System On Chip Test Architectures

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System-on-Chip Test Architectures

Author : Laung-Terng Wang,Charles E. Stroud,Nur A. Touba
Publisher : Morgan Kaufmann
Page : 896 pages
File Size : 44,9 Mb
Release : 2010-07-28
Category : Technology & Engineering
ISBN : 0080556809

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System-on-Chip Test Architectures by Laung-Terng Wang,Charles E. Stroud,Nur A. Touba Pdf

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

Introduction to Advanced System-on-Chip Test Design and Optimization

Author : Erik Larsson
Publisher : Springer Science & Business Media
Page : 388 pages
File Size : 54,8 Mb
Release : 2006-03-30
Category : Technology & Engineering
ISBN : 9780387256245

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Introduction to Advanced System-on-Chip Test Design and Optimization by Erik Larsson Pdf

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

On-Chip Communication Architectures

Author : Sudeep Pasricha,Nikil Dutt
Publisher : Morgan Kaufmann
Page : 544 pages
File Size : 45,8 Mb
Release : 2010-07-28
Category : Technology & Engineering
ISBN : 0080558283

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On-Chip Communication Architectures by Sudeep Pasricha,Nikil Dutt Pdf

Over the past decade, system-on-chip (SoC) designs have evolved to address the ever increasing complexity of applications, fueled by the era of digital convergence. Improvements in process technology have effectively shrunk board-level components so they can be integrated on a single chip. New on-chip communication architectures have been designed to support all inter-component communication in a SoC design. These communication architecture fabrics have a critical impact on the power consumption, performance, cost and design cycle time of modern SoC designs. As application complexity strains the communication backbone of SoC designs, academic and industrial R&D efforts and dollars are increasingly focused on communication architecture design. On-Chip Communication Architecures is a comprehensive reference on concepts, research and trends in on-chip communication architecture design. It will provide readers with a comprehensive survey, not available elsewhere, of all current standards for on-chip communication architectures. A definitive guide to on-chip communication architectures, explaining key concepts, surveying research efforts and predicting future trends Detailed analysis of all popular standards for on-chip communication architectures Comprehensive survey of all research on communication architectures, covering a wide range of topics relevant to this area, spanning the past several years, and up to date with the most current research efforts Future trends that with have a significant impact on research and design of communication architectures over the next several years

System-on-Chip for Real-Time Applications

Author : Wael Badawy,Graham A. Julien
Publisher : Springer Science & Business Media
Page : 464 pages
File Size : 45,7 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461503514

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System-on-Chip for Real-Time Applications by Wael Badawy,Graham A. Julien Pdf

System-on-Chip for Real-Time Applications will be of interest to engineers, both in industry and academia, working in the area of SoC VLSI design and application. It will also be useful to graduate and undergraduate students in electrical and computer engineering and computer science. A selected set of papers from the 2nd International Workshop on Real-Time Applications were used to form the basis of this book. It is organized into the following chapters: -Introduction; -Design Reuse; -Modeling; -Architecture; -Design Techniques; -Memory; -Circuits; -Low Power; -Interconnect and Technology; -MEMS. System-on-Chip for Real-Time Applications contains many signal processing applications and will be of particular interest to those working in that community.

VLSI Test Principles and Architectures

Author : Laung-Terng Wang,Cheng-Wen Wu,Xiaoqing Wen
Publisher : Elsevier
Page : 808 pages
File Size : 49,7 Mb
Release : 2006-08-14
Category : Technology & Engineering
ISBN : 0080474799

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VLSI Test Principles and Architectures by Laung-Terng Wang,Cheng-Wen Wu,Xiaoqing Wen Pdf

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Essential Issues in SOC Design

Author : Youn-Long Steve Lin
Publisher : Springer Science & Business Media
Page : 405 pages
File Size : 42,9 Mb
Release : 2007-05-31
Category : Technology & Engineering
ISBN : 9781402053528

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Essential Issues in SOC Design by Youn-Long Steve Lin Pdf

This book originated from a workshop held at the DATE 2005 conference, namely Designing Complex SOCs. State-of-the-art in issues related to System-on-Chip (SoC) design by leading experts in the fields, it covers IP development, verification, integration, chip implementation, testing and software. It contains valuable academic and industrial examples for those involved with the design of complex SOCs.

Arm System-On-Chip Architecture, 2/E

Author : Furber
Publisher : Pearson Education India
Page : 432 pages
File Size : 44,8 Mb
Release : 2001-09
Category : Electronic
ISBN : 8131708403

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Arm System-On-Chip Architecture, 2/E by Furber Pdf

System-on-Chip Test Architectures

Author : Laung-Terng Wang,Charles Stroud,Nur Touba
Publisher : Unknown
Page : 896 pages
File Size : 45,8 Mb
Release : 2010
Category : Integrated circuits
ISBN : OCLC:1100907298

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System-on-Chip Test Architectures by Laung-Terng Wang,Charles Stroud,Nur Touba Pdf

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. KEY FEATURES * Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. * Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. * Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. * Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. * Practical problems at the end of each chapter for students.

3D Integration for NoC-based SoC Architectures

Author : Abbas Sheibanyrad,Frédéric Pétrot,Axel Jantsch
Publisher : Springer Science & Business Media
Page : 280 pages
File Size : 45,8 Mb
Release : 2010-11-08
Category : Technology & Engineering
ISBN : 9781441976185

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3D Integration for NoC-based SoC Architectures by Abbas Sheibanyrad,Frédéric Pétrot,Axel Jantsch Pdf

This book presents the research challenges that are due to the introduction of the 3rd dimension in chips for researchers and covers the whole architectural design approach for 3D-SoCs. Nowadays the 3D-Integration technologies, 3D-Design techniques, and 3D-Architectures are emerging as interesting, truly hot, broad topics. The present book gathers the recent advances in the whole domain by renowned experts in the field to build a comprehensive and consistent book around the hot topics of three-dimensional architectures and micro-architectures. This book includes contributions from high level international teams working in this field.

Design and Test Technology for Dependable Systems-on-chip

Author : Raimund Ubar,Jaan Raik,Heinrich Theodor Vierhaus
Publisher : IGI Global
Page : 550 pages
File Size : 46,7 Mb
Release : 2011-01-01
Category : Computers
ISBN : 9781609602147

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Design and Test Technology for Dependable Systems-on-chip by Raimund Ubar,Jaan Raik,Heinrich Theodor Vierhaus Pdf

"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Author : Krishnendu Chakrabarty
Publisher : Springer Science & Business Media
Page : 218 pages
File Size : 48,5 Mb
Release : 2002-09-30
Category : Computers
ISBN : 1402072058

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SOC (System-on-a-Chip) Testing for Plug and Play Test Automation by Krishnendu Chakrabarty Pdf

Various aspects of system-on-a-chip (SOC) integrated circuit testing are addressed in 13 papers on test planning, access, and scheduling; test data compression; and interconnect, crosstalk, and signal integrity. Topics include concurrent test of core-based SOC design and testing for interconnect crosstalk defects using on-chip embedded processor cores. The editor is affiliated with Duke University. The book is reprinted from a Special Issue of the Journal of Electronic Testing, vol. 18, nos. 4 & 5. There is no subject index. Annotation (c)2003 Book News, Inc., Portland, OR (booknews.com).

Network-on-Chip

Author : Santanu Kundu,Santanu Chattopadhyay
Publisher : CRC Press
Page : 388 pages
File Size : 47,6 Mb
Release : 2018-09-03
Category : Technology & Engineering
ISBN : 9781466565272

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Network-on-Chip by Santanu Kundu,Santanu Chattopadhyay Pdf

Addresses the Challenges Associated with System-on-Chip Integration Network-on-Chip: The Next Generation of System-on-Chip Integration examines the current issues restricting chip-on-chip communication efficiency, and explores Network-on-chip (NoC), a promising alternative that equips designers with the capability to produce a scalable, reusable, and high-performance communication backbone by allowing for the integration of a large number of cores on a single system-on-chip (SoC). This book provides a basic overview of topics associated with NoC-based design: communication infrastructure design, communication methodology, evaluation framework, and mapping of applications onto NoC. It details the design and evaluation of different proposed NoC structures, low-power techniques, signal integrity and reliability issues, application mapping, testing, and future trends. Utilizing examples of chips that have been implemented in industry and academia, this text presents the full architectural design of components verified through implementation in industrial CAD tools. It describes NoC research and developments, incorporates theoretical proofs strengthening the analysis procedures, and includes algorithms used in NoC design and synthesis. In addition, it considers other upcoming NoC issues, such as low-power NoC design, signal integrity issues, NoC testing, reconfiguration, synthesis, and 3-D NoC design. This text comprises 12 chapters and covers: The evolution of NoC from SoC—its research and developmental challenges NoC protocols, elaborating flow control, available network topologies, routing mechanisms, fault tolerance, quality-of-service support, and the design of network interfaces The router design strategies followed in NoCs The evaluation mechanism of NoC architectures The application mapping strategies followed in NoCs Low-power design techniques specifically followed in NoCs The signal integrity and reliability issues of NoC The details of NoC testing strategies reported so far The problem of synthesizing application-specific NoCs Reconfigurable NoC design issues Direction of future research and development in the field of NoC Network-on-Chip: The Next Generation of System-on-Chip Integration covers the basic topics, technology, and future trends relevant to NoC-based design, and can be used by engineers, students, and researchers and other industry professionals interested in computer architecture, embedded systems, and parallel/distributed systems.

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Author : Krishnendu Chakrabarty
Publisher : Springer Science & Business Media
Page : 202 pages
File Size : 53,9 Mb
Release : 2013-04-17
Category : Technology & Engineering
ISBN : 9781475765274

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SOC (System-on-a-Chip) Testing for Plug and Play Test Automation by Krishnendu Chakrabarty Pdf

System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.

VLSI-SOC: From Systems to Chips

Author : Manfred Glesner,Ricardo Reis,Leandro Indrusiak,Vincent Mooney,Hans Eveking
Publisher : Springer
Page : 315 pages
File Size : 48,9 Mb
Release : 2006-08-16
Category : Computers
ISBN : 9780387334035

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VLSI-SOC: From Systems to Chips by Manfred Glesner,Ricardo Reis,Leandro Indrusiak,Vincent Mooney,Hans Eveking Pdf

This book contains extended and revised versions of the best papers that have been presented during the twelfth edition of the IFIP TC10/WG10.5 International Conference on Very Large Scale Integration, a Global System-on-a-Chip Design & CAD Conference. The 12* edition was held at the Lufthansa Training Center in Seeheim-Jugenheim, south of Darmstadt, Germany (December 1-3, 2003). Previous conferences have taken place in Edinburgh (81), Trondheim (83), Tokyo (85), Vancouver (87), Munich (89), Edinburgh (91), Grenoble (93), Tokyo (95), Gramado (97), Lisbon (99)andMontpellier(01). The purpose of this conference, sponsored by IFIP TC 10 Working Group 10.5, is to provide a forum to exchange ideas and show research results in the field of microelectronics design. The current trend toward increasing chip integration brings about exhilarating new challenges both at the physical and system-design levels: this conference aims to address these exciting new issues. The 2003 edition of VLSI-SoC conserved the traditional structure, which has been successful in previous editions. The quality of submissions (142 papers) made the selection process difficult, but finally 57 papers and 14 posters were accepted for presentation in VLSI-SoC 2003. Submissions came from Austria, Bulgaria, Brazil, Canada, Egypt, England, Estonia, Finland, France, Germany, Greece, Hungary, India, Iran, Israel, Italy, Japan, Korea, Malaysia, Mexico, Netherlands, Poland, Portugal, Romania, Spain, Sweden, Taiwan and the United States of America. From 57 papers presented at the conference, 18 were selected to have an extended and revised version included in this book.

Advances in Electronic Testing

Author : Dimitris Gizopoulos
Publisher : Springer Science & Business Media
Page : 431 pages
File Size : 40,7 Mb
Release : 2006-01-22
Category : Technology & Engineering
ISBN : 9780387294094

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Advances in Electronic Testing by Dimitris Gizopoulos Pdf

This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.