Proceedings The Ieee International Workshop On Defect And Fault Tolerance In Vlsi Systems November 13 15 1995 Lafayette Louisiana

Author : IEEE Computer Society
Publisher : IEEE Computer Society
Page : 305 pages
File Size : 41,7 Mb
Release : 1995
Category : Fault-tolerant computing
ISBN : 0818671076

Get Book

Proceedings, the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, November 13-15, 1995, Lafayette, Louisiana by IEEE Computer Society Pdf

An invited talk recounts Intel's experience with increasing die yield through CAD algorithms, and a panel discussion examines tools for the extracting of critical areas for a yield analysis of VLSI design. Others of the 34 papers cover critical area analysis, defect sensitivity and reliability, fault tolerant architectures and arrays, yield projection and enhancement, fault tolerant and testing techniques, and self-checking and coding techniques. No subject index. Annotation copyright by Book News, Inc., Portland, OR

Author : Sandeep Kumar Shukla,R. Iris Bahar
Publisher : Springer Science & Business Media
Page : 358 pages
File Size : 41,8 Mb
Release : 2007-05-08
Category : Computers
ISBN : 9781402080685

Get Book

Nano, Quantum and Molecular Computing by Sandeep Kumar Shukla,R. Iris Bahar Pdf

One of the grand challenges in the nano-scopic computing era is guarantees of robustness. Robust computing system design is confronted with quantum physical, probabilistic, and even biological phenomena, and guaranteeing high reliability is much more difficult than ever before. Scaling devices down to the level of single electron operation will bring forth new challenges due to probabilistic effects and uncertainty in guaranteeing 'zero-one' based computing. Minuscule devices imply billions of devices on a single chip, which may help mitigate the challenge of uncertainty by replication and redundancy. However, such device densities will create a design and validation nightmare with the shear scale. The questions that confront computer engineers regarding the current status of nanocomputing material and the reliability of systems built from such miniscule devices, are difficult to articulate and answer. We have found a lack of resources in the confines of a single volume that at least partially attempts to answer these questions. We believe that this volume contains a large amount of research material as well as new ideas that will be very useful for some one starting research in the arena of nanocomputing, not at the device level, but the problems one would face at system level design and validation when nanoscopic physicality will be present at the device level.

Author : IEEE Computer Society
Publisher : Unknown
Page : 326 pages
File Size : 49,5 Mb
Release : 1995
Category : Computers
ISBN : 0818671076

Get Book

Proceedings, the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, November 13-15, 1995, Lafayette, Louisiana by IEEE Computer Society Pdf

An invited talk recounts Intel's experience with increasing die yield through CAD algorithms, and a panel discussion examines tools for the extracting of critical areas for a yield analysis of VLSI design. Others of the 34 papers cover critical area analysis, defect sensitivity and reliability, fault tolerant architectures and arrays, yield projection and enhancement, fault tolerant and testing techniques, and self-checking and coding techniques. No subject index. Annotation copyright by Book News, Inc., Portland, OR.

Author : Anonim
Publisher : Unknown
Page : 220 pages
File Size : 54,7 Mb
Release : 2001
Category : Computer architecture
ISBN : STANFORD:36105111034414

Get Book

2001 International Workshop on System-Level Interconnect Prediction by Anonim Pdf

"The SLIP workshop is a forum for the exchange of ideas at the interface between interconnect technology and physical design ... This year, in recognition of the highly diverse backgrounds and motivations of the attendees, SLIP 2001 has been organized around three mini-tutorials: a review of wire distribution models, a look under the hood of a variety of system level interconnect modeling programs, and back end of line yield modeling. These tutorials set the scene for the paper sessions that follow."--Forward.

Author : Anonim
Publisher : Unknown
Page : 346 pages
File Size : 54,8 Mb
Release : 1997
Category : Integrated circuits
ISBN : UOM:39015040300041

Get Book

Proceedings by Anonim Pdf

Author : British Library. Document Supply Centre
Publisher : Unknown
Page : 890 pages
File Size : 42,5 Mb
Release : 1998
Category : Conference proceedings
ISBN : UOM:39015048505633

Get Book

Index of Conference Proceedings by British Library. Document Supply Centre Pdf

Author : Anonim
Publisher : Unknown
Page : 441 pages
File Size : 53,7 Mb
Release : 2002
Category : Electronic
ISBN : OCLC:1132061488

Get Book

DFT 2002 by Anonim Pdf

Author : Anonim
Publisher : IEEE
Page : 607 pages
File Size : 49,9 Mb
Release : 2003-01-01
Category : Technology & Engineering
ISBN : 0769520421

Get Book

18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems by Anonim Pdf

The DFT 2003 Symposium encompasses a wide range of topics in the research, design and implementation of VLSI systems that are defect- and fault-tolerant. This is the 18th symposium and throughout these years DFT's unique emphasis on theory and practice continues to provide an ideal source for developers and researchers to present and discuss innovative work covering a multitude of topics.

Author : Anonim
Publisher : Unknown
Page : 0 pages
File Size : 53,6 Mb
Release : 1996
Category : Fault-tolerant computing
ISBN : OCLC:456608790

Get Book

Proceedings ... IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems by Anonim Pdf

Author : IEEE Staff
Publisher : Unknown
Page : 128 pages
File Size : 41,6 Mb
Release : 2017-10-23
Category : Integrated circuits
ISBN : 1538603632

Get Book

2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) by IEEE Staff Pdf

DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance One of the unique features of this symposium is to combine new academic research with state of the art industrial data, necessary ingredients for significant advances in this field

Author : IEEE Computer Society
Publisher : Unknown
Page : 128 pages
File Size : 44,9 Mb
Release : 1999-11-01
Category : Electronic
ISBN : 0769503268

Get Book

Defect and Fault-Tolerance in VLSI Systems by IEEE Computer Society Pdf

Author : IEEE Staff
Publisher : Unknown
Page : 128 pages
File Size : 46,5 Mb
Release : 2015-10-12
Category : Electronic
ISBN : 1479986313

Get Book

2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) by IEEE Staff Pdf

DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies One of the unique features of this symposium is to combine new academic research with state of the art industrial data, necessary ingredients for significant advances in this field All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest

Author : IEEE Staff
Publisher : Unknown
Page : 128 pages
File Size : 44,9 Mb
Release : 2016-09-19
Category : Electronic
ISBN : 1509036245

Get Book

2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) by IEEE Staff Pdf

DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies One of the unique features of this symposium is to combine new academic research with state of the art industrial data, necessary ingredients for significant advances in this field All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest

Author : Anonim
Publisher : IEEE
Page : 441 pages
File Size : 50,6 Mb
Release : 2002
Category : Technology & Engineering
ISBN : 0769518311

Get Book

DFT 2002 by Anonim Pdf

These 45 papers from the November 2002 symposium discuss techniques to assess and enhance the yield, reliability, and availability of VLSI systems. Several of the contributors present new approaches to fault simulation and injection, concurrent error detection, yield prediction, and sequential circu

Author : IEEE Staff
Publisher : Unknown
Page : 128 pages
File Size : 46,9 Mb
Release : 2020-10-19
Category : Electronic
ISBN : 172819458X

Get Book

2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) by IEEE Staff Pdf

DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI and nanotechnology systems inclusive of emerging technologies One of the unique features of this symposium is to combine new academic research with state of the art industrial data, necessary ingredients for significant advances in this field All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest