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Author : Stephen Jesse
Publisher : Unknown
Page : 36 pages
File Size : 47,7 Mb
Release : 2013
Category : Materials
ISBN : OCLC:882237961
Author : Sergei V. Kalinin,Alexei Gruverman
Publisher : Springer Science & Business Media
Page : 563 pages
File Size : 52,9 Mb
Release : 2010-12-13
Category : Technology & Engineering
ISBN : 9781441971678
The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.
Author : Sergei V. Kalinin,Alexei Gruverman
Publisher : Springer Science & Business Media
Page : 1002 pages
File Size : 43,9 Mb
Release : 2007-04-03
Category : Technology & Engineering
ISBN : 9780387286686
This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.
Author : Sergei V Kalinin,Alexei Gruverman
Publisher : Springer
Page : 576 pages
File Size : 44,8 Mb
Release : 2016-04-01
Category : Electronic
ISBN : 1493939475
Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to characterize a wide range of functional materials, including complex oxides, biopolymers, and semiconductors.
Author : Vijay Nalladega
Publisher : BoD – Books on Demand
Page : 258 pages
File Size : 49,6 Mb
Release : 2012-04-27
Category : Science
ISBN : 9789535105763
Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film structures, oxide thin layers and superconducting structures, novel scanning probe microscopy techniques for characterization of mechanical and electrical properties, evaluation of mechanical and tribological properties of hybrid coatings and thin films. The variety of topics chosen for the book underlines the strong interdisciplinary nature of the research work in the field of scanning probe microscopy.
Author : Sergei V. Kalinin,Alexei Gruverman
Publisher : Springer
Page : 555 pages
File Size : 43,9 Mb
Release : 2010-12-10
Category : Technology & Engineering
ISBN : 144196567X
The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.
Author : Dawn A. Bonnell,Sergei V. Kalinin
Publisher : World Scientific
Page : 640 pages
File Size : 41,5 Mb
Release : 2013
Category : Technology & Engineering
ISBN : 9789814434713
Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.
Author : Seizo Morita
Publisher : Springer Science & Business Media
Page : 207 pages
File Size : 41,7 Mb
Release : 2006-12-30
Category : Technology & Engineering
ISBN : 9783540343158
Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.
Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
Page : 281 pages
File Size : 55,8 Mb
Release : 2008-10-22
Category : Technology & Engineering
ISBN : 9783540850373
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.
Author : Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Publisher : Springer Science & Business Media
Page : 465 pages
File Size : 48,9 Mb
Release : 2007-12-20
Category : Technology & Engineering
ISBN : 9783540740803
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
Author : Rui F. M. Lobo
Publisher : Springer
Page : 73 pages
File Size : 44,7 Mb
Release : 2015-07-22
Category : Technology & Engineering
ISBN : 9783319170077
This book provides a succinct account of the ways in which nano technology is being applied to improve energy efficiency. The coverage includes current scanning probe techniques for electrical energy storage, energy harvesting systems and local electrochemistry as well as emerging techniques of relevance to diverse materials and devices, including advanced scanning probes for nano fabrication and nano tribology. The tools of nanotechnology, such as scanning probe microscopes and micro machines, can provide important information about the fundamental nature of space, especially the zero-point electromagnetic field. An exciting aspect of this subject is that a better understanding of the force that arises from the zero-point field, i.e., the Casimir force, may enable its control to some extent, impacting on the development of nano electromechanical systems. Readers will find this book to be a clear and concise summary of the state of the art in nanophysics and nanotechnology as they relate to energy efficiency.
Author : Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Publisher : Springer Science & Business Media
Page : 475 pages
File Size : 44,5 Mb
Release : 2007-12-20
Category : Technology & Engineering
ISBN : 9783540740858
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
Page : 284 pages
File Size : 51,6 Mb
Release : 2008-10-29
Category : Technology & Engineering
ISBN : 9783540850496
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Author : Paula M. Vilarinho,Yossi Rosenwaks,Angus Kingon
Publisher : Springer Science & Business Media
Page : 503 pages
File Size : 45,7 Mb
Release : 2006-06-15
Category : Science
ISBN : 9781402030192
As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.
Author : Sergio Pizzini
Publisher : John Wiley & Sons
Page : 412 pages
File Size : 44,8 Mb
Release : 2012-06-07
Category : Technology & Engineering
ISBN : 9781118312162
Today, the silicon feedstock for photovoltaic cells comes from processes which were originally developed for the microelectronic industry. It covers almost 90% of the photovoltaic market, with mass production volume at least one order of magnitude larger than those devoted to microelectronics. However, it is hard to imagine that this kind of feedstock (extremely pure but heavily penalized by its high energy cost) could remain the only source of silicon for a photovoltaic market which is in continuous expansion, and which has a cumulative growth rate in excess of 30% in the last few years. Even though reports suggest that the silicon share will slowly decrease in the next twenty years, finding a way to manufacture a specific solar grade feedstock in large quantities, at a low cost while maintaining the quality needed, still remains a crucial issue. Thin film and quantum confinement-based silicon cells might be a complementary solution. Advanced Silicon Materials for Photovoltaic Applications has been designed to describe the full potentialities of silicon as a multipurpose material and covers: Physical, chemical and structural properties of silicon Production routes including the promise of low cost feedstock for PV applications Defect engineering and the role of impurities and defects Characterization techniques, and advanced analytical techniques for metallic and non-metallic impurities Thin film silicon and thin film solar cells Innovative quantum effects, and 3rd generation solar cells With contributions from internationally recognized authorities, this book gives a comprehensive analysis of the state-of-the-art of process technologies and material properties, essential for anyone interested in the application and development of photovoltaics.