In Situ Transmission Electron Microscopy Experiments

Author : Renu Sharma
Publisher : John Wiley & Sons
Page : 389 pages
File Size : 47,7 Mb
Release : 2023-05-15
Category : Science
ISBN : 9783527347988

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In-Situ Transmission Electron Microscopy Experiments by Renu Sharma Pdf

In-Situ Transmission Electron Microscopy Experiments Design and execute cutting-edge experiments with transmission electron microscopy using this essential guide In-situ microscopy is a recently-discovered and rapidly-developing approach to transmission electron microscopy (TEM) that allows for the study of atomic and/or molecular changes and processes while they are in progress. Experimental specimens are subjected to stimuli that replicate near real-world conditions and their effects are observed at a previously unprecedented scale. Though in-situ microscopy is becoming an increasingly important approach to TEM, there are no current texts combining an up-to-date overview of this cutting-edge set of techniques with the experience of in-situ TEM professionals. In-Situ Transmission Electron Microscopy Experiments meets this need with a work that synthesizes the collective experience of myriad collaborators. It constitutes a comprehensive guide for planning and performing in-situ TEM measurements, incorporating both fundamental principles and novel techniques. Its combination of technical detail and practical how-to advice makes it an indispensable introduction to this area of research. In-Situ Transmission Electron Microscopy Experiments readers will also find: Coverage of the entire experimental process, from method selection to experiment design to measurement and data analysis Detailed treatment of multimodal and correlative microscopy, data processing and machine learning, and more Discussion of future challenges and opportunities facing this field of research In-Situ Transmission Electron Microscopy Experiments is essential for graduate students, post-doctoral fellows, and early career researchers entering the field of in-situ TEM.

Author : P.W. Hawkes,John C.H. Spence
Publisher : Springer Science & Business Media
Page : 1322 pages
File Size : 50,7 Mb
Release : 2008-08-29
Category : Technology & Engineering
ISBN : 9780387497624

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Science of Microscopy by P.W. Hawkes,John C.H. Spence Pdf

This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.

Author : Anonim
Publisher : Unknown
Page : 128 pages
File Size : 49,9 Mb
Release : 2024-06-15
Category : Electronic
ISBN : 9789814471466

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In-Situ Electron Microscopy at High Resolution by Anonim Pdf

Author : Gerhard Dehm,James M. Howe,Josef Zweck
Publisher : John Wiley & Sons
Page : 403 pages
File Size : 40,7 Mb
Release : 2012-05-30
Category : Technology & Engineering
ISBN : 9783527652181

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In-situ Electron Microscopy by Gerhard Dehm,James M. Howe,Josef Zweck Pdf

Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

Author : Florian Banhart
Publisher : World Scientific
Page : 318 pages
File Size : 55,5 Mb
Release : 2008
Category : Science
ISBN : 9789812797339

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In-situ Electron Microscopy at High Resolution by Florian Banhart Pdf

In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.

Author : Frances M. Ross
Publisher : Cambridge University Press
Page : 529 pages
File Size : 43,5 Mb
Release : 2017
Category : Science
ISBN : 9781107116573

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Liquid Cell Electron Microscopy by Frances M. Ross Pdf

2.6.2 Electrodes for Electrochemistry

Author : E. P. Butler,K. F. Hale
Publisher : North-Holland
Page : 484 pages
File Size : 46,5 Mb
Release : 1981
Category : Electron microscopes
ISBN : IND:30000121265205

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Dynamic Experiments in the Electron Microscope by E. P. Butler,K. F. Hale Pdf

Author : Stefan G. Stanciu
Publisher : BoD – Books on Demand
Page : 444 pages
File Size : 43,8 Mb
Release : 2016-09-21
Category : Technology & Engineering
ISBN : 9789535125785

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Microscopy and Analysis by Stefan G. Stanciu Pdf

Microscopes represent tools of the utmost importance for a wide range of disciplines. Without them, it would have been impossible to stand where we stand today in terms of understanding the structure and functions of organelles and cells, tissue composition and metabolism, or the causes behind various pathologies and their progression. Our knowledge on basic and advanced materials is also intimately intertwined to the realm of microscopy, and progress in key fields of micro- and nanotechnologies critically depends on high-resolution imaging systems. This volume includes a series of chapters that address highly significant scientific subjects from diverse areas of microscopy and analysis. Authoritative voices in their fields present in this volume their work or review recent trends, concepts, and applications, in a manner that is accessible to a broad readership audience from both within and outside their specialist area.

Author : C. Barry Carter,David B. Williams
Publisher : Springer
Page : 518 pages
File Size : 54,8 Mb
Release : 2016-08-24
Category : Technology & Engineering
ISBN : 9783319266510

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Transmission Electron Microscopy by C. Barry Carter,David B. Williams Pdf

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

Author : Audry M. Glauert
Publisher : Unknown
Page : 484 pages
File Size : 53,9 Mb
Release : 1972
Category : Electron microscopy
ISBN : UOM:39015006171642

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Practical Methods in Electron Microscopy: Butler, E.P. and Hale, K.F. Dynamic experiments in the electron microscope by Audry M. Glauert Pdf

Author : Peter W. Hawkes,John C.H. Spence
Publisher : Springer Nature
Page : 1561 pages
File Size : 42,7 Mb
Release : 2019-11-02
Category : Technology & Engineering
ISBN : 9783030000691

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Springer Handbook of Microscopy by Peter W. Hawkes,John C.H. Spence Pdf

This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.

Author : Litao Sun,Tao Xu,Ze Zhang
Publisher : Springer Nature
Page : 378 pages
File Size : 46,5 Mb
Release : 2023-03-11
Category : Technology & Engineering
ISBN : 9789811968457

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In-Situ Transmission Electron Microscopy by Litao Sun,Tao Xu,Ze Zhang Pdf

This book focuses on in-situ transmission electron microscopy (TEM), an investigatory technique used to observe a sample’s response to a given stimulus (including electron irradiation, thermal excitation, mechanical force, optical excitation, electric and magnetic fields) at the nanoscale in real time. The book introduces readers to the technical strategy behind the in-situ technique and its developments. It reviews the research frontiers of using in-situ TEM in energy conversion and storage, catalysis, nanomaterials synthesis, nanoelectronics, etc. Furthermore, it discusses the future prospects for in-situ TEM. The book offers a valuable guide for all undergraduate and graduate students who are interested in TEM characterization technology. It also serves as a reference source on cutting-edge in-situ techniques for researchers and engineers.

Author : M.L Jenkins,M.A Kirk
Publisher : CRC Press
Page : 224 pages
File Size : 55,8 Mb
Release : 2000-11-21
Category : Science
ISBN : 9781420034646

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Characterisation of Radiation Damage by Transmission Electron Microscopy by M.L Jenkins,M.A Kirk Pdf

Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clusters, such as dislocation loops, because the coverage in general microscopy textbooks is limited and omits many of the problems associated with the analysis of these defects. The book also describes in situ, high-resolution, and analytical techniques. Techniques are illustrated with examples, providing a solid overview of the contribution of TEM to radiation damage mechanisms. The book is most useful to researchers in, or entering into, the field of defect analysis in materials.

Author : Debbie Stokes
Publisher : John Wiley & Sons
Page : 247 pages
File Size : 44,6 Mb
Release : 2008-12-22
Category : Science
ISBN : 9780470065402

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Principles and Practice of Variable Pressure / Environmental Scanning Electron Microscopy (VP-ESEM) by Debbie Stokes Pdf

Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations Crucially, the principles and applications outlined in this book are completely generic: i.e. applicable to all types of VPSEM, irrespective of manufacturer. Information presented will enable reader to turn principles into practice Published in association with the Royal Microscopical Society (RMS) -www.rms.org.uk

Author : Charles E. Lyman,Dale E. Newbury,Joseph Goldstein,David B. Williams,Alton D. Romig Jr.,John Armstrong,Patrick Echlin,Charles Fiori,David C. Joy,Eric Lifshin,Klaus-Rüdiger Peters
Publisher : Springer Science & Business Media
Page : 415 pages
File Size : 53,9 Mb
Release : 2012-12-06
Category : Science
ISBN : 9781461306351

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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy by Charles E. Lyman,Dale E. Newbury,Joseph Goldstein,David B. Williams,Alton D. Romig Jr.,John Armstrong,Patrick Echlin,Charles Fiori,David C. Joy,Eric Lifshin,Klaus-Rüdiger Peters Pdf

During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal classes in universities and colleges and by special summer courses such as the ones offered for the past 19 years at Lehigh University. Laboratory work, which should be an integral part of such courses, is often hindered by the lack of a suitable laboratory workbook. While laboratory workbooks for transmission electron microscopy have-been in existence for many years, the broad range of topics that must be dealt with in scanning electron microscopy and microanalysis has made it difficult for instructors to devise meaningful experiments. The present workbook provides a series of fundamental experiments to aid in "hands-on" learning of the use of the instrumentation and the techniques. It is written by a group of eminently qualified scientists and educators. The importance of hands-on learning cannot be overemphasized.