Scanning Probe Microscopy Characterization Nanofabrication And Device Application Of Functional Materials

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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

Paula M. Vilarinho,Yossi Rosenwaks,Angus Kingon
Scanning Probe Microscopy Characterization Nanofabrication and Device Application of Functional Materials Book PDF

Author : Paula M. Vilarinho,Yossi Rosenwaks,Angus Kingon
Publisher : Springer Science & Business Media
Page : 503 pages
File Size : 44,8 Mb
Release : 2006-06-15
Category : Science
ISBN : 9781402030192

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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials by Paula M. Vilarinho,Yossi Rosenwaks,Angus Kingon Pdf

As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.

Scanning Probe Microscopy of Functional Materials

Sergei V. Kalinin,Alexei Gruverman
Scanning Probe Microscopy of Functional Materials Book PDF

Author : Sergei V. Kalinin,Alexei Gruverman
Publisher : Springer Science & Business Media
Page : 563 pages
File Size : 46,8 Mb
Release : 2010-12-13
Category : Technology & Engineering
ISBN : 9781441971678

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Scanning Probe Microscopy of Functional Materials by Sergei V. Kalinin,Alexei Gruverman Pdf

The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.

Scanning Probe Microscopy of Functional Materials

Sergei V Kalinin,Alexei Gruverman
Scanning Probe Microscopy of Functional Materials Book PDF

Author : Sergei V Kalinin,Alexei Gruverman
Publisher : Springer
Page : 576 pages
File Size : 52,9 Mb
Release : 2016-04-01
Category : Electronic
ISBN : 1493939475

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Scanning Probe Microscopy of Functional Materials by Sergei V Kalinin,Alexei Gruverman Pdf

Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to characterize a wide range of functional materials, including complex oxides, biopolymers, and semiconductors.

Scanning Probe Microscopy of Functional Materials

Sergei V. Kalinin,Alexei Gruverman
Scanning Probe Microscopy of Functional Materials Book PDF

Author : Sergei V. Kalinin,Alexei Gruverman
Publisher : Springer
Page : 555 pages
File Size : 49,7 Mb
Release : 2010-12-10
Category : Technology & Engineering
ISBN : 144196567X

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Scanning Probe Microscopy of Functional Materials by Sergei V. Kalinin,Alexei Gruverman Pdf

The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.

Scanning Probe Microscopy

Sergei V. Kalinin,Alexei Gruverman
Scanning Probe Microscopy Book PDF

Author : Sergei V. Kalinin,Alexei Gruverman
Publisher : Springer Science & Business Media
Page : 1002 pages
File Size : 50,8 Mb
Release : 2007-04-03
Category : Technology & Engineering
ISBN : 9780387286686

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Scanning Probe Microscopy by Sergei V. Kalinin,Alexei Gruverman Pdf

This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.

Scanning Probe Microscopy in Nanoscience and Nanotechnology 2

Bharat Bhushan
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 Book PDF

Author : Bharat Bhushan
Publisher : Springer Science & Business Media
Page : 816 pages
File Size : 45,6 Mb
Release : 2010-12-17
Category : Technology & Engineering
ISBN : 9783642104978

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Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 by Bharat Bhushan Pdf

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Nanofabrication

Ampere A. Tseng
Nanofabrication Book PDF

Author : Ampere A. Tseng
Publisher : World Scientific
Page : 583 pages
File Size : 48,9 Mb
Release : 2008
Category : Technology & Engineering
ISBN : 9789812790897

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Nanofabrication by Ampere A. Tseng Pdf

Many of the devices and systems used in modern industry are becoming progressively smaller and have reached the nanoscale domain. Nanofabrication aims at building nanoscale structures, which can act as components, devices, or systems, in large quantities at potentially low cost. Nanofabrication is vital to all nanotechnology fields, especially for the realization of nanotechnology that involves the traditional areas across engineering and science. This is the first book solely dedicated to the manufacturing technology in nanoscale structures, devices, and systems and is designed to satisfy the growing demands of researchers, professionals, and graduate students. Both conventional and non-conventional fabrication technologies are introduced with emphasis on multidisciplinary principles, methodologies, and practical applications. While conventional technologies consider the emerging techniques developed for next generation lithography, non-conventional techniques include scanning probe microscopy lithography, self-assembly, and imprint lithography, as well as techniques specifically developed for making carbon tubes and molecular circuits and devices. Sample Chapter(s). Chapter 1: Atom, Molecule, and Nanocluster Manipulations for Nanostructure Fabrication Using Scanning Probe Microscopy (3,320 KB). Contents: Atomic Force Microscope Lithography (N Kawasegi et al.); Nanowire Assembly and Integration (Z Gu & D H Gracias); Extreme Ultraviolet Lithography (H Kinoshita); Electron Projection Lithography (T Miura et al.); Electron Beam Direct Writing (K Yamazaki); Electron Beam Induced Deposition (K Mitsuishi); Focused Ion Beams and Interaction with Solids (T Ishitani et al.); Nanofabrication of Nanoelectromechanical Systems (NEMS): Emerging Techniques (K L Ekinci & J Brugger); and other papers. Readership: Researchers, professionals, and graduate students in the fields of nanoengineering and nanoscience.

Scanning Probe Microscopy for Energy Research

Dawn A Bonnell,Sergei V Kalinin
Scanning Probe Microscopy for Energy Research Book PDF

Author : Dawn A Bonnell,Sergei V Kalinin
Publisher : World Scientific
Page : 640 pages
File Size : 43,8 Mb
Release : 2013-03-26
Category : Science
ISBN : 9789814434720

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Scanning Probe Microscopy for Energy Research by Dawn A Bonnell,Sergei V Kalinin Pdf

Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field. Contents:Introduction:Local Probes in the Next Decade of Energy Research: Bridging Macroscopic and Atomic Worlds (D A Bonnell and S V Kalinin)Scanning Probes for Energy Harvesting Systems: Photovoltaics and Solar Cells:Electrical Scanning Probe Microscopy on Solar Cell Materials (R Giridharagopal, G E Rayermann and D S Ginger)Organic Solar Cell Materials and Devices Characterized by Conductive and Photoconductive Atomic Force Microscopy (X-D Dang, M Guide and T-Q Nguyen)Kelvin Probe Force Microscopy for Solar Cell Applications (T Glatzel)Reversible Rectification in Sub-Monolayer Molecular P-N Junctions: Towards Nanoscale Photovoltaic Studies (J A Smerdon, N C Giebink and J R Guest)Study of Photoinduced Charges with Atomic Force Microscopy (M Dokukin, N Guz and I Sokolov)Imaging of Nanoscale Photogenerated Charge Transport in Organic Photovoltaic Materials (B Hamadani, P M Haney and N B Zhitenev)Photoassisted Kelvin Probe Force Microscopy for Characterization of Solar Cell Materials (T Takahashi)Scanning Probes for Fuel Cells and Local Electrochemistry:Electrochemical Strain Microscopy of Oxygen-Ion Conductors: Fuel Cells and Oxide Electronics (A Kumar, S Jesse, S V Kalinin, F Ciucci and A Morozovska)Ion Dynamics in Nanoscopic Subvolumes of Solid Electrolytes Analysed by Electrostatic Force Spectroscopy (A Schirmeisen and B Roling)Nanoscale Electrochemistry in Energy Related Systems Using Atomic Force Microscopy (W Lee, M H Lee, R P O'Hayre and F B Prinz)Scanning Probe Microscopy of Fuel Cell Materials Under Realistic Operating Conditions (S S Nonnenmann and D A Bonnell)Scanning Probe Microscopy of Energy Storage Materials and Devices:In situ SPM Analysis of Interfacial Phenomena in Lithium-Ion Batteries (M Inaba, S-K Jeong and Z Ogumi)Conducting-Probe Atomic Force Microscopy of Electrochemical Interfaces (P A Veneman and K J Stevenson)Electrochemical Strain Microscopy of Li-ion and Li-air Battery Materials (T M Arruda, N Balke, S Jesse and S V Kalinin)Emerging Scanning Probe Techniques:High Sensitivity Scanning Impedance Microscopy and Spectroscopy (S S Nonnenmann, X Chen and D A Bonnell)Scanning Microwave Microscopy: Advances in Quantitative Capacitance and Carrier Density Measurements at the Nanometer Scale (S Wu, F Kienberger and H Tanbakuchi)Mapping Electrochemistry at the Micro and Nanoscales with Scanning Ion Conductance Microscopy (C Laslau, D E Williams and J Travas-Sejdic)Force Microscopy, Nanochemistry and Nanofabrication (R Garcia, M Chiesa and Y K Ryu)Studying the Mechanism of Piezoelectric Nanogenerators (J Song and Z L Wang) Readership: Students, professionals and researchers in materials science, nanomaterials and new materials. Keywords:Energy Materials;Scanning Probe Microscopy;Fuel Cells;Photovoltaics;Batteries;Solar CellsKey Features:A first broad overview of SPM for energy materials and devicesWritten by world leaders in scanning probe microscopyContains both applications of established SPM techniques as well as overview of novel emergent methods and addresses applications in all major arenas of energy: alternative energy generation, energy harvesting, and storage

Scanning Probe Microscopy in Nanoscience and Nanotechnology 3

Bharat Bhushan
Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 Book PDF

Author : Bharat Bhushan
Publisher : Springer Science & Business Media
Page : 630 pages
File Size : 51,6 Mb
Release : 2012-10-24
Category : Science
ISBN : 9783642254147

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Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 by Bharat Bhushan Pdf

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Scanning Probe Microscopy

Vijay Nalladega
Scanning Probe Microscopy Book PDF

Author : Vijay Nalladega
Publisher : BoD – Books on Demand
Page : 258 pages
File Size : 44,5 Mb
Release : 2012-04-27
Category : Science
ISBN : 9789535105763

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Scanning Probe Microscopy by Vijay Nalladega Pdf

Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film structures, oxide thin layers and superconducting structures, novel scanning probe microscopy techniques for characterization of mechanical and electrical properties, evaluation of mechanical and tribological properties of hybrid coatings and thin films. The variety of topics chosen for the book underlines the strong interdisciplinary nature of the research work in the field of scanning probe microscopy.

Kelvin Probe Force Microscopy

Sascha Sadewasser,Thilo Glatzel
Kelvin Probe Force Microscopy Book PDF

Author : Sascha Sadewasser,Thilo Glatzel
Publisher : Springer
Page : 521 pages
File Size : 55,8 Mb
Release : 2018-03-09
Category : Science
ISBN : 9783319756875

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Kelvin Probe Force Microscopy by Sascha Sadewasser,Thilo Glatzel Pdf

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.

Scanning Microscopy for Nanotechnology

Weilie Zhou,Zhong Lin Wang
Scanning Microscopy for Nanotechnology Book PDF

Author : Weilie Zhou,Zhong Lin Wang
Publisher : Springer Science & Business Media
Page : 533 pages
File Size : 54,6 Mb
Release : 2007-03-09
Category : Technology & Engineering
ISBN : 9780387396200

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Scanning Microscopy for Nanotechnology by Weilie Zhou,Zhong Lin Wang Pdf

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

Applied Scanning Probe Methods XIII

Bharat Bhushan,Harald Fuchs
Applied Scanning Probe Methods XIII Book PDF

Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
Page : 238 pages
File Size : 54,7 Mb
Release : 2008-10-29
Category : Technology & Engineering
ISBN : 9783540850496

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Applied Scanning Probe Methods XIII by Bharat Bhushan,Harald Fuchs Pdf

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Scanning Probe Microscopy¿in Industrial Applications

Dalia G. Yablon
Scanning Probe Microscopy in Industrial Applications Book PDF

Author : Dalia G. Yablon
Publisher : John Wiley & Sons
Page : 337 pages
File Size : 50,9 Mb
Release : 2013-10-24
Category : Technology & Engineering
ISBN : 9781118723043

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Scanning Probe Microscopy¿in Industrial Applications by Dalia G. Yablon Pdf

Describes new state-of-the-science tools and their contribution to industrial R&D With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R&D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others. Scanning Probe Microscopy in Industrial Applications emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview of nanomechanical characterization methods, offering a complete practical tutorial for readers who are new to the topic. Several chapters include worked examples of useful calculations such as using Hertz mechanics with and without adhesion to model a contact, step-by-step instructions for simulations to guide cantilever selection for an experiment, and data analysis procedures for dynamic contact experiments. The second half of the book describes applications of nanomechanical characterization in industry, including: New formulation development for pharmaceuticals Measurement of critical dimensions and thin dielectric films in the semiconductor industry Effect of humidity and temperature on biomaterials Characterization of polymer blends to guide product formulation in the chemicals sector Unraveling links between food structure and function in the food industry Contributions are based on the authors' thorough review of the current literature as well as their own firsthand experience applying scanning probe microscopy to solve industrial R&D problems. By explaining the fundamentals before advancing to applications, Scanning Probe Microscopy in Industrial Applications offers a complete treatise that is accessible to both novices and professionals. All readers will discover how to apply scanning probe microscopy to build and enhance their R&D efforts.

Scanning Probe Microscopy in Nanoscience and Nanotechnology

Bharat Bhushan
Scanning Probe Microscopy in Nanoscience and Nanotechnology Book PDF

Author : Bharat Bhushan
Publisher : Unknown
Page : 988 pages
File Size : 42,6 Mb
Release : 2016-04-01
Category : Electronic
ISBN : 3662502208

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Scanning Probe Microscopy in Nanoscience and Nanotechnology by Bharat Bhushan Pdf

This book presents the physical and technical foundation of the state-of-the-art in applied scanning probe techniques. It constitutes a comprehensive overview of SPM applications. The chapters are written by leading researchers and application scientists.