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Hierarchical Electromigration Reliability Diagnosis For Ulsi Interconnects Book in PDF, ePub and Kindle version is available to download in english. Read online anytime anywhere directly from your device. Click on the download button below to get a free pdf file of Hierarchical Electromigration Reliability Diagnosis For Ulsi Interconnects book. This book definitely worth reading, it is an incredibly well-written.
Author : Anonim
Publisher : Unknown
Page : 872 pages
File Size : 52,8 Mb
Release : 1996
Category : Dissertation abstracts
ISBN : UOM:39015086908202
Author : Institute of Electrical and Electronics Engineers
Publisher : Unknown
Page : 1468 pages
File Size : 50,7 Mb
Release : 1997
Category : Electrical engineering
ISBN : STANFORD:36105021810853
Author : Anonim
Publisher : Unknown
Page : 1990 pages
File Size : 51,7 Mb
Release : 1995
Category : Electrical engineering
ISBN : OSU:32435054907035
Author : Yannis Tsividis
Publisher : World Scientific
Page : 300 pages
File Size : 49,6 Mb
Release : 2002
Category : Technology & Engineering
ISBN : 9812381112
Improve your circuit-design potential with this expert guide to the devices and technology used in mixed analog-digital VLSI chips for such high-volume applications as hard-disk drives, wireless telephones, and consumer electronics. The book provides you with a critical understanding of device models, fabrication technology, and layout as they apply to mixed analog-digital circuits.You will learn about the many device-modeling requirements for analog work, as well as the pitfalls in models used today for computer simulators such as Spice. Also included is information on fabrication technologies developed specifically for mixed-signal VLSI chips, plus guidance on the layout of mixed analog-digital chips for a high degree of analog-device matching and minimum digital-to-analog interference.This reference book features an intuitive introduction to MOSFET operation that will enable you to view with insight any MOSFET model ? besides thorough discussions on valuable large-signal and small-signal models.Filled with practical information, this first-of-its-kind book will help you grasp the nuances of mixed-signal VLSI-device models and layout that are crucial to the design of high-performance chips.
Author : Marius Bazu,Titu Bajenescu
Publisher : John Wiley & Sons
Page : 372 pages
File Size : 42,5 Mb
Release : 2011-03-08
Category : Technology & Engineering
ISBN : 9781119990000
Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers need practical orientation around the complex procedures involved in failure analysis. This guide acts as a tool for all advanced techniques, their benefits and vital aspects of their use in a reliability programme. Using twelve complex case studies, the authors explain why failure analysis should be used with electronic components, when implementation is appropriate and methods for its successful use. Inside you will find detailed coverage on: a synergistic approach to failure modes and mechanisms, along with reliability physics and the failure analysis of materials, emphasizing the vital importance of cooperation between a product development team involved the reasons why failure analysis is an important tool for improving yield and reliability by corrective actions the design stage, highlighting the ‘concurrent engineering' approach and DfR (Design for Reliability) failure analysis during fabrication, covering reliability monitoring, process monitors and package reliability reliability resting after fabrication, including reliability assessment at this stage and corrective actions a large variety of methods, such as electrical methods, thermal methods, optical methods, electron microscopy, mechanical methods, X-Ray methods, spectroscopic, acoustical, and laser methods new challenges in reliability testing, such as its use in microsystems and nanostructures This practical yet comprehensive reference is useful for manufacturers and engineers involved in the design, fabrication and testing of electronic components, devices, ICs and electronic systems, as well as for users of components in complex systems wanting to discover the roots of the reliability flaws for their products.
Author : Ashok K. Sharma
Publisher : Wiley-IEEE Press
Page : 480 pages
File Size : 52,5 Mb
Release : 2002-09-10
Category : Technology & Engineering
ISBN : 0780310004
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including. * Memory cell structures and fabrication technologies. * Application-specific memories and architectures. * Memory design, fault modeling and test algorithms, limitations, and trade-offs. * Space environment, radiation hardening process and design techniques, and radiation testing. * Memory stacks and multichip modules for gigabyte storage.
Author : Hubert Kaeslin
Publisher : Cambridge University Press
Page : 878 pages
File Size : 49,7 Mb
Release : 2008-04-28
Category : Technology & Engineering
ISBN : 9780521882675
This practical, tool-independent guide to designing digital circuits takes a unique, top-down approach, reflecting the nature of the design process in industry. Starting with architecture design, the book comprehensively explains the why and how of digital circuit design, using the physics designers need to know, and no more.
Author : Anonim
Publisher : Unknown
Page : 1904 pages
File Size : 42,6 Mb
Release : 1997
Category : Electrical engineering
ISBN : OSU:32435059589259
Author : Anonim
Publisher : Unknown
Page : 2540 pages
File Size : 42,8 Mb
Release : 2002
Category : Chemistry
ISBN : UOM:39015057321377
Author : Anonim
Publisher : Unknown
Page : 1014 pages
File Size : 54,9 Mb
Release : 1999
Category : Metallurgy
ISBN : CORNELL:31924077935538
Author : Abbas Sheibanyrad,Frédéric Pétrot,Axel Jantsch
Publisher : Springer Science & Business Media
Page : 280 pages
File Size : 53,6 Mb
Release : 2010-11-08
Category : Technology & Engineering
ISBN : 9781441976185
This book presents the research challenges that are due to the introduction of the 3rd dimension in chips for researchers and covers the whole architectural design approach for 3D-SoCs. Nowadays the 3D-Integration technologies, 3D-Design techniques, and 3D-Architectures are emerging as interesting, truly hot, broad topics. The present book gathers the recent advances in the whole domain by renowned experts in the field to build a comprehensive and consistent book around the hot topics of three-dimensional architectures and micro-architectures. This book includes contributions from high level international teams working in this field.
Author : Manoj Kumar Majumder,Vijay Rao Kumbhare,Aditya Japa,Brajesh Kumar Kaushik
Publisher : CRC Press
Page : 373 pages
File Size : 50,6 Mb
Release : 2020-11-24
Category : Science
ISBN : 9781000223071
Focussing on micro- and nanoelectronics design and technology, this book provides thorough analysis and demonstration, starting from semiconductor devices to VLSI fabrication, designing (analog and digital), on-chip interconnect modeling culminating with emerging non-silicon/ nano devices. It gives detailed description of both theoretical as well as industry standard HSPICE, Verilog, Cadence simulation based real-time modeling approach with focus on fabrication of bulk and nano-devices. Each chapter of this proposed title starts with a brief introduction of the presented topic and ends with a summary indicating the futuristic aspect including practice questions. Aimed at researchers and senior undergraduate/graduate students in electrical and electronics engineering, microelectronics, nanoelectronics and nanotechnology, this book: Provides broad and comprehensive coverage from Microelectronics to Nanoelectronics including design in analog and digital electronics. Includes HDL, and VLSI design going into the nanoelectronics arena. Discusses devices, circuit analysis, design methodology, and real-time simulation based on industry standard HSPICE tool. Explores emerging devices such as FinFETs, Tunnel FETs (TFETs) and CNTFETs including their circuit co-designing. Covers real time illustration using industry standard Verilog, Cadence and Synopsys simulations.
Author : Henry Baltes,Oliver Brand,Gary K. Fedder,Christofer Hierold,Jan G. Korvink,Osamu Tabata
Publisher : John Wiley & Sons
Page : 612 pages
File Size : 40,6 Mb
Release : 2008-07-11
Category : Technology & Engineering
ISBN : 9783527616930
Microstructures, electronics, nanotechnology - these vast fields of research are growing together as the size gap narrows and many different materials are combined. Current research, engineering sucesses and newly commercialized products hint at the immense innovative potentials and future applications that open up once mankind controls shape and function from the atomic level right up to the visible world without any gaps. Sensor systems, microreactors, nanostructures, nanomachines, functional surfaces, integrated optics, displays, communications technology, biochips, human/machine interfaces, prosthetics, miniaturized medical and surgery equipment and many more opportunities are being explored. This new series, Advanced Micro and Nano Systems, provides cutting-edge reviews from top authors on technologies, devices and advanced systems from the micro and nano worlds.
Author : Jens Lienig,Matthias Thiele
Publisher : Springer
Page : 159 pages
File Size : 53,5 Mb
Release : 2018-02-23
Category : Technology & Engineering
ISBN : 9783319735580
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability.
Author : Jan Rabaey
Publisher : Springer Science & Business Media
Page : 371 pages
File Size : 49,5 Mb
Release : 2009-04-21
Category : Technology & Engineering
ISBN : 9780387717135
This book contains all the topics of importance to the low power designer. It first lays the foundation and then goes on to detail the design process. The book also discusses such special topics as power management and modal design, ultra low power, and low power design methodology and flows. In addition, coverage includes projections of the future and case studies.