Defect Recognition And Image Processing In Semiconductors 1997

Author : J. Doneker
Publisher : Routledge
Page : 524 pages
File Size : 49,5 Mb
Release : 2017-11-22
Category : Science
ISBN : 9781351456470

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Defect Recognition and Image Processing in Semiconductors 1997 by J. Doneker Pdf

Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.

Author : J. Doneker,I. Rechenberg
Publisher : CRC Press
Page : 524 pages
File Size : 46,6 Mb
Release : 1998-01-01
Category : Science
ISBN : 0750305002

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Defect Recognition and Image Processing in Semiconductors 1997 by J. Doneker,I. Rechenberg Pdf

Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.

Author : J. Donecker,I. Rechenberg
Publisher : Unknown
Page : 128 pages
File Size : 54,8 Mb
Release : 1998
Category : TECHNOLOGY & ENGINEERING
ISBN : 1315140810

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Defect Recognition and Image Processing in Semiconductors 1997 by J. Donecker,I. Rechenberg Pdf

"Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide."--Provided by publisher.

Author : Juan Jiménez
Publisher : CRC Press
Page : 448 pages
File Size : 48,5 Mb
Release : 1994-05-26
Category : Art
ISBN : UVA:X002496258

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Defect Recognition and Image Processing in Semiconductors and Devices, Proceedings of the 5th INT Conference, 6-10 September 1993, Santander, Spain by Juan Jiménez Pdf

The fifth in this series of conferences was held in Santander, Spain from 6 to 10 September 1993, and was attended by workers from industry and research institutes worldwide. Device yield is a crucial factor for determining the choice of semiconducting material made by manufacturers, and that choice is based upon a knowledge of how defects might affect a particular substrate, epilayer or base material. The DRIP conference series was instigated to address the mapping of these technologically important defects. Topics covered at the meeting included silicon, and compound semiconductor substrates and epilayers. Methods for defect recognition included tunelling microscopy, inelastic light scattering (Raman), elastic light scattering, photoluminescence mapping, defect characterization, optical probe beams, and effects of defects on devices. The meeting focused in particular on the microscopic nature of as-grown defects: their distribution as a function of growth conditions, and their redistribution under subsequent heat treatments. The conference dealt with the increasing number and sophistication of visualization techniques which map physical properties of defects, and which may in future permit better control of defect engineering. Researchers in solid state or device physics, or electrical engineering will find this volume an invaluable, up to date reference on the latest techniques for the identification of defects, developments in their control, implications for device fabrication, and future directions for the analysis and mapping of semiconductors.

Author : J. P. Fillard
Publisher : Elsevier Publishing Company
Page : 326 pages
File Size : 51,5 Mb
Release : 1985
Category : Technology & Engineering
ISBN : WISC:89013302856

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Defect Recognition and Image Processing in III-V Compounds by J. P. Fillard Pdf

Author : Juan P. Martínez-Pastor,Pablo P. Boix,Guichuan Xing
Publisher : Elsevier
Page : 574 pages
File Size : 44,7 Mb
Release : 2023-07-20
Category : Technology & Engineering
ISBN : 9780323985543

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Metal Halide Perovskites for Generation, Manipulation and Detection of Light by Juan P. Martínez-Pastor,Pablo P. Boix,Guichuan Xing Pdf

Metal Halide Perovskites for Generation, Manipulation and Detection of Light covers the current state and future prospects of lead halide perovskite photonics and photon sources, both from an academic and industrial point-of-view. Advances in metal halide perovskite photon sources (lasers) based on thin films, microcrystals and nanocrystals are comprehensively reviewed, with leading experts contributing current advances in theory, fundamental concepts, fabrication techniques, experiments and other important research innovations. This book is suitable for graduate students, researchers, scientists and engineers in academia and R&D in industry working in the disciplines of materials science and engineering. Includes comprehensive reviews from academic and industrial perspectives of current trends in the field of metal halide perovskite for photonics Provides an up-to-date look at the most recent and upcoming applications in metal halide perovskite photonics, such as; photodetectors, lighting, lasing, nonlinear photonics and quantum technologies Discusses future prospective trends and envisioned applications of metal halide perovskites, from near-UV to near-IR photonics

Author : A.R Mickelson
Publisher : CRC Press
Page : 288 pages
File Size : 48,5 Mb
Release : 1996-05-30
Category : Science
ISBN : 0750303727

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Defect Recognition and Image Processing in Semiconductors 1995 by A.R Mickelson Pdf

These proceedings provide an overview of research into defect inhomogeneities semiconductor materials and (as grown) devices. Defect inhomogeneities affect the performance of both as grown and processed semiconductors. A valuable overview of mapping and microscopy techniques for the study of such defects and an insight into the effect of such defects on device performance.

Author : Hiroshi Yamada-Kaneta,Akira Sakai
Publisher : Trans Tech Publications Ltd
Page : 324 pages
File Size : 45,6 Mb
Release : 2012-07-12
Category : Technology & Engineering
ISBN : 9783038138563

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Defects-Recognition, Imaging and Physics in Semiconductors XIV by Hiroshi Yamada-Kaneta,Akira Sakai Pdf

Selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP-14), September 25-29, 2011, Miyazaki, Japan

Author : Eicke R. Weber
Publisher : Elsevier Publishing Company
Page : 340 pages
File Size : 47,8 Mb
Release : 1987
Category : Computers
ISBN : UOM:39015012053255

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Defect Recognition and Image Processing in III-V Compounds, II by Eicke R. Weber Pdf

Author : R R Bowker Publishing
Publisher : Unknown
Page : 1312 pages
File Size : 47,8 Mb
Release : 1999-03
Category : Electronic
ISBN : 0835240878

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American Book Publishing Record Cumulative 1998 by R R Bowker Publishing Pdf

Author : International Symposium on Defect Recognition and Image Processing in III-V Compounds
Publisher : Unknown
Page : 306 pages
File Size : 49,7 Mb
Release : 1985
Category : Electronic
ISBN : OCLC:633018481

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Defect Recognition and Image Processing in III-V Compounds by International Symposium on Defect Recognition and Image Processing in III-V Compounds Pdf

Author : British Library. Document Supply Centre
Publisher : Unknown
Page : 870 pages
File Size : 52,7 Mb
Release : 2003
Category : Conference proceedings
ISBN : STANFORD:36105115205242

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Index of Conference Proceedings by British Library. Document Supply Centre Pdf

Author : Arthur James Wells
Publisher : Unknown
Page : 1778 pages
File Size : 45,7 Mb
Release : 1999
Category : Bibliography, National
ISBN : UOM:39015079755818

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The British National Bibliography by Arthur James Wells Pdf

Author : Anonim
Publisher : Unknown
Page : 378 pages
File Size : 49,7 Mb
Release : 1998
Category : Crystallography
ISBN : UOM:39015046279744

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Zeitschrift Für Kristallographie by Anonim Pdf

Author : Howard R. Huff,U. Gösele,H. Tsuya
Publisher : Unknown
Page : 800 pages
File Size : 40,5 Mb
Release : 1998
Category : Semiconductors
ISBN : 1566771935

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Silicon Materials Science and Technology by Howard R. Huff,U. Gösele,H. Tsuya Pdf