Scanning Transmission Electron Microscopy

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Scanning Transmission Electron Microscopy

Stephen J. Pennycook,Peter D. Nellist
Scanning Transmission Electron Microscopy Book PDF

Author : Stephen J. Pennycook,Peter D. Nellist
Publisher : Springer Science & Business Media
Page : 764 pages
File Size : 49,8 Mb
Release : 2011-03-24
Category : Technology & Engineering
ISBN : 9781441972002

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Scanning Transmission Electron Microscopy by Stephen J. Pennycook,Peter D. Nellist Pdf

Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Science of Microscopy

P.W. Hawkes,John C.H. Spence
Science of Microscopy Book PDF

Author : P.W. Hawkes,John C.H. Spence
Publisher : Springer Science & Business Media
Page : 1336 pages
File Size : 48,7 Mb
Release : 2008-08-29
Category : Technology & Engineering
ISBN : 9780387497624

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Science of Microscopy by P.W. Hawkes,John C.H. Spence Pdf

This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.

Introduction to Scanning Transmission Electron Microscopy

Dr Robert Keyse
Introduction to Scanning Transmission Electron Microscopy Book PDF

Author : Dr Robert Keyse
Publisher : Routledge
Page : 127 pages
File Size : 48,5 Mb
Release : 2018-12-19
Category : Technology & Engineering
ISBN : 9781351436618

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Introduction to Scanning Transmission Electron Microscopy by Dr Robert Keyse Pdf

1997 was the 'Year of the Electron' because it marked the centenary pf the celebrated discovery of the smallest of the fundamental particles that make up ordinary matter, and which has proved to have so many remarkable properties that, after light, it has become the most widley used of the particles in scientific and technogical applications. STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.

Scanning Transmission Electron Microscopy

Alina Bruma
Scanning Transmission Electron Microscopy Book PDF

Author : Alina Bruma
Publisher : CRC Press
Page : 162 pages
File Size : 47,6 Mb
Release : 2020-12-22
Category : Technology & Engineering
ISBN : 9780429516160

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Scanning Transmission Electron Microscopy by Alina Bruma Pdf

Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications The information comprised in this book is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.

Introduction to Scanning Transmission Electron Microscopy

Robert Keyse
Introduction to Scanning Transmission Electron Microscopy Book PDF

Author : Robert Keyse
Publisher : CRC Press
Page : 128 pages
File Size : 43,6 Mb
Release : 2018-06-28
Category : Electronic
ISBN : 1138441511

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Introduction to Scanning Transmission Electron Microscopy by Robert Keyse Pdf

STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.

Introduction to Scanning Transmission Electron Microscopy

Robert J. Keyse,Anthony J. Garratt-Reed,Peter J. Goodhew,Gordon W. Lorimer
Introduction to Scanning Transmission Electron Microscopy Book PDF

Author : Robert J. Keyse,Anthony J. Garratt-Reed,Peter J. Goodhew,Gordon W. Lorimer
Publisher : Unknown
Page : 128 pages
File Size : 41,8 Mb
Release : 1998
Category : SCIENCE
ISBN : 0203749898

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Introduction to Scanning Transmission Electron Microscopy by Robert J. Keyse,Anthony J. Garratt-Reed,Peter J. Goodhew,Gordon W. Lorimer Pdf

Scanning Transmission Electron Microscopy (STEM) is one of the highest resolution methods for performing microanlysis on thin sections of material. The technique is used in many modern transmission electron microscopes, and an increasing number of specialized instruments dedicated to STEM are being developed. This book provides an up-to-date introduction to the principles and major applications of STEM.

Scanning Transmission Electron Microscopy of Nanomaterials

Nobuo Tanaka
Scanning Transmission Electron Microscopy of Nanomaterials Book PDF

Author : Nobuo Tanaka
Publisher : Unknown
Page : 571 pages
File Size : 54,8 Mb
Release : 2014
Category : Science
ISBN : 184816789X

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Scanning Transmission Electron Microscopy of Nanomaterials by Nobuo Tanaka Pdf

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.

Physical Principles of Electron Microscopy

Ray Egerton
Physical Principles of Electron Microscopy Book PDF

Author : Ray Egerton
Publisher : Springer Science & Business Media
Page : 224 pages
File Size : 43,5 Mb
Release : 2011-02-11
Category : Technology & Engineering
ISBN : 0387258000

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Physical Principles of Electron Microscopy by Ray Egerton Pdf

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Field Emission Scanning Electron Microscopy

Nicolas Brodusch,Hendrix Demers,Raynald Gauvin
Field Emission Scanning Electron Microscopy Book PDF

Author : Nicolas Brodusch,Hendrix Demers,Raynald Gauvin
Publisher : Springer
Page : 137 pages
File Size : 55,7 Mb
Release : 2017-09-25
Category : Technology & Engineering
ISBN : 9789811044335

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Field Emission Scanning Electron Microscopy by Nicolas Brodusch,Hendrix Demers,Raynald Gauvin Pdf

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

Scanning Electron Microscopy

Ludwig Reimer
Scanning Electron Microscopy Book PDF

Author : Ludwig Reimer
Publisher : Springer
Page : 538 pages
File Size : 51,8 Mb
Release : 2013-11-11
Category : Science
ISBN : 9783540389675

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Scanning Electron Microscopy by Ludwig Reimer Pdf

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Impact of Electron and Scanning Probe Microscopy on Materials Research

David G. Rickerby,Giovanni Valdrè,Ugo Valdrè
Impact of Electron and Scanning Probe Microscopy on Materials Research Book PDF

Author : David G. Rickerby,Giovanni Valdrè,Ugo Valdrè
Publisher : Springer Science & Business Media
Page : 503 pages
File Size : 49,6 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9789401144513

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Impact of Electron and Scanning Probe Microscopy on Materials Research by David G. Rickerby,Giovanni Valdrè,Ugo Valdrè Pdf

The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.

Advances in Imaging and Electron Physics

Anonim
Advances in Imaging and Electron Physics Book PDF

Author : Anonim
Publisher : Academic Press
Page : 320 pages
File Size : 52,9 Mb
Release : 2009-11-05
Category : Technology & Engineering
ISBN : 0080961584

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Advances in Imaging and Electron Physics by Anonim Pdf

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope. Updated with contributions from leading international scholars and industry experts Discusses hot topic areas and presents current and future research trends Provides an invaluable reference and guide for physicists, engineers and mathematicians

A Beginners' Guide to Scanning Electron Microscopy

Anwar Ul-Hamid
A Beginners Guide to Scanning Electron Microscopy Book PDF

Author : Anwar Ul-Hamid
Publisher : Springer
Page : 422 pages
File Size : 44,8 Mb
Release : 2018-10-26
Category : Technology & Engineering
ISBN : 9783319984827

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A Beginners' Guide to Scanning Electron Microscopy by Anwar Ul-Hamid Pdf

This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area. The SEM is routinely used to study the surface structure and chemistry of a wide range of biological and synthetic materials at the micrometer to nanometer scale. Ease-of-use, typically facile sample preparation, and straightforward image interpretation, combined with high resolution, high depth of field, and the ability to undertake microchemical and crystallographic analysis, has made scanning electron microscopy one of the most powerful and versatile techniques for characterization today. Indeed, the SEM is a vital tool for the characterization of nanostructured materials and the development of nanotechnology. However, its wide use by professionals with diverse technical backgrounds—including life science, materials science, engineering, forensics, mineralogy, etc., and in various sectors of government, industry, and academia—emphasizes the need for an introductory text providing the basics of effective SEM imaging.A Beginners’ Guide to Scanning Electron Microscopy explains instrumentation, operation, image interpretation and sample preparation in a wide ranging yet succinct and practical text, treating the essential theory of specimen-beam interaction and image formation in a manner that can be effortlessly comprehended by the novice SEM user. This book provides a concise and accessible introduction to the essentials of SEM includes a large number of illustrations specifically chosen to aid readers' understanding of key concepts highlights recent advances in instrumentation, imaging and sample preparation techniques offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds.

Electron Nano-Imaging

Nobuo Tanaka
Electron Nano Imaging Book PDF

Author : Nobuo Tanaka
Publisher : Springer
Page : 333 pages
File Size : 52,5 Mb
Release : 2017-04-04
Category : Technology & Engineering
ISBN : 9784431565024

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Electron Nano-Imaging by Nobuo Tanaka Pdf

In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. A comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by other knowledge of electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers.

Scanning Microscopy for Nanotechnology

Weilie Zhou,Zhong Lin Wang
Scanning Microscopy for Nanotechnology Book PDF

Author : Weilie Zhou,Zhong Lin Wang
Publisher : Springer Science & Business Media
Page : 533 pages
File Size : 54,9 Mb
Release : 2007-03-09
Category : Technology & Engineering
ISBN : 9780387396200

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Scanning Microscopy for Nanotechnology by Weilie Zhou,Zhong Lin Wang Pdf

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.