Applications Of Scanned Probe Microscopy To Polymers

Author : James Daryl Batteas,Chris A. Michaels,Gilbert C. Walker
Publisher : Unknown
Page : 292 pages
File Size : 47,5 Mb
Release : 2005
Category : Language Arts & Disciplines
ISBN : UOM:39015060574491

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Applications of Scanned Probe Microscopy to Polymers by James Daryl Batteas,Chris A. Michaels,Gilbert C. Walker Pdf

Applications of Scanned Probe Microscopy to Polymers stresses the analysis of polymer and biopolymer surfaces using the ever-expanding methodologies of scanned probe microscopies. This book includes studies of optical properties by near-field methodologies, local mechanical properties of polymer films by AFM, the dynamics and mechanics of single molecules probed by AFM, and methodologies for enhanced imaging modes. A primary focus of this book is the quantitative measurement of surface properties by scanned probe techniques, which illustrates how the field has evolved and what new challenges lie ahead. Applications of Scanned Probe Microscopy to Polymers will be valuable to students and professionals looking for studies that illustrate what types of polymer material properties may be probed by scanned probe microscopies.

Author : K. S. Birdi
Publisher : CRC Press
Page : 450 pages
File Size : 48,9 Mb
Release : 2003-02-26
Category : Science
ISBN : 9781135516338

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Scanning Probe Microscopes by K. S. Birdi Pdf

Scanning Probe Microscopes: Applications in Science and Technology explains, analyzes, and demonstrates the most widely used microscope in the family of microscopes -- the scanning probe microscope. Beginning with an introduction to the development of SPMs, the author introduces the basics of scanning tunneling and atomic force microscopes (STMs an

Author : G. Julius Vancso,Holger Schönherr
Publisher : Springer Science & Business Media
Page : 258 pages
File Size : 49,5 Mb
Release : 2010-08-02
Category : Technology & Engineering
ISBN : 9783642012310

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Scanning Force Microscopy of Polymers by G. Julius Vancso,Holger Schönherr Pdf

Scope of the Book Synthetic and natural polymers exhibit a complex structural and morphological hierarchy on multiple length scales [1], which determines their performance. Thus, research aiming at visualizing structure and morphology using a multitude of microscopy techniques has received considerable attention since the early days of polymer science and technology. Various well-developed techniques such as optical microscopy and different forms of electron microscopy (Scanning Electron Micr- copy, SEM; Transmission Electron Microscopy, TEM; Environmental Scanning Electron Microscopy, ESEM) allow one to view polymeric structure at different levels of magni?cation. These classical techniques, and their applications to po- mers, are well documented in the literature [2, 3]. The invention of Scanning Tunneling Microscopy (STM) inspired the devel- ment of Atomic Force Microscopy (AFM) and other forms of scanning proximity microscopes in the late 1980s [4, 5]. AFM, unlike STM, can be used to image n- conducting specimens such as polymers. In addition, AFM imaging is feasible in liquids, which has several advantages. Using liquid imaging cells the forces between specimen and AFM probe are drastically reduced, thus sample damage is prevented. In addition, the use of water as imaging medium opened up new applications aiming at imaging, characterizing, and analyzing biologically important systems.

Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
Page : 238 pages
File Size : 52,7 Mb
Release : 2008-10-29
Category : Technology & Engineering
ISBN : 9783540850496

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Applied Scanning Probe Methods XIII by Bharat Bhushan,Harald Fuchs Pdf

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
Page : 456 pages
File Size : 44,9 Mb
Release : 2006-06-22
Category : Technology & Engineering
ISBN : 9783540274537

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Applied Scanning Probe Methods II by Bharat Bhushan,Harald Fuchs Pdf

The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.

Author : Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Publisher : Springer Science & Business Media
Page : 427 pages
File Size : 49,8 Mb
Release : 2007-12-20
Category : Technology & Engineering
ISBN : 9783540740858

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Applied Scanning Probe Methods X by Bharat Bhushan,Harald Fuchs,Masahiko Tomitori Pdf

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
Page : 318 pages
File Size : 46,6 Mb
Release : 2006-04-28
Category : Technology & Engineering
ISBN : 9783540269144

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Applied Scanning Probe Methods IV by Bharat Bhushan,Harald Fuchs Pdf

Author : K. S. Birdi
Publisher : CRC Press
Page : 330 pages
File Size : 55,5 Mb
Release : 2003-02-26
Category : Science
ISBN : 9780203011072

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Scanning Probe Microscopes by K. S. Birdi Pdf

Scanning Probe Microscopes: Applications in Science and Technology explains, analyzes, and demonstrates the most widely used microscope in the family of microscopes -- the scanning probe microscope. Beginning with an introduction to the development of SPMs, the author introduces the basics of scanning tunneling and atomic force microscopes (STMs an

Author : Dalia G. Yablon
Publisher : John Wiley & Sons
Page : 337 pages
File Size : 52,5 Mb
Release : 2013-10-24
Category : Technology & Engineering
ISBN : 9781118723043

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Scanning Probe Microscopy¿in Industrial Applications by Dalia G. Yablon Pdf

Describes new state-of-the-science tools and their contribution to industrial R&D With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R&D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others. Scanning Probe Microscopy in Industrial Applications emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview of nanomechanical characterization methods, offering a complete practical tutorial for readers who are new to the topic. Several chapters include worked examples of useful calculations such as using Hertz mechanics with and without adhesion to model a contact, step-by-step instructions for simulations to guide cantilever selection for an experiment, and data analysis procedures for dynamic contact experiments. The second half of the book describes applications of nanomechanical characterization in industry, including: New formulation development for pharmaceuticals Measurement of critical dimensions and thin dielectric films in the semiconductor industry Effect of humidity and temperature on biomaterials Characterization of polymer blends to guide product formulation in the chemicals sector Unraveling links between food structure and function in the food industry Contributions are based on the authors' thorough review of the current literature as well as their own firsthand experience applying scanning probe microscopy to solve industrial R&D problems. By explaining the fundamentals before advancing to applications, Scanning Probe Microscopy in Industrial Applications offers a complete treatise that is accessible to both novices and professionals. All readers will discover how to apply scanning probe microscopy to build and enhance their R&D efforts.

Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
Page : 380 pages
File Size : 54,9 Mb
Release : 2006-11-09
Category : Technology & Engineering
ISBN : 9783540373216

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Applied Scanning Probe Methods VII by Bharat Bhushan,Harald Fuchs Pdf

The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments. Volume VII presents 9 chapters on a variety of new and emerging techniques and refinements of SPM applications.

Author : Bharat Bhushan,Harald Fuchs,Satoshi Kawata
Publisher : Springer Science & Business Media
Page : 344 pages
File Size : 44,6 Mb
Release : 2006-11-04
Category : Technology & Engineering
ISBN : 9783540373162

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Applied Scanning Probe Methods V by Bharat Bhushan,Harald Fuchs,Satoshi Kawata Pdf

The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. This is the first book summarizing the state-of-the-art of this technique. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
Page : 236 pages
File Size : 44,7 Mb
Release : 2008-10-22
Category : Technology & Engineering
ISBN : 9783540850373

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Applied Scanning Probe Methods XI by Bharat Bhushan,Harald Fuchs Pdf

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.

Author : I. Meisel,C. S. Kniep,S. Spiegel,K. Grieve
Publisher : Wiley-VCH
Page : 0 pages
File Size : 47,9 Mb
Release : 2001-08-15
Category : Technology & Engineering
ISBN : 3527303294

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Advances in Scanning Probe Microscopy of Polymers by I. Meisel,C. S. Kniep,S. Spiegel,K. Grieve Pdf

The symposium "Recent Advances in Scanning Probe Microscopy of Polymers" held during the 220th American Chemical Society National Meeting in Washington DC in August 2000 focused on the latest advances in applications of SPM techniques for the study of polymeric and organic materials. The main topics consisted of SPM imaging of polymer morphology and microstructure, microtribological properties of polymers, micromechanical probing of polymers, microthermal imaging, studies of ultrathin and molecular organic and polymeric films, modeling of tip-surface interactions, chemical compositional analysis of heterogeneous materials, and SPM applications to industrial polymers. This volume of Macromolecular Symposia will be a valuable guide in the field of contemporary SPM studies of polymeric materials.

Author : Buddy D. Ratner,American Chemical Society. Meeting
Publisher : Unknown
Page : 392 pages
File Size : 55,8 Mb
Release : 1998
Category : Science
ISBN : UOM:39015041915540

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Scanning Probe Microscopy of Polymers by Buddy D. Ratner,American Chemical Society. Meeting Pdf

The highlights of this book include an examination of the use of scanning probe microscopy to characterize a variety of polymeric materials, from polymer single crystals and molecular films to composites and biopolymers. The volume provides a synthesis of critical overviews and important new developments, including applications in atomic resolution, chemical force microscopy, and recognition/nanolithography. It includes a review of basic principles and operational modes, terminology, trends, and a discussion of key industrial applications, such as polymer fibers, polymer composites, and filled polymers. It also includes chapters on biopolymers and living cells and on methods for probing micromechanical properties.

Author : Anonim
Publisher : Unknown
Page : 367 pages
File Size : 47,5 Mb
Release : 1998
Category : Electronic
ISBN : OCLC:1132087263

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Scanning Probe Microscopy of Polymers by Anonim Pdf