Aberration Corrected Analytical Transmission Electron Microscopy

Author : Rik Brydson
Publisher : John Wiley & Sons
Page : 235 pages
File Size : 53,6 Mb
Release : 2011-08-02
Category : Science
ISBN : 9781119979906

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Aberration-Corrected Analytical Transmission Electron Microscopy by Rik Brydson Pdf

The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

Author : Rolf Erni
Publisher : World Scientific
Page : 348 pages
File Size : 54,9 Mb
Release : 2010
Category : Science
ISBN : 9781848165366

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Aberration-corrected Imaging in Transmission Electron Microscopy by Rolf Erni Pdf

This book provides a concise introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. As such, it addresses recent advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science. It covers two of the most popular atomic resolution imaging techniques' namely high-resolution transmission electron microscopy and scanning transmission electron microscopy. The book bridges the gap between application-oriented textbooks in conventional electron microscopy and books in physics covering dedicated topics in charged-particle optics and aberration correction. The book is structured in three parts which can be read separately. While in the first part the fundamentals of the imaging techniques and their limits in conventional electron microscopes are explained, the second part provides readers with the basic principles of electron optics and the characteristics of electron lenses. The third part, focusing on aberrations, describes the functionality of aberration correctors and provides readers with practical guidelines for the daily work with aberration-corrected electron microscopes. The book represents a detailed and easy readable guide to aberration-corrected electron microscopy.

Author : Stephen J. Pennycook,Peter D. Nellist
Publisher : Springer Science & Business Media
Page : 762 pages
File Size : 53,5 Mb
Release : 2011-03-24
Category : Technology & Engineering
ISBN : 9781441972002

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Scanning Transmission Electron Microscopy by Stephen J. Pennycook,Peter D. Nellist Pdf

Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Author : Rolf Erni
Publisher : World Scientific Publishing Company
Page : 432 pages
File Size : 55,9 Mb
Release : 2015-03-23
Category : Technology & Engineering
ISBN : 9781783265305

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Aberration-Corrected Imaging in Transmission Electron Microscopy by Rolf Erni Pdf

Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes and possible artefacts which are caused by the intrinsic lens aberrations that are unavoidable in such instruments. The second part introduces fundamental electron optical concepts and thus provides a brief introduction to electron optics. Based on the first and second parts of the book, the third part focuses on aberration correction; it describes the various aberrations in electron microscopy and introduces the concepts of spherical aberration correctors and advanced aberration correctors, including correctors for chromatic aberration. This part also provides guidelines on how to optimize the imaging conditions for atomic-resolution STEM and TEM imaging. This second edition has been completely revised and updated in order to incorporate the very recent technological and scientific achievements that have been realized since the first edition appeared in 2010.

Author : Anonim
Publisher : Academic Press
Page : 590 pages
File Size : 52,9 Mb
Release : 2009-06-12
Category : Technology & Engineering
ISBN : 0080880355

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Advances in Imaging and Electron Physics by Anonim Pdf

The invention of the electron microscope more than 70 years ago made it possible to visualize a new world, far smaller than anything that could be seen with the traditional microscope. The biologist could study viruses and the components of cells, the materials scientist could study the structure of metals and alloys and many other substances, and especially their defects. But even the electron microscope had limits, and truly atomic structure was still too small to be observed directly. The so-called "limit of resolution" of the microscope was well understood, but attempts to use the necessary correctors were unsuccessful until the late 1990s. Such correctors now equip many microscopes in Europe, the USA and Japan and the results are extremely impressive. Moreover, microscopists feel that they are only at the beginning of a new era of subatomic microscopic imaging. In the present volume, we have brought together the principal contributors, instrument designers and microscopists to discuss this topic in depth. * First book on the subject of correctors * Well known contributors from academia and microscope manufacturers * Provides an ideal starting point for preparing funding proposals

Author : Ludwig Reimer,Helmut Kohl
Publisher : Springer
Page : 602 pages
File Size : 45,7 Mb
Release : 2008-12-15
Category : Science
ISBN : 9780387347585

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Transmission Electron Microscopy by Ludwig Reimer,Helmut Kohl Pdf

The aim of this monograph is to outline the physics of image formation, electron–specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy ?lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci?c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to ?nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi?ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics.

Author : Peter J. Goodhew,John Humphreys
Publisher : CRC Press
Page : 264 pages
File Size : 55,8 Mb
Release : 2000-11-30
Category : Technology & Engineering
ISBN : 9781482289343

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Electron Microscopy and Analysis by Peter J. Goodhew,John Humphreys Pdf

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors h

Author : John Hren
Publisher : Springer
Page : 632 pages
File Size : 40,9 Mb
Release : 1979
Category : Technology & Engineering
ISBN : UCAL:B4530950

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Introduction to Analytical Electron Microscopy by John Hren Pdf

Appendices, tables, summaries and acknowledgements are widely used after some chapters.

Author : Peter J. Goodhew,F. J. Humphreys
Publisher : CRC Press
Page : 248 pages
File Size : 41,6 Mb
Release : 1988-04-25
Category : Science
ISBN : 0850664144

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Electron Microscopy And Analysis by Peter J. Goodhew,F. J. Humphreys Pdf

A comprehensive introductory text, extensively revised and updated to cover the physical basis and operation of the common types of electron microscope with illustrations of their applications. In addition, electron microscopy is compared with other modern techniques for examining both crystalline and non-crystalline materials.

Author : Frances M. Ross
Publisher : Cambridge University Press
Page : 529 pages
File Size : 47,7 Mb
Release : 2017
Category : Science
ISBN : 9781107116573

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Liquid Cell Electron Microscopy by Frances M. Ross Pdf

2.6.2 Electrodes for Electrochemistry

Author : Dr Robert Keyse
Publisher : Routledge
Page : 205 pages
File Size : 40,8 Mb
Release : 2018-12-19
Category : Technology & Engineering
ISBN : 9781351436601

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Introduction to Scanning Transmission Electron Microscopy by Dr Robert Keyse Pdf

1997 was the 'Year of the Electron' because it marked the centenary pf the celebrated discovery of the smallest of the fundamental particles that make up ordinary matter, and which has proved to have so many remarkable properties that, after light, it has become the most widley used of the particles in scientific and technogical applications. STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.

Author : Ludwig Reimer,P.W. Hawkes
Publisher : Springer
Page : 435 pages
File Size : 50,6 Mb
Release : 2013-06-29
Category : Science
ISBN : 9783540489955

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Energy-Filtering Transmission Electron Microscopy by Ludwig Reimer,P.W. Hawkes Pdf

Energy-Filtering Transmission Electron Microscopy (EFTEM) presents a summary of the electron optics, the electron-specimen interactions, and the operation and contrast modes of this new field of analytical electron microscopy. The electron optics of filter lenses and the progress in the correction of aberrations are discussed in detail. An evaluation of our present knowledge of plasmon losses and inner-shell ionisations is of increasing interest for a quantitative application of EFTEM in materials and life sciences. This can be realized not only by filtering the elastically scattered electrons but mainly by imgaging and analyzing with inelastically scattered electrons at different energy losses up to 2000 eV. The strength of EFTEM is the combination of the modes EELS, ESI, ESD and REM.

Author : Joseph Goldstein,Dale E. Newbury,David C. Joy,Charles E. Lyman,Patrick Echlin,Eric Lifshin,Linda Sawyer,J.R. Michael
Publisher : Springer Science & Business Media
Page : 689 pages
File Size : 51,9 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461502159

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Scanning Electron Microscopy and X-Ray Microanalysis by Joseph Goldstein,Dale E. Newbury,David C. Joy,Charles E. Lyman,Patrick Echlin,Eric Lifshin,Linda Sawyer,J.R. Michael Pdf

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.

Author : Charles E. Lyman,Dale E. Newbury,Joseph Goldstein,David B. Williams,Alton D. Romig Jr.,John Armstrong,Patrick Echlin,Charles Fiori,David C. Joy,Eric Lifshin,Klaus-Rüdiger Peters
Publisher : Springer Science & Business Media
Page : 415 pages
File Size : 44,7 Mb
Release : 2012-12-06
Category : Science
ISBN : 9781461306351

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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy by Charles E. Lyman,Dale E. Newbury,Joseph Goldstein,David B. Williams,Alton D. Romig Jr.,John Armstrong,Patrick Echlin,Charles Fiori,David C. Joy,Eric Lifshin,Klaus-Rüdiger Peters Pdf

During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal classes in universities and colleges and by special summer courses such as the ones offered for the past 19 years at Lehigh University. Laboratory work, which should be an integral part of such courses, is often hindered by the lack of a suitable laboratory workbook. While laboratory workbooks for transmission electron microscopy have-been in existence for many years, the broad range of topics that must be dealt with in scanning electron microscopy and microanalysis has made it difficult for instructors to devise meaningful experiments. The present workbook provides a series of fundamental experiments to aid in "hands-on" learning of the use of the instrumentation and the techniques. It is written by a group of eminently qualified scientists and educators. The importance of hands-on learning cannot be overemphasized.

Author : Jürgen Thomas,Thomas Gemming
Publisher : Unknown
Page : 368 pages
File Size : 45,8 Mb
Release : 2014-05-31
Category : Electronic
ISBN : 940178602X

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Analytical Transmission Electron Microscopy by Jürgen Thomas,Thomas Gemming Pdf