Multi Run Memory Tests For Pattern Sensitive Faults

Author : Ireneusz Mrozek
Publisher : Unknown
Page : 128 pages
File Size : 51,5 Mb
Release : 2019
Category : Computer storage devices
ISBN : 3319912054

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Multi-run Memory Tests for Pattern Sensitive Faults by Ireneusz Mrozek Pdf

This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations. Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process; Presents practical algorithms for design and implementation of efficient multi-run tests; Demonstrates methods verified by analytical and experimental investigations.

Author : Ireneusz Mrozek
Publisher : Springer
Page : 135 pages
File Size : 42,9 Mb
Release : 2018-07-06
Category : Technology & Engineering
ISBN : 9783319912042

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Multi-run Memory Tests for Pattern Sensitive Faults by Ireneusz Mrozek Pdf

This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations. Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process; Presents practical algorithms for design and implementation of efficient multi-run tests; Demonstrates methods verified by analytical and experimental investigations.

Author : R. Dean Adams
Publisher : Springer Science & Business Media
Page : 250 pages
File Size : 44,9 Mb
Release : 2006-04-11
Category : Technology & Engineering
ISBN : 9780306479724

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High Performance Memory Testing by R. Dean Adams Pdf

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

Author : Said Hamdioui
Publisher : Springer Science & Business Media
Page : 231 pages
File Size : 53,5 Mb
Release : 2013-06-29
Category : Technology & Engineering
ISBN : 9781475767063

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Testing Static Random Access Memories by Said Hamdioui Pdf

Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.

Author : Kenli Li,Zheng Xiao,Yan Wang,Jiayi Du,Keqin Li
Publisher : Springer
Page : 614 pages
File Size : 54,9 Mb
Release : 2014-03-08
Category : Computers
ISBN : 9783642539626

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Parallel Computational Fluid Dynamics by Kenli Li,Zheng Xiao,Yan Wang,Jiayi Du,Keqin Li Pdf

This book constitutes the refereed proceedings of the 25th International Conference on Parallel Computational Fluid Dynamics, ParCFD 2013, held in Changsha, China, in May 2013. The 35 revised full papers presented were carefully reviewed and selected from more than 240 submissions. The papers address issues such as parallel algorithms, developments in software tools and environments, unstructured adaptive mesh applications, industrial applications, atmospheric and oceanic global simulation, interdisciplinary applications and evaluation of computer architectures and software environments.

Author : Whitson G. Waldo
Publisher : First Books
Page : 314 pages
File Size : 53,5 Mb
Release : 2010-09
Category : Business & Economics
ISBN : 9781592994830

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Program Management for System on Chip Platforms by Whitson G. Waldo Pdf

A Fully Integrated Presentation of New Hardware and Software Product Introductions Using Program Management Methodologies for System on Chip Platforms If you're an executive, manager, or engineer in the semiconductor, software, or systems industries, this book provides conceptual views ranging from the design of integrated circuits or systems on a chip, through fabrication, to integration of chips onto boards, and through development of enablement and runtime software for system and platform deliveries. Special features included this book are: - Program management methodologies - General management fundamentals - An overview of leadership principles - Basic discrete device technology - Internal structure and operation of some common logic gates - Basic integrated circuit design concepts, building blocks, and flow - Chip packaging technologies - Details of the fabrication process for integrated circuits - Printed circuit board design, manufacture, and test - Software design, development, and test - Integrated circuit test, silicon validation, and device qualification - Program management applications bringing it all together The book explores interactions and dependencies of technologies that impact systems and platforms. This is a valuable resource to learn these technologies or to use as a reference.

Author : Daniel Siewiorek,Robert Swarz
Publisher : Digital Press
Page : 908 pages
File Size : 40,6 Mb
Release : 2014-06-28
Category : Computers
ISBN : 9781483297439

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Reliable Computer Systems by Daniel Siewiorek,Robert Swarz Pdf

Enhance your hardware/software reliability Enhancement of system reliability has been a major concern of computer users and designers ¦ and this major revision of the 1982 classic meets users' continuing need for practical information on this pressing topic. Included are case studies of reliable systems from manufacturers such as Tandem, Stratus, IBM, and Digital, as well as coverage of special systems such as the Galileo Orbiter fault protection system and AT&T telephone switching processors.

Author : Daniel P. Siewiorek,Robert S. Swarz
Publisher : CRC Press
Page : 908 pages
File Size : 55,6 Mb
Release : 1998-12-15
Category : Computers
ISBN : 9781439863961

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Reliable Computer Systems by Daniel P. Siewiorek,Robert S. Swarz Pdf

This classic reference work is a comprehensive guide to the design, evaluation, and use of reliable computer systems. It includes case studies of reliable systems from manufacturers, such as Tandem, Stratus, IBM, and Digital. It covers special systems such as the Galileo Orbiter fault protection system and AT&T telephone switching system processors

Author : Anonim
Publisher : ASM International
Page : 540 pages
File Size : 52,5 Mb
Release : 2019-12-01
Category : Technology & Engineering
ISBN : 9781627082730

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ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis by Anonim Pdf

The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.

Author : Louis Scheffer,Luciano Lavagno,Grant Martin
Publisher : CRC Press
Page : 544 pages
File Size : 54,5 Mb
Release : 2018-10-03
Category : Technology & Engineering
ISBN : 9781420007947

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EDA for IC System Design, Verification, and Testing by Louis Scheffer,Luciano Lavagno,Grant Martin Pdf

Presenting a comprehensive overview of the design automation algorithms, tools, and methodologies used to design integrated circuits, the Electronic Design Automation for Integrated Circuits Handbook is available in two volumes. The first volume, EDA for IC System Design, Verification, and Testing, thoroughly examines system-level design, microarchitectural design, logical verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for IC designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. Save on the complete set.

Author : Anonim
Publisher : ASM International
Page : 128 pages
File Size : 48,6 Mb
Release : 2017-12-01
Category : Technology & Engineering
ISBN : 9781627081511

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ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis by Anonim Pdf

The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.

Author : Manoj Franklin
Publisher : Unknown
Page : 180 pages
File Size : 42,6 Mb
Release : 1990
Category : Electronic
ISBN : WISC:89016024291

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Row/column Pattern Sensitive Faults in Random Access Memories by Manoj Franklin Pdf

Author : Jack Ganssle
Publisher : Elsevier
Page : 279 pages
File Size : 52,6 Mb
Release : 2012-12-02
Category : Computers
ISBN : 9780080499420

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The Art of Programming Embedded Systems by Jack Ganssle Pdf

Embedded systems are products such as microwave ovens, cars, and toys that rely on an internal microprocessor. This book is oriented toward the design engineer or programmer who writes the computer code for such a system. There are a number of problems specific to the embedded systems designer, and this book addresses them and offers practical solutions. Offers cookbook routines, algorithms, and design techniques Includes tips for handling debugging management and testing Explores the philosophy of tightly coupling software and hardware in programming and developing an embedded system Provides one of the few coherent references on this subject

Author : Anonim
Publisher : Conference
Page : 1032 pages
File Size : 51,9 Mb
Release : 1995
Category : Automatic test equipment
ISBN : UCSD:31822021341052

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Proceedings, International Test Conference 1995 by Anonim Pdf

Author : Dimitris Gizopoulos
Publisher : Springer Science & Business Media
Page : 431 pages
File Size : 52,7 Mb
Release : 2006-01-22
Category : Technology & Engineering
ISBN : 9780387294094

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Advances in Electronic Testing by Dimitris Gizopoulos Pdf

This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.