Scanning Probe Microscopies

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Scanning Probe Microscopy

Author : Bert Voigtländer
Publisher : Springer
Page : 375 pages
File Size : 42,6 Mb
Release : 2015-02-24
Category : Technology & Engineering
ISBN : 9783662452400

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Scanning Probe Microscopy by Bert Voigtländer Pdf

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

Scanning Probe Microscopes

Author : K. S. Birdi
Publisher : CRC Press
Page : 450 pages
File Size : 49,7 Mb
Release : 2003-02-26
Category : Science
ISBN : 9781135516338

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Scanning Probe Microscopes by K. S. Birdi Pdf

Scanning Probe Microscopes: Applications in Science and Technology explains, analyzes, and demonstrates the most widely used microscope in the family of microscopes -- the scanning probe microscope. Beginning with an introduction to the development of SPMs, the author introduces the basics of scanning tunneling and atomic force microscopes (STMs an

Scanning Probe Microscopy

Author : Sergei V. Kalinin,Alexei Gruverman
Publisher : Springer Science & Business Media
Page : 1002 pages
File Size : 45,6 Mb
Release : 2007-04-03
Category : Technology & Engineering
ISBN : 9780387286686

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Scanning Probe Microscopy by Sergei V. Kalinin,Alexei Gruverman Pdf

This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.

Scanning Probe Microscopy and Spectroscopy

Author : Roland Wiesendanger
Publisher : Cambridge University Press
Page : 664 pages
File Size : 46,5 Mb
Release : 1994-09-29
Category : Science
ISBN : 0521428475

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Scanning Probe Microscopy and Spectroscopy by Roland Wiesendanger Pdf

The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunnelling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, as are the applications of these techniques in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used.

Applied Scanning Probe Methods II

Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
Page : 456 pages
File Size : 47,8 Mb
Release : 2006-06-22
Category : Technology & Engineering
ISBN : 9783540274537

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Applied Scanning Probe Methods II by Bharat Bhushan,Harald Fuchs Pdf

The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.

Scanning Probe Microscopy

Author : Ernst Meyer,Hans Josef Hug,Roland Bennewitz
Publisher : Springer Science & Business Media
Page : 215 pages
File Size : 42,7 Mb
Release : 2013-03-14
Category : Science
ISBN : 9783662098011

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Scanning Probe Microscopy by Ernst Meyer,Hans Josef Hug,Roland Bennewitz Pdf

Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.

Procedures in Scanning Probe Microscopies

Author : Richard J. Colton
Publisher : Unknown
Page : 682 pages
File Size : 43,9 Mb
Release : 1998-08-21
Category : Medical
ISBN : STANFORD:36105023105674

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Procedures in Scanning Probe Microscopies by Richard J. Colton Pdf

Procedures in Scanning Probe Microscopies Edited by R J Colton, Naval Research Laboratory, Washington DC, USA A Engel, Biocenter, Basel University, Switzerland J Frommer, IBM Almaden Research Center, San Jose, CA, USA H E Gaub, Technical University, Munich, Germany A A Gewirth, University of Illinois, Urbana, IL, USA R Guckenberger, Max-Planck-Institute for Biochemistry, Martinsried, Germany W Heckl, Ludwig Maximillians University, Munich, Germany B Parkinson, Colorado State University, Fort Collins, CO, USA J Rabe, Humboldt University, Berlin, Germany Scanning Probe Microscopies (SPM) are revolutionising scientific discovery in diverse disciplines including organic, inorganic and physical chemistry, polymer and materials science, biological and medical systems, electrochemistry and nanotechnology. In this collection of protocols, Procedures in Scanning Probe Microscopies will enable you to: * Build confidence in using SPM * Maximise the potential of your SPM instrumentation * Extend your skill levels The only applications-orientated guide, Procedures in Scanning Probe Microscopies covers scanning tunnelling microscopy, atomic force microscopy and electrochemical methods.

Acoustic Scanning Probe Microscopy

Author : Francesco Marinello,Daniele Passeri,Enrico Savio
Publisher : Springer Science & Business Media
Page : 513 pages
File Size : 40,5 Mb
Release : 2012-10-04
Category : Science
ISBN : 9783642274947

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Acoustic Scanning Probe Microscopy by Francesco Marinello,Daniele Passeri,Enrico Savio Pdf

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.

Bringing Scanning Probe Microscopy up to Speed

Author : Stephen C. Minne,Scott R. Manalis,Calvin F. Quate
Publisher : Springer Science & Business Media
Page : 169 pages
File Size : 46,9 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461551676

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Bringing Scanning Probe Microscopy up to Speed by Stephen C. Minne,Scott R. Manalis,Calvin F. Quate Pdf

Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. The authors include useful information on the characteristics and limitations of current state-of-the-art machines as well as the properties of the systems that will follow in the future. The basic approach is two-fold. First, fast scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented. The key components of the SPM are the mechanical microcantilever with integrated tip and the systems used to measure its deflection. In essence, the entire apparatus is devoted to moving the tip over a surface with a well-controlled force. The mechanical response of the actuator that governs the force is of the utmost importance since it determines the scanning speed. The mechanical response relates directly to the size of the actuator; smaller is faster. Traditional scanning probe microscopes rely on piezoelectric tubes of centimeter size to move the probe. In future scanning probe systems, the large actuators will be replaced with cantilevers where the actuators are integrated on the beam. These will be combined in arrays of multiple cantilevers with MEMS as the key technology for the fabrication process.

A Practical Guide to Scanning Probe Microscopy

Author : Rebecca Howland,Lisa Benatar
Publisher : Unknown
Page : 74 pages
File Size : 41,5 Mb
Release : 1998-06
Category : Electronic
ISBN : 0788171267

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A Practical Guide to Scanning Probe Microscopy by Rebecca Howland,Lisa Benatar Pdf

Provides basic information about scanning probe microscopes (SPMs), which are used in a wide variety of disciplines, including fundamental surface science, routine surface roughness analysis, & spectacular three-dimensional imaging -- from atoms of silicon to micron-sized protrusions on the surface of a living cell. Issues covered in this handbook range from fundamental physics of SPMs to their practical capabilities & instrumentation. Examples of applications are included throughout the text, & several application-specific articles are listed at the end of each chapter.

Exploring Scanning Probe Microscopy with MATHEMATICA

Author : Dror Sarid
Publisher : John Wiley & Sons
Page : 310 pages
File Size : 55,9 Mb
Release : 2007-02-27
Category : Science
ISBN : 9783527609871

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Exploring Scanning Probe Microscopy with MATHEMATICA by Dror Sarid Pdf

This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features applications, dealing with, among others, Kelvin and Raman probe microscopy. The self-contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The Mathematica code for all the examples is included in the CD-ROM, affording the freedom to change the values and parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs.

Atomic Force Microscopy/Scanning Tunneling Microscopy

Author : Samuel H. Cohen,M.T. Bray,Marcia L. Lightbody
Publisher : Springer Science & Business Media
Page : 468 pages
File Size : 40,5 Mb
Release : 1994
Category : Science
ISBN : 9780306448904

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Atomic Force Microscopy/Scanning Tunneling Microscopy by Samuel H. Cohen,M.T. Bray,Marcia L. Lightbody Pdf

Papers presented at the first US Army Natick Research, Development and Engineering Center Symposium on [title], held in Natick, Mass., June 1993. The various symposium topics included application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments including new probe microscopies. The procee.

Scanning Probe Microscopy in Nanoscience and Nanotechnology 2

Author : Bharat Bhushan
Publisher : Springer Science & Business Media
Page : 823 pages
File Size : 42,7 Mb
Release : 2010-12-17
Category : Technology & Engineering
ISBN : 9783642104978

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Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 by Bharat Bhushan Pdf

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Scanning Probe Microscopy¿in Industrial Applications

Author : Dalia G. Yablon
Publisher : John Wiley & Sons
Page : 337 pages
File Size : 49,6 Mb
Release : 2013-10-24
Category : Technology & Engineering
ISBN : 9781118723043

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Scanning Probe Microscopy¿in Industrial Applications by Dalia G. Yablon Pdf

Describes new state-of-the-science tools and their contribution to industrial R&D With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R&D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others. Scanning Probe Microscopy in Industrial Applications emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview of nanomechanical characterization methods, offering a complete practical tutorial for readers who are new to the topic. Several chapters include worked examples of useful calculations such as using Hertz mechanics with and without adhesion to model a contact, step-by-step instructions for simulations to guide cantilever selection for an experiment, and data analysis procedures for dynamic contact experiments. The second half of the book describes applications of nanomechanical characterization in industry, including: New formulation development for pharmaceuticals Measurement of critical dimensions and thin dielectric films in the semiconductor industry Effect of humidity and temperature on biomaterials Characterization of polymer blends to guide product formulation in the chemicals sector Unraveling links between food structure and function in the food industry Contributions are based on the authors' thorough review of the current literature as well as their own firsthand experience applying scanning probe microscopy to solve industrial R&D problems. By explaining the fundamentals before advancing to applications, Scanning Probe Microscopy in Industrial Applications offers a complete treatise that is accessible to both novices and professionals. All readers will discover how to apply scanning probe microscopy to build and enhance their R&D efforts.

Scanning Probe Microscopy and Spectroscopy

Author : Dawn Bonnell
Publisher : John Wiley & Sons
Page : 520 pages
File Size : 53,8 Mb
Release : 2000-12-05
Category : Science
ISBN : 9780471248248

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Scanning Probe Microscopy and Spectroscopy by Dawn Bonnell Pdf

A practical introduction to basic theory and contemporary applications across a wide range of research disciplines Over the past two decades, scanning probe microscopies and spectroscopies have gained acceptance as indispensable characterization tools for an array of disciplines. This book provides novices and experienced researchers with a highly accessible treatment of basic theory, alongside detailed examples of current applications of both scanning tunneling and force microscopies and spectroscopies. Like its popular predecessor, Scanning Probe Microscopy and Spectroscopy, Second Edition features contributions from distinguished scientists working in a wide range of specialties at university, commercial, and government research labs around the world. Chapters have been edited for clarity, conciseness, and uniformity of presentation to provide professionals with a concise working reference to scanning probe microscopic and spectroscopic principles, techniques, and practices. This Second Edition has been substantially revised and expanded to reflect important advances and new applications. In addition to numerous examples, the Second Edition features expanded coverage of electrostatic and magnetic force microscopies, near-field optical microscopies, and new applications of buried interfaces in nanomechanics, electrochemistry, and biology. Scanning Probe Microscopy and Spectroscopy, Second Edition is an indispensable working resource for surface scientists, microscopists, and spectroscopists in materials science, chemistry, engineering, biochemistry, physics, and the life sciences. It is also an unparalleled reference text for advanced undergraduates and graduate students in those fields.