Plasma Parameter Dependence Of Thin Oxide Charging Damage To Microelectronic Test Structures In An Electron Cyclotron Resonance Plasma

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Dissertation Abstracts International

Author : Anonim
Publisher : Unknown
Page : 780 pages
File Size : 43,9 Mb
Release : 1996
Category : Dissertations, Academic
ISBN : STANFORD:36105020028358

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Digest of Technical Papers

Author : Anonim
Publisher : Unknown
Page : 1020 pages
File Size : 55,9 Mb
Release : 2003
Category : Actuators
ISBN : UOM:39015047932655

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Microelectronic Processes, Sensors, and Controls

Author : James Bondur
Publisher : Unknown
Page : 480 pages
File Size : 52,8 Mb
Release : 1994
Category : Technology & Engineering
ISBN : UOM:39015032421151

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Microelectronic Processes, Sensors, and Controls by James Bondur Pdf

Chemical Abstracts

Author : Anonim
Publisher : Unknown
Page : 2540 pages
File Size : 49,6 Mb
Release : 2002
Category : Chemistry
ISBN : UOM:39015057321377

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Catalog of National Bureau of Standards Publications, 1966-1976

Author : United States. National Bureau of Standards. Technical Information and Publications Division,Betty L. Burris,Rebecca J. Morehouse
Publisher : Unknown
Page : 844 pages
File Size : 51,5 Mb
Release : 1978
Category : Government publications
ISBN : UOM:39015086505636

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Catalog of National Bureau of Standards Publications, 1966-1976 by United States. National Bureau of Standards. Technical Information and Publications Division,Betty L. Burris,Rebecca J. Morehouse Pdf

Catalog of National Bureau of Standards Publications, 1966-1976

Author : United States. National Bureau of Standards
Publisher : Unknown
Page : 844 pages
File Size : 41,8 Mb
Release : 1978
Category : Government publications
ISBN : UIUC:30112104127250

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Catalog of National Bureau of Standards Publications, 1966-1976 by United States. National Bureau of Standards Pdf

Relationship Between the Charging Damage of Test Structures and the Deposited Charge on Unpatterned Wafers Exposed to an Electron Cyclotron Resonance Plasma

Author : Cristian cismaru
Publisher : Unknown
Page : 34 pages
File Size : 42,8 Mb
Release : 1997
Category : Electronic
ISBN : OCLC:957128963

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Relationship Between the Charging Damage of Test Structures and the Deposited Charge on Unpatterned Wafers Exposed to an Electron Cyclotron Resonance Plasma by Cristian cismaru Pdf

Plasma Sources for Thin Film Deposition and Etching

Author : Maurice H. Francombe,John L. Vossen
Publisher : Elsevier
Page : 352 pages
File Size : 52,6 Mb
Release : 1994-08-18
Category : Science
ISBN : 0125330189

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Plasma Sources for Thin Film Deposition and Etching by Maurice H. Francombe,John L. Vossen Pdf

Steinbrüchel, Christoph; The formation of particles in thin-film processing plasmas.

Physics Briefs

Author : Anonim
Publisher : Unknown
Page : 934 pages
File Size : 40,8 Mb
Release : 1994
Category : Physics
ISBN : UOM:39015027829848

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Electrical & Electronics Abstracts

Author : Anonim
Publisher : Unknown
Page : 2240 pages
File Size : 41,7 Mb
Release : 1997
Category : Electrical engineering
ISBN : OSU:32435059589358

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Ceramic Abstracts

Author : American Ceramic Society
Publisher : Unknown
Page : 1000 pages
File Size : 52,5 Mb
Release : 1996
Category : Ceramics
ISBN : CORNELL:31924077912669

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Metals Abstracts

Author : Anonim
Publisher : Unknown
Page : 1592 pages
File Size : 54,6 Mb
Release : 1992
Category : Metallurgy
ISBN : MINN:31951D00986588Y

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