Materials Research With Ion Beams

Author : Horst Schmidt-Böcking,Alwin Schempp,Kurt E. Stiebing
Publisher : Springer Science & Business Media
Page : 210 pages
File Size : 53,6 Mb
Release : 2013-06-29
Category : Technology & Engineering
ISBN : 9783662027943

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Materials Research with Ion Beams by Horst Schmidt-Böcking,Alwin Schempp,Kurt E. Stiebing Pdf

Due to new technological progress in the development of ion sources and accelerators interesting kinds of beams are now available. They open new fields for materials research with ion beams. The present status and future possibilities of these research activities are described by experts on this field in the form of review articles. The papers presented in the book focus on very different aspects ranging from the field of truly appliedresearch to the field of fundamental atomic research investigating interaction mechanisms of slow, highly charged particles with surfaces. The book is intended to provide a source of information about recent developments in basic research for the physicists about the status ofthe input of their work into applied materials science. In addition, also other well established techniques, such as Rutherford backscattering analysis and their use in materials research such as of HTC are described. The reader of this book will benefit from its broad view over the various methods of materilas research with ion beams.

Author : Bernd Schmidt,Klaus Wetzig
Publisher : Springer Science & Business Media
Page : 425 pages
File Size : 55,8 Mb
Release : 2012-12-13
Category : Technology & Engineering
ISBN : 9783211993569

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Ion Beams in Materials Processing and Analysis by Bernd Schmidt,Klaus Wetzig Pdf

A comprehensive review of ion beam application in modern materials research is provided, including the basics of ion beam physics and technology. The physics of ion-solid interactions for ion implantation, ion beam synthesis, sputtering and nano-patterning is treated in detail. Its applications in materials research, development and analysis, developments of special techniques and interaction mechanisms of ion beams with solid state matter result in the optimization of new material properties, which are discussed thoroughly. Solid-state properties optimization for functional materials such as doped semiconductors and metal layers for nano-electronics, metal alloys, and nano-patterned surfaces is demonstrated. The ion beam is an important tool for both materials processing and analysis. Researchers engaged in solid-state physics and materials research, engineers and technologists in the field of modern functional materials will welcome this text.

Author : Horst Schmidt-Böcking,Alwin Schempp,Kurt E. Stiebing
Publisher : Springer
Page : 145 pages
File Size : 55,5 Mb
Release : 1992-10-29
Category : Technology & Engineering
ISBN : 3540557741

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Materials Research with Ion Beams by Horst Schmidt-Böcking,Alwin Schempp,Kurt E. Stiebing Pdf

Due to new technological progress in the development of ion sources and accelerators interesting kinds of beams are now available. They open new fields for materials research with ion beams. The present status and future possibilities of these research activities are described by experts on this field in the form of review articles. The papers presented in the book focus on very different aspects ranging from the field of truly appliedresearch to the field of fundamental atomic research investigating interaction mechanisms of slow, highly charged particles with surfaces. The book is intended to provide a source of information about recent developments in basic research for the physicists about the status ofthe input of their work into applied materials science. In addition, also other well established techniques, such as Rutherford backscattering analysis and their use in materials research such as of HTC are described. The reader of this book will benefit from its broad view over the various methods of materilas research with ion beams.

Author : R. Curtis Bird,J. S. Williams
Publisher : Elsevier
Page : 743 pages
File Size : 53,9 Mb
Release : 1989-11-28
Category : Technology & Engineering
ISBN : 9780080916897

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Ion Beams for Materials Analysis by R. Curtis Bird,J. S. Williams Pdf

The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treats all ion beam techniques and their applications in such diverse fields as materials science, thin film and semiconductor technology, surface science, geology, biology, medicine, environmental science, archaeology and so on.

Author : Harry Bernas
Publisher : Springer Science & Business Media
Page : 386 pages
File Size : 55,7 Mb
Release : 2009-10-03
Category : Technology & Engineering
ISBN : 9783540887898

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Materials Science with Ion Beams by Harry Bernas Pdf

Materials science is the prime example of an interdisciplinary science. It - compasses the ?elds of physics, chemistry, material science, electrical en- neering, chemical engineering and other disciplines. Success has been o- standing. World-class accomplishments in materials have been recognized by NobelprizesinPhysicsandChemistryandgivenrisetoentirelynewtechno- gies. Materials science advances have underpinned the technology revolution that has driven societal changes for the last ?fty years. Obviouslytheendisnotinsight!Futuretechnology-basedproblemsd- inatethecurrentscene.Highonthelistarecontrolandconservationofenergy and environment, water purity and availability, and propagating the inf- mation revolution. All fall in the technology domain. In every case proposed solutions begin with new forms of materials, materials processing or new arti?cial material structures. Scientists seek new forms of photovoltaics with greater e?ciency and lower cost. Water purity may be solved through surface control, which promises new desalination processes at lower energy and lower cost. Revolutionary concepts to extend the information revolution reside in controlling the “spin” of electrons or enabling quantum states as in quantum computing. Ion-beam experts make substantial contributions to all of these burgeoning sciences.

Author : J. Thomas
Publisher : Springer Science & Business Media
Page : 521 pages
File Size : 43,6 Mb
Release : 2012-12-06
Category : Science
ISBN : 9781468408560

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Material Characterization Using Ion Beams by J. Thomas Pdf

The extensive use of low-energy accelerators in non-nuclear physics has now reached the stage where these activities are recognized as a natural field of investigation. Many other areas in physics and chemistry have undergone similarly spectacular development: beam foil spectroscopy in atomic physics, studies in atomic collisions, materials implantation, defects creation, nuclear microanalysis, and so on. Now, this most recent activity by itself and in its evident connec tion with the others has brought a new impetus to both the funda mental and the applied aspects of materials science. A summer school on "Material Characterization Using Ion Beams" has resulted from these developments and the realization that the use of ion beams is not restricted to accelerators but covers a wide energy range in the developing technology. The idea of the ion beam as a common denominator of many act1v1t1es dealing with surface and near-surface characterization was enthu siastically received by many scientists and a school on this subject received the positive endorsement of NATO. The Advanced Study Institute on Materials Science has assumed for us the status of an "institution" leading to better contact among the many laboratories engaged in this field. The fourth Institute in this series was held in Aleria, Corsica, between August 22 and September 12, 1976.

Author : Lynn E. Rehn,Joseph E. Greene,Fred A. Smidt
Publisher : Mrs Proceedings
Page : 800 pages
File Size : 46,8 Mb
Release : 1989-04-19
Category : Science
ISBN : UOM:39015012052653

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Processing and Characterization of Materials Using Ion Beams: Volume 128 by Lynn E. Rehn,Joseph E. Greene,Fred A. Smidt Pdf

Author index.

Author : Devesh Kumar Avasthi,Girijesh Kumar Mehta
Publisher : Springer Science & Business Media
Page : 292 pages
File Size : 51,6 Mb
Release : 2011-05-24
Category : Science
ISBN : 9789400712294

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Swift Heavy Ions for Materials Engineering and Nanostructuring by Devesh Kumar Avasthi,Girijesh Kumar Mehta Pdf

Ion beams have been used for decades for characterizing and analyzing materials. Now energetic ion beams are providing ways to modify the materials in unprecedented ways. This book highlights the emergence of high-energy swift heavy ions as a tool for tailoring the properties of materials with nanoscale structures. Swift heavy ions interact with materials by exciting/ionizing electrons without directly moving the atoms. This opens a new horizon towards the 'so-called' soft engineering. The book discusses the ion beam technology emerging from the non-equilibrium conditions and emphasizes the power of controlled irradiation to tailor the properties of various types of materials for specific needs.

Author : Harry Bernas
Publisher : Unknown
Page : 353 pages
File Size : 43,9 Mb
Release : 2001
Category : Ion bombardment
ISBN : OCLC:248450417

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Materials Science with Ion Beams by Harry Bernas Pdf

Author : David C. Cox
Publisher : Morgan & Claypool Publishers
Page : 110 pages
File Size : 49,7 Mb
Release : 2015-10-01
Category : Technology & Engineering
ISBN : 9781681741482

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Introduction to Focused Ion Beam Nanometrology by David C. Cox Pdf

This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology. Beginning with a description of the currently available instruments including the new addition to the field of plasma-based sources, it then gives an overview of ion solid interactions and how the different types of instrument can be applied. Chapters then describe how these machines can be applied to the field of materials science and device fabrication giving examples of recent and current activity in both these areas.

Author : A.G. Balogh,G. Walter
Publisher : Trans Tech Publications Ltd
Page : 512 pages
File Size : 54,7 Mb
Release : 1997-05-29
Category : Technology & Engineering
ISBN : 9783035705201

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Materials Science Applications of Ion Beam Techniques by A.G. Balogh,G. Walter Pdf

The first particle accelerators were built in the early 1930’s. For a long time, these devices were used exclusively by nuclear physicists. In the 1960’s, extensive developments in measuring techniques occurred, mainly as a result of newly developed semiconductor devices. Further strong interest arose from the semiconductor industry, and ion implantation became widely accepted as being the ultimate tool for Si-based device fabrication.

Author : Ishaq Ahmad,Tingkai Zhao
Publisher : BoD – Books on Demand
Page : 115 pages
File Size : 41,8 Mb
Release : 2020-06-10
Category : Technology & Engineering
ISBN : 9781789845709

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Ion Beam Techniques and Applications by Ishaq Ahmad,Tingkai Zhao Pdf

A wide variety of ion beam techniques are being used in several versatile applications ranging from environmental science, nuclear physics, microdevice fabrication to materials science. In addition, new applications of ion beam techniques across a broad range of disciplines and fields are also being discovered frequently. In this book, the latest research and development on progress in ion beam techniques has been compiled and an overview of ion beam irradiation-induced applications in nanomaterial-focused ion beam applications, ion beam analysis techniques, as well as ion implantation application in cells is provided. Moreover, simulations of ion beam-induced damage to structural materials of nuclear fusion reactors are also presented in this book.

Author : Y. Wang,M. Nastasi
Publisher : Materials Research Society
Page : 128 pages
File Size : 54,9 Mb
Release : 2010-03-01
Category : Technology & Engineering
ISBN : 1605112178

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Handbook of Modern Ion Beam Materials Analysis 2 Volume Set by Y. Wang,M. Nastasi Pdf

The Handbook of Modern Ion Beam Materials Analysis, 2nd Edition is a compilation of updated techniques and data for use in the ion-beam analysis of materials. The information presented is unavailable collectively from any other source, and places a strong emphasis on practical examples of the analysis techniques as they are applied to common problems. Revised and updated from the popular handbook previously released in 1995, this edition is written and compiled by over 30 leading authorities in the field of ion beam analysis. It provides an excellent introduction to the fundamentals and lab practices of ion beam analysis and is also useful as a teaching text for undergraduate senior or first-year graduate students This text is a comprehensive collection of nuclear and atomic data for the applications of ion beam materials analysis. In addition, the DVD includes bonus info - both the Ion Beam Analysis Nuclear Data Library (IBANDL) and GUPIX Subroutines (CSA and YLS) for X-ray Database.

Author : Leonard C. Feldman,James W. Mayer,Steward T.A. Picraux
Publisher : Academic Press
Page : 321 pages
File Size : 53,8 Mb
Release : 2012-12-02
Category : Technology & Engineering
ISBN : 9780323139816

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Materials Analysis by Ion Channeling by Leonard C. Feldman,James W. Mayer,Steward T.A. Picraux Pdf

Our intention has been to write a book that would be useful to people with a variety of levels of interest in this subject. Clearly it should be useful to both graduate students and workers in the field. We have attempted to bring together many of the concepts used in channeling beam analysis with an indication of the origin of the ideas within fundamental channeling theory. The level of the book is appropriate to senior under-graduates and graduate students who have had a modern physics course work in related areas of materials science and wish to learn more about the "channeling" probe, its strengths, weaknesses, and areas of further potential application. To them we hope we have explained this apparent paradox of using mega-electron volt ions to probe solid state phenomena that have characteristic energies of electron volts.

Author : Nan Yao
Publisher : Cambridge University Press
Page : 0 pages
File Size : 45,8 Mb
Release : 2011-04-14
Category : Technology & Engineering
ISBN : 0521158591

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Focused Ion Beam Systems by Nan Yao Pdf

The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.