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Microscopy Techniques for Materials Science by A Clarke,Colin Nigel Eberhardt Pdf
Annotation CONTENTS Part 1 Basic principles: Interaction of EM radiation with materials; Digital imaging and processing. Part 2 2D Optical reflection and confocal laser scanning microscopy: 2D Optical reflection microscopy; 3D Confocal Laser Scanning. Part 3 Other microscopical techniques: Complementary optical and EM imaging techniques; Other microscopy techniques.
High-Resolution Electron Microscopy for Materials Science by Daisuke Shindo,Hiraga Kenji Pdf
High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.
Analytical Electron Microscopy for Materials Science by DAISUKE Shindo,T. Oikawa Pdf
Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
Advanced Microscopy by Merin Sara Thomas,Józef T. Haponiuk,Sabu Thomas,Anne George Pdf
This interdisciplinary book, Advanced Microscopy: A Strong Analytical Tool in Materials Science, covers the methodology and applications of different advanced microscopic techniques in various research fields, including chemistry, nanotechnology, polymers, chemical engineering, and biomedical engineering, providing an informative overview that helps to determine the best applications for advanced materials. Materials usually behave very differently at nanoscale in all aspects, and this volume shows how microscopy can help provide a detailed understanding of materials such as semiconductors, metals, polymers, biopolymers, etc. The volume illustrates advanced microscopic techniques that include scanning electron microscopy (SEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), confocal microscopy, and others. The microscopy techniques presented in the volume show applications in many areas of science, including botany and plant science, medicine, nanotechnology, chemistry, food science, waste management, and others. This book presents the diverse advanced microscopic techniques for researchers, giving a better understanding as well as implementation of novel techniques in materials science.
Materials Characterization Using Nondestructive Evaluation (NDE) Methods by Gerhard Huebschen,Iris Altpeter,Ralf Tschuncky,Hans-Georg Herrmann Pdf
Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques Reviews the determination of microstructural and mechanical properties Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials
Electron Microscopy In Material Science by U Valdre Pdf
Electron Microscopy in Material Science covers the proceedings of the International School of Electron Microscopy held in Erice, Itsaly, in 1970. The said conference is intended to the developments of electron optics and electron microscopy and its applications in material science. The book is divided into four parts. Part I discusses the impact of electron microscopy in the science of materials. Part II covers topics such as electron optics and instrumentation; geometric electron optics and its problems; and special electron microscope specimen stages. Part III explains the theory of electron diffraction image contrast and then elaborates on related areas such as the application of electron diffraction and of electron microscopy to radiation; computing methods; and problems in electron microscopy. Part IV includes topics such as the transfer of image information in the electron microscope; phase contrast microscopy; and the magnetic phase contrast. The text is recommended for electron microscopists who are interested in the application of their field in material science, as well as for experts in the field of material science and would like to know about the importance of electron microscopy.
Surface Analysis Methods in Materials Science by D.J. O'Connor,Brett A. Sexton,Roger S.C. Smart Pdf
This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references. It outlines the application of surface analysis techniques to a broad range of studies in materials science and engineering. The book consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing 19 techniques and a section on applications. This book is aimed at industrial scientists and engineers in research and development. The level and content of this book make it ideal as a course text for senior undergraduate and postgraduate students in materials science, materials engineering, physics, chemistry and metallurgy.
Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz,James M. Howe Pdf
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Scanning Transmission Electron Microscopy by Alina Bruma Pdf
Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications The information comprised in this book is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.
S. Amelinckx,Dirk van Dyck,J. van Landuyt,Gustaaf van Tendeloo
Author : S. Amelinckx,Dirk van Dyck,J. van Landuyt,Gustaaf van Tendeloo Publisher : John Wiley & Sons Page : 507 pages File Size : 45,6 Mb Release : 2008-08-29 Category : Science ISBN : 9783527620531
Handbook of Microscopy by S. Amelinckx,Dirk van Dyck,J. van Landuyt,Gustaaf van Tendeloo Pdf
Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information. With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which techique is suitable for characterizing a given material?"
Microscopic Techniques for the Non-Expert by Sathish-Kumar Kamaraj,Arun Thirumurugan,Shanmuga Sundar Dhanabalan,Samuel A. Hevia Pdf
This book covers fundamental microscopic techniques for Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Atomic Force Microscopy (AFM), and other microscopic tools. It provides step-by-step instructions and explanations of the basic fundamental concepts and mechanisms and guides the reader on resolving queries related to taking and analyzing microscopy images. The latest advancements and developments in microscopic equipment are described. Theoretical background on microscopy is also provided to enhance the reader’s understanding of microscopy techniques and tools. Microscopic Techniques for the Non-Expert is an ideal book for undergraduate and postgraduate students, as well as researchers with a background in environmental science, materials science, biomedicine, engineering, or bio-nanotechnology.
Characterisation of Radiation Damage by Transmission Electron Microscopy by M.L Jenkins,M.A Kirk Pdf
Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clus