Surface Analysis By Auger And X Ray Photoelectron Spectroscopy

Author : Siegfried Hofmann
Publisher : Springer Science & Business Media
Page : 544 pages
File Size : 44,6 Mb
Release : 2012-10-25
Category : Science
ISBN : 9783642273803

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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science by Siegfried Hofmann Pdf

To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.

Author : D. Briggs,M. P. Seah
Publisher : Unknown
Page : 694 pages
File Size : 43,7 Mb
Release : 1990-11-30
Category : Science
ISBN : UOM:39015024953492

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Practical Surface Analysis, Auger and X-ray Photoelectron Spectroscopy by D. Briggs,M. P. Seah Pdf

The aim of this text is to present the background, the important concepts, and tabulated data of Auger electron spectroscopy (AES) and x-ray photoelectron spectroscopy (XPS) in a practical context for those involved in applied surface analysis techniques.

Author : David Briggs,John T. Grant
Publisher : Im Publications
Page : 899 pages
File Size : 48,6 Mb
Release : 2003-01-01
Category : Electron spectroscopy
ISBN : 1901019047

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Surface Analysis by Auger and X-ray Photoelectron Spectroscopy by David Briggs,John T. Grant Pdf

Author : Anonim
Publisher : Unknown
Page : 128 pages
File Size : 53,7 Mb
Release : 2015
Category : Electronic
ISBN : OCLC:913008869

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Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy by Anonim Pdf

Author : John F. Watts,John Wolstenholme
Publisher : John Wiley & Sons
Page : 307 pages
File Size : 43,9 Mb
Release : 2019-08-27
Category : Technology & Engineering
ISBN : 9781119417644

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An Introduction to Surface Analysis by XPS and AES by John F. Watts,John Wolstenholme Pdf

Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.

Author : David Briggs,M. P. Seah
Publisher : Unknown
Page : 533 pages
File Size : 48,5 Mb
Release : 1983
Category : Electronic
ISBN : OCLC:797742091

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Practical Surface Analysis by David Briggs,M. P. Seah Pdf

Author : David Briggs,M. P. Seah
Publisher : Unknown
Page : 657 pages
File Size : 55,5 Mb
Release : 1994
Category : Auger effect
ISBN : 379413317X

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Auger and X-ray Photoelectron Spectroscopy by David Briggs,M. P. Seah Pdf

Author : Graham C. Smith
Publisher : Springer Science & Business Media
Page : 165 pages
File Size : 45,7 Mb
Release : 2013-11-21
Category : Science
ISBN : 9781489909671

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Surface Analysis by Electron Spectroscopy by Graham C. Smith Pdf

This book is t~e fifth in aseries of scientific textbooks designed to cover advances in selected research fields from a basic and general view point. The reader is taken carefully but rapidly through the introductory material in order that t~e significance of recent developments can be understood with only limited initial knowledge. The inclusion in the Appendix of the abstracts of many of the more important papers in the field provides further assistance for the non-specialist, and acts as aspringboard to supplementary reading for those who wish to consult the original liter ature. Surface analysis has been the subject of numerous books and review articles, and the fundamental scientific principles of t~e more popular techniques are now reasonably weIl established. This book is concerned with the very powerful techniques of Auger electron and X-ray photoelectron spectroscopy (AES and XPS), with an emphasis on how they may be performed as part of a modern analytical facility. Since the development of AES and XPS in the late 1960s and early 1970s there have been great strides forward in the sensitivities and resolutions of the instrumentation. Simultaneously, these spectroscopies have undergone a veritable explosion, both in their acceptance alongside more routine ana1ytical techniques and in the range of problems and materials to which they are applied. As a result, many researchers in industry and in academia now come into contact with AES and XPS not as specialists, but as users.

Author : D.R. Vij
Publisher : Springer Science & Business Media
Page : 748 pages
File Size : 53,7 Mb
Release : 2007-02-15
Category : Science
ISBN : 9780387375908

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Handbook of Applied Solid State Spectroscopy by D.R. Vij Pdf

Solid-State spectroscopy is a burgeoning field with applications in many branches of science, including physics, chemistry, biosciences, surface science, and materials science. This handbook brings together in one volume information about various spectroscopic techniques that is currently scattered in the literature of these disciplines. This concise yet comprehensive volume covers theory and applications of a broad range of spectroscopies. It provides an overview of sixteen spectroscopic technique and self-contained chapters present up-to-date scientific and technical information and references with minimal overlap and redundancy.

Author : Paul van der Heide
Publisher : John Wiley & Sons
Page : 275 pages
File Size : 55,9 Mb
Release : 2011-11-01
Category : Science
ISBN : 9781118162903

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X-ray Photoelectron Spectroscopy by Paul van der Heide Pdf

This book introduces readers interested in the field of X-ray Photoelectron Spectroscopy (XPS) to the practical concepts in this field. The book first introduces the reader to the language and concepts used in this field and then demonstrates how these concepts are applied. Including how the spectra are produced, factors that can influence the spectra (all initial and final state effects are discussed), how to derive speciation, volume analysed and how one controls this (includes depth profiling), and quantification along with background substraction and curve fitting methodologies. This is presented in a concise yet comprehensive manner and each section is prepared such that they can be read independently of each other, and all equations are presented using the most commonly used units. Greater emphasis has been placed on spectral understanding/interpretation. For completeness sake, a description of commonly used instrumentation is also presented. Finally, some complementary surface analytical techniques and associated concepts are reviewed for comparative purposes in stand-alone appendix sections.

Author : D.J. O'Connor,Brett A. Sexton,Roger S.C. Smart
Publisher : Springer Science & Business Media
Page : 588 pages
File Size : 51,7 Mb
Release : 2013-06-29
Category : Technology & Engineering
ISBN : 9783662052273

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Surface Analysis Methods in Materials Science by D.J. O'Connor,Brett A. Sexton,Roger S.C. Smart Pdf

This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references. It outlines the application of surface analysis techniques to a broad range of studies in materials science and engineering. The book consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing 19 techniques and a section on applications. This book is aimed at industrial scientists and engineers in research and development. The level and content of this book make it ideal as a course text for senior undergraduate and postgraduate students in materials science, materials engineering, physics, chemistry and metallurgy.

Author : John F. Watts
Publisher : Oxford University Press, USA
Page : 100 pages
File Size : 52,6 Mb
Release : 1990
Category : Science
ISBN : UOM:39015019840092

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An Introduction to Surface Analysis by Electron Spectroscopy by John F. Watts Pdf

Surface analysis--the examination of the outer few nanometers of a material--is a routine undertaking in laboratories throughout the world, and is of great importance in such areas as corrosion, adhesion, polymer surface treatment, and microelectronics fabrication. This handbook provides an introduction to the two most popular surface analysis techniques: X-ray photoelectron spectroscopy and Auger electron spectroscopy. It explains the underlying physical principles, discusses instrumentation, and looks at the interpretation of resulting spectra. Applications of the two techniques are considered, and a critical comparison with other available methods is also included. This fully illustrated guide will be a valuable introduction for students and researchers in physics, engineering, and materials science.

Author : Gleb Mamantov,Roberto Marassi
Publisher : Springer Science & Business Media
Page : 538 pages
File Size : 50,7 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9789400938632

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Molten Salt Chemistry by Gleb Mamantov,Roberto Marassi Pdf

Molten salts are of considerable significance to chemical technology. Applications range from the established ones, such as the production of aluminum, magnesium, sodium and fluorine, to those as yet to be fully exploited, such as molten salt batteries and fuel cells, catalysis, and solar energy. Molten salts are investigated for different purposes by many diverse techniques. There is a need to keep investigators working in different areas, such as metal production, power sources, and glass industry, aware of progress in various specialties, as well as to familiarize new research workers with the fundamental aspects of the broad field of molten salt _ chemistry. This volume constitutes the plenary lectures presented at the NATO Advanced Study Institute on Molten Salt Chemistry, Camerino, Italy, August 3-15, 1986. The fundamentals and several selected applications of molten salt chemistry were addressed. The major fundamental topics covered at this ASI were the structure of melts, thermodynamics of molten salt mixtures, theoretical and experimental studies of transport processes, metal-metal salt solutions, solvent properties of melt systems, acid-base effects in molten salt chemistry, electronic absorption, vibrational, and nuclear magnetic resonance spectroscopy of melt systems, electrochemistry and electroanalytical chemistry in molten salts, and organic chemistry in molten salts. The applied aspects of molten salt chemistry included the chemistry of aluminum production, electrodeposition using molten salts, and molten salt batteries and fuel cells.

Author : Yang Leng
Publisher : John Wiley & Sons
Page : 384 pages
File Size : 45,6 Mb
Release : 2009-03-04
Category : Technology & Engineering
ISBN : 9780470822999

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Materials Characterization by Yang Leng Pdf

This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.

Author : Yoshio Nishi,Robert Doering
Publisher : CRC Press
Page : 1720 pages
File Size : 42,9 Mb
Release : 2017-12-19
Category : Technology & Engineering
ISBN : 9781420017663

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Handbook of Semiconductor Manufacturing Technology by Yoshio Nishi,Robert Doering Pdf

Retaining the comprehensive and in-depth approach that cemented the bestselling first edition's place as a standard reference in the field, the Handbook of Semiconductor Manufacturing Technology, Second Edition features new and updated material that keeps it at the vanguard of today's most dynamic and rapidly growing field. Iconic experts Robert Doering and Yoshio Nishi have again assembled a team of the world's leading specialists in every area of semiconductor manufacturing to provide the most reliable, authoritative, and industry-leading information available. Stay Current with the Latest Technologies In addition to updates to nearly every existing chapter, this edition features five entirely new contributions on... Silicon-on-insulator (SOI) materials and devices Supercritical CO2 in semiconductor cleaning Low-κ dielectrics Atomic-layer deposition Damascene copper electroplating Effects of terrestrial radiation on integrated circuits (ICs) Reflecting rapid progress in many areas, several chapters were heavily revised and updated, and in some cases, rewritten to reflect rapid advances in such areas as interconnect technologies, gate dielectrics, photomask fabrication, IC packaging, and 300 mm wafer fabrication. While no book can be up-to-the-minute with the advances in the semiconductor field, the Handbook of Semiconductor Manufacturing Technology keeps the most important data, methods, tools, and techniques close at hand.