 pages
File Size : 55,5 Mb
Release : 2010-04-28
Category : Technology & Engineering
ISBN : 9783642030512
21 years ago it was a joint idea with Hans Rottenkolber to organize a workshop dedicated to the discussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial and scientific applications of optical metrology. A couple of months later more than 50 specialists from East and West met in East Berlin, the capital of the former GDR, to spend 3 days with the discussion of new principles of fringe processing. In the stimulating atmoshere the idea was born to repeat the workshop and to organize the meeting in an olympic schedule. And thus meanwhile 20 years have been passed and we have today Fringe number six. However, such a workshop takes place in a dynamic environment. Therefore the main topics of the previous events were always adapted to the most interesting subjects of the new period. In 1993 the workshop took place in Bremen and was dedicated to new principles of optical shape measurement, setup calibration, phase unwrapping and nondestructive testing, while in 1997 new approaches in multi-sensor metrology, active measurement strategies and hybrid processing technologies played a central role. 2001, the first meeting in the 21st century, was focused to optical methods for micromeasurements, hybrid measurement technologies and new sensor solutions for industrial inspection.
Author : Toru Yoshizawa
Publisher : CRC Press
Page : 744 pages
File Size : 46,6 Mb
Release : 2017-07-28
Category : Technology & Engineering
ISBN : 9781351831840
Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.
Author : Carolyn Mercer
Publisher : Springer Science & Business Media
Page : 468 pages
File Size : 52,7 Mb
Release : 2013-04-17
Category : Science
ISBN : 9781475737776
Optical Metrology for Fluids, Combustion and Solids is the first practical handbook that presents the assemblage of the techniques necessary to provide a basic understanding of optical measurement for fluids, combustion, and solids. The use of light as a measurement tool has grown over the past twenty years from a narrowly specialized activity to a mainstay of modern research today. Until recently, the knowledge that could be extracted from the light interaction of light with physical objects was limited to specialized activities. The invention of the laser, the computer and microelectronics has enabled a measurement revolution such that virtually every parameter of engineering interest can be measured using the minimally intrusive properties of light. The authors of this book's chapters are leaders in this revolution. They work on the front lines of research in government, industry, and universities, inventing yet more ways to harness the power of light for the generation of knowledge.
Author : Wei Gao
Publisher : Springer Science & Business Media
Page : 354 pages
File Size : 43,7 Mb
Release : 2010-06-14
Category : Technology & Engineering
ISBN : 9781849962544
Precision Nanometrology describes the new field of precision nanometrology, which plays an important part in nanoscale manufacturing of semiconductors, optical elements, precision parts and similar items. It pays particular attention to the measurement of surface forms of precision workpieces and to stage motions of precision machines. The first half of the book is dedicated to the description of optical sensors for the measurement of angle and displacement, which are fundamental quantities for precision nanometrology. The second half presents a number of scanning-type measuring systems for surface forms and stage motions. The systems discussed include: • error separation algorithms and systems for measurement of straightness and roundness, • the measurement of micro-aspherics, • systems based on scanning probe microscopy, and • scanning image-sensor systems. Precision Nanometrology presents the fundamental and practical technologies of precision nanometrology with a helpful selection of algorithms, instruments and experimental data. It will be beneficial for researchers, engineers and postgraduate students involved in precision engineering, nanotechnology and manufacturing.