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Author : Anonim
Publisher : Unknown
Page : 218 pages
File Size : 40,7 Mb
Release : 1998
Category : Computers
ISBN : UOM:39015047822948
Author : John C. Russ
Publisher : Springer Science & Business Media
Page : 461 pages
File Size : 55,7 Mb
Release : 2012-12-06
Category : Science
ISBN : 9781461305637
The use of computer-based image analysis systems for all kinds of images, but especially for microscope images, has become increasingly widespread in recent years, as computer power has increased and costs have dropped. Software to perform each of the various tasks described in this book exists now, and without doubt additional algorithms to accomplish these same things more efficiently, and to perform new kinds of image processing, feature discrimination and measurement, will continue to be developed. This is likely to be true particularly in the field of three-dimensional imaging, since new microscopy methods are beginning to be used which can produce such data. It is not the intent of this book to train programmers who will assemble their own computer systems and write their own programs. Most users require only the barest of knowledge about how to use the computer, but the greater their understanding of the various image analysis operations which are possible, their advantages and limitations, the greater the likelihood of success in their application. Likewise, the book assumes little in the way of a mathematical background, but the researcher with a secure knowledge of appropriate statistical tests will find it easier to put some of these methods into real use, and have confidence in the results, than one who has less background and experience. Supplementary texts and courses in statistics, microscopy, and specimen preparation are recommended as necessary.
Author : John C. Russ,F. Brent Neal
Publisher : CRC Press
Page : 1035 pages
File Size : 44,8 Mb
Release : 2018-09-03
Category : Technology & Engineering
ISBN : 9781498740289
Consistently rated as the best overall introduction to computer-based image processing, The Image Processing Handbook covers two-dimensional (2D) and three-dimensional (3D) imaging techniques, image printing and storage methods, image processing algorithms, image and feature measurement, quantitative image measurement analysis, and more. Incorporating image processing and analysis examples at all scales, from nano- to astro-, this Seventh Edition: Features a greater range of computationally intensive algorithms than previous versions Provides better organization, more quantitative results, and new material on recent developments Includes completely rewritten chapters on 3D imaging and a thoroughly revamped chapter on statistical analysis Contains more than 1700 references to theory, methods, and applications in a wide variety of disciplines Presents 500+ entirely new figures and images, with more than two-thirds appearing in color The Image Processing Handbook, Seventh Edition delivers an accessible and up-to-date treatment of image processing, offering broad coverage and comparison of algorithms, approaches, and outcomes.
Author : John C. Russ
Publisher : Springer Science & Business Media
Page : 313 pages
File Size : 47,8 Mb
Release : 2013-11-11
Category : Science
ISBN : 9781489925787
The author integrates discussions of fractal geometry, surface modeling techniques, and applications to real world problems to provide a comprehensive, accessible overview of the field. His work will equip researchers with the basic tools for measurement and interpretation of data, stimulating more work on these problems and, perhaps, leading to an understanding of the reasons that Nature has adopted this geometry to shape much of our world.
Author : Polina Golland,Nobuhiko Hata,Christian Barillot,Joachim Hornegger,Robert Howe
Publisher : Springer
Page : 460 pages
File Size : 48,9 Mb
Release : 2014-08-31
Category : Computers
ISBN : 9783319104430
The three-volume set LNCS 8673, 8674, and 8675 constitutes the refereed proceedings of the 17th International Conference on Medical Image Computing and Computer-Assisted Intervention, MICCAI 2014, held in Boston, MA, USA, in September 2014. Based on rigorous peer reviews, the program committee carefully selected 253 revised papers from 862 submissions for presentation in three volumes. The 53 papers included in the third volume have been organized in the following topical sections: shape and population analysis; brain; diffusion MRI; and machine learning.
Author : Gwidon Stachowiak,Andrew W Batchelor
Publisher : Elsevier
Page : 372 pages
File Size : 48,6 Mb
Release : 2004-05-18
Category : Technology & Engineering
ISBN : 0080472737
This is an indespensible guide to both researchers in academia and industry who wish to perform tribological experiments more effectively. With an extensive range of illustrations which communicate the basic concepts in experimental methods tribology more effectively than text alone. An extensive citation list is also provided at the end of each chapter facilitating a more thorough navigation through a particular subject. * Contains extensive illustrations * Highlights limitations of current techniques
Author : A Clarke,C Eberhardt
Publisher : Elsevier
Page : 456 pages
File Size : 41,7 Mb
Release : 2002-10-29
Category : Technology & Engineering
ISBN : 9781855737501
This comprehensive reference work provides an overview of, and practical guide to, the various computer-aided microscopical techniques used in materials science today. After introducing the reader to the basic concepts of optics, the interactions between light and matter, and image processing, the book goes on to discuss in depth both 2D reflection microscopy and confocal laser scanning microscopy. The application of these techniques to the characterisation of materials is abundantly illustrated by hundreds of photographs and illustrations, and through specific case studies. There is also discussion of other modern optical imaging techniques and of non-optical ones such as x-ray micrography. This reference text is essential both for beginners looking for an introduction to the subject as well as advanced materials researchers in the fields where optical microscopy is used. Major reference work on the application of microscopy techniques to materials science research Includes over 420 photographs and illustrations Provides detailed coverage of the major light microscopical techniques including optical reflection microscopy and confocal laser scanning microscopy as well as novel techniques such raman microscopy, tomography and microtomography
Author : John C. Russ,Jens Rindel,P. Lord
Publisher : CRC Press
Page : 276 pages
File Size : 54,8 Mb
Release : 2016-01-22
Category : Law
ISBN : 9781498733083
The ability to work with, and retrieve images, is vital to forensic and criminal case work. During a five-decade-long career, author John C. Russ has taught methods for image processing and measurement to thousands of students. Forensic Uses of Digital Imaging, Second Edition distills his classroom and workshop material to present the information m
Author : A.G. Cullis,P.A. Midgley
Publisher : Springer Science & Business Media
Page : 504 pages
File Size : 52,5 Mb
Release : 2008-12-02
Category : Technology & Engineering
ISBN : 9781402086151
This volume contains invited and contributed papers presented at the conference on ‘Microscopy of Semiconducting Materials’ held at the University of Cambridge on 2-5 April 2007. The event was organised under the auspices of the Electron Microscopy and Analysis Group of the Institute of Physics, the Royal Microscopical Society and the Materials Research Society. This international conference was the fifteenth in the series that focuses on the most recent world-wide advances in semiconductor studies carried out by all forms of microscopy and it attracted delegates from more than 20 countries. With the relentless evolution of advanced electronic devices into ever smaller nanoscale structures, the problem relating to the means by which device features can be visualised on this scale becomes more acute. This applies not only to the imaging of the general form of layers that may be present but also to the determination of composition and doping variations that are employed. In view of this scenario, the vital importance of transmission and scanning electron microscopy, together with X-ray and scanning probe approaches can immediately be seen. The conference featured developments in high resolution microscopy and nanoanalysis, including the exploitation of recently introduced aberration-corrected electron microscopes. All associated imaging and analytical techniques were demonstrated in studies including those of self-organised and quantum domain structures. Many analytical techniques based upon scanning probe microscopies were also much in evidence, together with more general applications of X-ray diffraction methods.
Author : R.W. Cahn,P. Haasen
Publisher : Elsevier
Page : 2889 pages
File Size : 40,5 Mb
Release : 1996-02-09
Category : Technology & Engineering
ISBN : 9780080538945
This is the fourth edition of a work which first appeared in 1965. The first edition had approximately one thousand pages in a single volume. This latest volume has almost three thousand pages in 3 volumes which is a fair measure of the pace at which the discipline of physical metallurgy has grown in the intervening 30 years. Almost all the topics previously treated are still in evidence in this version which is approximately 50% bigger than the previous edition. All the chapters have been either totally rewritten by new authors or thoroughly revised and expanded, either by the third-edition authors alone or jointly with new co-authors. Three chapters on new topics have been added, dealing with dry corrosion, oxidation and protection of metal surfaces; the dislocation theory of the mechanical behavior of intermetallic compounds; and (most novel) a chapter on polymer science for metallurgists, which analyses the conceptual mismatch between metallurgists' and polymer scientists' way of looking at materials. Special care has been taken throughout all chapters to incorporate the latest experimental research results and theoretical insights. Several thousand citations to the research and review literature are included in this edition. There is a very detailed subject index, as well as a comprehensive author index. The original version of this book has long been regarded as the standard text in physical metallurgy and this thoroughly rewritten and updated version will retain this status.
Author : Adam J. Schwartz,Mukul Kumar,Brent L. Adams,David P. Field
Publisher : Springer Science & Business Media
Page : 352 pages
File Size : 41,5 Mb
Release : 2013-06-29
Category : Technology & Engineering
ISBN : 9781475732054
Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).
Author : Qiang Wu,Fatima Merchant,Kenneth Castleman
Publisher : Elsevier
Page : 576 pages
File Size : 54,8 Mb
Release : 2010-07-27
Category : Computers
ISBN : 0080558542
Digital image processing, an integral part of microscopy, is increasingly important to the fields of medicine and scientific research. This book provides a unique one-stop reference on the theory, technique, and applications of this technology. Written by leading experts in the field, this book presents a unique practical perspective of state-of-the-art microscope image processing and the development of specialized algorithms. It contains in-depth analysis of methods coupled with the results of specific real-world experiments. Microscope Image Processing covers image digitization and display, object measurement and classification, autofocusing, and structured illumination. Key Features: Detailed descriptions of many leading-edge methods and algorithms In-depth analysis of the method and experimental results, taken from real-life examples Emphasis on computational and algorithmic aspects of microscope image processing Advanced material on geometric, morphological, and wavelet image processing, fluorescence, three-dimensional and time-lapse microscopy, microscope image enhancement, MultiSpectral imaging, and image data management This book is of interest to all scientists, engineers, clinicians, post-graduate fellows, and graduate students working in the fields of biology, medicine, chemistry, pharmacology, and other related fields. Anyone who uses microscopes in their work and needs to understand the methodologies and capabilities of the latest digital image processing techniques will find this book invaluable. Presents a unique practical perspective of state-of-the-art microcope image processing and the development of specialized algorithms Each chapter includes in-depth analysis of methods coupled with the results of specific real-world experiments Co-edited by Kenneth R. Castleman, world-renowned pioneer in digital image processing and author of two seminal textbooks on the subject
Author : Usha Chandra
Publisher : BoD – Books on Demand
Page : 385 pages
File Size : 41,8 Mb
Release : 2011-07-27
Category : Technology & Engineering
ISBN : 9789533075730
The Microwave heating has not only revolutionized the food industry but also has extended its wings widely towards its multidimensional applications. Thus it has opened new vistas of potential research in science and technology. The book is compiled into Seventeen Chapters highlighting different aspects varying from epistemological discussion to applicability of conceptual constructs. The inclusion of discussion on the avenues in the field of Chemistry, Health
Author : Joël Lépinoux,Dominique Mazière,Vassilis Pontikis,Georges Saada
Publisher : Springer Science & Business Media
Page : 540 pages
File Size : 40,6 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9789401140485
A profusion of research and results on the mechanical behaviour of crystalline solids has followed the discovery of dislocations in the early thirties. This trend has been enhanced by the development of powerful experimental techniques. particularly X ray diffraction. transmission and scanning electron microscopy. microanalysis. The technological advancement has given rise to the study of various and complex materials. not to speak of those recently invented. whose mechanical properties need to be mastered. either for their lise as structural materials. or more simply for detenllining their fonnability processes. As is often the case this fast growth has been diverted both by the burial of early fundamental results which are rediscovered more or less accurately. and by the too fast publication of inaccurate results. which propagate widely. and are accepted without criticism. Examples of these statements abound. and will not be quoted here for the sake of dispassionateness. Understanding the mechanical properties of materials implies the use of various experimental techniques. combined with a good theoretical knowledge of elasticity. thermodynamics and solid state physics. The recent development of various computer techniques (simulation. ab initio calculations) has added to the difficulty of gathering the experimental information. and mastering the theoretical understanding. No laboratory is equipped with all the possible experimental settings. almost no scientist masters all this theoretical kno\vledge. Therefore. cooperation between scientists is needed more than even before.
Author : Anonim
Publisher : Unknown
Page : 100 pages
File Size : 42,8 Mb
Release : 1993
Category : Biomedical engineering
ISBN : MINN:31951D012206817
