An Introduction To Surface Analysis By Xps And Aes

Author : John F. Watts,John Wolstenholme
Publisher : John Wiley & Sons
Page : 288 pages
File Size : 45,7 Mb
Release : 2019-08-15
Category : Technology & Engineering
ISBN : 9781119417620

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An Introduction to Surface Analysis by XPS and AES by John F. Watts,John Wolstenholme Pdf

Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.

Author : Anonim
Publisher : Unknown
Page : 128 pages
File Size : 48,9 Mb
Release : 2003
Category : Electronic
ISBN : OCLC:744970792

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An Introduction to Surface Analysis by XPS and AES. by Anonim Pdf

Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods. Includes an accessible introduction to the key spectroscopic techniques in surface analysis. Provides descriptions of latest instruments and techniques. Includes a detailed glossary of key surface analysis terms.

Author : Siegfried Hofmann
Publisher : Springer Science & Business Media
Page : 544 pages
File Size : 53,8 Mb
Release : 2012-10-25
Category : Science
ISBN : 9783642273803

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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science by Siegfried Hofmann Pdf

To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.

Author : John F. Watts,John Wolstenholme
Publisher : John Wiley & Sons
Page : 294 pages
File Size : 43,5 Mb
Release : 2019-11-04
Category : Technology & Engineering
ISBN : 9781119417583

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An Introduction to Surface Analysis by XPS and AES by John F. Watts,John Wolstenholme Pdf

Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.

Author : John F. Watts
Publisher : Oxford University Press, USA
Page : 100 pages
File Size : 40,6 Mb
Release : 1990
Category : Science
ISBN : UOM:39015019840092

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An Introduction to Surface Analysis by Electron Spectroscopy by John F. Watts Pdf

Surface analysis--the examination of the outer few nanometers of a material--is a routine undertaking in laboratories throughout the world, and is of great importance in such areas as corrosion, adhesion, polymer surface treatment, and microelectronics fabrication. This handbook provides an introduction to the two most popular surface analysis techniques: X-ray photoelectron spectroscopy and Auger electron spectroscopy. It explains the underlying physical principles, discusses instrumentation, and looks at the interpretation of resulting spectra. Applications of the two techniques are considered, and a critical comparison with other available methods is also included. This fully illustrated guide will be a valuable introduction for students and researchers in physics, engineering, and materials science.

Author : D.J. O'Connor,Brett A. Sexton,Roger S.C. Smart
Publisher : Springer Science & Business Media
Page : 588 pages
File Size : 42,7 Mb
Release : 2013-06-29
Category : Technology & Engineering
ISBN : 9783662052273

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Surface Analysis Methods in Materials Science by D.J. O'Connor,Brett A. Sexton,Roger S.C. Smart Pdf

This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references. It outlines the application of surface analysis techniques to a broad range of studies in materials science and engineering. The book consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing 19 techniques and a section on applications. This book is aimed at industrial scientists and engineers in research and development. The level and content of this book make it ideal as a course text for senior undergraduate and postgraduate students in materials science, materials engineering, physics, chemistry and metallurgy.

Author : D.R. Vij
Publisher : Springer Science & Business Media
Page : 748 pages
File Size : 51,7 Mb
Release : 2007-02-15
Category : Science
ISBN : 9780387375908

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Handbook of Applied Solid State Spectroscopy by D.R. Vij Pdf

Solid-State spectroscopy is a burgeoning field with applications in many branches of science, including physics, chemistry, biosciences, surface science, and materials science. This handbook brings together in one volume information about various spectroscopic techniques that is currently scattered in the literature of these disciplines. This concise yet comprehensive volume covers theory and applications of a broad range of spectroscopies. It provides an overview of sixteen spectroscopic technique and self-contained chapters present up-to-date scientific and technical information and references with minimal overlap and redundancy.

Author : Paul van der Heide
Publisher : John Wiley & Sons
Page : 275 pages
File Size : 51,8 Mb
Release : 2011-11-01
Category : Science
ISBN : 9781118162903

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X-ray Photoelectron Spectroscopy by Paul van der Heide Pdf

This book introduces readers interested in the field of X-ray Photoelectron Spectroscopy (XPS) to the practical concepts in this field. The book first introduces the reader to the language and concepts used in this field and then demonstrates how these concepts are applied. Including how the spectra are produced, factors that can influence the spectra (all initial and final state effects are discussed), how to derive speciation, volume analysed and how one controls this (includes depth profiling), and quantification along with background substraction and curve fitting methodologies. This is presented in a concise yet comprehensive manner and each section is prepared such that they can be read independently of each other, and all equations are presented using the most commonly used units. Greater emphasis has been placed on spectral understanding/interpretation. For completeness sake, a description of commonly used instrumentation is also presented. Finally, some complementary surface analytical techniques and associated concepts are reviewed for comparative purposes in stand-alone appendix sections.

Author : David Briggs,John T. Grant
Publisher : Im Publications
Page : 899 pages
File Size : 42,9 Mb
Release : 2003-01-01
Category : Electron spectroscopy
ISBN : 1901019047

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Surface Analysis by Auger and X-ray Photoelectron Spectroscopy by David Briggs,John T. Grant Pdf

Author : Yang Leng
Publisher : John Wiley & Sons
Page : 384 pages
File Size : 43,5 Mb
Release : 2009-03-04
Category : Technology & Engineering
ISBN : 9780470822999

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Materials Characterization by Yang Leng Pdf

This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.

Author : D. P. Woodruff,T. A. Delchar
Publisher : Cambridge University Press
Page : 612 pages
File Size : 43,7 Mb
Release : 1994-03-03
Category : Science
ISBN : 0521424984

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Modern Techniques of Surface Science by D. P. Woodruff,T. A. Delchar Pdf

Revised and expanded second edition of the standard work on new techniques for studying solid surfaces.

Author : Anonim
Publisher : Unknown
Page : 42 pages
File Size : 43,7 Mb
Release : 1980
Category : Metals
ISBN : OCLC:219876658

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Modern Surface Analysis by Anonim Pdf

Author : D.J. O'Connor,Brett A. Sexton,Roger St.C. Smart
Publisher : Springer Science & Business Media
Page : 457 pages
File Size : 42,6 Mb
Release : 2013-04-17
Category : Science
ISBN : 9783662027677

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Surface Analysis Methods in Materials Science by D.J. O'Connor,Brett A. Sexton,Roger St.C. Smart Pdf

The idea for this book stemmed from a remark by Philip Jennings of Murdoch University in a discussion session following a regular meeting of the Australian Surface Science group. He observed that a text on surface analysis and applica tions to materials suitable for final year undergraduate and postgraduate science students was not currently available. Furthermore, the members of the Australian Surface Science group had the research experience and range of coverage of sur face analytical techniques and applications to provide a text for this purpose. A of techniques and applications to be included was agreed at that meeting. The list intended readership of the book has been broadened since the early discussions, particularly to encompass industrial users, but there has been no significant alter ation in content. The editors, in consultation with the contributors, have agreed that the book should be prepared for four major groups of readers: - senior undergraduate students in chemistry, physics, metallurgy, materials science and materials engineering; - postgraduate students undertaking research that involves the use of analytical techniques; - groups of scientists and engineers attending training courses and workshops on the application of surface analytical techniques in materials science; - industrial scientists and engineers in research and development seeking a description of available surface analytical techniques and guidance on the most appropriate techniques for particular applications. The contributors mostly come from Australia, with the notable exception of Ray Browning from Stanford University.

Author : Gernot Friedbacher,Henning Bubert
Publisher : John Wiley & Sons
Page : 514 pages
File Size : 42,6 Mb
Release : 2011-03-31
Category : Technology & Engineering
ISBN : 9783527636938

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Surface and Thin Film Analysis by Gernot Friedbacher,Henning Bubert Pdf

Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)

Author : John C. Vickerman,Ian S. Gilmore
Publisher : John Wiley & Sons
Page : 690 pages
File Size : 41,5 Mb
Release : 2011-08-10
Category : Technology & Engineering
ISBN : 9781119965510

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Surface Analysis by John C. Vickerman,Ian S. Gilmore Pdf

This completely updated and revised second edition of Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists. Within this comprehensive text, experts in each analysis area introduce the theory and practice of the principal techniques that have shown themselves to be effective in both basic research and in applied surface analysis. Examples of analysis are provided to facilitate the understanding of this topic and to show readers how they can overcome problems within this area of study.