Local Electrode Atom Probe Tomography

Author : David J. Larson,Ty J. Prosa,Robert M. Ulfig,Brian P. Geiser,Thomas F. Kelly
Publisher : Springer Science & Business Media
Page : 328 pages
File Size : 43,5 Mb
Release : 2013-12-12
Category : Technology & Engineering
ISBN : 9781461487210

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Local Electrode Atom Probe Tomography by David J. Larson,Ty J. Prosa,Robert M. Ulfig,Brian P. Geiser,Thomas F. Kelly Pdf

This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through trial and error, allowing users to succeed much more quickly in the challenging areas of specimen preparation and data collection. A closing chapter on applications presents selected, state-of-the-art results using the LEAP microscope.

Author : Michael K. Miller,Richard G. Forbes
Publisher : Springer
Page : 437 pages
File Size : 52,6 Mb
Release : 2014-07-31
Category : Technology & Engineering
ISBN : 9781489974303

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Atom-Probe Tomography by Michael K. Miller,Richard G. Forbes Pdf

Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography. Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe – a new state-of-the-art instrument – is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique.

Author : David J. Larson,Ty J. Prosa,Robert M. Ulfig
Publisher : Unknown
Page : 338 pages
File Size : 54,6 Mb
Release : 2013-12-31
Category : Electronic
ISBN : 1461487226

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Local Electrode Atom Probe Tomography by David J. Larson,Ty J. Prosa,Robert M. Ulfig Pdf

Author : Williams Lefebvre,Francois Vurpillot,Xavier Sauvage
Publisher : Academic Press
Page : 416 pages
File Size : 47,6 Mb
Release : 2016-05-30
Category : Technology & Engineering
ISBN : 9780128047453

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Atom Probe Tomography by Williams Lefebvre,Francois Vurpillot,Xavier Sauvage Pdf

Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen-one of the leading scientific research centers exploring the various aspects of the instrument-will further enhance understanding and the learning process. Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials Written for both experienced researchers and new users Includes exercises, along with corrections, for users to practice the techniques discussed Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy

Author : Michael K. Miller
Publisher : Springer Science & Business Media
Page : 247 pages
File Size : 44,8 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461542810

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Atom Probe Tomography by Michael K. Miller Pdf

The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.

Author : Thomas F. Kelly,Brian P. Gorman,Simon P. Ringer
Publisher : Cambridge University Press
Page : 263 pages
File Size : 47,9 Mb
Release : 2022-03-24
Category : Technology & Engineering
ISBN : 9781107162501

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Atomic-Scale Analytical Tomography by Thomas F. Kelly,Brian P. Gorman,Simon P. Ringer Pdf

The first comprehensive guide on Atomic-Scale Analytical Tomography, extending basics to the future implications for science and technology.

Author : Desmond E. Moser,Fernando Corfu,James R. Darling,Steven M. Reddy,Kimberly Tait
Publisher : John Wiley & Sons
Page : 402 pages
File Size : 49,7 Mb
Release : 2017-11-23
Category : Science
ISBN : 9781119227359

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Microstructural Geochronology by Desmond E. Moser,Fernando Corfu,James R. Darling,Steven M. Reddy,Kimberly Tait Pdf

Microstructural Geochronology Geochronology techniques enable the study of geological evolution and environmental change over time. This volume integrates two aspects of geochronology: one based on classical methods of orientation and spatial patterns, and the other on ratios of radioactive isotopes and their decay products. The chapters illustrate how material science techniques are taking this field to the atomic scale, enabling us to image the chemical and structural record of mineral lattice growth and deformation, and sometimes the patterns of radioactive parent and daughter atoms themselves, to generate a microstructural geochronology from some of the most resilient materials in the solar system. First compilation of research focusing on the crystal structure, material properties, and chemical zoning of the geochronology mineral archive down to nanoscale Novel comparisons of mineral time archives from different rocky planets and asteroids and their shock metamorphic histories Fundamentals on how to reconstruct and date radiogenic isotope distributions using atom probe tomography Microstructural Geochronology will be a valuable resource for graduate students, academics, and researchers in the fields of petrology, geochronology, mineralogy, geochemistry, planetary geology, astrobiology, chemistry, and material science. It will also appeal to philosophers and historians of science from other disciplines.

Author : Sateeshchandra Satyabodha Bajikar
Publisher : Unknown
Page : 268 pages
File Size : 42,8 Mb
Release : 1996
Category : Electronic
ISBN : WISC:89055761100

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Local-electrode Atom Probe Studies Using Silicon Field Emitter Arrays by Sateeshchandra Satyabodha Bajikar Pdf

Author : Baptiste Gault,Michael P. Moody,Julie M. Cairney,Simon P. Ringer
Publisher : Springer Science & Business Media
Page : 411 pages
File Size : 51,8 Mb
Release : 2012-08-27
Category : Technology & Engineering
ISBN : 9781461434368

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Atom Probe Microscopy by Baptiste Gault,Michael P. Moody,Julie M. Cairney,Simon P. Ringer Pdf

Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.

Author : Ziyang Zhou,Zhengquan Wang,Ranming Niu,Pang-Yu Liu,Chao Huang,Yi-Hsuan Sun,Xiutong Wang,Hung-Wei Yen,Julie M. Cairney,Yi-Sheng Chen
Publisher : OAE Publishing Inc.
Page : 23 pages
File Size : 53,7 Mb
Release : 2023-11-13
Category : Technology & Engineering
ISBN : 8210379456XXX

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Cryogenic atom probe tomography and its applications: a review by Ziyang Zhou,Zhengquan Wang,Ranming Niu,Pang-Yu Liu,Chao Huang,Yi-Hsuan Sun,Xiutong Wang,Hung-Wei Yen,Julie M. Cairney,Yi-Sheng Chen Pdf

Cryogenic atom probe tomography (cryo-APT) is a new microstructure characterization technique with the potential to address challenges across various research fields. In this review, we provide an overview of the development of cryo-APT and the associated instrumentation that transforms conventional APT into cryo-APT. We start by introducing the APT principle and the instrumentation involved in the cryo-APT workflow, emphasizing the key techniques that enable cryo-APT specimen preparation. Furthermore, we shed light on the research made possible by cryo-APT, presenting several recent outcomes to demonstrate its capabilities effectively. Finally, we discuss the limitations of cryo-APT and summarize the potential research areas that can further benefit from this cutting-edge microstructural characterization technique.

Author : Thomas F. Kelly,Brian P. Gorman,Simon P. Ringer
Publisher : Cambridge University Press
Page : 128 pages
File Size : 49,9 Mb
Release : 2022-03-24
Category : Technology & Engineering
ISBN : 9781009254861

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Atomic-Scale Analytical Tomography by Thomas F. Kelly,Brian P. Gorman,Simon P. Ringer Pdf

A comprehensive guide on Atomic-Scale Analytical Tomography (ASAT) that discusses basic concepts and implications of the technique in areas such as material sciences, microscopy, engineering sciences and several interdisciplinary avenues. The title interrogates how to successfully achieve ASAT at the intersection of transmission electron microscopy and atom probe microscopy. This novel concept is capable of identifying individual atoms in large volumes as well as in 3D, with high spatial resolution. Written by leading experts from academia and industry, this book serves as a guide with real-world applications on cutting-edge research problems. An essential reading for researchers, engineers and practitioners interested in nanoscale characterisation, this book introduces the reader to a new direction for atomic-scale microscopy.

Author : Nan Yao,Zhong Lin Wang
Publisher : Springer Science & Business Media
Page : 745 pages
File Size : 52,8 Mb
Release : 2006-07-12
Category : Technology & Engineering
ISBN : 9781402080067

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Handbook of Microscopy for Nanotechnology by Nan Yao,Zhong Lin Wang Pdf

Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.

Author : Wenwen Song
Publisher : Springer Nature
Page : 194 pages
File Size : 47,8 Mb
Release : 2024-01-03
Category : Technology & Engineering
ISBN : 9783031429675

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Nano-Engineering of High Strength Steels by Wenwen Song Pdf

This book offers new insights into the process of adjusting nanostructures in high-strength steels to achieve enhanced mechanical properties. It summarizes the state-of-the-art nanoengineering approaches, such as precipitation engineering, interface engineering, and short-range ordering engineering. The book explores the nanostructure-process-property relationships in various high-strength steels, including TRIP/TWIP/MBIP in high-Mn steels (HMnS), medium-Mn steels (MMnS), bearing steels, tool steels, and more. The author investigates a novel approach to control the phase transformation process during deformation and/or thermal treatment in steels, employing both experimental and theoretical tools.

Author : Desmond E. Moser,Fernando Corfu,James R. Darling,Steven M. Reddy,Kimberly Tait
Publisher : John Wiley & Sons
Page : 402 pages
File Size : 55,8 Mb
Release : 2017-11-17
Category : Science
ISBN : 9781119227366

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Microstructural Geochronology by Desmond E. Moser,Fernando Corfu,James R. Darling,Steven M. Reddy,Kimberly Tait Pdf

Microstructural Geochronology Geochronology techniques enable the study of geological evolution and environmental change over time. This volume integrates two aspects of geochronology: one based on classical methods of orientation and spatial patterns, and the other on ratios of radioactive isotopes and their decay products. The chapters illustrate how material science techniques are taking this field to the atomic scale, enabling us to image the chemical and structural record of mineral lattice growth and deformation, and sometimes the patterns of radioactive parent and daughter atoms themselves, to generate a microstructural geochronology from some of the most resilient materials in the solar system. First compilation of research focusing on the crystal structure, material properties, and chemical zoning of the geochronology mineral archive down to nanoscale Novel comparisons of mineral time archives from different rocky planets and asteroids and their shock metamorphic histories Fundamentals on how to reconstruct and date radiogenic isotope distributions using atom probe tomography Microstructural Geochronology will be a valuable resource for graduate students, academics, and researchers in the fields of petrology, geochronology, mineralogy, geochemistry, planetary geology, astrobiology, chemistry, and material science. It will also appeal to philosophers and historians of science from other disciplines.

Author : Zhiyong Ma,David G. Seiler
Publisher : CRC Press
Page : 843 pages
File Size : 40,6 Mb
Release : 2017-03-27
Category : Science
ISBN : 9781351733946

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Metrology and Diagnostic Techniques for Nanoelectronics by Zhiyong Ma,David G. Seiler Pdf

Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.