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Structure And Electronic Properties Of Ultrathin Dielectric Films On Silicon And Related Structures Book in PDF, ePub and Kindle version is available to download in english. Read online anytime anywhere directly from your device. Click on the download button below to get a free pdf file of Structure And Electronic Properties Of Ultrathin Dielectric Films On Silicon And Related Structures book. This book definitely worth reading, it is an incredibly well-written.
Author : Anonim
Publisher : Unknown
Page : 386 pages
File Size : 47,5 Mb
Release : 1999
Category : Dielectric films
ISBN : OCLC:319204694
Author : D. A. Buchanan
Publisher : Mrs Proceedings
Page : 408 pages
File Size : 47,6 Mb
Release : 2000-10-17
Category : Technology & Engineering
ISBN : UOM:39015050054850
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. The book, first published in 2000, includes detailed theoretical studies of the nature of SiO2 and its interface with silicon, electron paramagnetic resonance for the study of defects, electron tunneling, and band alignment among others.
Author : Ram Ekwal Sah
Publisher : The Electrochemical Society
Page : 606 pages
File Size : 53,9 Mb
Release : 2005
Category : Nature
ISBN : 1566774594
Author : Fred Roozeboom
Publisher : The Electrochemical Society
Page : 482 pages
File Size : 43,5 Mb
Release : 2000
Category : Technology & Engineering
ISBN : 1566772745
The proceedings from this May 2000 symposium illustrate the range of applications in Rapid Thermal Processing (RTP). The refereed papers cover a variety of issues, such as ultra-shallow junctions; contacts for nanoscale CMOS; gate stacks; new applications of RTP, such as for the enhanced crystalization of amorphous silicon thin films; and advances on RTP systems and process monitoring, including optimizing and controlling gas flows in an RTCVD reactor. Most presentations are supported by charts and other graphical data. c. Book News Inc.
Author : Shigemi Terakawa
Publisher : Springer Nature
Page : 83 pages
File Size : 40,7 Mb
Release : 2022-11-07
Category : Technology & Engineering
ISBN : 9789811968723
This book reports the establishment of a single-atomic layer metal of In and a novel (In, Mg) ultrathin film on Si(111) surfaces. A double-layer phase of In called “rect” has been extensively investigated as a two-dimensional metal. Another crystalline phase called “hex” was also suggested, but it had not been established due to difficulty in preparing the sample. The author succeeded in growing the large and high-quality sample of the hex phase and revealed that it is a single-layer metal. The author also established a new triple-atomic layer (In, Mg) film with a nearly freestanding character by Mg deposition onto the In double layer. This work proposes a novel method to decouple ultrathin metal films from Si dangling bonds. The present study demonstrates interesting properties of indium itself, which is a p-block metal both with metallicity and covalency. In this book, readers also see principles of various surface analysis techniques and learn how to use them and analyze the results in the real systems. This book is useful to researchers and students interested in surface science, particularly ultrathin metal films on semiconductor surfaces.
Author : David J Dumin
Publisher : World Scientific
Page : 281 pages
File Size : 52,9 Mb
Release : 2002-01-18
Category : Technology & Engineering
ISBN : 9789814489454
This book presents in summary the state of our knowledge of oxide reliability. The articles have been written by experts who are among the most knowledgeable in the field. The book will be an invaluable aid to reliability engineers and manufacturing engineers, helping them to produce and characterize reliable oxides. It can be used as an introduction for new engineers interested in oxide reliability, besides being a reference for engineers already engaged in the field.
Author : Eric Garfunkel,Evgeni Gusev,Alexander Vul'
Publisher : Springer Science & Business Media
Page : 503 pages
File Size : 45,9 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9789401150088
An extrapolation of ULSI scaling trends indicates that minimum feature sizes below 0.1 mu and gate thicknesses of Audience: Both expert scientists and engineers who wish to keep up with cutting edge research, and new students who wish to learn more about the exciting basic research issues relevant to next-generation device technology.
Author : Mikhail Baklanov,Karen Maex,Martin Green
Publisher : John Wiley & Sons
Page : 508 pages
File Size : 52,9 Mb
Release : 2007-04-04
Category : Technology & Engineering
ISBN : 9780470065419
The topic of thin films is an area of increasing importance in materials science, electrical engineering and applied solid state physics; with both research and industrial applications in microelectronics, computer manufacturing, and physical devices. Advanced, high-performance computers, high-definition TV, broadband imaging systems, flat-panel displays, robotic systems, and medical electronics and diagnostics are a few examples of the miniaturized device technologies that depend on the utilization of thin film materials. This book presents an in-depth overview of the novel developments made by the scientific leaders in the area of modern dielectric films for advanced microelectronic applications. It contains clear, concise explanations of material science of dielectric films and their problem for device operation, including high-k, low-k, medium-k dielectric films and also specific features and requirements for dielectric films used in the packaging technology. A broad range of related topics are covered, from physical principles to design, fabrication, characterization, and applications of novel dielectric films.
Author : Anthony C. Jones
Publisher : Unknown
Page : 336 pages
File Size : 54,9 Mb
Release : 2000-08-04
Category : Crafts & Hobbies
ISBN : UOM:39015043254906
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author : David G. Seiler
Publisher : American Institute of Physics
Page : 868 pages
File Size : 40,9 Mb
Release : 2003-10-08
Category : Computers
ISBN : UOM:39015052982736
The worldwide semiconductor community faces increasingly difficult challenges as it moves into the manufacturing of chips with feature sizes approaching 100 nm and beyond. The magnitude of these challenges demands special attention from the metrology and analytical measurements community. New paradigms must be found. Adequate research and development for new metrology concepts are urgently needed. Topics include: integrated circuit history, challenges and overviews, front end, lithography, interconnect and back end, and critical analytical techniques. Characterization and metrology are key enablers for developing new semiconductor technology and in improving manufacturing. This book summarizes major issues and gives critical reviews of important measurement techniques that are crucial to continue the advances in semiconductor technology. It covers major aspects of process technology and most characterization techniques for silicon research, including development, manufacturing, and diagnostics. The editors believe that this book of collected papers provides a concise and effective portrayal of industry characterization needs and the way they are being addressed by industry, academia, and government to continue the dramatic progress in semiconductor technology. Hopefully, it will also provide a basis for stimulating advances in metrology and new ideas for research and development.
Author : Anonim
Publisher : Unknown
Page : 128 pages
File Size : 54,8 Mb
Release : 2000
Category : Amorphous semiconductors
ISBN : UVA:X004522626
Author : Robert W. Collins
Publisher : Unknown
Page : 1118 pages
File Size : 47,6 Mb
Release : 2001-04-10
Category : Science
ISBN : UOM:39015053754142
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author : Materials Research Society. Fall Meeting
Publisher : Unknown
Page : 200 pages
File Size : 40,7 Mb
Release : 2001-03-29
Category : Computers
ISBN : UOM:39015050475063
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author : Richard Vinci,Richard Paul Vinci
Publisher : Mrs Proceedings
Page : 576 pages
File Size : 54,8 Mb
Release : 2000-09-25
Category : Science
ISBN : UCSD:31822028476570
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author : Hisham Z. Massoud,Edward H. Poindexter,C. Robert Helms
Publisher : Unknown
Page : 804 pages
File Size : 46,6 Mb
Release : 1996
Category : Science
ISBN : UOM:39015047064400