Author : Lawrence C. Wagner
Publisher : Springer Science & Business Media
Page : 256 pages
File Size : 51,5 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461549192
Failure Analysis of Integrated Circuits by Lawrence C. Wagner Pdf
This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.