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Author : Anonim
Publisher : Unknown
Page : 520 pages
File Size : 50,8 Mb
Release : 1957
Category : X-rays
ISBN : UVA:X004842878
Author : William M. Mueller
Publisher : Springer
Page : 0 pages
File Size : 44,9 Mb
Release : 2012-12-06
Category : Science
ISBN : 1468486314
The original scope of the annual conference on industrial applications of x-ray analysis envisioned almost total participation by representatives from industrial laboratories_ These people were concerned with problems of an immediate nature and thus welcomed the opportunity to meet for a few days with associates from other laboratnries in order to discuss problems of a similar nature, as weH as to interchange information freely and rapidly_ Certainly, this was true during the first few years of the conference's existence. During the past few years, however, a rather subtle blending has occur red of representatives from industrial laboratories, universities, and manu facturers of x-ray equipment. Papers which deal with the fundamental as pects of some phase of x-ray research and which, in many cases, have no end or ultimate objective, are as eagerly received by the conferees as are papers which deal with a specific problem of immediate importance or a paper in which the la test equipment available is portrayed. In our opinion, this x-ray conference, while perhaps no longer slanted specificaHy toward industrial applications of x-ray techniques, does continue to serve the same purpose as a medium of interchange of the latest available information and at the same time provide an opportunity for basic researchers, applied researchers and manufacturing representatives to become acquainted with each other's problems.
Author : William M. Mueller
Publisher : Springer
Page : 353 pages
File Size : 47,5 Mb
Release : 1995-12-31
Category : Science
ISBN : 0306381028
The original scope of the annual conference on industrial applications of x-ray analysis envisioned almost total participation by representatives from industrial laboratories_ These people were concerned with problems of an immediate nature and thus welcomed the opportunity to meet for a few days with associates from other laboratnries in order to discuss problems of a similar nature, as weH as to interchange information freely and rapidly_ Certainly, this was true during the first few years of the conference's existence. During the past few years, however, a rather subtle blending has occur red of representatives from industrial laboratories, universities, and manu facturers of x-ray equipment. Papers which deal with the fundamental as pects of some phase of x-ray research and which, in many cases, have no end or ultimate objective, are as eagerly received by the conferees as are papers which deal with a specific problem of immediate importance or a paper in which the la test equipment available is portrayed. In our opinion, this x-ray conference, while perhaps no longer slanted specificaHy toward industrial applications of x-ray techniques, does continue to serve the same purpose as a medium of interchange of the latest available information and at the same time provide an opportunity for basic researchers, applied researchers and manufacturing representatives to become acquainted with each other's problems.
Author : Anonim
Publisher : Unknown
Page : 792 pages
File Size : 45,5 Mb
Release : 1994
Category : Analytical chemistry
ISBN : STANFORD:36105009169181
Author : W. Pickles
Publisher : Springer
Page : 642 pages
File Size : 42,8 Mb
Release : 1975-03-01
Category : Science
ISBN : 0306381184
In the past the Denver X-Ray Conference has served as a forum for the interchange of information between people working in the extremely varied applied technologies which are based on x-ray physics. This year we hoped to continue this tradition by empha sizing some of the technologies associated with the energy and process control industries, which have expanded recently. The development of nuclear fusion into a power source, and the operation of the nuclear fission power reactor fuel cycle are two parts of the energy industry in which x-ray technology is currently playing a major role. The principle role of x-ray technology in the effort to develop a controlled thermonuclear or fusion power reactor, is that of a diagnostic tool to study the properties of high temperature plasmas. Since this subject is relatively new to many, it was reviewed in two of the invited papers. The role of x-ray technology in the nuclear fission reactor fuel cycle is primarily that of fluorescent x-ray analysis of reactor fuel materials for the purposes of process control and nuclear safeguards during fabrication and reprocessing. One of the invited papers reviewed this topic. This year the subject of x-ray lasers was also introduced via an invited paper. If an x-ray laser can be developed, it will probably become the center of many new technologies. The contributed papers this year covered x-ray diagnostics of plasmas, x-ray lasers, hardware and technique development for x-ray fluorescence analysis, atmospheric aerosol analysis, and materials characterization.
Author : William M. Mueller
Publisher : Springer
Page : 564 pages
File Size : 51,9 Mb
Release : 2012-10-08
Category : Science
ISBN : 1468476076
The text of this volume had its origin in the Tenth Annual Conference on Applications of X-Ray Analysis sponsored by the University of Denver and held August 7,8,9, 1961, at the Albany Hotel in Denver, Colorado. Approximately 300 participants derived benefit from the presentation of fifty-six papers on new scientific and technological developments in X-ray methods and the discussions that followed. Forty-eight of these papers plus one presented at the Ninth Con ference and cleared for publication too late to be included in Volume 4 are given here. The growth of the annual conferences and the breadth and intensity of the presentations are confirmations of the observation that the field of X-ray re search is indeed in a state of rapid and healthy development. Financial assistance provided by the United States Office of Naval Research permitted the participation oftwo distinguished scientists from Europe, Professor Andre Guinier of the University of Paris and Professor Hans Nowotny of the University of Vienna.
Author : Charles S. Barrett,J.V. Gilfrich,Ron Jenkins,John C. Russ,J.W. Richardson Jr.,Paul K. Predecki
Publisher : Springer
Page : 720 pages
File Size : 50,5 Mb
Release : 1989-06-01
Category : Science
ISBN : 0306432366
The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. As usual, alternating with x-ray diffraction, the emphasis this year was x-ray fluorescence, but as has been the pattern for several occasions over the last few years, the Plenary Session did not deal with that subject, specifically. In an attempt to introduce the audience to one of the new developments in x-ray analysis, the title of the session was "High Brilliance Sources/Applications," and dealt exclusively with synchrotron radiation, a topic which has made a very large impact on the x-ray community over the last decade. As the organizer and co-chairman of the Plenary Session (with Paul Predecki), it is my responsibility to report on that session here. The Conference had the privilege of obtaining the services of some of the preeminent practitioners of research using this remarkable x-ray source; they presented the audience with unusually lucid descriptions of the work which has been accomplished in the development and application of the continuous, high intensity, tunable, polarized and collimated x-rays available from no facility other than these specialized storage rings. The opening lecture (and I use that term intentionally) was an enthusiastic description of "What is Synchrotron Radiation?" by Professor Boris Batterman of Cornell University and the Cornell High Energy Synchrotron Sourc(! (CHESS).
Author : Frank Smith
Publisher : CRC Press
Page : 1024 pages
File Size : 53,9 Mb
Release : 1999-09-22
Category : Science
ISBN : 9781482276114
By illustrating a wide range of specific applications in all major industries, this work broadens the coverage of X-ray diffraction beyond basic tenets, research and academic principles. The book serves as a guide to solving problems faced everyday in the laboratory, and offers a review of the current theory and practice of X-ray diffraction, major
Author : Conference on Applications of X-Ray Analysis
Publisher : Unknown
Page : 783 pages
File Size : 45,6 Mb
Release : 1976
Category : X-ray spectroscopy
ISBN : 0840313837
Author : John B. Newkirk,Gavin R. Mallett,Heinz G. Pfeiffer
Publisher : Springer
Page : 499 pages
File Size : 54,5 Mb
Release : 2013-10-10
Category : Science
ISBN : 1468486780
X-ray emission spectrography, while based on Moseley's work, as a generally useful analytical method had its genesis in the work of Friedman, Birks, and Brooks 30 years ago. The central theme of this conference, quantitative methods in X-ray spectrometric analy sis, and the large number of papers on that subject attest to the growth of the application and usefulness of X-ray emission. It is a privilege to have as an invited speaker Laverne Birks, one of the original group that put X-ray emission into analytical chemistry. Determination of elements above titanium in the periodic table was considered the province of X-ray fluorescence, and most of the early development was aimed at the analy sis of alloys. The papers in this volume on metals analysis accept most operational features as routine and have concentrated on the improved treatment of the observed data in order to convert them to more accurate results. As the treatment of matrix effects, geometry, and stability have been better understood, corrections have become routine. For most elements that are present in amounts greater than a few parts per million, determinations can now be done with accuracies rivaling wet methods. Trace quantities are being determined to lower and lower amounts, largely owing to improvement of equipment and development of concentration techniques. For most trace elements, X-ray spectrography has become the preferred analytical method. The develop ment of improved methods for separating signals from noise should lead to major reduc tions in minimum detection levels.
Author : C. Grant
Publisher : Springer
Page : 596 pages
File Size : 53,6 Mb
Release : 2013-05-28
Category : Science
ISBN : 1461399777
The successful application of x-r~ diffraction techniques and x-r~ spectrometry depends in large measure on the availability of dependable standards and reference data. The preparation of such standards in the fields of metallurgy, geology, life sciences, and other disciplines is both costly and time consuming. As a result. the necessary standards for effective utilization of existing instrumentation are often not available. One of the purposes of the invited papers in this 22nd Annual Denver X-Ray Conference was tc review the status of programs to prepare such standards and reference data. Simultaneously, it seemed appropriate to examine the role of sampling both in terms of standards and samples to be analyzed. The first section of the invited papers focuses on the standards and reference data problems. In addition, many of the contributed papers offer information on this theme. The second topic in the invited papers consi ders the problem of sampling. If we recognize that analyses are conducted on samples which vary in size from several grams to a few micrograms or less, the magnitude of the random and systematic error components of sam pling on the quality of results should be obvious. Many of the contributed papers in such fields as air pollution and similar disciplines speak clear ly to the difficulty of obtaining "representative" samples. The papers contained in this volume and the many lively discussions such as the panel discussion at the close of the first session of papers should stimulate further attention to this vital topic.
Author : Anonim
Publisher : Unknown
Page : 886 pages
File Size : 50,8 Mb
Release : 1975-12
Category : Nuclear energy
ISBN : PSU:000047759176
Author : Anonim
Publisher : Unknown
Page : 502 pages
File Size : 41,9 Mb
Release : 1962
Category : Analytical chemistry
ISBN : UOM:39015095055474
Author : Argonne National Laboratory. Library Services Department,Argonne National Laboratory,University of Chicago,U.S. Atomic Energy Commission
Publisher : Unknown
Page : 286 pages
File Size : 49,9 Mb
Release : 1968
Category : Periodicals
ISBN : UOM:39015095149517
