Long Term Non Operating Reliability Of Electronic Products

Author : Judy Pecht
Publisher : CRC Press
Page : 194 pages
File Size : 44,7 Mb
Release : 2019-07-23
Category : Mathematics
ISBN : 9781351091077

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Long-Term Non-Operating Reliability of Electronic Products by Judy Pecht Pdf

In today's electronic environment, operating reliability for continued daily use of electronic products is essential. This book discusses the reliability of products that lie dormant for long periods of time and are subject to stresses such as humidity, ionic contaminants, temperature, radiation, shock, and vibration. Non-operating reliability is especially critical for life-saving electronic products such as fire alarm systems, standby power sources, and burglar alarms. Air bags in automobiles, earthquake alarm systems, and radiation warning systems in nuclear power plants are also covered. This physics-of-failure approach is also important to maintaining defense hardware such as missiles and munitions systems which often lie dormant for years before being deployed on very short notice

Author : Judy Pecht
Publisher : CRC Press
Page : 130 pages
File Size : 53,7 Mb
Release : 2019-07-23
Category : Mathematics
ISBN : 9781351082624

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Long-Term Non-Operating Reliability of Electronic Products by Judy Pecht Pdf

In today's electronic environment, operating reliability for continued daily use of electronic products is essential. This book discusses the reliability of products that lie dormant for long periods of time and are subject to stresses such as humidity, ionic contaminants, temperature, radiation, shock, and vibration. Non-operating reliability is especially critical for life-saving electronic products such as fire alarm systems, standby power sources, and burglar alarms. Air bags in automobiles, earthquake alarm systems, and radiation warning systems in nuclear power plants are also covered. This physics-of-failure approach is also important to maintaining defense hardware such as missiles and munitions systems which often lie dormant for years before being deployed on very short notice

Author : Milton Ohring,Lucian Kasprzak
Publisher : Academic Press
Page : 758 pages
File Size : 50,7 Mb
Release : 2014-11-03
Category : Technology & Engineering
ISBN : 9780080575520

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Reliability and Failure of Electronic Materials and Devices by Milton Ohring,Lucian Kasprzak Pdf

Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites

Author : Anonim
Publisher : Unknown
Page : 888 pages
File Size : 43,9 Mb
Release : 1974
Category : Integrated circuits
ISBN : UOM:39015004478858

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Microcircuit Reliability Bibliography by Anonim Pdf

Author : Patrick O'Connor,Andre Kleyner
Publisher : John Wiley & Sons
Page : 491 pages
File Size : 40,7 Mb
Release : 2012-01-30
Category : Technology & Engineering
ISBN : 9780470979822

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Practical Reliability Engineering by Patrick O'Connor,Andre Kleyner Pdf

With emphasis on practical aspects of engineering, this bestseller has gained worldwide recognition through progressive editions as the essential reliability textbook. This fifth edition retains the unique balanced mixture of reliability theory and applications, thoroughly updated with the latest industry best practices. Practical Reliability Engineering fulfils the requirements of the Certified Reliability Engineer curriculum of the American Society for Quality (ASQ). Each chapter is supported by practice questions, and a solutions manual is available to course tutors via the companion website. Enhanced coverage of mathematics of reliability, physics of failure, graphical and software methods of failure data analysis, reliability prediction and modelling, design for reliability and safety as well as management and economics of reliability programmes ensures continued relevance to all quality assurance and reliability courses. Notable additions include: New chapters on applications of Monte Carlo simulation methods and reliability demonstration methods. Software applications of statistical methods, including probability plotting and a wider use of common software tools. More detailed descriptions of reliability prediction methods. Comprehensive treatment of accelerated test data analysis and warranty data analysis. Revised and expanded end-of-chapter tutorial sections to advance students’ practical knowledge. The fifth edition will appeal to a wide range of readers from college students to seasoned engineering professionals involved in the design, development, manufacture and maintenance of reliable engineering products and systems. www.wiley.com/go/oconnor_reliability5

Author : Michael Pecht,Rakish Agarwal,F. Patrick McCluskey,Terrance J. Dishongh,Sirus Javadpour,Rahul Mahajan
Publisher : CRC Press
Page : 112 pages
File Size : 44,9 Mb
Release : 2017-12-19
Category : Technology & Engineering
ISBN : 9781351830041

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Electronic Packaging Materials and Their Properties by Michael Pecht,Rakish Agarwal,F. Patrick McCluskey,Terrance J. Dishongh,Sirus Javadpour,Rahul Mahajan Pdf

Packaging materials strongly affect the effectiveness of an electronic packaging system regarding reliability, design, and cost. In electronic systems, packaging materials may serve as electrical conductors or insulators, create structure and form, provide thermal paths, and protect the circuits from environmental factors, such as moisture, contamination, hostile chemicals, and radiation. Electronic Packaging Materials and Their Properties examines the array of packaging architecture, outlining the classification of materials and their use for various tasks requiring performance over time. Applications discussed include: interconnections printed circuit boards substrates encapsulants dielectrics die attach materials electrical contacts thermal materials solders Electronic Packaging Materials and Their Properties also reviews key electrical, thermal, thermomechanical, mechanical, chemical, and miscellaneous properties as well as their significance in electronic packaging.

Author : Michael Pecht,Yeun Tsun Wong
Publisher : CRC Press
Page : 474 pages
File Size : 45,9 Mb
Release : 1995-10-23
Category : Technology & Engineering
ISBN : 0849396220

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Advanced Routing of Electronic Modules by Michael Pecht,Yeun Tsun Wong Pdf

The rapid growth of the electronic products market has created an increasing need for affordable, reliable, high-speed and high-density multi-layer printed circuit boards (PCBs). This book presents the technologies, algorithms, and methodologies for engineers and others developing the next generation of electronic products. A vision of the future in advanced electronics Advanced Routing of Electronic Modules provides both fundamental theory and advanced technologies for improving routing. Beginning chapters discuss approaches to approximate a minimum rectilinear Steiner tree from a minimum spanning tree and introduce ways to avoid obstacles for routing simple multi-terminal nets sequentially in a workspace. Timing delay, clock skew, and noise control requirements in signal integrity are described as well as computer-aided approaches to managing these requirements in high-speed PCB/MCM routing. Later chapters present the two-layer wiring problem, rip-up and reroute approaches, and parallel routing, including global routing, boundary crossing placement, and detailed maze routing in hardware acceleration. Data structures, data management, and algorithms for parallel routing in a multiple-processor hardware systems are also covered.

Author : I. R. Walker
Publisher : Cambridge University Press
Page : 128 pages
File Size : 44,5 Mb
Release : 2011-01-27
Category : Science
ISBN : 1139493353

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Reliability in Scientific Research by I. R. Walker Pdf

Covering many techniques widely used in research, this book will help researchers in the physical sciences and engineering solve troublesome - and potentially very time consuming - problems in their work. The book deals with technical difficulties that often arise unexpectedly during the use of various common experimental methods, as well as with human error. It provides preventive measures and solutions for such problems, thereby saving valuable time for researchers. Some of the topics covered are: sudden leaks in vacuum systems, electromagnetic interference in electronic instruments, vibrations in sensitive equipment, and bugs in computer software. The book also discusses mistakes in mathematical calculations, and pitfalls in designing and carrying out experiments. Each chapter contains a summary of its key points, to give a quick overview of important potential problems and their solutions in a given area.

Author : Michael Pecht,Riko Radojcic,Gopal Rao
Publisher : CRC Press
Page : 224 pages
File Size : 54,6 Mb
Release : 2017-11-22
Category : Technology & Engineering
ISBN : 9781351443579

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Guidebook for Managing Silicon Chip Reliability by Michael Pecht,Riko Radojcic,Gopal Rao Pdf

Achieving cost-effective performance over time requires an organized, disciplined, and time-phased approach to product design, development, qualification, manufacture, and in-service management. Guidebook for Managing Silicon Chip Reliability examines the principal failure mechanisms associated with modern integrated circuits and describes common practices used to resolve them. This quick reference on semiconductor reliability addresses the key question: How will the understanding of failure mechanisms affect the future? Chapters discuss: failure sites, operational loads, and failure mechanism intrinsic device sensitivities electromigration hot carrier aging time dependent dielectric breakdown mechanical stress induced migration alpha particle sensitivity electrostatic discharge (ESD) and electrical overstress latch-up qualification screening guidelines for designing reliability Guidebook for Managing Silicon Chip Reliability focuses on device failure and causes throughout - providing a thorough framework on how to model the mechanism, test for defects, and avoid and manage damage. It will serve as an exceptional resource for electrical engineers as well as mechanical engineers working in the field of electronic packaging.

Author : Elissa M. Bumiller,David A. Douthit,Joan Pecht
Publisher : CRC Press
Page : 232 pages
File Size : 45,9 Mb
Release : 2002-11-12
Category : Technology & Engineering
ISBN : 9781420040067

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Contamination of Electronic Assemblies by Elissa M. Bumiller,David A. Douthit,Joan Pecht Pdf

Contamination problems have become a major factor in determining the manufacturability, quality, and reliability of electronic assemblies. Understanding the mechanics and chemistry of contamination has become necessary for improving quality and reliability and reducing costs of electronic assemblies. Designed as a practical guide, Contamination of Electronic Assemblies presents a generalized overview of contamination problems and serves as a problem-solving reference point. It takes a step-by-step approach to identifying contaminants and their effects on electronic products at each level of manufacture. The text is divided into four sections: Laminate Manufacturing, Substrate Fabrication, Printed Wiring Board Assembly, and Conformal Coatings. These sections discuss all aspects of contamination of electronic assemblies, from the manufacture of glass fibers used in the laminates to the complete assembly of the finished product. The authors present detection and control methods that can help you reduce defects during the manufacturing process. With tables, figures, and fishbone diagrams serving as a quick reference, Contamination of Electronic Assemblies will help you familiarize yourself with the origination, detection, measurement, control, and prevention of contamination in electronic assemblies.

Author : Pradeep Lall,Michael Pecht,Edward B. Hakim
Publisher : CRC Press
Page : 327 pages
File Size : 53,7 Mb
Release : 2020-07-09
Category : Technology & Engineering
ISBN : 9780429611117

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Influence of Temperature on Microelectronics and System Reliability by Pradeep Lall,Michael Pecht,Edward B. Hakim Pdf

This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures. The author provides readers a sound scientific basis for system operation at realistic steady state temperatures without reliability penalties. Higher temperature performance than is commonly recommended is shown to be cost effective in production for life cycle costs. The microelectronic package considered in the book is assumed to consist of a semiconductor device with first-level interconnects that may be wirebonds, flip-chip, or tape automated bonds; die attach; substrate; substrate attach; case; lid; lid seal; and lead seal. The temperature effects on electrical parameters of both bipolar and MOSFET devices are discussed, and models quantifying the temperature effects on package elements are identified. Temperature-related models have been used to derive derating criteria for determining the maximum and minimum allowable temperature stresses for a given microelectronic package architecture. The first chapter outlines problems with some of the current modeling strategies. The next two chapters present microelectronic device failure mechanisms in terms of their dependence on steady state temperature, temperature cycle, temperature gradient, and rate of change of temperature at the chip and package level. Physics-of-failure based models used to characterize these failure mechanisms are identified and the variabilities in temperature dependence of each of the failure mechanisms are characterized. Chapters 4 and 5 describe the effects of temperature on the performance characteristics of MOS and bipolar devices. Chapter 6 discusses using high-temperature stress screens, including burn-in, for high-reliability applications. The burn-in conditions used by some manufacturers are examined and a physics-of-failure approach is described. The

Author : F. Patrick McCluskey,Thomas Podlesak,Richard Grzybowski
Publisher : CRC Press
Page : 354 pages
File Size : 42,9 Mb
Release : 1996-12-13
Category : Technology & Engineering
ISBN : 0849396239

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High Temperature Electronics by F. Patrick McCluskey,Thomas Podlesak,Richard Grzybowski Pdf

The development of electronics that can operate at high temperatures has been identified as a critical technology for the next century. Increasingly, engineers will be called upon to design avionics, automotive, and geophysical electronic systems requiring components and packaging reliable to 200 °C and beyond. Until now, however, they have had no single resource on high temperature electronics to assist them. Such a resource is critically needed, since the design and manufacture of electronic components have now made it possible to design electronic systems that will operate reliably above the traditional temperature limit of 125 °C. However, successful system development efforts hinge on a firm understanding of the fundamentals of semiconductor physics and device processing, materials selection, package design, and thermal management, together with a knowledge of the intended application environments. High Temperature Electronics brings together this essential information and presents it for the first time in a unified way. Packaging and device engineers and technologists will find this book required reading for its coverage of the techniques and tradeoffs involved in materials selection, design, and thermal management and for its presentation of best design practices using actual fielded systems as examples. In addition, professors and students will find this book suitable for graduate-level courses because of its detailed level of explanation and its coverage of fundamental scientific concepts. Experts from the field of high temperature electronics have contributed to nine chapters covering topics ranging from semiconductor device selection to testing and final assembly.

Author : United States. Defense Logistics Studies Information Exchange
Publisher : Unknown
Page : 1070 pages
File Size : 54,7 Mb
Release : 1979
Category : Military research
ISBN : MINN:31951T00248977Y

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Annual Department of Defense Bibliography of Logistics Studies and Related Documents by United States. Defense Logistics Studies Information Exchange Pdf

Author : Patrick O'Connor
Publisher : John Wiley & Sons
Page : 294 pages
File Size : 51,9 Mb
Release : 2001
Category : Technology & Engineering
ISBN : UOM:39015050525693

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Test Engineering by Patrick O'Connor Pdf

Testing is usually the most expensive, time-consuming and difficult activity during the development of engineering products and systems. Development testing must be performed to ensure that designs meet requirements for performance, safety, durability, reliability, statutory aspects, etc. Most manufactured items must be tested to ensure that they are correctly made. However, much of the testing that is performed in industry is based upon traditions, standards and procedures that do not provide the optimum balance of assurance versus cost and time. There is often pressure to reduce testing because of the high costs involved, without appreciation of the effects on performance, reliability. etc. Misperceptions are commonplace, particularly the idea that tests should not stress products in excess of their operating levels. The main reason for this situation seems to be that engineers have not developed a consistent philosophy and methodology for testing. Testing is seldom taught as part of engineering curricula, and there are no books on the subject. Specialist areas are taught, for example fatigue testing to mechanical engineers and digital device testing to electronics engineers. However, a wide range is untaught, particularly multidisciplinary and systems aspects. Testing is not just an engineering issue. Because of the importance and magnitude of the economic and business aspects testing is an issue for management. Testing is perceived as a high cost activity, when it should be considered as a value-adding process. The objective of this book is, therefore, to propose a philosophy of engineering test and to describe the necessary technologies and methods that will provide a foundation for all plans, methods and decisions related to testing of engineered products and systems. The book will help those who must manage and conduct this most difficult and uncertain task. It will also provide a text which can be used as the basis for teaching the principles of testing to all engineering students.

Author : Anonim
Publisher : Unknown
Page : 608 pages
File Size : 53,7 Mb
Release : 2013
Category : Authors, American
ISBN : UCSD:31822037943230

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The Writers Directory by Anonim Pdf