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Author : United States. National Aeronautics and Space Administration. Technology Utilization Office
Publisher : Unknown
Page : 38 pages
File Size : 40,7 Mb
Release : 1972
Category : Electric testing
ISBN : STANFORD:36105024713682
Author : United States. National Aeronautics and Space Administration. Technology Utilization Office
Publisher : Unknown
Page : 40 pages
File Size : 44,7 Mb
Release : 1972
Category : Electric apparatus and appliances
ISBN : UIUC:30112008171719
Author : Dimitris Gizopoulos
Publisher : Springer Science & Business Media
Page : 431 pages
File Size : 44,9 Mb
Release : 2006-01-22
Category : Technology & Engineering
ISBN : 9780387294094
This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.
Author : Eugene R. Bartlett
Publisher : McGraw-Hill Companies
Page : 328 pages
File Size : 43,5 Mb
Release : 1992
Category : Technology & Engineering
ISBN : UOM:39015025274955
Author : United States. Superintendent of Documents
Publisher : Unknown
Page : 1194 pages
File Size : 45,6 Mb
Release : 1972
Category : Government publications
ISBN : UCAL:B2968747
February issue includes Appendix entitled Directory of United States Government periodicals and subscription publications; September issue includes List of depository libraries; June and December issues include semiannual index.
Author : Geoffrey W. A. Dummer,Norman B. Griffin
Publisher : Elsevier
Page : 473 pages
File Size : 45,6 Mb
Release : 2013-10-22
Category : Technology & Engineering
ISBN : 9781483135915
Environmental Testing Techniques for Electronics and Materials reviews environmental testing techniques for evaluating the performance of electronic equipment, components, and materials. Environmental test planning, test methods, and instrumentation are described, along with the general environmental conditions under which equipment must operate. This book is comprised of 15 chapters and begins by explaining why environmental testing is necessary and describing the environment in which electronics must operate. The next chapter considers how an environmental test plan is designed; the methods for the environmental testing of components and materials; instrumentation and control of test chambers; shock and vibration test instrumentation; and requirements for specification writing. The reader is then introduced to factors that might affect the reliability of equipment, including high humidity environment; galvanic corrosion problems; high- and low-temperature environments; mechanical and associated hazards; transport hazards; and long-term storage. Problems posed by high altitude and space environments, nuclear radiation, and acoustic noise are also discussed. The final chapter is devoted to environmental protection techniques and looks at the effects of climatic environments on radio interference as well as the effects of the environment on the human operator. This monograph will be of value to materials scientists and electronics engineers as well as those engaged in the design, development, and production of professional and military equipment.
Author : Francis C. Wong
Publisher : Elsevier
Page : 248 pages
File Size : 50,9 Mb
Release : 2012-12-02
Category : Technology & Engineering
ISBN : 9780080504346
Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
Author : United States. Superintendent of Documents
Publisher : Unknown
Page : 1348 pages
File Size : 44,5 Mb
Release : 1970
Category : United States
ISBN : STANFORD:36105019598304
Author : John D. Lenk
Publisher : McGraw-Hill Companies
Page : 424 pages
File Size : 55,9 Mb
Release : 1994
Category : Technology & Engineering
ISBN : UOM:39015033137657
Author : Richard.F. Powell
Publisher : Taylor & Francis
Page : 233 pages
File Size : 40,8 Mb
Release : 2022-11-30
Category : Technology & Engineering
ISBN : 9781351411530
This book meets the vital need of providing one place where a comprehensive information on how to test more than one type of electronic component. The monograph gathers together data from scattered literature, including books, manufacturers' guides, instruction manuals, application notes and military and industry standards and provides a key information necessary to allow users to get started immediately on component testing and presents effective options for handling high-, low- and medium-volume testing.
Author : United States. National Aeronautics and Space Administration. Office of Reliability and Quality Assurance
Publisher : Unknown
Page : 602 pages
File Size : 40,9 Mb
Release : 1968
Category : Quality control
ISBN : STANFORD:36105015617363
Author : Ray Tricker,Samantha Tricker
Publisher : Newnes
Page : 416 pages
File Size : 44,7 Mb
Release : 1999-02-16
Category : Political Science
ISBN : 0750639024
Introduction; Ambient Temperature; Solar Radiation; Humidity; Air Pressure and Altitude; Weather and Precipitation; Pollutants and Contaminants, Flora & Fauna; Mechanical; Ergonomics; Electrical; General.
Author : Defense Documentation Center (U.S.)
Publisher : Unknown
Page : 88 pages
File Size : 45,5 Mb
Release : 1960
Category : Maintainability (Engineering)
ISBN : CHI:086496572
Author : Anonim
Publisher : Unknown
Page : 258 pages
File Size : 54,9 Mb
Release : 1978
Category : Aeronautics
ISBN : MINN:30000011060732
Author : https://www.chinesestandard.net
Publisher : https://www.chinesestandard.net
Page : 15 pages
File Size : 48,7 Mb
Release : 2014-05-11
Category : Computers
ISBN : 8210379456XXX
This Standard defines the technical requirements and test methods for the adaptability of the environment and mechanical stress for mobile telecommunication handsets. This Standard is applicable for mobile telecommunication handset and it is also the reference for other mobile telecommunication terminals in addition to the handset.