Nanoscale Cmos Vlsi Circuits Design For Manufacturability

Author : Sandip Kundu,Aswin Sreedhar
Publisher : McGraw Hill Professional
Page : 316 pages
File Size : 41,6 Mb
Release : 2010-06-22
Category : Technology & Engineering
ISBN : 9780071635202

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Nanoscale CMOS VLSI Circuits: Design for Manufacturability by Sandip Kundu,Aswin Sreedhar Pdf

Cutting-Edge CMOS VLSI Design for Manufacturability Techniques This detailed guide offers proven methods for optimizing circuit designs to increase the yield, reliability, and manufacturability of products and mitigate defects and failure. Covering the latest devices, technologies, and processes, Nanoscale CMOS VLSI Circuits: Design for Manufacturability focuses on delivering higher performance and lower power consumption. Costs, constraints, and computational efficiencies are also discussed in the practical resource. Nanoscale CMOS VLSI Circuits covers: Current trends in CMOS VLSI design Semiconductor manufacturing technologies Photolithography Process and device variability: analyses and modeling Manufacturing-Aware Physical Design Closure Metrology, manufacturing defects, and defect extraction Defect impact modeling and yield improvement techniques Physical design and reliability DFM tools and methodologies

Author : Charles Chiang,Jamil Kawa
Publisher : Springer Science & Business Media
Page : 277 pages
File Size : 54,6 Mb
Release : 2007-06-15
Category : Technology & Engineering
ISBN : 9781402051883

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Design for Manufacturability and Yield for Nano-Scale CMOS by Charles Chiang,Jamil Kawa Pdf

This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.

Author : Rohit Dhiman,Rajeevan Chandel
Publisher : Springer Nature
Page : 319 pages
File Size : 55,7 Mb
Release : 2020-10-03
Category : Technology & Engineering
ISBN : 9789811579370

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Nanoscale VLSI by Rohit Dhiman,Rajeevan Chandel Pdf

This book describes methodologies in the design of VLSI devices, circuits and their applications at nanoscale levels. The book begins with the discussion on the dominant role of power dissipation in highly scaled devices.The 15 Chapters of the book are classified under four sections that cover design, modeling, and simulation of electronic, magnetic and compound semiconductors for their applications in VLSI devices, circuits, and systems. This comprehensive volume eloquently presents the design methodologies for ultra–low power VLSI design, potential post–CMOS devices, and their applications from the architectural and system perspectives. The book shall serve as an invaluable reference book for the graduate students, Ph.D./ M.S./ M.Tech. Scholars, researchers, and practicing engineers working in the frontier areas of nanoscale VLSI design.

Author : Chiang
Publisher : Unknown
Page : 281 pages
File Size : 50,7 Mb
Release : 2009-06-01
Category : Electronic
ISBN : 8184892446

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Design For Manufacturability And Yield For Nano-Scale Cmos by Chiang Pdf

Author : Krishnendu Chakrabarty,Sandeep K. Goel
Publisher : CRC Press
Page : 259 pages
File Size : 40,6 Mb
Release : 2017-03-29
Category : Electronic
ISBN : 1138075779

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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits by Krishnendu Chakrabarty,Sandeep K. Goel Pdf

Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay defects (SDDs), which can cause immediate timing failures on both critical and non-critical paths in the circuit. � Overviews semiconductor industry test challenges and the need for SDD testing, including basic concepts and introductory material Describes algorithmic solutions incorporated in commercial tools from Mentor Graphics Reviews SDD testing based on "alternative methods" that explores new metrics, top-off ATPG, and circuit topology-based solutions Highlights the advantages and disadvantages of a diverse set of metrics, and identifies scope for improvement Written from the triple viewpoint of university researchers, EDA tool developers, and chip designers and tool users, this book is the first of its kind to address all aspects of SDD testing from such a diverse perspective. The book is designed as a one-stop reference for current industrial practices, research challenges in the domain of SDD testing, and recent developments in SDD solutions.

Author : Trent McConaghy,Kristopher Breen,Jeffrey Dyck,Amit Gupta
Publisher : Springer Science & Business Media
Page : 188 pages
File Size : 55,8 Mb
Release : 2012-10-02
Category : Technology & Engineering
ISBN : 9781461422693

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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide by Trent McConaghy,Kristopher Breen,Jeffrey Dyck,Amit Gupta Pdf

This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects. It teaches them the state-of-the-art in Variation-Aware Design tools, which help the designer to analyze quickly the variation effects, identify the problems, and fix the problems. Furthermore, this book describes the algorithms and algorithm behavior/performance/limitations, which is of use to designers considering these tools, designers using these tools, CAD researchers, and CAD managers.

Author : Kevin Zhang
Publisher : Springer Science & Business Media
Page : 390 pages
File Size : 43,9 Mb
Release : 2009-04-21
Category : Technology & Engineering
ISBN : 9780387884974

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Embedded Memories for Nano-Scale VLSIs by Kevin Zhang Pdf

Kevin Zhang Advancement of semiconductor technology has driven the rapid growth of very large scale integrated (VLSI) systems for increasingly broad applications, incl- ing high-end and mobile computing, consumer electronics such as 3D gaming, multi-function or smart phone, and various set-top players and ubiquitous sensor and medical devices. To meet the increasing demand for higher performance and lower power consumption in many different system applications, it is often required to have a large amount of on-die or embedded memory to support the need of data bandwidth in a system. The varieties of embedded memory in a given system have alsobecome increasingly more complex, ranging fromstatictodynamic and volatile to nonvolatile. Among embedded memories, six-transistor (6T)-based static random access memory (SRAM) continues to play a pivotal role in nearly all VLSI systems due to its superior speed and full compatibility with logic process technology. But as the technology scaling continues, SRAM design is facing severe challenge in mainta- ing suf?cient cell stability margin under relentless area scaling. Meanwhile, rapid expansion in mobile application, including new emerging application in sensor and medical devices, requires far more aggressive voltage scaling to meet very str- gent power constraint. Many innovative circuit topologies and techniques have been extensively explored in recent years to address these challenges.

Author : Saraju P. Mohanty,Nagarajan Ranganathan,Elias Kougianos,Priyardarsan Patra
Publisher : Springer Science & Business Media
Page : 325 pages
File Size : 51,8 Mb
Release : 2008-05-31
Category : Technology & Engineering
ISBN : 9780387764740

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Low-Power High-Level Synthesis for Nanoscale CMOS Circuits by Saraju P. Mohanty,Nagarajan Ranganathan,Elias Kougianos,Priyardarsan Patra Pdf

This self-contained book addresses the need for analysis, characterization, estimation, and optimization of the various forms of power dissipation in the presence of process variations of nano-CMOS technologies. The authors show very large-scale integration (VLSI) researchers and engineers how to minimize the different types of power consumption of digital circuits. The material deals primarily with high-level (architectural or behavioral) energy dissipation.

Author : Miloš Stanisavljević,Alexandre Schmid,Yusuf Leblebici
Publisher : Springer Science & Business Media
Page : 215 pages
File Size : 52,7 Mb
Release : 2010-10-20
Category : Technology & Engineering
ISBN : 9781441962171

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Reliability of Nanoscale Circuits and Systems by Miloš Stanisavljević,Alexandre Schmid,Yusuf Leblebici Pdf

This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.

Author : Niraj K. Jha,Deming Chen
Publisher : Springer Science & Business Media
Page : 489 pages
File Size : 55,7 Mb
Release : 2010-12-21
Category : Technology & Engineering
ISBN : 9781441976093

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Nanoelectronic Circuit Design by Niraj K. Jha,Deming Chen Pdf

This book is about large-scale electronic circuits design driven by nanotechnology, where nanotechnology is broadly defined as building circuits using nanoscale devices that are either implemented with nanomaterials (e.g., nanotubes or nanowires) or following an unconventional method (e.g., FinFET or III/V compound-based devices). These nanoscale devices have significant potential to revolutionize the fabrication and integration of electronic systems and scale beyond the perceived scaling limitations of traditional CMOS. While innovations in nanotechnology originate at the individual device level, realizing the true impact of electronic systems demands that these device-level capabilities be translated into system-level benefits. This is the first book to focus on nanoscale circuits and their design issues, bridging the existing gap between nanodevice research and nanosystem design.

Author : Marco Ottavi,Dimitris Gizopoulos,Salvatore Pontarelli
Publisher : Springer
Page : 281 pages
File Size : 45,5 Mb
Release : 2017-08-28
Category : Technology & Engineering
ISBN : 9783319544229

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Dependable Multicore Architectures at Nanoscale by Marco Ottavi,Dimitris Gizopoulos,Salvatore Pontarelli Pdf

This book provides comprehensive coverage of the dependability challenges in today's advanced computing systems. It is an in-depth discussion of all the technological and design-level techniques that may be used to overcome these issues and analyzes various dependability-assessment methods. The impact of individual application scenarios on the definition of challenges and solutions is considered so that the designer can clearly assess the problems and adjust the solution based on the specifications in question. The book is composed of three sections, beginning with an introduction to current dependability challenges arising in complex computing systems implemented with nanoscale technologies, and of the effect of the application scenario. The second section details all the fault-tolerance techniques that are applicable in the manufacture of reliable advanced computing devices. Different levels, from technology-level fault avoidance to the use of error correcting codes and system-level checkpointing are introduced and explained as applicable to the different application scenario requirements. Finally the third section proposes a roadmap of future trends in and perspectives on the dependability and manufacturability of advanced computing systems from the special point of view of industrial stakeholders. Dependable Multicore Architectures at Nanoscale showcases the original ideas and concepts introduced into the field of nanoscale manufacturing and systems reliability over nearly four years of work within COST Action IC1103 MEDIAN, a think-tank with participants from 27 countries. Academic researchers and graduate students working in multi-core computer systems and their manufacture will find this book of interest as will industrial design and manufacturing engineers working in VLSI companies.

Author : Ban Wong,Anurag Mittal,Yu Cao,Greg W. Starr
Publisher : John Wiley & Sons
Page : 413 pages
File Size : 55,5 Mb
Release : 2005-04-08
Category : Technology & Engineering
ISBN : 9780471678861

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Nano-CMOS Circuit and Physical Design by Ban Wong,Anurag Mittal,Yu Cao,Greg W. Starr Pdf

Based on the authors' expansive collection of notes taken over the years, Nano-CMOS Circuit and Physical Design bridges the gap between physical and circuit design and fabrication processing, manufacturability, and yield. This innovative book covers: process technology, including sub-wavelength optical lithography; impact of process scaling on circuit and physical implementation and low power with leaky transistors; and DFM, yield, and the impact of physical implementation.

Author : Rajesh Garg
Publisher : Springer Science & Business Media
Page : 224 pages
File Size : 53,6 Mb
Release : 2009-10-22
Category : Technology & Engineering
ISBN : 9781441909312

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Analysis and Design of Resilient VLSI Circuits by Rajesh Garg Pdf

This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.

Author : Ban P. Wong,Anurag Mittal,Greg W. Starr,Franz Zach,Victor Moroz,Andrew Kahng
Publisher : John Wiley & Sons
Page : 408 pages
File Size : 44,5 Mb
Release : 2008-12-29
Category : Technology & Engineering
ISBN : 9780470382813

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Nano-CMOS Design for Manufacturability by Ban P. Wong,Anurag Mittal,Greg W. Starr,Franz Zach,Victor Moroz,Andrew Kahng Pdf

Discover innovative tools that pave the way from circuit and physical design to fabrication processing Nano-CMOS Design for Manufacturability examines the challenges that design engineers face in the nano-scaled era, such as exacerbated effects and the proven design for manufacturability (DFM) methodology in the midst of increasing variability and design process interactions. In addition to discussing the difficulties brought on by the continued dimensional scaling in conformance with Moore's law, the authors also tackle complex issues in the design process to overcome the difficulties, including the use of a functional first silicon to support a predictable product ramp. Moreover, they introduce several emerging concepts, including stress proximity effects, contour-based extraction, and design process interactions. This book is the sequel to Nano-CMOS Circuit and Physical Design, taking design to technology nodes beyond 65nm geometries. It is divided into three parts: Part One, Newly Exacerbated Effects, introduces the newly exacerbated effects that require designers' attention, beginning with a discussion of the lithography aspects of DFM, followed by the impact of layout on transistor performance Part Two, Design Solutions, examines how to mitigate the impact of process effects, discussing the methodology needed to make sub-wavelength patterning technology work in manufacturing, as well as design solutions to deal with signal, power integrity, WELL, stress proximity effects, and process variability Part Three, The Road to DFM, describes new tools needed to support DFM efforts, including an auto-correction tool capable of fixing the layout of cells with multiple optimization goals, followed by a look ahead into the future of DFM Throughout the book, real-world examples simplify complex concepts, helping readers see how they can successfully handle projects on Nano-CMOS nodes. It provides a bridge that allows engineers to go from physical and circuit design to fabrication processing and, in short, make designs that are not only functional, but that also meet power and performance goals within the design schedule.

Author : Rene van Leuken,Gilles Sicard
Publisher : Springer
Page : 260 pages
File Size : 45,9 Mb
Release : 2011-01-16
Category : Computers
ISBN : 9783642177521

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Integrated Circuit and System Design. Power and Timing Modeling, Optimization, and Simulation by Rene van Leuken,Gilles Sicard Pdf

This book constitutes the refereed proceedings of the 20th International Conference on Integrated Circuit and System Design, PATMOS 2010, held in Grenoble, France, in September 2010. The 24 revised full papers presented and the 9 extended abstracts were carefully reviewed and are organized in topical sections on design flows; circuit techniques; low power circuits; self-timed circuits; process variation; high-level modeling of poweraware heterogeneous designs in SystemC-AMS; and minalogic.