Failure Analysis Of Integrated Circuits

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Failure Analysis of Integrated Circuits

Author : Lawrence C. Wagner
Publisher : Springer Science & Business Media
Page : 256 pages
File Size : 51,5 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461549192

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Failure Analysis of Integrated Circuits by Lawrence C. Wagner Pdf

This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.

Integrated Circuit Failure Analysis

Author : Friedrich Beck
Publisher : John Wiley & Sons
Page : 198 pages
File Size : 47,8 Mb
Release : 1998-02-04
Category : Technology & Engineering
ISBN : 0471974013

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Integrated Circuit Failure Analysis by Friedrich Beck Pdf

Funktionstests an integrierten Schaltungen sind für deren Zuverlässigkeit von herausragender Bedeutung. Erstmals werden in diesem Werk die speziellen Präparationstechniken für die Fehleranalyse beschrieben. Ausgehend von den theoretischen Grundlagen erläutert der Autor in praxisnahem Stil die verschiedenen Techniken, die das Zurückverfolgen von Ausfällen ermöglichen.

2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

Author : IEEE Staff
Publisher : Unknown
Page : 128 pages
File Size : 45,6 Mb
Release : 2016-07-18
Category : Electronic
ISBN : 1467382604

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2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) by IEEE Staff Pdf

IPFA is devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability, yield and performance, especially those related to advanced process technologies

2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits

Author : Institute of Electrical and Electronics Engineers (New York, NY),IEEE Staff,IEEE Electron Devices Society. Seoul Section,IEEE Electron Devices Society
Publisher : Unknown
Page : 407 pages
File Size : 45,6 Mb
Release : 2011-07-08
Category : Integrated circuits
ISBN : 1457701596

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2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits by Institute of Electrical and Electronics Engineers (New York, NY),IEEE Staff,IEEE Electron Devices Society. Seoul Section,IEEE Electron Devices Society Pdf

Microelectronics Failure Analysis

Author : Anonim
Publisher : ASM International
Page : 813 pages
File Size : 44,6 Mb
Release : 2004-01-01
Category : Technology & Engineering
ISBN : 9780871708045

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Microelectronics Failure Analysis by Anonim Pdf

For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was assigned to the update by the Electron