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Author : K. C. Thompson-Russell,Jeffrey William Edington
Publisher : Unknown
Page : 154 pages
File Size : 47,6 Mb
Release : 1977
Category : Electron microscopy
ISBN : UCSD:31822002727725
Author : Jeanne Ayache,Luc Beaunier,Jacqueline Boumendil,Gabrielle Ehret,Danièle Laub
Publisher : Springer Science & Business Media
Page : 250 pages
File Size : 44,5 Mb
Release : 2010-07-03
Category : Technology & Engineering
ISBN : 0387981829
Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti?c literature detailing speci?c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin spe- men preparation have appeared until this present work, ?rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.
Author : Jeanne Ayache,Luc Beaunier,Jacqueline Boumendil,Gabrielle Ehret,Danièle Laub
Publisher : Springer Science & Business Media
Page : 338 pages
File Size : 46,6 Mb
Release : 2010-06-08
Category : Technology & Engineering
ISBN : 1441959742
Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti c literature detailing speci c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin specimen preparation have appeared until this present work, rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.
Author : PJ Goodhew
Publisher : Garland Science
Page : 50 pages
File Size : 43,8 Mb
Release : 2020-11-25
Category : Science
ISBN : 9781000142761
Details the essential practical steps which must precede microscopy. Methods for preparing sheet or disc specimens and final thinning techniques are described with reference to practical problems. The book also covers methods for mounting specimens in the
Author : Peter J. Goodhew
Publisher : North Holland
Page : 190 pages
File Size : 41,8 Mb
Release : 1973
Category : Science
ISBN : UOM:39015004454859
Author : Peter J. Goodhew
Publisher : Garland Science
Page : 56 pages
File Size : 55,8 Mb
Release : 1984
Category : Electron microscope, Transmission
ISBN : UCAL:B4564362
Details the essential practical steps which must precede microscopy. Methods for preparing sheet or disc specimens and final thinning techniques are described with reference to practical problems. The book also covers methods for mounting specimens in the
Author : Audrey Marion Glauert
Publisher : Unknown
Page : 0 pages
File Size : 45,7 Mb
Release : 1973
Category : Electronic
ISBN : 0720442508
Author : Patrick Echlin
Publisher : Springer Science & Business Media
Page : 329 pages
File Size : 48,9 Mb
Release : 2011-04-14
Category : Technology & Engineering
ISBN : 9780387857312
Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Author : Xiao-Feng Zhang,Ze Zhang
Publisher : Springer Science & Business Media
Page : 342 pages
File Size : 50,6 Mb
Release : 2001-10-18
Category : Medical
ISBN : 3540676813
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume 2 illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.
Author : Audrey M. Glauert
Publisher : Unknown
Page : 464 pages
File Size : 46,8 Mb
Release : 1972
Category : Electron microscopy
ISBN : UVA:X000729441
Author : Ron M. Anderson,Scott D. Walck
Publisher : Unknown
Page : 320 pages
File Size : 41,6 Mb
Release : 1997
Category : Science
ISBN : 1558993843
Successful transmission electron microscopy (TEM) experimentation depends on many things, one being specimen preparation. Whereas TEM samples of bulk metallic or ceramic materials can be prepared in a straightforward manner, the need to examine nonbulk and/or other classes of materials creates a need for more specialized preparation methods. This book from MRS, the fourth in a successful series, pioneers novel methods or ways of characterizing the specimen preparation process. Contributions to the book are tutorial in nature, and therefore somewhat longer than usual. Papers cover both general and materials-specific specimen preparation methods. Metallic, polymer, plastic, semiconducting, ceramic and magnetic materials as found in bulk, thin-film, dispersed and powdered forms are discussed.
Author : Anonim
Publisher : ASTM International
Page : 761 pages
File Size : 52,5 Mb
Release : 2024-06-30
Category : Electronic
ISBN : 8210379456XXX
Author : Anwar Ul-Hamid
Publisher : Springer
Page : 422 pages
File Size : 40,5 Mb
Release : 2018-10-26
Category : Technology & Engineering
ISBN : 9783319984827
This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area. The SEM is routinely used to study the surface structure and chemistry of a wide range of biological and synthetic materials at the micrometer to nanometer scale. Ease-of-use, typically facile sample preparation, and straightforward image interpretation, combined with high resolution, high depth of field, and the ability to undertake microchemical and crystallographic analysis, has made scanning electron microscopy one of the most powerful and versatile techniques for characterization today. Indeed, the SEM is a vital tool for the characterization of nanostructured materials and the development of nanotechnology. However, its wide use by professionals with diverse technical backgrounds—including life science, materials science, engineering, forensics, mineralogy, etc., and in various sectors of government, industry, and academia—emphasizes the need for an introductory text providing the basics of effective SEM imaging.A Beginners’ Guide to Scanning Electron Microscopy explains instrumentation, operation, image interpretation and sample preparation in a wide ranging yet succinct and practical text, treating the essential theory of specimen-beam interaction and image formation in a manner that can be effortlessly comprehended by the novice SEM user. This book provides a concise and accessible introduction to the essentials of SEM includes a large number of illustrations specifically chosen to aid readers' understanding of key concepts highlights recent advances in instrumentation, imaging and sample preparation techniques offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds.
Author : M. A. Nasser Hajibagheri
Publisher : Springer Science & Business Media
Page : 292 pages
File Size : 51,8 Mb
Release : 2008-02-02
Category : Science
ISBN : 9781592592012
Electron Microscopy Methods and Protocols is designed for the established researcher as a manual for extending knowledge of the field. It is also for the newcomer who wishes to move into the field. A wide range of applications for the examination of cells, tissues, biological macromolecules, molecular structures, and their interactions are discussed. We have tried to gather together methods that we consider to be those most generally appli- ble to current research in both cell and molecular biology. Each chapter c- tains a set of related practical protocols with examples provided by experts who have first-hand knowledge of the techniques they describe. The individual chapters are grouped according to similarities in their specimen preparation and methodology. Methods are presented in detail, in a step-by-step fashion, using reproducible protocols the authors have personally checked. During the last decade, the scientific literature describing the use of colloidal gold as an immunocytochemical marker has increased at an ex- nential rate, and this trend is expected to continue. We have included a large number of variations on the immunogold labeling technique. In both the ne- tive staining and cryo chapters, authors emphasize the “immunological app- cations” in order to correlate as fully as possible with the emphasis on immunogold labeling in the other chapters. Electron Microscopy Methods and Protocols commences with the routine preparation of biological material for classical transmission electron microscopy involving tissue fixation, embedding, and sectioning (Chap. 1).
Author : J. McCall
Publisher : Springer Science & Business Media
Page : 360 pages
File Size : 40,7 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461587088
/.letallography is much more than taking striking pictures at high magnifications or polishing and etching specimens in such a way that no scratches can be seen. Basically, metallography is the physical metallurgist's most useful and most used tool for studying metals. Although it is perhaps his oldest tool, it certainly is not likely to become obsolete. Rather, the continued demands that have been placed upon materials have required more detailed charac terizations of their microstructures and this, in turn, has re quired the metallographer to develop new techniques to make these characterizations. Not too many years ago, the metallographer had only optical microscopes with which to examine his specimens. Now he has elec tron microscopes, scanning electron microscopes, and a whole host of instruments which were unknown to him only a relatively few years ago. This has forced him to learn not only how to use these new instruments and how to interpret the information that they provide but it also has made him develop new techniques for preparing the samples for examination.
