Introduction To Advanced System On Chip Test Design And Optimization

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Introduction to Advanced System-on-Chip Test Design and Optimization

Author : Erik Larsson
Publisher : Springer Science & Business Media
Page : 388 pages
File Size : 41,7 Mb
Release : 2006-03-30
Category : Technology & Engineering
ISBN : 9780387256245

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Introduction to Advanced System-on-Chip Test Design and Optimization by Erik Larsson Pdf

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

Introduction to Advanced System-on-Chip Test Design and Optimization

Author : Erik Larsson
Publisher : Springer
Page : 0 pages
File Size : 51,6 Mb
Release : 2008-11-01
Category : Technology & Engineering
ISBN : 0387522794

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Introduction to Advanced System-on-Chip Test Design and Optimization by Erik Larsson Pdf

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

Reliability, Availability and Serviceability of Networks-on-Chip

Author : Érika Cota,Alexandre de Morais Amory,Marcelo Soares Lubaszewski
Publisher : Springer Science & Business Media
Page : 209 pages
File Size : 47,8 Mb
Release : 2011-09-23
Category : Technology & Engineering
ISBN : 1461407915

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Reliability, Availability and Serviceability of Networks-on-Chip by Érika Cota,Alexandre de Morais Amory,Marcelo Soares Lubaszewski Pdf

This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.

Ubiquitous Communications and Network Computing

Author : Navin Kumar,Arpita Thakre
Publisher : Springer
Page : 265 pages
File Size : 45,7 Mb
Release : 2017-12-22
Category : Computers
ISBN : 9783319734231

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Ubiquitous Communications and Network Computing by Navin Kumar,Arpita Thakre Pdf

This book constitutes the refereed proceedings of the First International Conference on Ubiquitous Communications and Network Computing, UBICNET 2017, held in Bangalore, India, in August 2017. The 23 full papers were selected from 71 submissions and are grouped in topical sections on safety and energy efficient computing, cloud computing and mobile commerce, advanced and software defined networks, and advanced communication systems and networks.

System-on-Chip Test Architectures

Author : Laung-Terng Wang,Charles E. Stroud,Nur A. Touba
Publisher : Morgan Kaufmann
Page : 896 pages
File Size : 51,7 Mb
Release : 2010-07-28
Category : Technology & Engineering
ISBN : 0080556809

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System-on-Chip Test Architectures by Laung-Terng Wang,Charles E. Stroud,Nur A. Touba Pdf

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

Design and Test Technology for Dependable Systems-on-chip

Author : Raimund Ubar,Jaan Raik,Heinrich Theodor Vierhaus
Publisher : IGI Global
Page : 550 pages
File Size : 44,5 Mb
Release : 2011-01-01
Category : Computers
ISBN : 9781609602147

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Design and Test Technology for Dependable Systems-on-chip by Raimund Ubar,Jaan Raik,Heinrich Theodor Vierhaus Pdf

"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

System-on-Chip for Real-Time Applications

Author : Wael Badawy,Graham A. Julien
Publisher : Springer Science & Business Media
Page : 476 pages
File Size : 43,7 Mb
Release : 2002-10-31
Category : Technology & Engineering
ISBN : 1402072546

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System-on-Chip for Real-Time Applications by Wael Badawy,Graham A. Julien Pdf

System-on-Chip for Real-Time Applications will be of interest to engineers, both in industry and academia, working in the area of SoC VLSI design and application. It will also be useful to graduate and undergraduate students in electrical and computer engineering and computer science. A selected set of papers from the 2nd International Workshop on Real-Time Applications were used to form the basis of this book. It is organized into the following chapters: -Introduction; -Design Reuse; -Modeling; -Architecture; -Design Techniques; -Memory; -Circuits; -Low Power; -Interconnect and Technology; -MEMS. System-on-Chip for Real-Time Applications contains many signal processing applications and will be of particular interest to those working in that community.

Design of Systems on a Chip: Design and Test

Author : Ricardo Reis,Marcelo Soares Lubaszewski,Jochen A.G. Jess
Publisher : Springer Science & Business Media
Page : 237 pages
File Size : 51,8 Mb
Release : 2007-05-06
Category : Technology & Engineering
ISBN : 9780387325002

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Design of Systems on a Chip: Design and Test by Ricardo Reis,Marcelo Soares Lubaszewski,Jochen A.G. Jess Pdf

This book is the second of two volumes addressing the design challenges associated with new generations of semiconductor technology. The various chapters are compiled from tutorials presented at workshops in recent years by prominent authors from all over the world. Technology, productivity and quality are the main aspects under consideration to establish the major requirements for the design and test of upcoming systems on a chip.

Essential Issues in SOC Design

Author : Youn-Long Steve Lin
Publisher : Springer Science & Business Media
Page : 405 pages
File Size : 50,6 Mb
Release : 2007-05-31
Category : Technology & Engineering
ISBN : 9781402053528

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Essential Issues in SOC Design by Youn-Long Steve Lin Pdf

This book originated from a workshop held at the DATE 2005 conference, namely Designing Complex SOCs. State-of-the-art in issues related to System-on-Chip (SoC) design by leading experts in the fields, it covers IP development, verification, integration, chip implementation, testing and software. It contains valuable academic and industrial examples for those involved with the design of complex SOCs.

Innovations and Advanced Techniques in Computer and Information Sciences and Engineering

Author : Tarek Sobh
Publisher : Springer Science & Business Media
Page : 548 pages
File Size : 55,8 Mb
Release : 2007-09-04
Category : Technology & Engineering
ISBN : 9781402062681

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Innovations and Advanced Techniques in Computer and Information Sciences and Engineering by Tarek Sobh Pdf

This book includes a set of rigorously reviewed world-class manuscripts addressing and detailing state-of-the-art research projects in the areas of Computer Science, Computer Engineering and Information Sciences. The book presents selected papers from the conference proceedings of the International Conference on Systems, Computing Sciences and Software Engineering (SCSS 2006). All aspects of the conference were managed on-line.

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Author : Krishnendu Chakrabarty
Publisher : Springer Science & Business Media
Page : 202 pages
File Size : 47,6 Mb
Release : 2013-04-17
Category : Technology & Engineering
ISBN : 9781475765274

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SOC (System-on-a-Chip) Testing for Plug and Play Test Automation by Krishnendu Chakrabarty Pdf

System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.

System-on-Chip

Author : Bashir M. Al-Hashimi
Publisher : IET
Page : 940 pages
File Size : 43,5 Mb
Release : 2006-01-31
Category : Technology & Engineering
ISBN : 9780863415524

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System-on-Chip by Bashir M. Al-Hashimi Pdf

This book highlights both the key achievements of electronic systems design targeting SoC implementation style, and the future challenges presented by the continuing scaling of CMOS technology.

System-on-a-Chip Verification

Author : Prakash Rashinkar,Peter Paterson,Leena Singh
Publisher : Springer Science & Business Media
Page : 383 pages
File Size : 53,8 Mb
Release : 2001
Category : Computers
ISBN : 9780792372790

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System-on-a-Chip Verification by Prakash Rashinkar,Peter Paterson,Leena Singh Pdf

This is the first book to cover verification strategies and methodologies for SOC verification from system level verification to the design sign-off. All the verification aspects in this exciting new book are illustrated with a single reference design for Bluetooth application.

Advanced Techniques for Embedded Systems Design and Test

Author : Juan C. López,Román Hermida,Walter Geisselhardt
Publisher : Springer Science & Business Media
Page : 310 pages
File Size : 46,9 Mb
Release : 1998-02-28
Category : Computers
ISBN : 0792381289

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Advanced Techniques for Embedded Systems Design and Test by Juan C. López,Román Hermida,Walter Geisselhardt Pdf

As electronic technology reaches the point where complex systems can be integrated on a single chip, and higher degrees of performance can be achieved at lower costs, designers must devise new ways to undertake the laborious task of coping with the numerous, and non-trivial, problems that arise during the conception of such systems. On the other hand, shorter design cycles (so that electronic products can fit into shrinking market windows) put companies, and consequently designers, under pressure in a race to obtain reliable products in the minimum period of time. New methodologies, supported by automation and abstraction, have appeared which have been crucial in making it possible for system designers to take over the traditional electronic design process and embedded systems is one of the fields that these methodologies are mainly targeting. The inherent complexity of these systems, with hardware and software components that usually execute concurrently, and the very tight cost and performance constraints, make them specially suitable to introduce higher levels of abstraction and automation, so as to allow the designer to better tackle the many problems that appear during their design. Advanced Techniques for Embedded Systems Design and Test is a comprehensive book presenting recent developments in methodologies and tools for the specification, synthesis, verification, and test of embedded systems, characterized by the use of high-level languages as a road to productivity. Each specific part of the design process, from specification through to test, is looked at with a constant emphasis on behavioral methodologies. Advanced Techniques for Embedded Systems Design and Test is essential reading for all researchers in the design and test communities as well as system designers and CAD tools developers.

High Performance Memory Testing

Author : R. Dean Adams
Publisher : Springer Science & Business Media
Page : 250 pages
File Size : 48,7 Mb
Release : 2006-04-11
Category : Technology & Engineering
ISBN : 9780306479724

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High Performance Memory Testing by R. Dean Adams Pdf

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.