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Author : Alan W. Agar,Ronald H. Alderson,Dawn Chescoe
Publisher : Unknown
Page : 368 pages
File Size : 50,6 Mb
Release : 1974
Category : Electron microscopes
ISBN : WISC:89030493936
Author : A.M. Glauert
Publisher : Unknown
Page : 345 pages
File Size : 50,5 Mb
Release : 1974
Category : Electronic
ISBN : 0720442508
Author : A. W. Agar
Publisher : Unknown
Page : 345 pages
File Size : 41,9 Mb
Release : 1974
Category : Electronic
ISBN : 0720442508
The basic principles of the electron microscope; The design of the electron microscope; Image formation in the electron microscope; Alignment and adjustment of the electron microscope; Checking the performance of the electron microscope; Operation of the electron microscope; Image recording and display; Image interpretation; Future developments of the electron microscope.
Author : Ian M. Watt
Publisher : Cambridge University Press
Page : 506 pages
File Size : 53,6 Mb
Release : 1997-01-30
Category : Science
ISBN : 0521435919
The first edition of this book was widely praised as an excellent introduction to electron microscopy for materials scientists, physicists, earth and biological scientists. This completely revised new edition contains expanded coverage of existing topics and much new material. The author presents the subject of electron microscopy in a readable way, open both to those inexperienced in the technique, and also to practising electron microscopists. The coverage has been brought completely up to date, whilst retaining descriptions of early classic techniques. Currently live topics such as computer control of microscopes, energy-filtered imaging, cryo- and environmental microscopy, digital imaging, and high resolution scanning and transmission microscopy are all described. The highly praised case studies of the first edition have been expanded to include some interesting new examples. This indispensable guide to electron microscopy, written by an author with thirty years practical experience, will be invaluable to new and experienced electron microscopists in any area of science and technology.
Author : R.F. Egerton
Publisher : Springer
Page : 196 pages
File Size : 44,7 Mb
Release : 2016-07-01
Category : Technology & Engineering
ISBN : 9783319398778
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Author : Thomas Willum Hansen,Jakob Birkedal Wagner
Publisher : Springer
Page : 329 pages
File Size : 53,7 Mb
Release : 2015-10-23
Category : Technology & Engineering
ISBN : 9783319229881
This book illustrates the practical workings of environmental transmission electron microscopy (ETEM) from history and instrument design through to solving practical problems. Aspects of instrument design, performance, and operating procedures are covered, together with common problems and pitfalls of the technique. Not only will a properly operated instrument and a carefully set up experiment provide new insight into your specimen, but the ability to observe the specimen in its natural habitat will be essential to meeting specific design criteria for the development of the next generation of materials. Over the past five decades, transmission electron microscopy (TEM) under environmental conditions relevant to a particular sample has been of increasing interest. Symposia dealing with the topic are now among the best attended at international microscopy conferences. Since typical operating modes for the ETEM require the sample be subjected to a harsh environment consisting of corrosive gases and high temperatures, the challenges of adapting and operating the instrument for observation under dynamic operating conditions are numerous. However, careful consideration of the interaction of the electrons with the gases and sample, as well as the gases with the microscope components, can lead to highly rewarding results. In Controlled Atmosphere Transmission Electron Microscopy, leading experts help you to perform successful experiments using the ETEM, and to interpret and understand the results.
Author : Ray Egerton
Publisher : Springer Science & Business Media
Page : 224 pages
File Size : 54,9 Mb
Release : 2011-02-11
Category : Technology & Engineering
ISBN : 0387258000
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Author : Debbie Stokes
Publisher : John Wiley & Sons
Page : 247 pages
File Size : 47,8 Mb
Release : 2008-12-22
Category : Science
ISBN : 9780470065402
Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations Crucially, the principles and applications outlined in this book are completely generic: i.e. applicable to all types of VPSEM, irrespective of manufacturer. Information presented will enable reader to turn principles into practice Published in association with the Royal Microscopical Society (RMS) -www.rms.org.uk
Author : Joseph Goldstein,Dale E. Newbury,Patrick Echlin,David C. Joy,Charles Fiori,Eric Lifshin
Publisher : Springer Science & Business Media
Page : 679 pages
File Size : 53,9 Mb
Release : 2013-11-11
Category : Science
ISBN : 9781461332732
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Author : Graham Lawes,Arthur M. James
Publisher : Unknown
Page : 103 pages
File Size : 50,8 Mb
Release : 1987
Category : Electron microscopy
ISBN : 0471913901
Author : Richard E. Crang,Jack A. Ward
Publisher : Saunders
Page : 80 pages
File Size : 54,9 Mb
Release : 1975-06-01
Category : Electron microscopy
ISBN : 0721698808
Author : Audrey M. Glauert
Publisher : Unknown
Page : 368 pages
File Size : 43,8 Mb
Release : 1972
Category : Electron microscopy
ISBN : UVA:X000729442
Author : M. A. Hayat
Publisher : John Wiley & Sons
Page : 264 pages
File Size : 45,5 Mb
Release : 1974
Category : Science
ISBN : UIUC:30112006003344
Author : Elizabeth M. Slayter,Henry S. Slayter
Publisher : Cambridge University Press
Page : 336 pages
File Size : 52,6 Mb
Release : 1992-10-30
Category : Science
ISBN : 0521339480
The compound optical microscope, in its various modern forms, is probably the most familiar of all laboratory instruments and the electron microscope, once an exotic rarity, has now become a standard tool in biological and materials research. Both instruments are often used effectively with little knowledge of the relevant theory, or even of how a particular type of microscope functions. Eventually however, proper use, interpretation of images and choices of specific applications demand an understanding of fundamental principles. This book describes the principles of operation of each type of microscope currently available and of use to biomedical and materials scientists. It explains the mechanisms of image formation, contrast and its enhancement, accounts for ultimate limits on the size of observable details (resolving power and resolution) and finally provides an account of Fourier optical theory. Principles behind the photographic methods used in microscopy are also described and there is some discussion of image processing methods. The book will appeal to graduate students and researchers in the biomedical sciences, and it will be helpful to students taking a course involving the principles of microscopy.
Author : M. A. Hayat
Publisher : John Wiley & Sons
Page : 392 pages
File Size : 47,6 Mb
Release : 1976
Category : Science
ISBN : UOM:39015004339035
High voltage electron microscopy; The principles of high resolution electron microscopy; Contrast and image formation of biological specimens; The analysis of biological structure with x-ray diffraction techniques; Tilting experiments in the electron microscope; Electron autoradiography of free specimens; Cryoultramicrotomy; Eletron interference microscope.