Download Full eBooks in PDF
Materials Reliability In Microelectronics Ii Volume 265 Book in PDF, ePub and Kindle version is available to download in english. Read online anytime anywhere directly from your device. Click on the download button below to get a free pdf file of Materials Reliability In Microelectronics Ii Volume 265 book. This book definitely worth reading, it is an incredibly well-written.
Author : C. V. Thompson,J. R. Lloyd
Publisher : Cambridge University Press
Page : 344 pages
File Size : 42,9 Mb
Release : 2014-06-05
Category : Technology & Engineering
ISBN : 1107409683
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author : C. V. Thompson,J. R. Lloyd
Publisher : Unknown
Page : 352 pages
File Size : 55,5 Mb
Release : 1992-09-30
Category : Technology & Engineering
ISBN : UCSD:31822015049075
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author : Paul S. Ho,Chao-Kun Hu,Martin Gall,Valeriy Sukharev
Publisher : Cambridge University Press
Page : 433 pages
File Size : 44,8 Mb
Release : 2022-05-12
Category : Science
ISBN : 9781107032385
Learn to assess electromigration reliability and design more resilient chips in this comprehensive and practical resource. Beginning with fundamental physics and building to advanced methodologies, this book enables the reader to develop highly reliable on-chip wiring stacks and power grids. Through a detailed review on the role of microstructure, interfaces and processing on electromigration reliability, as well as characterisation, testing and analysis, the book follows the development of on-chip interconnects from microscale to nanoscale. Practical modeling methodologies for statistical analysis, from simple 1D approximation to complex 3D description, can be used for step-by-step development of reliable on-chip wiring stacks and industrial-grade power/ground grids. This is an ideal resource for materials scientists and reliability and chip design engineers.
Author : Anonim
Publisher : Unknown
Page : 336 pages
File Size : 55,9 Mb
Release : 1999
Category : Microelectronics
ISBN : UOM:39015048111085
Author : Kenneth P. Rodbell
Publisher : Unknown
Page : 520 pages
File Size : 54,9 Mb
Release : 1993-08-31
Category : Technology & Engineering
ISBN : UCSD:31822016911422
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author : C. R. Abernathy
Publisher : Mrs Proceedings
Page : 760 pages
File Size : 49,9 Mb
Release : 1993-03-23
Category : Technology & Engineering
ISBN : UOM:39015029451641
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author : Anonim
Publisher : Unknown
Page : 762 pages
File Size : 54,9 Mb
Release : 1992
Category : Microelectronics
ISBN : UVA:X002237798
Author : Anthony S. Oates
Publisher : Unknown
Page : 552 pages
File Size : 47,6 Mb
Release : 1995-10-24
Category : Technology & Engineering
ISBN : UCSD:31822021537147
This long-standing proceedings series is highly regarded as a premier forum for the discussion of microelectronics reliability issues. In this fifth book, emphasis is on the fundamental understanding of failure phenomena in thin-film materials. Special attention is given to electromigration and mechanical stress effects. The reliability of thin dielectrics and hot carrier degradation of transistors are also featured. Topics include: modeling and simulation of failure mechanisms; reliability issues for submicron IC technologies and packaging; stresses in thin films/lines; gate oxides; barrier layers; electromigration mechanisms; reliability issues for Cu metallizations; electromigration and microstructure; electromigration and stress voiding in circuit interconnects; and resistance measurements of electromigration damage.
Author : Christopher Viney,Steven T. Case,J. Herbert Waite
Publisher : Unknown
Page : 312 pages
File Size : 55,9 Mb
Release : 1993-05-28
Category : Technology & Engineering
ISBN : UOM:39015029941054
Lessons from nature; Cellular synthesis; Non-cellular synthesis; Structural and mechanical properties; Applications.
Author : Avishay Katz
Publisher : Mrs Proceedings
Page : 1000 pages
File Size : 55,9 Mb
Release : 1992-10-28
Category : Technology & Engineering
ISBN : UOM:39015029157925
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author : Ronald H. Baney
Publisher : Mrs Proceedings
Page : 208 pages
File Size : 53,6 Mb
Release : 1992-09-14
Category : Technology & Engineering
ISBN : UOM:39015029192088
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author : Jeremy Broughton,Paul Bristowe,John Newsam
Publisher : Unknown
Page : 696 pages
File Size : 47,9 Mb
Release : 1993-05-07
Category : Technology & Engineering
ISBN : UOM:39015029708503
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author : James E. Mark,Steven P. Marsh
Publisher : Unknown
Page : 432 pages
File Size : 40,5 Mb
Release : 1992-09-23
Category : Technology & Engineering
ISBN : UOM:39015028462961
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author : Donald H. Liebenberg,Ronald W. Armstrong,John J. Gilman
Publisher : Unknown
Page : 416 pages
File Size : 41,8 Mb
Release : 1993-05-28
Category : Technology & Engineering
ISBN : UOM:39015029943340
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author : Kenneth S. Grabowski
Publisher : Mrs Proceedings
Page : 432 pages
File Size : 53,9 Mb
Release : 1992-10-09
Category : Science
ISBN : UOM:39015028462946
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.