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Author : Ichiko Misumi
Publisher : Unknown
Page : 128 pages
File Size : 43,5 Mb
Release : 2021
Category : Electronic
ISBN : 0750331909
Author : Günter Wilkening,Ludger Koenders
Publisher : John Wiley & Sons
Page : 541 pages
File Size : 54,5 Mb
Release : 2006-05-12
Category : Technology & Engineering
ISBN : 9783527606870
The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing
Author : Richard Leach
Publisher : Elsevier
Page : 384 pages
File Size : 41,9 Mb
Release : 2014-05-17
Category : Science
ISBN : 9781455777501
Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. Richard Leach introduces these techniques to a broad audience of engineers and scientists involved in nanotechnology and manufacturing applications and research. He also provides a routemap and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale. Starting from the fundamentals of precision measurement, the author progresses into different measurement and characterization techniques. The focus on nanometrology in engineering contexts makes this book an essential guide for the emerging nanomanufacturing / nanofabrication sector, where measurement and standardization requirements are paramount both in product specification and quality assurance. This book provides engineers and scientists with the methods and understanding needed to design and produce high-performance, long-lived products while ensuring that compliance and public health requirements are met. Updated to cover new and emerging technologies, and recent developments in standards and regulatory frameworks, this second edition includes many new sections, e.g. new technologies in scanning probe and e-beam microscopy, recent developments in interferometry and advances in co-ordinate metrology. Demystifies nanometrology for a wide audience of engineers, scientists, and students involved in nanotech and advanced manufacturing applications and research Introduces metrologists to the specific techniques and equipment involved in measuring at the nano-scale or to nano-scale uncertainty Fully updated to cover the latest technological developments, standards, and regulations
Author : Elisabeth Mansfield,Debra L. Kaiser,Daisuke Fujita,Marcel Van de Voorde
Publisher : John Wiley & Sons
Page : 626 pages
File Size : 42,8 Mb
Release : 2017-04-10
Category : Technology & Engineering
ISBN : 9783527340392
For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products. First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.
Author : Wei Gao,Yasuhiro Takaya,Yongsheng Gao,Michael Krystek
Publisher : Trans Tech Publications Ltd
Page : 674 pages
File Size : 42,9 Mb
Release : 2008-06-12
Category : Technology & Engineering
ISBN : 9783038131830
Volume is indexed by Thomson Reuters BCI (WoS). Measurement, rigorously defined as ascertaining the size, amount or degree of a measurand by instrumental comparison with a standard unit or by indirect calculation based upon theory, is what makes science and technology different to imagination. Measurement is essential in industry, commerce and daily life. In the manufacturing industry in particular, measurement and instrumentation technology play increasingly important roles not only in the traditional field of manufacturing but also in the new fields of micro/nano technology and bioengineering. This book presents recent advances in the use of measurement and instrumentation in the manufacturing industry. A wide range of topics are covered including: micro/nano-metrology,precision measurements,online and in-process measurements,surface metrology,optical metrology and image processing,bio-measurement, sensor technology,intelligent measurement and instrumentation,uncertainty, traceability and calibration and signal-processing algorithms.
Author : Ichiko Misumi
Publisher : Unknown
Page : 0 pages
File Size : 45,7 Mb
Release : 2021
Category : Nanotechnology
ISBN : 0750331917
The purpose of this book is to help semiconductor inspection equipment users and manufacturers understand what nano dimensional standards are used to calibrate their equipment and how to employ them effectively. Reviewing trends and developments in nanoscale standards, the book starts with an introductory overview of nanometrological standards before proceeding to detail pitch standard, step height, line width, nano particle size, and surface roughness. This book is essential for users making quantitative nanoscale measurements, be that in a commercial or academic research setting, or involved in engineering nanometrology for quality control in industrial applications. Here the author provides an approachable understanding and application of the nanoscale standards in a practical context across a range of common nanoscale measurement modalities, including 3D, with particular emphasis on applications to AFM, an exceptional and arguably the most common technique used in nanometrology due to the ease of use and versatility of applications.
Author : David J. Whitehouse
Publisher : CRC Press
Page : 982 pages
File Size : 53,6 Mb
Release : 2002-12-01
Category : Science
ISBN : 9781420034196
The Handbook of Surface and Nanometrology explains and challenges current concepts in nanotechnology. It covers in great detail surface metrology and nanometrology and more importantly the areas where they overlap, thereby providing a quantitative means of controlling and predicting processes and performance. Trends and mechanisms are explained wit
Author : Elisabeth Mansfield,Debra L. Kaiser,Daisuke Fujita,Marcel Van de Voorde
Publisher : John Wiley & Sons
Page : 626 pages
File Size : 55,9 Mb
Release : 2017-01-20
Category : Technology & Engineering
ISBN : 9783527800056
For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products. First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.
Author : David H. Guston
Publisher : SAGE Publications
Page : 1025 pages
File Size : 43,8 Mb
Release : 2010-07-14
Category : Social Science
ISBN : 9781452266176
Labeled either as the "next industrial revolution" or as just "hype," nanoscience and nanotechnologies are controversial, touted by some as the likely engines of spectacular transformation of human societies and even human bodies, and by others as conceptually flawed. These challenges make an encyclopedia of nanoscience and society an absolute necessity. Providing a guide to what these understandings and challenges are about, the Encyclopedia of Nanoscience and Society offers accessible descriptions of some of the key technical achievements of nanoscience along with its history and prospects. Rather than a technical primer, this encyclopedia instead focuses on the efforts of governments around the world to fund nanoscience research and to tap its potential for economic development as well as to assess how best to regulate a new technology for the environmental, occupational, and consumer health and safety issues related to the field. Contributions examine and analyze the cultural significance of nanoscience and nanotechnologies and describe some of the organizations, and their products, that promise to make nanotechnologies a critical part of the global economy. Written by noted scholars and practitioners from around the globe, these two volumes offer nearly 500 entries describing the societal aspects of nanoscience and nanotechnology. Key Themes - Art, Design, and Materials - Bionanotechnology Centers - Context - Economics and Business - Engagement and the Public - Environment and Risk - Ethics and Values - Geographies and Distribution - History and Philosophy - Integration and Interdisciplinarity - Nanotechnology Companies - Nanotechnology Organizations
Author : Petr Klapetek
Publisher : Elsevier
Page : 416 pages
File Size : 42,5 Mb
Release : 2018-02-03
Category : Science
ISBN : 9780128133484
Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software. Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap. Associated data sets can be downloaded from http://gwyddion.net/qspm/ Features step-by-step guidance to aid readers in progressing from a general understanding of SPM principles to a greater mastery of complex data measurement techniques Includes a focus on metrology aspects of measurements, arming readers with a solid grasp of instrumentation and measuring methods accuracy Worked examples show quantitative data processing for different SPM analytical techniques
Author : British Standards Institute Staff
Publisher : Unknown
Page : 128 pages
File Size : 42,9 Mb
Release : 2007-12-31
Category : Electronic
ISBN : 0580613186
Nanotechnology, Nanomaterials, Nanoparticles, Particle size distribution, Particle size measurement, Surface chemistry, Chemical analysis and testing, Instrumental methods of analysis, Spectroscopy, Microscopic analysis, Test equipment
Author : Mudiwa Afolayan
Publisher : Unknown
Page : 304 pages
File Size : 47,5 Mb
Release : 2017-02
Category : Electronic
ISBN : 1681177196
Author : Evangelos Eleftheriou,S.O. Reza Moheimani
Publisher : Springer
Page : 292 pages
File Size : 46,9 Mb
Release : 2011-07-15
Category : Technology & Engineering
ISBN : 9783642221736
This book comprises a selection of the presentations made at the “Workshop on Dynamics and Control of Micro and Nanoscale Systems” held at IBM Research – Zurich, Switzerland, on the 10th and 11th of December 2009. The aim of the workshop was to bring together some of the leading researchers in the field of dynamics and control of micro- and nanoscale systems. It proved an excellent forum for discussing new ideas and approaches.
Author : Hilmi Ünlü,Norman J. M. Horing,Jaroslaw Dabrowski
Publisher : Springer
Page : 688 pages
File Size : 54,6 Mb
Release : 2015-12-01
Category : Science
ISBN : 9783319253404
This book focuses on the fundamental phenomena at nanoscale. It covers synthesis, properties, characterization and computer modelling of nanomaterials, nanotechnologies, bionanotechnology, involving nanodevices. Further topics are imaging, measuring, modeling and manipulating of low dimensional matter at nanoscale. The topics covered in the book are of vital importance in a wide range of modern and emerging technologies employed or to be employed in most industries, communication, healthcare, energy, conservation , biology, medical science, food, environment, and education, and consequently have great impact on our society.
Author : Samir Mekid
Publisher : John Wiley & Sons
Page : 404 pages
File Size : 46,5 Mb
Release : 2021-12-02
Category : Technology & Engineering
ISBN : 9781119721710
Metrology and Instrumentation: Practical Applications for Engineering and Manufacturing provides students and professionals with an accessible foundation in the metrology techniques, instruments, and governing standards used in mechanical engineering and manufacturing. The book opens with an overview of metrology units and scale, then moves on to explain topics such as sources of error, calibration systems, uncertainty, and dimensional, mechanical, and thermodynamic measurement systems. A chapter on tolerance stack-ups covers GD&T, ASME Y14.5-2018, and the ISO standard for general tolerances, while a chapter on digital measurements connects metrology to newer, Industry 4.0 applications.