1995 4th International Conference On Solid State And Integrated Circuit Technology
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1995 4th International Conference on Solid-State and Integrated Circuit Technology by International Conference on Solid-State and Integrated Circuit Technology,IEEE Electron Devices Society Pdf
Silicon Optoelectronic Integrated Circuits by Horst Zimmermann Pdf
Explains the circuit design of silicon optoelectronic integrated circuits (OEICs), which are central to advances in wireless and wired telecommunications. The essential features of optical absorption are summarized, as is the device physics of photodetectors and their integration in modern bipolar, CMOS, and BiCMOS technologies. This information provides the basis for understanding the underlying mechanisms of the OEICs described in the main part of the book. In order to cover the topic comprehensively, Silicon Optoelectronic Integrated Circuits presents detailed descriptions of many OEICs for a wide variety of applications from various optical sensors, smart sensors, 3D-cameras, and optical storage systems (DVD) to fiber receivers in deep-sub-μm CMOS. Numerous detailed illustrations help to elucidate the material.
Author : Peter L. F. Hemment Publisher : The Electrochemical Society Page : 458 pages File Size : 46,7 Mb Release : 1996 Category : Science ISBN : 1566771536
Compact Models and Performance Investigations for Subthreshold Interconnects by Rohit Dhiman,Rajeevan Chandel Pdf
The book provides a detailed analysis of issues related to sub-threshold interconnect performance from the perspective of analytical approach and design techniques. Particular emphasis is laid on the performance analysis of coupling noise and variability issues in sub-threshold domain to develop efficient compact models. The proposed analytical approach gives physical insight of the parameters affecting the transient behavior of coupled interconnects. Remedial design techniques are also suggested to mitigate the effect of coupling noise. The effects of wire width, spacing between the wires, wire length are thoroughly investigated. In addition, the effect of parameters like driver strength on peak coupling noise has also been analyzed. Process, voltage and temperature variations are prominent factors affecting sub-threshold design and have also been investigated. The process variability analysis has been carried out using parametric analysis, process corner analysis and Monte Carlo technique. The book also provides a qualitative summary of the work reported in the literature by various researchers in the design of digital sub-threshold circuits. This book should be of interest for researchers and graduate students with deeper insights into sub-threshold interconnect models in particular. In this sense, this book will best fit as a text book and/or a reference book for students who are initiated in the area of research and advanced courses in nanotechnology, interconnect design and modeling.
Reliability of Electronic Components by Titu I. Bajenescu,Marius I. Bazu Pdf
This application-oriented professional book explains why components fail, addressing the needs of engineers who apply reliability principles in design, manufacture, testing and field service. A detailed index, a glossary, acronym lists, reliability dictionaries and a rich specific bibliography complete the book.
Comprehensive Semiconductor Science and Technology by Anonim Pdf
Semiconductors are at the heart of modern living. Almost everything we do, be it work, travel, communication, or entertainment, all depend on some feature of semiconductor technology. Comprehensive Semiconductor Science and Technology, Six Volume Set captures the breadth of this important field, and presents it in a single source to the large audience who study, make, and exploit semiconductors. Previous attempts at this achievement have been abbreviated, and have omitted important topics. Written and Edited by a truly international team of experts, this work delivers an objective yet cohesive global review of the semiconductor world. The work is divided into three sections. The first section is concerned with the fundamental physics of semiconductors, showing how the electronic features and the lattice dynamics change drastically when systems vary from bulk to a low-dimensional structure and further to a nanometer size. Throughout this section there is an emphasis on the full understanding of the underlying physics. The second section deals largely with the transformation of the conceptual framework of solid state physics into devices and systems which require the growth of extremely high purity, nearly defect-free bulk and epitaxial materials. The last section is devoted to exploitation of the knowledge described in the previous sections to highlight the spectrum of devices we see all around us. Provides a comprehensive global picture of the semiconductor world Each of the work's three sections presents a complete description of one aspect of the whole Written and Edited by a truly international team of experts
Controlling Strategy by Christopher S. Chapman Pdf
Ideas about the role of management accounting systems in a firm's strategy have changed in recent years, and this book explores the ways in which this has happened. Management control systems have frequently been seen as irrelevant to strategy, or even damaging. Controlling Strategy draws out the various ways in which management control systems can build and sustain valuable strategic roles. The book explores topics such as: *Strategic measurement; *Strategic data analysis; *The Balanced Scorecard; *Capital budgeting; *Strategy coordination; Written as an introduction to the strategic role of management control systems Controlling Strategy provides a synthesis of important work in the fields of strategy and management accounting. Academics and Advanced Students of Accounting, Strategy, or Management Studies will find the book an indispensable guide to this area.
Technological Applications and Advancements in Service Science, Management, and Engineering by Galup, Stuart D. Pdf
Services play a central role in the economies of nations and in global commerce, and to some extent we are all in the field of service. Technological Applications and Advancements in Service Science, Management, and Engineering is a compendium of research that proves to be an indispensable resource for cutting-edge knowledge in service science understood as a broad research field that embodies all the aspects that relate to services, their planning, design, operation, evaluation, and improvement. Perfect for academic researchers and practicing professionals, this volume serves as a vehicle for the development of service science and how good services are devised and engineered to get the maximum value for their efforts.
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections by Cher Ming Tan,Wei Li,Zhenghao Gan,Yuejin Hou Pdf
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability. Over the past two decades the application of FEMs has become widespread and continues to lead to a much better understanding of reliability physics. To help readers cope with the increasing sophistication of FEMs’ applications to interconnect reliability, Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections will: introduce the principle of FEMs; review numerical modeling of ULSI interconnect reliability; describe the physical mechanism of ULSI interconnect reliability encountered in the electronics industry; and discuss in detail the use of FEMs to understand and improve ULSI interconnect reliability from both the physical and practical perspective, incorporating the Monte Carlo method. A full-scale review of the numerical modeling methodology used in the study of interconnect reliability highlights useful and noteworthy techniques that have been developed recently. Many illustrations are used throughout the book to improve the reader’s understanding of the methodology and its verification. Actual experimental results and micrographs on ULSI interconnects are also included. Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections is a good reference for researchers who are working on interconnect reliability modeling, as well as for those who want to know more about FEMs for reliability applications. It gives readers a thorough understanding of the applications of FEM to reliability modeling and an appreciation of the strengths and weaknesses of various numerical models for interconnect reliability.
Methodologies For The Conception, Design And Application Of Soft Computing - Proceedings Of The 5th International Conference On Soft Computing And Information/intelligent Systems (In 2 Volumes) by Gen Matsumoto,Takeshi Yamakawa Pdf
Soft computing is the common name for a certain form of natural information processing that has its original form in biology, especially in the function of human brain. It is a discipline rooted in a group of technologies such as fuzzy logic, neural networks, chaos, genetic algorithms, probabilistic reasoning and learning algorithms. Today, soft computing has become an acknowledged concept; however, for a long time, such components of soft computing have been debated and individually developed.Since its beginning in 1990, the series of IIZUKA conferences has covered various kinds of technologies that constitute soft computing. This series has played a pioneering role in promoting the development of a symbiotic relationship between the various technologies of soft computing.At IIZUKA'98, the 5th International Conference on Soft Computing and Information/Intelligent Systems, new developments and results in this field were introduced and discussed by researchers from academic, governmental and industrial institutions around the world.This volume presents the opening lecture by Prof. Walter J Freeman, the keynote speech by Dr Gen Matsumoto, the plenary lectures by 5 eminent researchers and about 230 carefully selected papers drawn from more than 25 countries. It documents current research and in-depth studies on the fundamental aspects of soft computing and their practical applications.
