Metrology And Standardization For Nanotechnology

Author : Elisabeth Mansfield,Debra L. Kaiser,Daisuke Fujita,Marcel Van de Voorde
Publisher : John Wiley & Sons
Page : 626 pages
File Size : 51,5 Mb
Release : 2017-04-10
Category : Technology & Engineering
ISBN : 9783527340392

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Metrology and Standardization for Nanotechnology by Elisabeth Mansfield,Debra L. Kaiser,Daisuke Fujita,Marcel Van de Voorde Pdf

For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products. First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.

Author : Elisabeth Mansfield,Debra L. Kaiser,Daisuke Fujita,Marcel Van de Voorde
Publisher : John Wiley & Sons
Page : 626 pages
File Size : 44,9 Mb
Release : 2017-01-20
Category : Technology & Engineering
ISBN : 9783527800292

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Metrology and Standardization for Nanotechnology by Elisabeth Mansfield,Debra L. Kaiser,Daisuke Fujita,Marcel Van de Voorde Pdf

For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products. First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.

Author : Richard Leach
Publisher : Elsevier
Page : 384 pages
File Size : 40,8 Mb
Release : 2014-05-17
Category : Science
ISBN : 9781455777501

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Fundamental Principles of Engineering Nanometrology by Richard Leach Pdf

Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. Richard Leach introduces these techniques to a broad audience of engineers and scientists involved in nanotechnology and manufacturing applications and research. He also provides a routemap and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale. Starting from the fundamentals of precision measurement, the author progresses into different measurement and characterization techniques. The focus on nanometrology in engineering contexts makes this book an essential guide for the emerging nanomanufacturing / nanofabrication sector, where measurement and standardization requirements are paramount both in product specification and quality assurance. This book provides engineers and scientists with the methods and understanding needed to design and produce high-performance, long-lived products while ensuring that compliance and public health requirements are met. Updated to cover new and emerging technologies, and recent developments in standards and regulatory frameworks, this second edition includes many new sections, e.g. new technologies in scanning probe and e-beam microscopy, recent developments in interferometry and advances in co-ordinate metrology. Demystifies nanometrology for a wide audience of engineers, scientists, and students involved in nanotech and advanced manufacturing applications and research Introduces metrologists to the specific techniques and equipment involved in measuring at the nano-scale or to nano-scale uncertainty Fully updated to cover the latest technological developments, standards, and regulations

Author : Richard Leach
Publisher : William Andrew
Page : 352 pages
File Size : 49,7 Mb
Release : 2009-09-03
Category : Technology & Engineering
ISBN : 1437778321

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Fundamental Principles of Engineering Nanometrology by Richard Leach Pdf

Fundamental Principles of Engineering Nanometrology provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume that can be used for professional reference and academic study. Provides a basic introduction to measurement and instruments Thoroughly presents numerous measurement techniques, from static length and displacement to surface topography, mass and force Covers multiple optical surface measuring instruments and related topics (interferometry, triangulation, confocal , variable focus, and scattering instruments) Explains, in depth, the calibration of surface topography measuring instruments (traceability; calibration of profile and areal surface texture measuring instruments; uncertainties) Discusses the material in a way that is comprehensible to even those with only a limited mathematical knowledge

Author : Vladimir Murashov,John Howard
Publisher : Springer Science & Business Media
Page : 269 pages
File Size : 50,6 Mb
Release : 2011-02-01
Category : Technology & Engineering
ISBN : 9781441978530

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Nanotechnology Standards by Vladimir Murashov,John Howard Pdf

Written by a team of experts, Nanotechnology Standards provides the first comprehensive, state-of-the-art reviews of nanotechnology standards development, both in the field of standards development and in specific areas of nanotechnology. It also describes global standards-developing processes for nanotechnology, which can be extended to other emerging technologies. For topics related to nanotechnology, the reviews summarize active areas of standards development, supporting knowledge and future directions in easy-to-understand language aimed at a broad technical audience. This unique book is also an excellent resource for up-to-date information on the growing base of knowledge supporting the introduction of nanotechnology standards and applications into the market. Praise for this volume: “This book provides a valuable and detailed overview of current activities and issues relevant to the area as well as a useful summary of the short history of standardization for nanotechnologies and the somewhat longer history of standardization in general. I have no hesitation in recommending this book to anyone with an interest in nanotechnologies whether it is from a technical or societal perspective.” --Dr. Peter Hatto, Director of Research, IonBond Limited, Durham, UK

Author : Zhiyong Ma,David G. Seiler
Publisher : CRC Press
Page : 1454 pages
File Size : 41,8 Mb
Release : 2017-03-27
Category : Science
ISBN : 9781351733953

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Metrology and Diagnostic Techniques for Nanoelectronics by Zhiyong Ma,David G. Seiler Pdf

Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.

Author : David J. Whitehouse
Publisher : Taylor & Francis
Page : 1015 pages
File Size : 46,6 Mb
Release : 2023-03-17
Category : Science
ISBN : 9781351442077

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Handbook of Surface Metrology by David J. Whitehouse Pdf

Written by the leading authority in the subject, Handbook of Surface Metrology covers every conceivable aspect of measuring and characterizing a surface. Focusing both on theory and practice, the book provides useful guidelines for the design of precision instruments and presents data on the functional importance of surfaces. It also clearly explains the essential theory relevant to surface metrology. The book defines most terms and parameters according to national and international standards. Many examples and illustrations are drawn from the esteemed author's large fund of groundbreaking research work. This unparalleled, all-encompassing "metrology bible" is beneficial for engineering postgraduate students and researchers involved in tribology, instrumentation, data processing, and metrology.

Author : Ichiko Misumi
Publisher : Unknown
Page : 0 pages
File Size : 44,6 Mb
Release : 2021
Category : Nanotechnology
ISBN : 0750331917

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Nanoscale Standards by Metrological AFM and Other Instruments by Ichiko Misumi Pdf

The purpose of this book is to help semiconductor inspection equipment users and manufacturers understand what nano dimensional standards are used to calibrate their equipment and how to employ them effectively. Reviewing trends and developments in nanoscale standards, the book starts with an introductory overview of nanometrological standards before proceeding to detail pitch standard, step height, line width, nano particle size, and surface roughness. This book is essential for users making quantitative nanoscale measurements, be that in a commercial or academic research setting, or involved in engineering nanometrology for quality control in industrial applications. Here the author provides an approachable understanding and application of the nanoscale standards in a practical context across a range of common nanoscale measurement modalities, including 3D, with particular emphasis on applications to AFM, an exceptional and arguably the most common technique used in nanometrology due to the ease of use and versatility of applications.

Author : Waldemar Nawrocki
Publisher : Springer
Page : 326 pages
File Size : 55,9 Mb
Release : 2019-05-30
Category : Technology & Engineering
ISBN : 9783030196776

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Introduction to Quantum Metrology by Waldemar Nawrocki Pdf

This book discusses the theory of quantum effects used in metrology, and presents the author’s research findings in the field of quantum electronics. It also describes the quantum measurement standards used in various branches of metrology, such as those relating to electrical quantities, mass, length, time and frequency. The first comprehensive survey of quantum metrology problems, it introduces a new approach to metrology, placing a greater emphasis on its connection with physics, which is of importance for developing new technologies, nanotechnology in particular. Presenting practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a broad range of physicists and metrologists. It also promotes a better understanding and approval of the new system in both industry and academia. This second edition includes two new chapters focusing on the revised SI system and satellite positioning systems. Practical realization (mise en pratique) the base units (metre, kilogram, second, ampere, kelvin, candela, and mole), new defined in the revised SI, is presented in details. Another new chapter describes satellite positioning systems and their possible applications. In satellite positioning systems, like GPS, GLONASS, BeiDou and Galileo, quantum devices – atomic clocks – serve wide population of users.

Author : David J. Whitehouse
Publisher : Taylor & Francis
Page : 1150 pages
File Size : 41,6 Mb
Release : 2002-12-01
Category : Science
ISBN : 0750305835

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Handbook of Surface and Nanometrology by David J. Whitehouse Pdf

The Handbook of Surface and Nanometrology explains and challenges current concepts in nanotechnology. It covers in great detail surface metrology and nanometrology and more importantly the areas where they overlap, thereby providing a quantitative means of controlling and predicting processes and performance. Trends and mechanisms are explained with numerous practical examples. Bringing engineering and physics together at the nanoscale reveals some astonishing effects: geometric features such as shape change meaning; roughness can disappear altogether; signals from instruments have to be dealt with differently depending on scale. These and other aspects are dealt with for the first time in this book. It is relevant not only for today's technology but also for future advances. Many aspects of nanotechnology and precision engineering are considered in chapters on manufacture, characterization, standardization, performance and instrumentation. There is a special chapter on nanometrology and this subject permeates the whole book. The Handbook of Surface and Nanometrology is the only book that covers these subject areas and is the definitive work in this field. This book is indispensable for firms making, trading, and researching semiconductor devices, MEMS, and micro-optics, as well as tradition precision engineering products. It will also be useful in quality control as well as for research scientists, development engineers, and production managers.

Author : Gabor L. Hornyak,H.F. Tibbals,Joydeep Dutta,John J. Moore
Publisher : CRC Press
Page : 1635 pages
File Size : 43,9 Mb
Release : 2008-12-22
Category : Science
ISBN : 9781420047806

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Introduction to Nanoscience and Nanotechnology by Gabor L. Hornyak,H.F. Tibbals,Joydeep Dutta,John J. Moore Pdf

The maturation of nanotechnology has revealed it to be a unique and distinct discipline rather than a specialization within a larger field. Its textbook cannot afford to be a chemistry, physics, or engineering text focused on nano. It must be an integrated, multidisciplinary, and specifically nano textbook. The archetype of the modern nano textbook

Author : Gabor L. Hornyak,John J. Moore,H.F. Tibbals,Joydeep Dutta
Publisher : CRC Press
Page : 812 pages
File Size : 50,6 Mb
Release : 2018-12-14
Category : Technology & Engineering
ISBN : 9781420048049

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Fundamentals of Nanotechnology by Gabor L. Hornyak,John J. Moore,H.F. Tibbals,Joydeep Dutta Pdf

WINNER 2009 CHOICE AWARD OUTSTANDING ACADEMIC TITLE! Nanotechnology is no longer a subdiscipline of chemistry, engineering, or any other field. It represents the convergence of many fields, and therefore demands a new paradigm for teaching. This textbook is for the next generation of nanotechnologists. It surveys the field’s broad landscape, exploring the physical basics such as nanorheology, nanofluidics, and nanomechanics as well as industrial concerns such as manufacturing, reliability, and safety. The authors then explore the vast range of nanomaterials and systematically outline devices and applications in various industrial sectors. This color text is an ideal companion to Introduction to Nanoscience by the same group of esteemed authors. Both titles are also available as the single volume Introduction to Nanoscience and Nanotechnology Qualifying instructors who purchase either of these volumes (or the combined set) are given online access to a wealth of instructional materials. These include detailed lecture notes, review summaries, slides, exercises, and more. The authors provide enough material for both one- and two-semester courses.

Author : United States. Congress. House. Committee on Science
Publisher : Unknown
Page : 196 pages
File Size : 54,9 Mb
Release : 2006
Category : Political Science
ISBN : PSU:000058937709

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Research on Environmental and Safety Impacts of Nanotechnology by United States. Congress. House. Committee on Science Pdf

Author : Günter Wilkening,Ludger Koenders
Publisher : John Wiley & Sons
Page : 541 pages
File Size : 41,5 Mb
Release : 2006-05-12
Category : Technology & Engineering
ISBN : 9783527606870

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Nanoscale Calibration Standards and Methods by Günter Wilkening,Ludger Koenders Pdf

The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing

Author : Great Britain. Parliament. House of Lords. Science and Technology Committee
Publisher : The Stationery Office
Page : 380 pages
File Size : 51,7 Mb
Release : 2010
Category : Political Science
ISBN : 0108459233

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Nanotechnologies and Food by Great Britain. Parliament. House of Lords. Science and Technology Committee Pdf

Nanotechnologies and Food : 1st report of session 2009-10, Vol. 2: Evidence