Proceedings International Symposium On Vlsi Design

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VLSI Design and Test

Author : Anirban Sengupta,Sudeb Dasgupta,Virendra Singh,Rohit Sharma,Santosh Kumar Vishvakarma
Publisher : Springer
Page : 775 pages
File Size : 50,8 Mb
Release : 2019-08-17
Category : Computers
ISBN : 9789813297678

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VLSI Design and Test by Anirban Sengupta,Sudeb Dasgupta,Virendra Singh,Rohit Sharma,Santosh Kumar Vishvakarma Pdf

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

VLSI Design and Test

Author : Manoj Singh Gaur,Mark Zwolinski,Vijay Laxmi,D. Boolchandani,Virendra Sing,Adit Singh
Publisher : Springer
Page : 403 pages
File Size : 46,8 Mb
Release : 2013-12-13
Category : Computers
ISBN : 9783642420245

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VLSI Design and Test by Manoj Singh Gaur,Mark Zwolinski,Vijay Laxmi,D. Boolchandani,Virendra Sing,Adit Singh Pdf

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

VLSI Design and Test

Author : S. Rajaram,N.B. Balamurugan,D. Gracia Nirmala Rani,Virendra Singh
Publisher : Springer
Page : 722 pages
File Size : 46,7 Mb
Release : 2019-01-24
Category : Computers
ISBN : 9789811359507

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VLSI Design and Test by S. Rajaram,N.B. Balamurugan,D. Gracia Nirmala Rani,Virendra Singh Pdf

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.

VLSI Design and Test

Author : Brajesh Kumar Kaushik,Sudeb Dasgupta,Virendra Singh
Publisher : Springer
Page : 815 pages
File Size : 48,5 Mb
Release : 2017-12-21
Category : Computers
ISBN : 9789811074707

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VLSI Design and Test by Brajesh Kumar Kaushik,Sudeb Dasgupta,Virendra Singh Pdf

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

Progress in VLSI Design and Test

Author : Hafizur Rahaman,Sanatan Chattopadhyay,Santanu Chattopadhyay
Publisher : Springer
Page : 427 pages
File Size : 42,5 Mb
Release : 2012-06-26
Category : Computers
ISBN : 9783642314940

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Progress in VLSI Design and Test by Hafizur Rahaman,Sanatan Chattopadhyay,Santanu Chattopadhyay Pdf

This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.

VLSI for Embedded Intelligence

Author : Anu Gupta,Jai Gopal Pandey,Nitin Chaturvedi,Devesh Dwivedi
Publisher : Springer
Page : 0 pages
File Size : 47,5 Mb
Release : 2024-09-04
Category : Computers
ISBN : 9819737559

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VLSI for Embedded Intelligence by Anu Gupta,Jai Gopal Pandey,Nitin Chaturvedi,Devesh Dwivedi Pdf

This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integrated Circuits and Devices; FPGA-Based Design and Embedded Systems; Memory, Computing, and Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design.

Proceedings of International Conference on VLSI, Communication, Advanced Devices, Signals & Systems and Networking (VCASAN-2013)

Author : Veena S. Chakravarthi,Yasha Jyothi M. Shirur,Rekha P.
Publisher : Springer Science & Business Media
Page : 464 pages
File Size : 54,5 Mb
Release : 2013-07-10
Category : Technology & Engineering
ISBN : 9788132215240

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Proceedings of International Conference on VLSI, Communication, Advanced Devices, Signals & Systems and Networking (VCASAN-2013) by Veena S. Chakravarthi,Yasha Jyothi M. Shirur,Rekha P. Pdf

This book is a collection of papers presented by renowned researchers, keynote speakers, and academicians in the International Conference on VLSI, Communication, Analog Designs, Signals & Systems and Networking (VCASAN-2013), organized by B.N.M. Institute of Technology, Bangalore, India during July 17–19, 2013. The book provides global trends in cutting-edge technologies in electronics and communication engineering. The content of the book is useful to engineers, researchers, and academicians as well as industry professionals.

VLSI Design and Test

Author : Ambika Prasad Shah,Sudeb Dasgupta,Anand Darji,Jaynarayan Tudu
Publisher : Springer Nature
Page : 607 pages
File Size : 45,9 Mb
Release : 2022-12-16
Category : Computers
ISBN : 9783031215148

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VLSI Design and Test by Ambika Prasad Shah,Sudeb Dasgupta,Anand Darji,Jaynarayan Tudu Pdf

This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022. The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.

VLSI Design and Test

Author : Anirban Sengupta,Sudeb Dasgupta,Virendra Singh,Rohit Sharma,Santosh Kumar Vishvakarma
Publisher : Springer
Page : 775 pages
File Size : 41,5 Mb
Release : 2019-08-18
Category : Computers
ISBN : 9813297662

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VLSI Design and Test by Anirban Sengupta,Sudeb Dasgupta,Virendra Singh,Rohit Sharma,Santosh Kumar Vishvakarma Pdf

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

International Conference on Computer Design (ICCD '99)

Author : IEEE Computer Society
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
Page : 696 pages
File Size : 42,6 Mb
Release : 1999
Category : Computers
ISBN : 076950406X

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International Conference on Computer Design (ICCD '99) by IEEE Computer Society Pdf

The proceedings from the October 1999 conference include 107 technical presentations from 14 different countries. Not restricted to presented papers, this volume includes both the keynote and plenary addresses, poster presentations, as well as the proceedings of two tutorials, one on CAD and one on benchmarking, selecting, and debugging microcontrollers. Topics covered include applied verification techniques, computer arithmetic, intelligent memory, design convergence, test generation and delay testing, microarchitecture, and digital signal processors. No subject index. Annotation copyrighted by Book News, Inc., Portland, OR.