Diffraction And Imaging Techniques In Material Science P2

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Diffraction and Imaging Techniques in Material Science P2

S Amelinckx
Diffraction and Imaging Techniques in Material Science P2 Book PDF

Author : S Amelinckx
Publisher : Elsevier
Page : 412 pages
File Size : 43,7 Mb
Release : 2012-12-02
Category : Computers
ISBN : 9780444601865

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Diffraction and Imaging Techniques in Material Science P2 by S Amelinckx Pdf

Diffraction and Imaging Techniques in Material Science reviews recent developments in diffraction and imaging techniques used in the study of materials. It discusses advances in high-voltage electron microscopy, low-energy electron diffraction (LEED), X-ray and neutron diffraction, X-ray topography, mirror electron microscopy, and field emission microscopy. Organized into five parts encompassing nine chapters, this volume begins with an overview of the dynamical theory of the diffraction of high-energy electrons in crystals and methodically introduces the reader to dynamical diffraction in perfect and imperfect crystals, inelastic scattering of electrons in crystals, and X-ray production. It then explores back scattering effects, the technical features of high-voltage electron microscopes, and surface characterization by LEED. Other chapters focus on the kinematical theory of X-ray diffraction, techniques and interpretation in X-ray topography, and interpretation of the contrast of the images of defects on X-ray topographs. The book also describes theory and applications of mirror electron microscopy, surface studies by field emission of electrons, field ionization and field evaporation, and gas-surface interactions before concluding with a discussion on lattice imperfections. Scientists and students taking courses on diffraction and solid-state electron microscopy will benefit from this book.

Diffraction and Imaging Techniques in Material Science P1

S Amelinckx
Diffraction and Imaging Techniques in Material Science P1 Book PDF

Author : S Amelinckx
Publisher : Elsevier
Page : 472 pages
File Size : 44,6 Mb
Release : 2012-12-02
Category : Technology & Engineering
ISBN : 9780444601841

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Diffraction and Imaging Techniques in Material Science P1 by S Amelinckx Pdf

Diffraction and Imaging Techniques in Material Science describes the various methods used to study the atomic structure of matter at an atomic scale based on the interaction between matter and radiation. It classifies the possible methods of observation by making a list of radiations on the basis of wavelength, including ions, X-ray photons, neutrons, and electrons. It also discusses transmission electron microscopy, the weak-beam method of electron microscopy, and some applications of transmission electron microscopy to phase transitions. Organized into 13 chapters, this volume begins with an overview of the kinematic theory of electron diffraction and the ways to treat diffraction by a deformed crystal. It discusses the dynamical theory of diffraction of fast electrons, the treatment of absorption in the dynamical theory of electron diffraction, the use of electron microscopy to study planar interfaces, and analysis of weak-beam images. The book also covers the use of computed electron micrographs in defect identification, crystallographic analysis of dislocation loops containing shear components, and detection and identification of small coherent particles. In addition, the reader is introduced to interpretation of diffuse scattering and short-range order, along with the crystallography of martensitic transformations. The remaining chapters focus on the working principle of the transmission electron microscope, experimental structure imaging of crystals, and the study of diffuse scattering effects originating from substitutional disorder and displacement disorder. The information on diffraction and imaging techniques in material science contained in this book will be helpful to students, researchers, and scientists.

Diffraction and Imaging Techniques in Material Science

R. Gevers,J. van Landuyt
Diffraction and Imaging Techniques in Material Science Book PDF

Author : R. Gevers,J. van Landuyt
Publisher : North Holland
Page : 492 pages
File Size : 55,9 Mb
Release : 1978
Category : Technology & Engineering
ISBN : UCAL:B3764934

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Diffraction and Imaging Techniques in Material Science by R. Gevers,J. van Landuyt Pdf

Transmission Electron Microscopy

C. Barry Carter,David B. Williams
Transmission Electron Microscopy Book PDF

Author : C. Barry Carter,David B. Williams
Publisher : Springer
Page : 518 pages
File Size : 46,6 Mb
Release : 2016-08-24
Category : Technology & Engineering
ISBN : 9783319266510

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Transmission Electron Microscopy by C. Barry Carter,David B. Williams Pdf

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

X-Ray Diffraction for Materials Research

Myeongkyu Lee
X Ray Diffraction for Materials Research Book PDF

Author : Myeongkyu Lee
Publisher : CRC Press
Page : 302 pages
File Size : 47,6 Mb
Release : 2017-03-16
Category : Science
ISBN : 9781315361970

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X-Ray Diffraction for Materials Research by Myeongkyu Lee Pdf

X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.

Transmission Electron Microscopy and Diffractometry of Materials

Brent Fultz,James M. Howe
Transmission Electron Microscopy and Diffractometry of Materials Book PDF

Author : Brent Fultz,James M. Howe
Publisher : Springer Science & Business Media
Page : 759 pages
File Size : 41,8 Mb
Release : 2013-11-21
Category : Science
ISBN : 9783662045169

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Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz,James M. Howe Pdf

Aims and Scope of the Book This textbook was written for advanced un dergraduate students and beginning graduate students with backgrounds in physical science. Its goal is to acquaint them, as quickly as possible, with the central concepts and some details of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The topics in this book are developed to a level appropriate for most modern materials characterization research using TEM and XRD. There are, of course, many specialties that have attained a higher level of sophistication than presented here. The content of this book has been chosen in part to provide the background needed for a transition to these research specialties, or to other techniques such as neutron diffractometry. Although the book includes many practical details and examples, it does not cover some topics important for laboratory work. Perhaps the most obvious is the omission of specimen preparation methods for TEM. Beneath the details of principle and practice lies a larger goal of unifying the concepts common to both TEM and XRD. Coherence and wave interfer ence are conceptually similar for both x-ray waves and electron wavefunctions.

Advanced Real Time Imaging II

Jinichiro Nakano,P Chris Pistorius,Candan Tamerler,Hideyuki Yasuda,Zuotai Zhang,Neslihan Dogan,Wanlin Wang,Noritaka Saito,Bryan Webler
Advanced Real Time Imaging II Book PDF

Author : Jinichiro Nakano,P Chris Pistorius,Candan Tamerler,Hideyuki Yasuda,Zuotai Zhang,Neslihan Dogan,Wanlin Wang,Noritaka Saito,Bryan Webler
Publisher : Springer
Page : 154 pages
File Size : 48,7 Mb
Release : 2019-02-08
Category : Technology & Engineering
ISBN : 9783030061432

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Advanced Real Time Imaging II by Jinichiro Nakano,P Chris Pistorius,Candan Tamerler,Hideyuki Yasuda,Zuotai Zhang,Neslihan Dogan,Wanlin Wang,Noritaka Saito,Bryan Webler Pdf

“Real time” imaging techniques have assisted materials science studies especially for non-ambient environments. These techniques have never been collectively featured in a single venue. The book is an assembly of materials studies utilizing cutting edge real time imaging techniques, emphasizing the significance and impact of those techniques.

Electron Backscatter Diffraction in Materials Science

Adam J. Schwartz,Mukul Kumar,Brent L. Adams,David P. Field
Electron Backscatter Diffraction in Materials Science Book PDF

Author : Adam J. Schwartz,Mukul Kumar,Brent L. Adams,David P. Field
Publisher : Springer Science & Business Media
Page : 352 pages
File Size : 53,9 Mb
Release : 2013-06-29
Category : Technology & Engineering
ISBN : 9781475732054

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Electron Backscatter Diffraction in Materials Science by Adam J. Schwartz,Mukul Kumar,Brent L. Adams,David P. Field Pdf

Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).

Topics in Electron Diffraction and Microscopy of Materials

Peter. B Hirsch
Topics in Electron Diffraction and Microscopy of Materials Book PDF

Author : Peter. B Hirsch
Publisher : CRC Press
Page : 240 pages
File Size : 47,8 Mb
Release : 1999-01-01
Category : Science
ISBN : 075030538X

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Topics in Electron Diffraction and Microscopy of Materials by Peter. B Hirsch Pdf

Topics in Electron Diffraction and Microscopy of Materials celebrates the retirement of Professor Michael Whelan from the University of Oxford. Professor Whelan taught many of today's heads of department and was a pioneer in the development and use of electron microscopy. His collaborators and colleagues, each one of whom has made important advances in the use of microscopy to study materials, have contributed to this cohesive work. The book provides a useful overview of current applications for selected electron microscope techniques that have become important and widespread in their use for furthering our understanding of how materials behave. Linked through the dynamical theory of electron diffraction and inelastic scattering, the topics discussed include the history and impact of electron microscopy in materials science, weak-beam techniques for problem solving, defect structures and dislocation interactions, using beam diffraction patterns to look at defects in structures, obtaining chemical identification at atomic resolution, theoretical developments in backscattering channeling patterns, new ways to look at atomic bonds, using numerical simulations to look at electronic structure of crystals, RHEED observations for MBE growth, and atomic level imaging applications.

Impact of Electron and Scanning Probe Microscopy on Materials Research

David G. Rickerby,Giovanni Valdrè,Ugo Valdrè
Impact of Electron and Scanning Probe Microscopy on Materials Research Book PDF

Author : David G. Rickerby,Giovanni Valdrè,Ugo Valdrè
Publisher : Springer Science & Business Media
Page : 522 pages
File Size : 51,8 Mb
Release : 1999-10-31
Category : Science
ISBN : 0792359399

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Impact of Electron and Scanning Probe Microscopy on Materials Research by David G. Rickerby,Giovanni Valdrè,Ugo Valdrè Pdf

This book presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialised electron diffraction techniques are also covered, as is the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis. Materials analyzed include thin films, interfaces and non-conventional materials. WDS and EDS are treated, with an emphasis on phi(rhoZeta) techniques for the analysis of thin layers and surface films. Theoretical and practical aspects of ESEM are discussed in relation to applications in crystal growth, biomaterials and polymers. Recent developments in SPM are also described. A comprehensive survey of the state of the art in electron and SPM, future research directions and prospective applications in materials engineering.