Reliability And Degradation

Author : Waltraud Kahle,Sophie Mercier,Christian Paroissin
Publisher : John Wiley & Sons
Page : 240 pages
File Size : 54,9 Mb
Release : 2016-06-14
Category : Mathematics
ISBN : 9781119307525

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Degradation Processes in Reliability by Waltraud Kahle,Sophie Mercier,Christian Paroissin Pdf

“Degradation process” refers to many types of reliability models, which correspond to various kinds of stochastic processes used for deterioration modeling. This book focuses on the case of a univariate degradation model with a continuous set of possible outcomes. The envisioned univariate models have one single measurable quantity which is assumed to be observed over time. The first three chapters are each devoted to one degradation model. The last chapter illustrates the use of the previously described degradation models on some real data sets. For each of the degradation models, the authors provide probabilistic results and explore simulation tools for sample paths generation. Various estimation procedures are also developed.

Author : M. J. Howes,D. V. Morgan
Publisher : John Wiley & Sons
Page : 464 pages
File Size : 44,7 Mb
Release : 1981
Category : Technology & Engineering
ISBN : UOM:39015002068586

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Reliability and Degradation by M. J. Howes,D. V. Morgan Pdf

Author : Dimitris Kiritsis,Christos Emmanouilidis,Andy Koronios,Joseph Mathew
Publisher : Springer Science & Business Media
Page : 800 pages
File Size : 43,8 Mb
Release : 2011-02-03
Category : Technology & Engineering
ISBN : 9780857293206

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Engineering Asset Management by Dimitris Kiritsis,Christos Emmanouilidis,Andy Koronios,Joseph Mathew Pdf

Engineering Asset Management discusses state-of-the-art trends and developments in the emerging field of engineering asset management as presented at the Fourth World Congress on Engineering Asset Management (WCEAM). It is an excellent reference for practitioners, researchers and students in the multidisciplinary field of asset management, covering such topics as asset condition monitoring and intelligent maintenance; asset data warehousing, data mining and fusion; asset performance and level-of-service models; design and life-cycle integrity of physical assets; deterioration and preservation models for assets; education and training in asset management; engineering standards in asset management; fault diagnosis and prognostics; financial analysis methods for physical assets; human dimensions in integrated asset management; information quality management; information systems and knowledge management; intelligent sensors and devices; maintenance strategies in asset management; optimisation decisions in asset management; risk management in asset management; strategic asset management; and sustainability in asset management.

Author : Osamu Ueda
Publisher : Artech House Publishers
Page : 376 pages
File Size : 47,9 Mb
Release : 1996
Category : Science
ISBN : UOM:39015038140292

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Reliability and Degradation of III-V Optical Devices by Osamu Ueda Pdf

In developing III-V optical devices for use in optical fiber communication systems, digital-audio systems, and optical printers, reliability is paramount. Understanding the origins and causes of degradation is critical to successful design. This unique book focuses specifically on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing better understand the mechanism of degradation and details the major degradation modes of optical devices fabricated from three different systems. The book explains the character of defects and imperfections induced during material growth and fabrication, presents techniques for failure analysis, and describes methods for elimination of defect-generating mechanisms. More than 200 illustrations and 40 equations help clarify important concepts.

Author : Ding-Geng (Din) Chen,Yuhlong Lio,Hon Keung Tony Ng,Tzong-Ru Tsai
Publisher : Springer
Page : 376 pages
File Size : 50,9 Mb
Release : 2017-08-31
Category : Mathematics
ISBN : 9789811051944

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Statistical Modeling for Degradation Data by Ding-Geng (Din) Chen,Yuhlong Lio,Hon Keung Tony Ng,Tzong-Ru Tsai Pdf

This book focuses on the statistical aspects of the analysis of degradation data. In recent years, degradation data analysis has come to play an increasingly important role in different disciplines such as reliability, public health sciences, and finance. For example, information on products’ reliability can be obtained by analyzing degradation data. In addition, statistical modeling and inference techniques have been developed on the basis of different degradation measures. The book brings together experts engaged in statistical modeling and inference, presenting and discussing important recent advances in degradation data analysis and related applications. The topics covered are timely and have considerable potential to impact both statistics and reliability engineering.

Author : M.S. Nikulin,Nikolaos Limnios,N. Balakrishnan,Waltraud Kahle,Catherine Huber-Carol
Publisher : Springer Science & Business Media
Page : 436 pages
File Size : 46,9 Mb
Release : 2010-07-08
Category : Mathematics
ISBN : 9780817649241

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Advances in Degradation Modeling by M.S. Nikulin,Nikolaos Limnios,N. Balakrishnan,Waltraud Kahle,Catherine Huber-Carol Pdf

This volume is a collection of invited chapters covering recent advances in accelerated life testing and degradation models. The book covers a wide range of applications to areas such as reliability, quality control, the health sciences, economics and finance. It is an excellent reference for researchers and practitioners in applied probability and statistics, industrial statistics, the health sciences, quality control, economics, and finance.

Author : Milton Ohring,Lucian Kasprzak
Publisher : Academic Press
Page : 758 pages
File Size : 50,9 Mb
Release : 2014-11-03
Category : Technology & Engineering
ISBN : 9780080575520

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Reliability and Failure of Electronic Materials and Devices by Milton Ohring,Lucian Kasprzak Pdf

Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites

Author : Waltraud Kahle,Sophie Mercier,Christian Paroissin
Publisher : John Wiley & Sons
Page : 238 pages
File Size : 46,5 Mb
Release : 2016-06-13
Category : Mathematics
ISBN : 9781848218888

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Degradation Processes in Reliability by Waltraud Kahle,Sophie Mercier,Christian Paroissin Pdf

"Degradation process" refers to many types of reliability models, which correspond to various kinds of stochastic processes used for deterioration modeling. This book focuses on the case of a univariate degradation model with a continuous set of possible outcomes. The envisioned univariate models have one single measurable quantity which is assumed to be observed over time. The first three chapters are each devoted to one degradation model. The last chapter illustrates the use of the previously described degradation models on some real data sets. For each of the degradation models, the authors provide probabilistic results and explore simulation tools for sample paths generation. Various estimation procedures are also developed.

Author : Mitsuo Fukuda
Publisher : Artech House on Demand
Page : 343 pages
File Size : 51,9 Mb
Release : 1991-01-01
Category : Technology & Engineering
ISBN : 0890064652

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Reliability and Degradation of Semiconductor Lasers and LEDs by Mitsuo Fukuda Pdf

This comparative tutorial describes the reasons behind device failures and provides practical information on what can be done to minimize failure-prone designs and enhance device reliability. The text demonstrates how, with such advantages as smaller size, low-cost and simple operation, LEDs are well suited for a wide range of applications - especially in the field of optical fibre communication. This book should prove of interest to engineers and scientists in research, design, manufacturing and development of semiconductor lasers, LEDs and optical transmission systems.

Author : Alec Feinberg
Publisher : John Wiley & Sons
Page : 262 pages
File Size : 52,6 Mb
Release : 2016-10-17
Category : Technology & Engineering
ISBN : 9781119276227

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Thermodynamic Degradation Science by Alec Feinberg Pdf

Thermodynamic degradation science is a new and exciting discipline. This book merges the science of physics of failure with thermodynamics and shows how degradation modeling is improved and enhanced when using thermodynamic principles. The author also goes beyond the traditional physics of failure methods and highlights the importance of having new tools such as “Mesoscopic” noise degradation measurements for prognostics of complex systems, and a conjugate work approach to solving physics of failure problems with accelerated testing applications. Key features: • Demonstrates how the thermodynamics energy approach uncovers key degradation models and their application to accelerated testing. • Demonstrates how thermodynamic degradation models accounts for cumulative stress environments, effect statistical reliability distributions, and are key for reliability test planning. • Provides coverage of the four types of Physics of Failure processes describing aging: Thermal Activation Processes, Forced Aging, Diffusion, and complex combinations of these. • Coverage of numerous key topics including: aging laws; Cumulative Accelerated Stress Test (CAST) Plans; cumulative entropy fatigue damage; reliability statistics and environmental degradation and pollution. Thermodynamic Degradation Science: Physics of Failure, Accelerated Testing, Fatigue and Reliability Applications is essential reading for reliability, cumulative fatigue, and physics of failure engineers as well as students on courses which include thermodynamic engineering and/or physics of failure coverage.

Author : U.S. Nuclear Regulatory Commission
Publisher : Unknown
Page : 950 pages
File Size : 51,6 Mb
Release : 1979
Category : Nuclear energy
ISBN : MSU:31293024257119

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Nuclear Regulatory Commission Issuances by U.S. Nuclear Regulatory Commission Pdf

Author : Sanya Mathura
Publisher : CRC Press
Page : 86 pages
File Size : 47,5 Mb
Release : 2020-12-30
Category : Technology & Engineering
ISBN : 9781000288551

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Lubrication Degradation Mechanisms by Sanya Mathura Pdf

In industry, owners, engineers and workers have struggled with lubricant degradation and its effects on their equipment. The purpose of Lubrication Degradation Mechanisms: A Complete Guide is to help personnel to understand the reasons behind the degradation of their lubricant, determine methods to identify the onset of degradation and reduce or eliminate lubricant degradation within their equipment. One of the most common forms of lubricant degradation is oxidation. However, this is not the only method by which a lubricant degrades. By understanding the differences between degradation patterns, personnel can employ specific tasks / tests to aid in their identification of the type of degradation and the factors responsible. The aim of this book is to educate facility personnel on the methods of degradation and ways in which it can be reduced or eliminated while keeping an eye on the cost of operation.

Author : J. W. McPherson
Publisher : Springer Science & Business Media
Page : 406 pages
File Size : 53,5 Mb
Release : 2013-06-03
Category : Technology & Engineering
ISBN : 9783319001227

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Reliability Physics and Engineering by J. W. McPherson Pdf

"Reliability Physics and Engineering" provides critically important information for designing and building reliable cost-effective products. The textbook contains numerous example problems with solutions. Included at the end of each chapter are exercise problems and answers. "Reliability Physics and Engineering" is a useful resource for students, engineers, and materials scientists.

Author : Massimo Vanzi,Laurent Bechou,Mitsuo Fukuda,Giovanna Mura
Publisher : Elsevier
Page : 270 pages
File Size : 49,5 Mb
Release : 2021-07-24
Category : Technology & Engineering
ISBN : 9780081010891

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Advanced Laser Diode Reliability by Massimo Vanzi,Laurent Bechou,Mitsuo Fukuda,Giovanna Mura Pdf

Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction. Talk about Natural continuity with the most widespread existing textbooks, published by Mitsuo Fukuda Present the extension to new failure mechanisms, new technologies, new application fields, new environments Introduce a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantities

Author : Mauricio Sánchez-Silva,Georgia-Ann Klutke
Publisher : Springer
Page : 355 pages
File Size : 44,5 Mb
Release : 2015-11-27
Category : Technology & Engineering
ISBN : 9783319209463

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Reliability and Life-Cycle Analysis of Deteriorating Systems by Mauricio Sánchez-Silva,Georgia-Ann Klutke Pdf

This book compiles and critically discusses modern engineering system degradation models and their impact on engineering decisions. In particular, the authors focus on modeling the uncertain nature of degradation considering both conceptual discussions and formal mathematical formulations. It also describes the basics concepts and the various modeling aspects of life-cycle analysis (LCA). It highlights the role of degradation in LCA and defines optimum design and operation parameters. Given the relationship between operational decisions and the performance of the system’s condition over time, maintenance models are also discussed. The concepts and models presented have applications in a large variety of engineering fields such as Civil, Environmental, Industrial, Electrical and Mechanical engineering. However, special emphasis is given to problems related to large infrastructure systems. The book is intended to be used both as a reference resource for researchers and practitioners and as an academic text for courses related to risk and reliability, infrastructure performance modeling and life-cycle assessment.