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Author : P. Goodman,International Union of Crystallography
Publisher : Springer
Page : 454 pages
File Size : 52,9 Mb
Release : 1981-07-31
Category : Science
ISBN : MINN:31951000464806L
Author : P.P. Ewald
Publisher : Springer Science & Business Media
Page : 735 pages
File Size : 53,7 Mb
Release : 2012-12-06
Category : Science
ISBN : 9781461599616
Origin, Scope, and Plan of this Book In July 1962 the fiftieth anniversary of Max von Laue's discovery of the Diffraction of X-rays by crystals is going to be celebrated in Munich by a large international group of crystallographers, physi cists, chemists, spectroscopists, biologists, industrialists, and many others who are employing the methods based on Laue's discovery for their own research. The invitation for this celebration will be issued jointly by the Ludwig Maximilian University of Munich, where the discovery was made, by the Bavarian Academy of Sciences, where it was first made public, and by the International Union of Crystallo graphy, which is the international organization of the National Committees of Crystallography formed in some 30 countries to repre sent and advance the interests of the 3500 research workers in this field. The year 1912 also is the birth year of two branches of the physical sciences which developed promptly from Laue's discovery, namely X-ray Crystal Structure Analysis which is most closely linked to the names ofW. H. (Sir William) Bragg and W. L. (Sir Lawrence) Bragg, and X-ray Spectroscopy which is associated with the names of W. H. Bragg, H. G. J. Moseley, M. de Broglie and Manne Siegbahn. Crystal Structure Analysis began in November 1912 with the first papers ofW. L. Bragg, then still a student in Cambridge, in which, by analysis of the Laue diagrams _of zinc blende, he determined the correct lattice upon which the structure of this crystal is built.
Author : David B. Williams,C. Barry Carter
Publisher : Springer Science & Business Media
Page : 804 pages
File Size : 45,6 Mb
Release : 2009-08-05
Category : Science
ISBN : 9780387765006
This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, the book provides the necessary instructions for successful hands-on application of this versatile materials characterization technique.
Author : Lawrence Olin Brockway
Publisher : Unknown
Page : 544 pages
File Size : 40,6 Mb
Release : 1977
Category : Crystallography
ISBN : STANFORD:36105003131955
Author : Istv¿n Hargittai,M. Hargittai
Publisher : John Wiley & Sons
Page : 594 pages
File Size : 55,9 Mb
Release : 1988-10-01
Category : Science
ISBN : 9780471186892
This collection of twenty-six articles by leading experts is the first truly comprehensive account of the gas-phase electron diffraction technique. It is written for the non-specialist users of structural information. Part A discusses the development and present capabilities of gas electron diffraction. Several contributions deal with the combined application of various techniques. Part B contains the structural information and also presents trends and interpretations of structural variations.
Author : Michel A. VanHove,William Henry Weinberg,Chi-Ming Chan
Publisher : Springer Science & Business Media
Page : 617 pages
File Size : 52,6 Mb
Release : 2012-12-06
Category : Science
ISBN : 9783642827211
Surface crystallography plays the same fundamental role in surface science which bulk crystallography has played so successfully in solid-state physics and chemistry. The atomic-scale structure is one of the most important aspects in the understanding of the behavior of surfaces in such widely diverse fields as heterogeneous catalysis, microelectronics, adhesion, lubrication, cor rosion, coatings, and solid-solid and solid-liquid interfaces. Low-Energy Electron Diffraction or LEED has become the prime tech nique used to determine atomic locations at surfaces. On one hand, LEED has yielded the most numerous and complete structural results to date (almost 200 structures), while on the other, LEED has been regarded as the "technique to beat" by a variety of other surface crystallographic methods, such as photoemission, SEXAFS, ion scattering and atomic diffraction. Although these other approaches have had impressive successes, LEED has remained the most productive technique and has shown the most versatility of application: from adsorbed rare gases, to reconstructed surfaces of sem iconductors and metals, to molecules adsorbed on metals. However, these statements should not be viewed as excessively dogmatic since all surface sensitive techniques retain untapped potentials that will undoubtedly be explored and exploited. Moreover, surface science remains a multi-technique endeavor. In particular, LEED never has been and never will be self sufficient. LEED has evolved considerably and, in fact, has reached a watershed.
Author : Ludwig Reimer
Publisher : Springer
Page : 532 pages
File Size : 43,6 Mb
Release : 2013-11-11
Category : Science
ISBN : 9783662135532
The aim of this book is to outline the physics of image formation, electron specimen interactions and image interpretation in transmission electron mic roscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elek tronenmikroskopische Untersuchungs- und Priiparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of elec trons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recogni tion that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast.
Author : American Society for Testing and Materials Annual Meeting
Publisher : ASTM International
Page : 414 pages
File Size : 44,5 Mb
Release : 1968
Category : Electronic
ISBN : 8210379456XXX
Author : Allan L. Bednowitz,Armin P. Segmüller
Publisher : Springer Science & Business Media
Page : 275 pages
File Size : 42,7 Mb
Release : 2013-04-17
Category : Science
ISBN : 9789401737012
A brief historical account of the background leading to the publication of the first four editions of the World Directory of Crystallographers was presented by G. Boom in his preface to the Fourth Edition, published late in 1971. That edition was produced by traditional typesetting methods from compilations of biographical data prepared by national Sub-Editors. The major effort required to produce a directory by manual methods provided the impetus to use computer techniques for the Fifth Edition. The account of the production of the first computer assisted Directory was described by S.C. Abrahams in the preface of the Fifth Edition. Computer composition, which required a machine readable data base, offered several major advantages. The choice of typeface and range of characters was flexible. Corrections and additions to the data base were rapid and, once established, it was hoped updating for future editions would be simple and inexpensive. The data base was put to other Union uses, such as preparation of mailing labels and formulation of lists of crystallographers with specified common fields of interest. The Fifth Edition of the World Directory of Crystallographers was published in June of 1977, the Sixth in May of 1981. The Subject Indexes for the Fifth and Sixth Editions were printed in 1978 and 1981 respectively, both having a limited distribution.
Author : Lai Chung Liu
Publisher : Springer Nature
Page : 249 pages
File Size : 49,6 Mb
Release : 2020-09-10
Category : Science
ISBN : 9783030548513
The thesis provides the necessary experimental and analytical tools to unambiguously observe the atomically resolved chemical reactions. A great challenge of modern science has been to directly observe atomic motions during structural transitions, and while this was first achieved through a major advance in electron source brightness, the information content was still limited and new methods for image reconstruction using femtosecond electron diffraction methods were needed. One particular challenge lay in reconciling the innumerable possible nuclear configurations with the observation of chemical reaction mechanisms that reproducibly give the same kind of chemistry for large classes of molecules. The author shows that there is a simple solution that occurs during barrier crossing in which the highly anharmonic potential at that point in nuclear rearrangements couples high- and low-frequency vibrational modes to give highly localized nuclear motions, reducing hundreds of potential degrees of freedom to just a few key modes. Specific examples are given in this thesis, including two photoinduced phase transitions in an organic system, a ring closure reaction, and two direct observations of nuclear reorganization driven by spin transitions. The emerging field of structural dynamics promises to change the way we think about the physics of chemistry and this thesis provides tools to make it happen.
Author : Anonim
Publisher : Academic Press
Page : 885 pages
File Size : 52,5 Mb
Release : 1996-08-05
Category : Science
ISBN : 0080577628
As a complement to The Beginnings of Electron Microscopy, Advances in Imaging and Electron Physics is pleased to present Volume 96, The Growth of Electron Microscopy. This comprehensive collection of articles surveys the accomplishments of various national groups that comprise the International Federation of Societies of Electron Microscopy (IFSEM).
Author : Victor A. Drits
Publisher : Springer Science & Business Media
Page : 366 pages
File Size : 47,6 Mb
Release : 2012-12-06
Category : Science
ISBN : 9783642717291
The decision of Springer-Verlag to publish this book in English came as a pleasant surprise. The fact is that I started writing the first version of the book back in 1978. I wished to attract attention to potentialities inherent in selected-area electron diffraction (SAED) which, for various reasons, were not being put to use. By that time, I had at my disposal certain structural data on natural and synthetic minerals obtained using SAED and high-resolution electron microscopy (HREM), and this stimulated my writing this book. There were several aspects concerning these data that I wished to emphasize. First, it was mostly new and understudied minerals that possess the peculiar structural features studied by SAED and HREM. This could interest mineralogists, crystallo chemists, and crystallographers. Second, the results obtained indi cated that, under certain conditions, SAED could be an effective, and sometimes the only possible, method for structure analysis of minerals. This inference was of primary importance, since fine dispersion and poor crystallinity of numerous natural and synthe tic minerals makes their structure study by conventional diffrac tion methods hardly possible. Third, it was demonstrated that in many cases X-ray powder diffraction analysis of dispersed miner als ought to be combined with SAED and local energy dispersion analysis. This was important, since researchers in structural min eralogy quite often ignored, and still ignore even the simplest in formation which is readily available from geometrical analysis of SAED patterns obtained from microcrystals.
Author : David Bernard Williams,C. Barry Carter
Publisher : Springer Science & Business Media
Page : 818 pages
File Size : 50,5 Mb
Release : 1996
Category : Science
ISBN : 0306452472
This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.
Author : Anonim
Publisher : Academic Press
Page : 286 pages
File Size : 40,7 Mb
Release : 2018-03-19
Category : Computers
ISBN : 9780128155431
Advances in Imaging and Electron Physics, Volume 205 is the latest release in this series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contains contributions from leading authorities on the subject matter Informs and updates on all the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing
Author : Jian Min Zuo,John C.H. Spence
Publisher : Springer
Page : 729 pages
File Size : 50,6 Mb
Release : 2016-10-26
Category : Technology & Engineering
ISBN : 9781493966073
This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.