Impact Of Electron And Scanning Probe Microscopy On Materials Research

Author : David G. Rickerby,Giovanni Valdrè,Ugo Valdrè
Publisher : Springer Science & Business Media
Page : 503 pages
File Size : 43,5 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9789401144513

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Impact of Electron and Scanning Probe Microscopy on Materials Research by David G. Rickerby,Giovanni Valdrè,Ugo Valdrè Pdf

The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.

Author : Sergei V. Kalinin,Alexei Gruverman
Publisher : Springer Science & Business Media
Page : 1002 pages
File Size : 40,8 Mb
Release : 2007-04-03
Category : Technology & Engineering
ISBN : 9780387286686

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Scanning Probe Microscopy by Sergei V. Kalinin,Alexei Gruverman Pdf

This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.

Author : Bert Voigtländer
Publisher : Springer
Page : 382 pages
File Size : 41,6 Mb
Release : 2015-02-24
Category : Technology & Engineering
ISBN : 9783662452400

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Scanning Probe Microscopy by Bert Voigtländer Pdf

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

Author : T. Sakurai,Y. Watanabe
Publisher : Springer Science & Business Media
Page : 352 pages
File Size : 48,5 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9783642569494

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Advances in Scanning Probe Microscopy by T. Sakurai,Y. Watanabe Pdf

There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland. These two techniques, STM and AFM, now form the core of what has come to be called the 'scanning probe microscopy (SPM)' family. SPM is not just the most powerful microscope for scientists to image atoms on surfaces, but is also becoming an indispensable tool for manipulating atoms and molecules to construct man-made materials and devices. Its impact has been felt in various fields, from surface physics and chemistry to nano-mechanics, nano-electronics and medical science. Its influence will surely extend further as the years go by, beyond the reach of our present imagination, and new research applications will continue to emerge. This book, therefore, is not intended to be a comprehensive review or textbook on SPM. Its aim is to cover only a selected part of the active re search fields of SPM and related topics in which I have been directly involved over the years. These include the basic principles of STM and AFM, and their applications to fullerene film growth, SiC surface reconstructions, MBE (molecular beam epitaxy) growth of CaAs, atomic scale manipulation of Si surfaces and meso scopic work function.

Author : K. S. Birdi
Publisher : CRC Press
Page : 330 pages
File Size : 51,7 Mb
Release : 2003-02-26
Category : Science
ISBN : 9780203011072

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Scanning Probe Microscopes by K. S. Birdi Pdf

Scanning Probe Microscopes: Applications in Science and Technology explains, analyzes, and demonstrates the most widely used microscope in the family of microscopes -- the scanning probe microscope. Beginning with an introduction to the development of SPMs, the author introduces the basics of scanning tunneling and atomic force microscopes (STMs an

Author : Sergei V. Kalinin,Alexei Gruverman
Publisher : Springer Science & Business Media
Page : 563 pages
File Size : 46,9 Mb
Release : 2010-12-13
Category : Technology & Engineering
ISBN : 9781441971678

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Scanning Probe Microscopy of Functional Materials by Sergei V. Kalinin,Alexei Gruverman Pdf

The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.

Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
Page : 414 pages
File Size : 40,9 Mb
Release : 2006-04-28
Category : Technology & Engineering
ISBN : 9783540269106

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Applied Scanning Probe Methods III by Bharat Bhushan,Harald Fuchs Pdf

The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.

Author : Dawn Bonnell
Publisher : John Wiley & Sons
Page : 520 pages
File Size : 53,6 Mb
Release : 2000-12-05
Category : Science
ISBN : 9780471248248

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Scanning Probe Microscopy and Spectroscopy by Dawn Bonnell Pdf

A practical introduction to basic theory and contemporary applications across a wide range of research disciplines Over the past two decades, scanning probe microscopies and spectroscopies have gained acceptance as indispensable characterization tools for an array of disciplines. This book provides novices and experienced researchers with a highly accessible treatment of basic theory, alongside detailed examples of current applications of both scanning tunneling and force microscopies and spectroscopies. Like its popular predecessor, Scanning Probe Microscopy and Spectroscopy, Second Edition features contributions from distinguished scientists working in a wide range of specialties at university, commercial, and government research labs around the world. Chapters have been edited for clarity, conciseness, and uniformity of presentation to provide professionals with a concise working reference to scanning probe microscopic and spectroscopic principles, techniques, and practices. This Second Edition has been substantially revised and expanded to reflect important advances and new applications. In addition to numerous examples, the Second Edition features expanded coverage of electrostatic and magnetic force microscopies, near-field optical microscopies, and new applications of buried interfaces in nanomechanics, electrochemistry, and biology. Scanning Probe Microscopy and Spectroscopy, Second Edition is an indispensable working resource for surface scientists, microscopists, and spectroscopists in materials science, chemistry, engineering, biochemistry, physics, and the life sciences. It is also an unparalleled reference text for advanced undergraduates and graduate students in those fields.

Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
Page : 456 pages
File Size : 54,6 Mb
Release : 2006-06-22
Category : Technology & Engineering
ISBN : 9783540274537

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Applied Scanning Probe Methods II by Bharat Bhushan,Harald Fuchs Pdf

The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.

Author : Samuel H. Cohen,Marcia L. Lightbody
Publisher : Springer Science & Business Media
Page : 210 pages
File Size : 48,9 Mb
Release : 2007-05-08
Category : Technology & Engineering
ISBN : 9780306470950

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Atomic Force Microscopy/Scanning Tunneling Microscopy 3 by Samuel H. Cohen,Marcia L. Lightbody Pdf

The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998. This book represents the compilation of papers that were presented at the AFM/STM Symposium as well as a few that were presented at SCANNING 96 and SCANNING 97 meetings that took place in Monterey, California. The purpose of the symposium was to provide an interface between scientists and engineers, representatives of industry, government and academia, all of whom have a common interest in probe microscopies. The meetings offered an ideal forum where ideas could easily be exchanged and where individuals from diverse fields who are on the cutting edge ofprobe microscopy research could communicate with one another. Experts in probe microscopy from around the world representing a wide range of disciplines including physics, biotechnology, nanotechnology, chemistry, material science, etc., were invited to participate. The format of the meeting was structured so as to encourage communication among these individuals. During the first day’s sessions papers were presented on general topics such as application of scanning probe microscopy in materials science; STM and scanning tunneling spectroscopy of organic materials; fractal analysis in AFM; and nanomanipulation. Other papers presented included unexpected ordering of a molecule; synthesis ofpeptides and oligonucleotides; and analysis oflunar soils from Apollo 11.

Author : Paula Maria Vilarinho,Yossi Rosenwaks,Angus Kingon
Publisher : Springer Science & Business Media
Page : 530 pages
File Size : 54,7 Mb
Release : 2024-06-28
Category : Electronic
ISBN : 1402030177

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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials by Paula Maria Vilarinho,Yossi Rosenwaks,Angus Kingon Pdf

Author : Nicolas Brodusch,Hendrix Demers,Raynald Gauvin
Publisher : Springer
Page : 137 pages
File Size : 45,8 Mb
Release : 2017-09-25
Category : Technology & Engineering
ISBN : 9789811044335

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Field Emission Scanning Electron Microscopy by Nicolas Brodusch,Hendrix Demers,Raynald Gauvin Pdf

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

Author : Adam Foster,Werner A. Hofer
Publisher : Springer
Page : 282 pages
File Size : 40,7 Mb
Release : 2006-06-28
Category : Technology & Engineering
ISBN : 0387400907

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Scanning Probe Microscopy by Adam Foster,Werner A. Hofer Pdf

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today’s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today’s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.

Author : Roland Wiesendanger
Publisher : Cambridge University Press
Page : 664 pages
File Size : 54,5 Mb
Release : 1994-09-29
Category : Science
ISBN : 0521428475

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Scanning Probe Microscopy and Spectroscopy by Roland Wiesendanger Pdf

The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunnelling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, as are the applications of these techniques in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used.

Author : Vijay Nalladega
Publisher : BoD – Books on Demand
Page : 258 pages
File Size : 44,9 Mb
Release : 2012-04-27
Category : Science
ISBN : 9789535105763

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Scanning Probe Microscopy by Vijay Nalladega Pdf

Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film structures, oxide thin layers and superconducting structures, novel scanning probe microscopy techniques for characterization of mechanical and electrical properties, evaluation of mechanical and tribological properties of hybrid coatings and thin films. The variety of topics chosen for the book underlines the strong interdisciplinary nature of the research work in the field of scanning probe microscopy.